Journal of Applied Crystallography

Volume 16, Part 1 (February 1983)



research papers



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J. Appl. Cryst. (1983). 16, 1-10    [doi:10.1107/S0021889883009863]

Etude microstructurale de carbures M7C3

J. P. Morniroli and M. Gantois



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J. Appl. Cryst. (1983). 16, 11-13    [doi:10.1107/S0021889883009875]

A method for collection of step-scan data on a CAD4 diffractometer, homogeneity of the monochromated primary X-ray beam

B. Birknes and L. K. Hansen



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J. Appl. Cryst. (1983). 16, 14-20    [doi:10.1107/S0021889883009887]

Rotatory power measurements in the X-ray range with synchrotron radiation: Experimental set-up and preliminary results for NaBrO3 single crystals

M. Sauvage, C. Malgrange and J.-F. Petroff



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J. Appl. Cryst. (1983). 16, 21-23    [doi:10.1107/S0021889883009899]

Quantitative microanalysis of cristobalite by X-ray powder diffraction

E. Bye



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J. Appl. Cryst. (1983). 16, 24-27    [doi:10.1107/S0021889883009905]

K[alpha]2 elimination algorithm for Cu, Co and Cr radiations

G. Platbrood



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J. Appl. Cryst. (1983). 16, 28-41    [doi:10.1107/S0021889883009917]

Macromolecular crystallography with synchrotron radiation. II. Results

K. S. Wilson, E. A. Stura, D. L. Wild, R. J. Todd, D. I. Stuart, Y. S. Babu, J. A. Jenkins, T. S. Standing, L. N. Johnson, R. Fourme, R. Kahn, A. Gadet, K. S. Bartels and H. D. Bartunik



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J. Appl. Cryst. (1983). 16, 42-46    [doi:10.1107/S0021889883009929]

Information retrieval from X-ray small-angle scattering with polychromatic (`white') synchrotron radiation

O. Glatter and P. Laggner



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J. Appl. Cryst. (1983). 16, 47-56    [doi:10.1107/S0021889883009930]

X-ray topography of natural beryl using synchrotron and conventional sources

N. Herres and A. R. Lang



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J. Appl. Cryst. (1983). 16, 57-61    [doi:10.1107/S0021889883009942]

Twyman-Green interferometry for semi-quantitative analysis of homogeneity and nonlinearity of a mixing crystal

F. L. Schow, A. Riazi, O. P. Gandhi and R. W. Grow



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J. Appl. Cryst. (1983). 16, 62-69    [doi:10.1107/S0021889883009954]

Powder diffraction by layered minerals containing different layers and/or stacking defects. Comparison between Markovian and non-Markovian models

A. Plançon, V. A. Drits, B. A. Sakharov, Z. I. Gilan and J. B. Brahim



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J. Appl. Cryst. (1983). 16, 70-73    [doi:10.1107/S0021889883009966]

An auxiliary method of indexing electron diffraction patterns by means of gnomonic projections

F. S. Borges



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J. Appl. Cryst. (1983). 16, 74-82    [doi:10.1107/S0021889883009978]

Calculation of scattering curves for macromolecules in solution and comparison with results of methods using effective atomic scattering factors

J. J. Müller



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J. Appl. Cryst. (1983). 16, 83-88    [doi:10.1107/S002188988300998X]

Voronoi cells: An interesting and potentially useful cell model for interpreting the small-angle scattering of catalysts

H. Brumberger and J. Goodisman



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J. Appl. Cryst. (1983). 16, 89-95    [doi:10.1107/S0021889883009991]

Defect structure analysis of polycrystalline materials by computer-controlled double-crystal diffractometer with position-sensitive detector

R. Yazici, W. Mayo, T. Takemoto and S. Weissmann



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J. Appl. Cryst. (1983). 16, 96-98    [doi:10.1107/S0021889883010006]

Detwinning cell for high-transition-temperature atmosphere-sensitive ferroelastic crystals

S. C. Abrahams, J. L. Bernstein, J. P. Chaminade and J. Ravez



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J. Appl. Cryst. (1983). 16, 99-102    [doi:10.1107/S0021889883010018]

The f.c.c.+tetragonal two-phase region of the Cu-Ni-Zn system

O. S. Mayall



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J. Appl. Cryst. (1983). 16, 103-112    [doi:10.1107/S002188988301002X]

Some practical aspects of the Fourier deconvolution

M. Cernanský



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J. Appl. Cryst. (1983). 16, 113-125    [doi:10.1107/S0021889883010031]

On the variation of X-ray diffraction contrast with wavelength: A study with synchrotron radiation

A. R. Lang, A. P. W. Makepeace, M. Moore and W. C. Machado



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J. Appl. Cryst. (1983). 16, 126-132    [doi:10.1107/S0021889883010043]

An error assessment of single-crystal 2[pi]data from four-circle diffractometry

L. K. Frevel, T. J. Emge and T. J. Kistenmacher



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J. Appl. Cryst. (1983). 16, 133-135    [doi:10.1107/S0021889883010055]

Dielectric and thermal properties, expansion, and high-temperature plastic deformation of Cd4Na(VO4)3

S. C. Abrahams, K. Nassau, J. Ravez, A. Simon and R. Olazcuaga


short communications



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J. Appl. Cryst. (1983). 16, 136-137    [doi:10.1107/S0021889883010067]

Replacement of monochromator and proportional gas counter by mercuric iodide detector in X-ray powder diffraction

J. Nissenbaum, A. Levi, A. Burger and M. Schieber



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J. Appl. Cryst. (1983). 16, 138-140    [doi:10.1107/S0021889883010079]

Relationship of crystallographic polarity to piezoelectric, pyroelectric and chemical etching in Li2GeO3 and LiGaO2 single crystals

A. S. Bhalla, L. L. Tongson and R. E. Newnham


crystal data



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J. Appl. Cryst. (1983). 16, 140    [doi:10.1107/S0021889883010080]

Crystal data for benzofuroin

O. Durruthy, F. Fajardo and R. Pomes



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J. Appl. Cryst. (1983). 16, 141-142    [doi:10.1107/S0021889883010092]

Crystal data on some potassium lithium metal sulphides (KLiMS2, M being Zn, Mn or Fe)

D. M. Nicholas, M. S. Whaite and T. M. Ho



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J. Appl. Cryst. (1983). 16, 142-143    [doi:10.1107/S0021889883010109]

Le tétrabromomercurate(II) de monométhylammonium

A. Ben Salah



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J. Appl. Cryst. (1983). 16, 143    [doi:10.1107/S0021889883010110]

Crystal data for synthetic K2Mg(CO3)2

B. Simons and S. K. Sharma



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J. Appl. Cryst. (1983). 16, 143    [doi:10.1107/S0021889883010122]

Crystal data for antimony molybdenum oxide Sb2MoO6

A. Laarif, A. Hewat, F. Theobald and H. Vivier


computer programs



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J. Appl. Cryst. (1983). 16, 144-150    [doi:10.1107/S0021889883010134]

Protein model building by the use of a constrained-restrained least-squares procedure

O. Herzberg and J. L. Sussman



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J. Appl. Cryst. (1983). 16, 150-154    [doi:10.1107/S0021889883010146]

An improved program for searching and matching of X-ray powder diffraction patterns

Lin Tian-Hui, Zhang Sai-Zhu, Chen Li-Jun and Cai Xin-Xing



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J. Appl. Cryst. (1983). 16, 154-156    [doi:10.1107/S0021889883010158]

G-TDSCOR: one-phonon TDS corrections for measured integrated Bragg intensities

M. Sakata, A. W. Stevenson and J. Harada


laboratory notes



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J. Appl. Cryst. (1983). 16, 157-158    [doi:10.1107/S002188988301016X]

Reciprocal lattice and Ewald construction as an experiment for use in lectures

B. Uebigau, G. Zorn and K. L. Weiner


crystallographers



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J. Appl. Cryst. (1983). 16, 158    [doi:10.1107/S0021889883010171]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1983). 16, 158    [doi:10.1107/S0021889883010183]

Notes for Authors


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