Journal of Applied Crystallography

Volume 16, Part 2 (April 1983)



research papers



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J. Appl. Cryst. (1983). 16, 159-163    [doi:10.1107/S0021889883010195]

The estimation of standard deviations in powder diffraction Rietveld refinements

H. G. Scott



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J. Appl. Cryst. (1983). 16, 164-170    [doi:10.1107/S0021889883010201]

The structure of Na2UCl6 and Li2UCl6 from multiphase powder neutron profile refinement

P. J. Bendall, A. N. Fitch and B. E. F. Fender



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J. Appl. Cryst. (1983). 16, 171-175    [doi:10.1107/S0021889883010213]

Microdiffraction from stacking faults and twin boundaries in F.c.c. crystals

J. Zhu and J. M. Cowley



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J. Appl. Cryst. (1983). 16, 176-182    [doi:10.1107/S0021889883010225]

A method for the interpretation of the Warren-Averbach mean-squared strains and its application to recovery in aluminium

M. J. Turunen, Th. de Keijser, R. Delhez and N. M. van. der. Pers



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J. Appl. Cryst. (1983). 16, 183-191    [doi:10.1107/S0021889883010237]

A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line-broadening analysis

D. Louër, J. P. Auffrédic, J. I. Langford, D. Ciosmak and J. C. Niepce



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J. Appl. Cryst. (1983). 16, 192-197    [doi:10.1107/S0021889883010249]

Routine recording of diffuse scattering from disordered molecular crystals

T. R. Welberry



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J. Appl. Cryst. (1983). 16, 198-203    [doi:10.1107/S0021889883010250]

A focusing X-ray camera for recording low-angle diffraction from small specimens

J. R. Milch



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J. Appl. Cryst. (1983). 16, 204-211    [doi:10.1107/S0021889883010262]

A new optical method and apparatus `HAUP' for measuring simultaneously optical activity and birefringence of crystals. I. Principles and construction

J. Kobayashi and Y. Uesu



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J. Appl. Cryst. (1983). 16, 212-219    [doi:10.1107/S0021889883010274]

A new optical method and apparatus `HAUP' for measuring simultaneously optical activity and birefringence of crystals. II. Application to triglycine-sulphuric acid (NH2CH2CO2H)3.H2SO4

J. Kobayashi, Y. Uesu and H. Takehara



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J. Appl. Cryst. (1983). 16, 220-232    [doi:10.1107/S0021889883010286]

An energy-dispersive spectrometer for the rapid measurement of X-ray absorption spectra using synchrotron radiation

R. P. Phizackerley, Z. U. Rek, G. B. Stephenson, S. D. Conradson, K. O. Hodgson, T. Matsushita and H. Oyanagi



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J. Appl. Cryst. (1983). 16, 233-238    [doi:10.1107/S0021889883010298]

Double hexagonal superstructure of Au-Mg alloy containing 20 at.% Mg studied by high-voltage high-resolution electron microscopy

D. Shindo, K. Haraga, M. Hirabayashi, O. Terasaki and D. Watanabe



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J. Appl. Cryst. (1983). 16, 239-241    [doi:10.1107/S0021889883010304]

X-ray guide tube for diffraction experiments

H. Nakazawa



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J. Appl. Cryst. (1983). 16, 242-250    [doi:10.1107/S0021889883010316]

Oscillation camera data processing. 3. General diffraction spot size, shape and energy profile: formalism for polychromatic diffraction experiments with monochromatized synchrotron X-radiation from a singly bent triangular monochromator

T. J. Greenhough, J. R. Helliwell and S. A. Rule



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J. Appl. Cryst. (1983). 16, 251-256    [doi:10.1107/S0021889883010328]

X-ray measurement of the static Debye-Waller factor of NbHx

H. Behr, H. Metzger and J. Peisl



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J. Appl. Cryst. (1983). 16, 257-258    [doi:10.1107/S002188988301033X]

Reciprocal-lattice-compatible representation of linear position-sensitive detector output

A. McL Mathieson



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J. Appl. Cryst. (1983). 16, 259-263    [doi:10.1107/S0021889883010341]

Difference thermal analysis of crystalline solids by the use of energy-dispersive X-ray diffraction

N. Eisenreich and W. Engel



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J. Appl. Cryst. (1983). 16, 264-269    [doi:10.1107/S0021889883010353]

X-ray diffraction studies on the arrangement of water molecules in a smectite. I.Homogeneous two-water-layer Na-beidellite

J. B. Brahim, N. Armagan, G. Besson and C. Tchoubar



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J. Appl. Cryst. (1983). 16, 270-273    [doi:10.1107/S0021889883010365]

A rapid and precise method of measuring Kendrew-model coordinates with theodolites

L. Lebioda, M. H. Hatada and A. Tulinsky


short communications



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J. Appl. Cryst. (1983). 16, 274-276    [doi:10.1107/S0021889883010377]

The determination of the crystallinity in glass-ceramic materials by the method of Ruland

C. G. Vonk and G. Fagherazzi


crystal data



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J. Appl. Cryst. (1983). 16, 276    [doi:10.1107/S0021889883010389]

Crystal data for 2-(4-methyl-2-pyridyliminomethyl)phenol and 2-(4,6-dimethyl-2-pyridyliminomethyl)phenol

C. Escobar, M. T. Garland and E. Spodine



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J. Appl. Cryst. (1983). 16, 277    [doi:10.1107/S0021889883010390]

Crystal data for bis([eta]5-tert-butylcyclopentadienyl)hafnium(IV) dihydride dimer, [([eta]5-t-BuC5H4)2HfH([mu]-H)]2

A. Laarif, F. Theobald, B. Gautheron and G. Tainturier



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J. Appl. Cryst. (1983). 16, 277-278    [doi:10.1107/S0021889883010407]

Kristallstrukturdaten von PdPb0.2As0.8(m)

M. Ellner, U. Kattner und B. Predel



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J. Appl. Cryst. (1983). 16, 279-281    [doi:10.1107/S0021889883010419]

Crystal data for nickel and cadmium [alpha]-L-alaninates

A. Démaret and D. Mercier


computer programs



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J. Appl. Cryst. (1983). 16, 281-283    [doi:10.1107/S0021889883010420]

An interactive program for the interpretation and simulation of Laue patterns

J. Laughier and A. Filhol


crystallographers



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J. Appl. Cryst. (1983). 16, 284    [doi:10.1107/S0021889883010432]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1983). 16, 284    [doi:10.1107/S0021889883010444]

International Tables for Crystallography


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