Journal of Applied Crystallography

Volume 16, Part 2 (April 1983)

research papers
short communications
crystal data
computer programs
crystallographers
international union of crystallography

research papers

J. Appl. Cryst. (1983). 16, 159-163 [doi:10.1107/S0021889883010195]

The estimation of standard deviations in powder diffraction Rietveld refinements

H. G. Scott

J. Appl. Cryst. (1983). 16, 164-170 [doi:10.1107/S0021889883010201]

The structure of Na₂UCl₆ and Li₂UCl₆ from multiphase powder neutron profile refinement

P. J. Bendall, A. N. Fitch and B. E. F. Fender

J. Appl. Cryst. (1983). 16, 171-175 [doi:10.1107/S0021889883010213]

Microdiffraction from stacking faults and twin boundaries in F.c.c. crystals

J. Zhu and J. M. Cowley

J. Appl. Cryst. (1983). 16, 176-182 [doi:10.1107/S0021889883010225]

A method for the interpretation of the Warren-Averbach mean-squared strains and its application to recovery in aluminium

M. J. Turunen, Th. de Keijser, R. Delhez and N. M. van. der. Pers

J. Appl. Cryst. (1983). 16, 183-191 [doi:10.1107/S0021889883010237]

A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line-broadening analysis

D. Louër, J. P. Auffrédic, J. I. Langford, D. Ciosmak and J. C. Niepce

J. Appl. Cryst. (1983). 16, 192-197 [doi:10.1107/S0021889883010249]

Routine recording of diffuse scattering from disordered molecular crystals

T. R. Welberry

J. Appl. Cryst. (1983). 16, 198-203 [doi:10.1107/S0021889883010250]

A focusing X-ray camera for recording low-angle diffraction from small specimens

J. R. Milch

J. Appl. Cryst. (1983). 16, 204-211 [doi:10.1107/S0021889883010262]

A new optical method and apparatus `HAUP' for measuring simultaneously optical activity and birefringence of crystals. I. Principles and construction

J. Kobayashi and Y. Uesu

J. Appl. Cryst. (1983). 16, 212-219 [doi:10.1107/S0021889883010274]

A new optical method and apparatus `HAUP' for measuring simultaneously optical activity and birefringence of crystals. II. Application to triglycine-sulphuric acid (NH₂CH₂CO₂H)₃.H₂SO₄

J. Kobayashi, Y. Uesu and H. Takehara

J. Appl. Cryst. (1983). 16, 220-232 [doi:10.1107/S0021889883010286]

An energy-dispersive spectrometer for the rapid measurement of X-ray absorption spectra using synchrotron radiation

R. P. Phizackerley, Z. U. Rek, G. B. Stephenson, S. D. Conradson, K. O. Hodgson, T. Matsushita and H. Oyanagi

J. Appl. Cryst. (1983). 16, 233-238 [doi:10.1107/S0021889883010298]

Double hexagonal superstructure of Au-Mg alloy containing 20 at.% Mg studied by high-voltage high-resolution electron microscopy

D. Shindo, K. Haraga, M. Hirabayashi, O. Terasaki and D. Watanabe

J. Appl. Cryst. (1983). 16, 239-241 [doi:10.1107/S0021889883010304]

X-ray guide tube for diffraction experiments

H. Nakazawa

J. Appl. Cryst. (1983). 16, 242-250 [doi:10.1107/S0021889883010316]

Oscillation camera data processing. 3. General diffraction spot size, shape and energy profile: formalism for polychromatic diffraction experiments with monochromatized synchrotron X-radiation from a singly bent triangular monochromator

T. J. Greenhough, J. R. Helliwell and S. A. Rule

J. Appl. Cryst. (1983). 16, 251-256 [doi:10.1107/S0021889883010328]

X-ray measurement of the static Debye-Waller factor of NbH_x

H. Behr, H. Metzger and J. Peisl

J. Appl. Cryst. (1983). 16, 257-258 [doi:10.1107/S002188988301033X]

Reciprocal-lattice-compatible representation of linear position-sensitive detector output

A. McL Mathieson

J. Appl. Cryst. (1983). 16, 259-263 [doi:10.1107/S0021889883010341]

Difference thermal analysis of crystalline solids by the use of energy-dispersive X-ray diffraction

N. Eisenreich and W. Engel

J. Appl. Cryst. (1983). 16, 264-269 [doi:10.1107/S0021889883010353]

X-ray diffraction studies on the arrangement of water molecules in a smectite. I.Homogeneous two-water-layer Na-beidellite

J. B. Brahim, N. Armagan, G. Besson and C. Tchoubar

J. Appl. Cryst. (1983). 16, 270-273 [doi:10.1107/S0021889883010365]

A rapid and precise method of measuring Kendrew-model coordinates with theodolites

L. Lebioda, M. H. Hatada and A. Tulinsky

short communications

J. Appl. Cryst. (1983). 16, 274-276 [doi:10.1107/S0021889883010377]

The determination of the crystallinity in glass-ceramic materials by the method of Ruland

C. G. Vonk and G. Fagherazzi

crystal data

J. Appl. Cryst. (1983). 16, 276 [doi:10.1107/S0021889883010389]

Crystal data for 2-(4-methyl-2-pyridyliminomethyl)phenol and 2-(4,6-dimethyl-2-pyridyliminomethyl)phenol

C. Escobar, M. T. Garland and E. Spodine

J. Appl. Cryst. (1983). 16, 277 [doi:10.1107/S0021889883010390]

Crystal data for bis(⁵-tert-butylcyclopentadienyl)hafnium(IV) dihydride dimer, [(⁵-t-BuC₅H₄)₂HfH(-H)]₂

A. Laarif, F. Theobald, B. Gautheron and G. Tainturier

J. Appl. Cryst. (1983). 16, 277-278 [doi:10.1107/S0021889883010407]

Kristallstrukturdaten von PdPb_0.2As_0.8(m)

M. Ellner, U. Kattner und B. Predel

J. Appl. Cryst. (1983). 16, 279-281 [doi:10.1107/S0021889883010419]

Crystal data for nickel and cadmium -L-alaninates

A. Démaret and D. Mercier

computer programs

J. Appl. Cryst. (1983). 16, 281-283 [doi:10.1107/S0021889883010420]

An interactive program for the interpretation and simulation of Laue patterns

J. Laughier and A. Filhol

crystallographers

J. Appl. Cryst. (1983). 16, 284 [doi:10.1107/S0021889883010432]

Crystallographers

international union of crystallography

J. Appl. Cryst. (1983). 16, 284 [doi:10.1107/S0021889883010444]