Journal of Applied Crystallography
Volume 16, Part 3 (June 1983)
J. Appl. Cryst. (1983). 16, 285-288 [doi:10.1107/S0021889883010456]
Certification of Si powder diffraction standard reference material 640a
C. R. Hubbard
J. Appl. Cryst. (1983). 16, 289-294 [doi:10.1107/S0021889883010468]
Rational functions as profile models in powder diffraction
N. P. Pyrros and C. R. Hubbard
J. Appl. Cryst. (1983). 16, 295-303 [doi:10.1107/S002188988301047X]
On the X-ray reflectivity of elastically bent perfect crystals
Z. H. Kalman and S. Weissmann
J. Appl. Cryst. (1983). 16, 304-308 [doi:10.1107/S0021889883010481]
On-line Fourier analysis of the shapes of X-ray diffraction peaks
W. H. Schlosberg and J. B. Cohen
J. Appl. Cryst. (1983). 16, 309-316 [doi:10.1107/S0021889883010493]
The determination of crystallite-size and lattice-strain parameters in conjunction with the profile-refinement method for the determination of crystal structures
Th. de Keijser, E. J. Mittemeijer and H. C. F. Rozendaal
J. Appl. Cryst. (1983). 16, 317-324 [doi:10.1107/S002188988301050X]
Use of high-symmetry zone axes in electron diffraction in determining crystal point and space groups
J. W. Steeds and R. Vincent
J. Appl. Cryst. (1983). 16, 325-340 [doi:10.1107/S0021889883010511]
Residual stresses in cubic materials with orthorhombic or monoclinic specimen symmetry: influence of texture on ![[psi]](/logos/entities/psi_rmgif.gif)
splitting and
non-linear behaviour
C. M. Brakman
J. Appl. Cryst. (1983). 16, 341-348 [doi:10.1107/S0021889883011401]
A novel curved position-sensitive proportional counter for X-ray diffractometry
E. R. Wölfel
J. Appl. Cryst. (1983). 16, 349-353 [doi:10.1107/S0021889883010523]
Small-angle scattering of chain molecules in a hydrodynamic field. The internal rigidity of double-stranded DNA
B. Sjöberg and R. Osterberg
J. Appl. Cryst. (1983). 16, 354-356 [doi:10.1107/S0021889883010535]
Observations on the phase transition in quartz by synchrotron-radiation X-ray topography
A. Zarka
J. Appl. Cryst. (1983). 16, 357 [doi:10.1107/S0021889883010547]
On `forbidden' reflections in calcia- and yttria-stabilized zirconia (CSZ and YSZ)
L. H. Schoenlein and A. H. Heuer
J. Appl. Cryst. (1983). 16, 357 [doi:10.1107/S0021889883010559]
The crystal structure of ![[alpha]](/logos/entities/alpha_rmgif.gif)
-mercury(II) peroxide
M. Puselj, Z. Ban and E. Lukacevic
J. Appl. Cryst. (1983). 16, 358 [doi:10.1107/S0021889883010560]
PROMETHEUS. A program system for investigation of anharmonic thermal vibrations in crystals
U. H. Zucker, E. Perenthaler, W. F. Kuhs, R. Bachmann and H. Schulz
J. Appl. Cryst. (1983). 16, 359-360 [doi:10.1107/S0021889883010572]
Automated fail-safe control system for independent operation of two radiation shutters on a rotating-anode X-ray source
M. T. Short, W. J. Eisler Jnr and F. J. Stevens
J. Appl. Cryst. (1983). 16, 360 [doi:10.1107/S0021889883010584]
A simple method to cut a single crystal in any desired direction
C. Campos, L. P. Cardoso and S. Caticha-Ellis
J. Appl. Cryst. (1983). 16, 360-361 [doi:10.1107/S0021889883010596]
Crystallographers
J. Appl. Cryst. (1983). 16, 361 [doi:10.1107/S0021889883010602]
Report of the Twelth General Assembly and International Congress of Crystallography
J. Appl. Cryst. (1983). 16, 361 [doi:10.1107/S0021889883010614]
Report of the Executive Committee for 1981
J. Appl. Cryst. (1983). 16, 361-362 [doi:10.1107/S0021889883010626]
Developments in crystalline polymers edited by D. C. Bassett
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