Journal of Applied Crystallography

Volume 16, Part 4 (August 1983)



research papers



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J. Appl. Cryst. (1983). 16, 363-369    [doi:10.1107/S0021889883010638]

A rotating-crystal pulse shaper for use on a pulsed neutron source

J. M. Carpenter and C. J. Carlile



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J. Appl. Cryst. (1983). 16, 370-373    [doi:10.1107/S002188988301064X]

Caractérisation du polymorphisme du méthyl-2 naphtalène

A. Meresse, N. B. Chanh, J. Housty et Y. Haget



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J. Appl. Cryst. (1983). 16, 374-383    [doi:10.1107/S0021889883010651]

Use of diffraction and Mössbauer methods for the structural and crystallochemical characterization of nontronites

G. Besson, A. S. Bookin, L. G. Dainyak, M. Rautureau, S. I. Tsipursky, C. Tchoubar and V. A. Drits



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J. Appl. Cryst. (1983). 16, 384-389    [doi:10.1107/S0021889883010663]

Small-angle scattering with azimuthal asymmetry

G. C. Summerfield and D. F. R. Mildner



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J. Appl. Cryst. (1983). 16, 390-398    [doi:10.1107/S0021889883010675]

The growth and perfection of crystals of ammonium dihydrogen orthophosphate, NH4H2PO4. I. Dislocation characterization in self-nucleated crystals

H. L. Bhat, K. J. Roberts and J. N. Sherwood



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J. Appl. Cryst. (1983). 16, 399-403    [doi:10.1107/S0021889883010687]

Growth defects in a quartz druse <a+c> dislocations

E. Scandale, F. Stasi and A. Zarka



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J. Appl. Cryst. (1983). 16, 404-406    [doi:10.1107/S0021889883010699]

Counting statistics and powder diffraction scan refinements

E. Baharie and G. S. Pawley



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J. Appl. Cryst. (1983). 16, 407-414    [doi:10.1107/S0021889883010705]

New procedures for quantitative studies of diffuse X-ray scattering

T. B. Wu, E. Matsubara and J. B. Cohen



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J. Appl. Cryst. (1983). 16, 415-419    [doi:10.1107/S0021889883010717]

X-ray diffraction study of the system Ga2Se3-In2Te3

B. Grzeta-Plenkovic, S. Popovic, B. Celustka, Z. Ruzic-Toros, B. Santic and D. Soldo



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J. Appl. Cryst. (1983). 16, 420-427    [doi:10.1107/S0021889883010729]

Asymmetrically grooved monolithic crystal monochromators for suppression of harmonics in synchrotron X-radiation

H. Hashizume


short communications



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J. Appl. Cryst. (1983). 16, 428-429    [doi:10.1107/S0021889883010730]

A simple Gandolfi attachment for a Debye-Scherrer camera and its use in a forensic science laboratory

D. F. Rendle


crystal data



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J. Appl. Cryst. (1983). 16, 430    [doi:10.1107/S0021889883010742]

Données crystallographiques sur les composés Cu(C15H11N3) X2: X=Br-, I-

F. J. Ruiz, J. L. Mesa, T. Rojo et M. I. Arriortua



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J. Appl. Cryst. (1983). 16, 430    [doi:10.1107/S0021889883010754]

Crystal data for dilead(II) pentaoxosulfate(VI), Pb2SO5

B. F. Mentzen and A. Latrach



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J. Appl. Cryst. (1983). 16, 430    [doi:10.1107/S0021889883010766]

Crystal data for rhombohedral Pb3[Ge2O7]isotypic with Pb-barysilite

H. H. Otto


computer programs



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J. Appl. Cryst. (1983). 16, 431-432    [doi:10.1107/S0021889883010778]

PUCK 2, an improved version of the Cremer-Pople puckering program

P. Luger and R. Bülow



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J. Appl. Cryst. (1983). 16, 432-437    [doi:10.1107/S002188988301078X]

DOCKER, an interactive program for simulating protein receptor and substrate interactions

B. Busetta, I. J. Tickle and T. L. Blundell



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J. Appl. Cryst. (1983). 16, 437    [doi:10.1107/S0021889883010791]

Calculation of anomalous scattering factors at arbitrary wavelengths

D. T. Cromer


notes and news



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J. Appl. Cryst. (1983). 16, 438    [doi:10.1107/S0021889883010808]

Notes and News


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