Journal of Applied Crystallography

Volume 16, Part 5 (October 1983)



research papers



pdf version buy article online

J. Appl. Cryst. (1983). 16, 439-448    [doi:10.1107/S002188988301081X]

Etude du gonflement des vermiculites-ornithine en solution saline par analyse de la diffusion des rayons X aux petits angles. Méthode d'interprétation et recherche des paramètres d'ordre

J. Saez-Auñon, C. H. Pons, J. E. Iglesias et J. A. Rausell-Colom



pdf version buy article online

J. Appl. Cryst. (1983). 16, 449-452    [doi:10.1107/S0021889883010821]

A variable-temperature sample container for low-temperature neutron powder diffraction

E. Arzi and E. Sándor



pdf version buy article online

J. Appl. Cryst. (1983). 16, 453-457    [doi:10.1107/S0021889883010833]

Thermal expansivity of [alpha]-LiIO3 between 20 and 520 K

S. C. Abrahams, R. Liminga, P. Marsh, F. Schrey, J. Albertsson, C. Svensson and Å. Kvick



pdf version buy article online

J. Appl. Cryst. (1983). 16, 458-472    [doi:10.1107/S0021889883010845]

X-ray Rietveld refinement using Debye-Scherrer geometry

P. Thompson and I. G. Wood



pdf version buy article online

J. Appl. Cryst. (1983). 16, 473-478    [doi:10.1107/S0021889883010857]

An absolute intensity standard for small-angle X-ray scattering measured with position-sensitive detectors

T. P. Russell



pdf version buy article online

J. Appl. Cryst. (1983). 16, 479-485    [doi:10.1107/S0021889883010869]

Assessment of parameter accuracies in profile analysis of white-beam neutron powder diffraction experiments

H. Pöyry and K. J. Tilli



pdf version buy article online

J. Appl. Cryst. (1983). 16, 486-492    [doi:10.1107/S0021889883010870]

Precision interplanar spacing measurements of boron-doped silicon

D. A. W. Soares and C. A. Pimentel



pdf version buy article online

J. Appl. Cryst. (1983). 16, 493-497    [doi:10.1107/S0021889883010882]

A computer X-ray quantitative phase analysis

Z. Weiss, J. Krajícek, L. Smrcok and J. Fiala



pdf version buy article online

J. Appl. Cryst. (1983). 16, 498-504    [doi:10.1107/S0021889883010894]

A medium-resolution double-crystal diffractometer for the study of small-angle neutron scattering

J. Kulda and P. Mikula



pdf version buy article online

J. Appl. Cryst. (1983). 16, 505-507    [doi:10.1107/S0021889883010900]

The doping method in quantitative X-ray diffraction phase analysis. Addendum

S. Popovic, B. Grzeta-Plenkovic and T. Balic-Zunic



pdf version buy article online

J. Appl. Cryst. (1983). 16, 508-511    [doi:10.1107/S0021889883010912]

The effect of finite detector slit height on peak positions and shapes in powder diffraction

E. Prince



pdf version buy article online

J. Appl. Cryst. (1983). 16, 512-518    [doi:10.1107/S0021889883010924]

Diffraction line profiles and Scherrer constants for materials with hexagonal crystallites

R. Vargas, D. Louër and J. I. Langford



pdf version buy article online

J. Appl. Cryst. (1983). 16, 519-523    [doi:10.1107/S0021889883010936]

Analysis of anisotropy of small-angle neutron scattering of polyethylene single crystals

D. M. Sadler



pdf version buy article online

J. Appl. Cryst. (1983). 16, 524-531    [doi:10.1107/S0021889883010948]

Monolithic double-grooved-crystal monochromators with tunable harmonic suppression for neutrons and X-rays

U. Bonse, K. Olthoff-Münter and A. Rumpf



pdf version buy article online

J. Appl. Cryst. (1983). 16, 532-534    [doi:10.1107/S002188988301095X]

Eccentricity corrections for a modified Debye-Scherrer camera

L. K. Frevel



pdf version buy article online

J. Appl. Cryst. (1983). 16, 535-541    [doi:10.1107/S0021889883010961]

Can inherited textures in the B.c.c. phase furnish information about the type of transformation from the F.c.c. phase?

V. Jung



pdf version buy article online

J. Appl. Cryst. (1983). 16, 542-547    [doi:10.1107/S0021889883010973]

A focusing Weissenberg camera with multi-layer-line screens for macromolecular crystallography

N. Sakabe



pdf version buy article online

J. Appl. Cryst. (1983). 16, 548-558    [doi:10.1107/S0021889883010985]

Analytical molecular surface calculation

M. L. Connolly



pdf version buy article online

J. Appl. Cryst. (1983). 16, 559-562    [doi:10.1107/S0021889883010997]

A geometric method incorporated with a computer program for indexing crystal faces of microcrystallites

S. Simov, E. Simova, B. Davidkov and G. Mechenov



pdf version buy article online

J. Appl. Cryst. (1983). 16, 563-571    [doi:10.1107/S0021889883011000]

A small-angle camera for resonant scattering experiments at the storage ring DORIS

H. B. Stuhrmann and A. Gabriel


short communications



pdf version buy article online

J. Appl. Cryst. (1983). 16, 572-573    [doi:10.1107/S0021889883011012]

Detector aperture size in the conventional estimation of integrated intensity in the \def\lambdabar{\ifvmode\noindent\fi{\hbox{$\lambda$}\kern-0.35em\raise0.7ex\hbox-}\kern0.2em}}\lambdabar/20 scan mode

A. McL Mathieson



pdf version buy article online

J. Appl. Cryst. (1983). 16, 573-575    [doi:10.1107/S0021889883011024]

Error in 2[pi] from single-crystal diffractometers due to sample absorption in a divergent primary beam

C. Svensson


crystal data



pdf version buy article online

J. Appl. Cryst. (1983). 16, 575    [doi:10.1107/S0021889883011036]

Crystal data for Rb2CoCl4.2H2O

J. Hybler and M. Havránková



pdf version buy article online

J. Appl. Cryst. (1983). 16, 575    [doi:10.1107/S0021889883011048]

Crystal data for magnesium decavanadate. Mg3V10O2828.H2O

G. Rigotti, M. E. Escobar and E. J. Baran



pdf version buy article online

J. Appl. Cryst. (1983). 16, 576    [doi:10.1107/S002188988301105X]

Crystal data for CuGaxIn1-xTe2

B. Grzeta-Plenkovic and B. Santic



pdf versionsupplementary materials buy article online

J. Appl. Cryst. (1983). 16, 576    [doi:10.1107/S0021889883011061]

Studies on rare-earth carboxylates. II. Crystal chemical data on Ln(CH3CHCH3COO)3 where Ln=Er, Tm or Yb

M. A. Nabar and S. D. Barve



pdf version buy article online

J. Appl. Cryst. (1983). 16, 576-577    [doi:10.1107/S0021889883011073]

Crystal data for two orthorphosphates [alpha]-NaCuPO4 and [beta]-AgCuPO4

M. Quarton, M. T. Oumba and A. W. Kolsi


computer programs



pdf version buy article online

J. Appl. Cryst. (1983). 16, 577-578    [doi:10.1107/S0021889883011085]

A computer program generating parameters useful in X-ray diffraction topography studies

K. J. Roberts


laboratory notes



pdf version buy article online

J. Appl. Cryst. (1983). 16, 579    [doi:10.1107/S0021889883011097]

A remote-control direct-beam exposure device for the Arndt-Wonacott rotation camera

J. R. Helliwell and A. W. Thompson


crystallographers



pdf version free

J. Appl. Cryst. (1983). 16, 580    [doi:10.1107/S0021889883011103]

Crystallographers


book reviews



pdf version free

J. Appl. Cryst. (1983). 16, 580    [doi:10.1107/S0021889883011115]

Industrial crystallization 81 edited by S. J. Jancic and E. J. de Jong


books received



pdf version free

J. Appl. Cryst. (1983). 16, 580    [doi:10.1107/S0021889883011127]

ICOTOM-6 edited by S. Nagashima


Copyright © International Union of Crystallography
IUCr Webmaster