Journal of Applied Crystallography
Volume 16, Part 6 (December 1983)
J. Appl. Cryst. (1983). 16, 581-589 [doi:10.1107/S0021889883011139]
The sampling theorem and small-angle scattering
T. Gerber and P. W. Schmidt
J. Appl. Cryst. (1983). 16, 590-598 [doi:10.1107/S0021889883011140]
Crystallographic characteristics of the process of
-phase precipitation in chromium-nickel austenitic steels
J. Barcik
J. Appl. Cryst. (1983). 16, 599-605 [doi:10.1107/S0021889883011152]
A double-source double-crystal X-ray spectrometer for high-sensitivity lattice-parameter difference measurements
R. C. Buschert, A. J. Meyer, D. S. Kauffman and J. K. Gotwals
J. Appl. Cryst. (1983). 16, 606-610 [doi:10.1107/S0021889883011164]
Quantitative analysis of intensitities in X-ray topographs by enhanced microfluorescence
S. Weissmann, V. A. Greenhut, J. Chaudhuri and Z. H. Kalman
J. Appl. Cryst. (1983). 16, 611-622 [doi:10.1107/S0021889883011176]
Crystal-structure refinement by profile fitting and least-squares analysis of powder diffractometer data
G. Will, W. Parrish and T. C. Huang
J. Appl. Cryst. (1983). 16, 623-628 [doi:10.1107/S0021889883011188]
Lattice-parameter measurements of PbHPO4 single crystals by the ratio method
J. Horváth
J. Appl. Cryst. (1983). 16, 629-636 [doi:10.1107/S002188988301119X]
Oscillation photography of radiation-sensitive crystals using a synchrotron source
M. G. Rossmann and J. W. Erickson
J. Appl. Cryst. (1983). 16, 637-640 [doi:10.1107/S0021889883011206]
Qualitative and quantitative morphological study on
and
phases of ammonium pentaborate tetrahydrate
X. Solans, M. Font-Altaba, M. Aguiló, J. Solans and M. V. Domenech
J. Appl. Cryst. (1983). 16, 641-644 [doi:10.1107/S0021889883011218]
Correction for escape in X-ray spectra measured using a Ge detector
S. Steenstrup
J. Appl. Cryst. (1983). 16, 645-646 [doi:10.1107/S002188988301122X]
An X-ray determination of the thermal expansion of the intermetallic compound Ni3Zr
S. K. Shadangi, S. C. Panda and S. Bhan
J. Appl. Cryst. (1983). 16, 646-648 [doi:10.1107/S0021889883011231]
Application of in situ synchrotron X-ray topography to the study of a solid-phase transformation: crystallography of the transition in pure titanium
C. Jourdan and J. Gastaldi
J. Appl. Cryst. (1983). 16, 648 [doi:10.1107/S0021889883011243]
Asymmetrically grooved monolithic crystal monochromators for suppression of harmonics in synchrotron X-radiation: erratum
H. Hashizume
J. Appl. Cryst. (1983). 16, 648 [doi:10.1107/S0021889883011255]
Crystal data for C.I. Pigment Yellow 4,
-(1 -hydroxyethylidene)acetanilide-
-azo-(4'-nitrobenzine)
A. Whitaker
J. Appl. Cryst. (1983). 16, 649 [doi:10.1107/S0021889883011267]
Diagrammes de poudres de l'iminostilbene, C14H11N, de l'iminodibenzyle, C14H13N, et de son derivé: le chloro-3 iminodibenzyle, C14H12ClN
C. Caranoni et J. P. Reboul
J. Appl. Cryst. (1983). 16, 649 [doi:10.1107/S0021889883011279]
A new magnesium aluminium zirconium oxide, Mg5+xAl2.4-xZr1.7+0.25xO12 with -0.4
x
0.4
P. Tassot, G. Konig, F. Liebau and F. Seifert
J. Appl. Cryst. (1983). 16, 650-651 [doi:10.1107/S0021889883011280]
PLORTEP: a computer program to translate PLUTO instructions into those of ORTEP
G. Bandel and J. L. Sussman
J. Appl. Cryst. (1983). 16, 651-653 [doi:10.1107/S0021889883011292]
FINAX: a computer program for correcting diffraction angles, refining cell parameters and calculating powder patterns
E. R. Hovestreydt
J. Appl. Cryst. (1983). 16, 653-657 [doi:10.1107/S0021889883011309]
A computer program for the deconvolution of X-ray diffraction profiles with the composite of Pearson type VII functions
H. Toraya, M. Yoshimura and S. Somiya
J. Appl. Cryst. (1983). 16, 658-659 [doi:10.1107/S0021889883011310]
Measurement of the atomic coordinates of a Kendrew-type model from two projections
P. Dumas and B. Rees
J. Appl. Cryst. (1983). 16, 659 [doi:10.1107/S0021889883011322]
Crystallographers
J. Appl. Cryst. (1983). 16, 659-660 [doi:10.1107/S0021889883011334]
Prices of Acta Crystallographica and Journal of Applied Crystallography
J. Appl. Cryst. (1983). 16, 661-666
Subject index to volume 16 (1983)
J. Appl. Cryst. (1983). 16, 667-672
Author index to volume 16 (1983)
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