Journal of Applied Crystallography

Volume 16, Part 6 (December 1983)



research papers



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J. Appl. Cryst. (1983). 16, 581-589    [doi:10.1107/S0021889883011139]

The sampling theorem and small-angle scattering

T. Gerber and P. W. Schmidt



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J. Appl. Cryst. (1983). 16, 590-598    [doi:10.1107/S0021889883011140]

Crystallographic characteristics of the process of [sigma]-phase precipitation in chromium-nickel austenitic steels

J. Barcik



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J. Appl. Cryst. (1983). 16, 599-605    [doi:10.1107/S0021889883011152]

A double-source double-crystal X-ray spectrometer for high-sensitivity lattice-parameter difference measurements

R. C. Buschert, A. J. Meyer, D. S. Kauffman and J. K. Gotwals



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J. Appl. Cryst. (1983). 16, 606-610    [doi:10.1107/S0021889883011164]

Quantitative analysis of intensitities in X-ray topographs by enhanced microfluorescence

S. Weissmann, V. A. Greenhut, J. Chaudhuri and Z. H. Kalman



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J. Appl. Cryst. (1983). 16, 611-622    [doi:10.1107/S0021889883011176]

Crystal-structure refinement by profile fitting and least-squares analysis of powder diffractometer data

G. Will, W. Parrish and T. C. Huang



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J. Appl. Cryst. (1983). 16, 623-628    [doi:10.1107/S0021889883011188]

Lattice-parameter measurements of PbHPO4 single crystals by the ratio method

J. Horváth



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J. Appl. Cryst. (1983). 16, 629-636    [doi:10.1107/S002188988301119X]

Oscillation photography of radiation-sensitive crystals using a synchrotron source

M. G. Rossmann and J. W. Erickson



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J. Appl. Cryst. (1983). 16, 637-640    [doi:10.1107/S0021889883011206]

Qualitative and quantitative morphological study on [alpha] and [beta] phases of ammonium pentaborate tetrahydrate

X. Solans, M. Font-Altaba, M. Aguiló, J. Solans and M. V. Domenech



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J. Appl. Cryst. (1983). 16, 641-644    [doi:10.1107/S0021889883011218]

Correction for escape in X-ray spectra measured using a Ge detector

S. Steenstrup


short communications



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J. Appl. Cryst. (1983). 16, 645-646    [doi:10.1107/S002188988301122X]

An X-ray determination of the thermal expansion of the intermetallic compound Ni3Zr

S. K. Shadangi, S. C. Panda and S. Bhan



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J. Appl. Cryst. (1983). 16, 646-648    [doi:10.1107/S0021889883011231]

Application of in situ synchrotron X-ray topography to the study of a solid-phase transformation: crystallography of the transition in pure titanium

C. Jourdan and J. Gastaldi



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J. Appl. Cryst. (1983). 16, 648    [doi:10.1107/S0021889883011243]

Asymmetrically grooved monolithic crystal monochromators for suppression of harmonics in synchrotron X-radiation: erratum

H. Hashizume


crystal data



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J. Appl. Cryst. (1983). 16, 648    [doi:10.1107/S0021889883011255]

Crystal data for C.I. Pigment Yellow 4, [alpha]-(1 -hydroxyethylidene)acetanilide-[alpha]-azo-(4'-nitrobenzine)

A. Whitaker



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J. Appl. Cryst. (1983). 16, 649    [doi:10.1107/S0021889883011267]

Diagrammes de poudres de l'iminostilbene, C14H11N, de l'iminodibenzyle, C14H13N, et de son derivé: le chloro-3 iminodibenzyle, C14H12ClN

C. Caranoni et J. P. Reboul



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J. Appl. Cryst. (1983). 16, 649    [doi:10.1107/S0021889883011279]

A new magnesium aluminium zirconium oxide, Mg5+xAl2.4-xZr1.7+0.25xO12 with -0.4[less-than or equivalent to]x[less-than or equivalent to]0.4

P. Tassot, G. Konig, F. Liebau and F. Seifert


computer programs



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J. Appl. Cryst. (1983). 16, 650-651    [doi:10.1107/S0021889883011280]

PLORTEP: a computer program to translate PLUTO instructions into those of ORTEP

G. Bandel and J. L. Sussman



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J. Appl. Cryst. (1983). 16, 651-653    [doi:10.1107/S0021889883011292]

FINAX: a computer program for correcting diffraction angles, refining cell parameters and calculating powder patterns

E. R. Hovestreydt



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J. Appl. Cryst. (1983). 16, 653-657    [doi:10.1107/S0021889883011309]

A computer program for the deconvolution of X-ray diffraction profiles with the composite of Pearson type VII functions

H. Toraya, M. Yoshimura and S. Somiya


laboratory notes



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J. Appl. Cryst. (1983). 16, 658-659    [doi:10.1107/S0021889883011310]

Measurement of the atomic coordinates of a Kendrew-type model from two projections

P. Dumas and B. Rees


crystallographers



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J. Appl. Cryst. (1983). 16, 659    [doi:10.1107/S0021889883011322]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1983). 16, 659-660    [doi:10.1107/S0021889883011334]

Prices of Acta Crystallographica and Journal of Applied Crystallography


J. Appl. Cryst. (1983). 16, 661-666

Subject index to volume 16 (1983)


J. Appl. Cryst. (1983). 16, 667-672

Author index to volume 16 (1983)


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