Journal of Applied Crystallography
Volume 17, Part 1 (February 1984)
J. Appl. Cryst. (1984). 17, 1-6 [doi:10.1107/S0021889884010906]
A new method for the measurement of X-ray diffuse scattering with a combination of an energy-dispersive detector and source of white radiation
J. Harada, H. Iwata and K.-I. Ohshima
J. Appl. Cryst. (1984). 17, 7-12 [doi:10.1107/S0021889884010918]
Measurement of the polarization of X-rays from a synchrotron source
G. Materlik and P. Suortti
J. Appl. Cryst. (1984). 17, 13-17 [doi:10.1107/S002188988401092X]
Dilatation thermique des phases stables et métastable du naphtalènethiol-2
N. B. Chanh, A. Meresse et Y. Haget
J. Appl. Cryst. (1984). 17, 18-21 [doi:10.1107/S0021889884010931]
Quantitative X-ray phase analysis of surface layers
L. S. Zevin, P. Rozenak and D. Eliezer
J. Appl. Cryst. (1984). 17, 22-26 [doi:10.1107/S0021889884010943]
Single-peak methods for Fourier analysis of peak shapes
R. K. Nandi, H. K. Kuo, W. Schlosberg, G. Wissler, J. B. Cohen and B. Crist Jnr
J. Appl. Cryst. (1984). 17, 27-32 [doi:10.1107/S0021889884010955]
A simple approximation for calculating the small-angle X-ray and neutron scattering from polydisperse samples of independently scattering uniform spheres
P. W. Schmidt and M. Kalliat
J. Appl. Cryst. (1984). 17, 33-38 [doi:10.1107/S0021889884010967]
Application of the Energy-Dispersive X-ray diffraction method to determine static and dynamic displacements close to D in Ta single crystals
G. Steyrer, T. H. Metzger and J. Peisl

J. Appl. Cryst. (1984). 17, 39 [doi:10.1107/S0021889884010979]
Studies on rare-earth carboxylates. IV. Crystal chemical data on Ln(CH3Ch2CH2COO)3.2H2O, where Ln=Nd, Tb, Ho, Er, Tm, Yb or Y
M. A. Nabar and S. D. Barve
J. Appl. Cryst. (1984). 17, 39-42 [doi:10.1107/S0021889884010980]
A computer program for unique indexing of electron diffraction patterns
W. Prantl
J. Appl. Cryst. (1984). 17, 42-46 [doi:10.1107/S0021889884010992]
MITHRIL-an integrated direct-methods computer program
C. J. Gilmore
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