Journal of Applied Crystallography
Volume 17, Part 2 (April 1984)
J. Appl. Cryst. (1984). 17, 47-54 [doi:10.1107/S0021889884011006]
The peak in neutron powder diffraction
B. van Laar and W. B. Yelon
J. Appl. Cryst. (1984). 17, 55-60 [doi:10.1107/S0021889884011018]
Use of the Rietveld technique for estimating cation distributions
A. G. Nord
J. Appl. Cryst. (1984). 17, 61-76 [doi:10.1107/S002188988401102X]
The accuracy of experimental radial distribution functions for metallic glasses
B. J. Thijsse
J. Appl. Cryst. (1984). 17, 77-84 [doi:10.1107/S0021889884011031]
Scaling and phase-difference determination in solvent contrast variation experiments
M. Roth, A. Lewit-Bentley and G. A. Bentley
J. Appl. Cryst. (1984). 17, 85-95 [doi:10.1107/S0021889884011043]
Synchrotron X-ray powder diffraction
J. B. Hastings, W. Thomlinson and D. E. Cox
J. Appl. Cryst. (1984). 17, 96-99 [doi:10.1107/S0021889884011055]
Simulation of industrial furnacing with powder X-ray diffraction
S. E. Tarling, P. Barnes and A. L. Mackay
J. Appl. Cryst. (1984). 17, 100-102 [doi:10.1107/S0021889884011067]
X-ray study on the successive phase transition in cholesteryl 2,2,3,3-tetrafluoropionate (CTFP)
N. Nakamura, Y. Yoshimura, K. Shimaoka and S. Yano
J. Appl. Cryst. (1984). 17, 103-110 [doi:10.1107/S0021889884011079]
On the texture in diffusion-grown layers of silicides and germanides with the FeB structure, MeX (Me=Ti, Zr; X=Si, Ge) or the
ZrSi2 structure (ZrSi2, HfSi2, ZrGe2)
J. H. Maas, G. F. Bastin, F. J. J. van Loo and R. Metselaar
J. Appl. Cryst. (1984). 17, 111-117 [doi:10.1107/S0021889884011080]
An assessment of diamond turning for the production of silicon X-ray optical elements
S. M. Abdul Gani, B. K. Tanner, T. G. McKenney, H. T. Tingle and D. K. Bowen
J. Appl. Cryst. (1984). 17, 118-119 [doi:10.1107/S0021889884011092]
Optimum X-ray wavelength for protein crystallography
U. W. Arndt
J. Appl. Cryst. (1984). 17, 120 [doi:10.1107/S0021889884011109]
An optimized collimator for X-ray diffraction from very small samples using synchrotron radiation
H. D. Bartunik, T. Gehrmann and B. Robrahn
J. Appl. Cryst. (1984). 17, 120-121 [doi:10.1107/S0021889884011110]
A device for the easy centering of a Gandolfi X-ray diffraction camera
H. de Bruiyn, W. A. van der Westhuizen and G. J. Beukes
J. Appl. Cryst. (1984). 17, 122 [doi:10.1107/S0021889884011122]
Diffractometer detector aperture system with independently controlled jaws
A. McL Mathieson
J. Appl. Cryst. (1984). 17, 122 [doi:10.1107/S0021889884011134]
Crystallographers
J. Appl. Cryst. (1984). 17, 122 [doi:10.1107/S0021889884011146]
Appreciation of Co-editor's Service
J. Appl. Cryst. (1984). 17, 123 [doi:10.1107/S0021889884011158]
Crystals: growth, properties and applications. Vol. 7 and Vol. 8 edited by H. C. Freyhardt
J. Appl. Cryst. (1984). 17, 123-124 [doi:10.1107/S002188988401116X]
Crystal lattices, interfaces, matrices by W. Bollmann
Copyright © International Union of Crystallography
IUCr Webmaster