Journal of Applied Crystallography

Volume 17, Part 2 (April 1984)



research papers



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J. Appl. Cryst. (1984). 17, 47-54    [doi:10.1107/S0021889884011006]

The peak in neutron powder diffraction

B. van Laar and W. B. Yelon



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J. Appl. Cryst. (1984). 17, 55-60    [doi:10.1107/S0021889884011018]

Use of the Rietveld technique for estimating cation distributions

A. G. Nord



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J. Appl. Cryst. (1984). 17, 61-76    [doi:10.1107/S002188988401102X]

The accuracy of experimental radial distribution functions for metallic glasses

B. J. Thijsse



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J. Appl. Cryst. (1984). 17, 77-84    [doi:10.1107/S0021889884011031]

Scaling and phase-difference determination in solvent contrast variation experiments

M. Roth, A. Lewit-Bentley and G. A. Bentley



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J. Appl. Cryst. (1984). 17, 85-95    [doi:10.1107/S0021889884011043]

Synchrotron X-ray powder diffraction

J. B. Hastings, W. Thomlinson and D. E. Cox



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J. Appl. Cryst. (1984). 17, 96-99    [doi:10.1107/S0021889884011055]

Simulation of industrial furnacing with powder X-ray diffraction

S. E. Tarling, P. Barnes and A. L. Mackay



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J. Appl. Cryst. (1984). 17, 100-102    [doi:10.1107/S0021889884011067]

X-ray study on the successive phase transition in cholesteryl 2,2,3,3-tetrafluoropionate (CTFP)

N. Nakamura, Y. Yoshimura, K. Shimaoka and S. Yano



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J. Appl. Cryst. (1984). 17, 103-110    [doi:10.1107/S0021889884011079]

On the texture in diffusion-grown layers of silicides and germanides with the FeB structure, MeX (Me=Ti, Zr; X=Si, Ge) or the ZrSi2 structure (ZrSi2, HfSi2, ZrGe2)

J. H. Maas, G. F. Bastin, F. J. J. van Loo and R. Metselaar



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J. Appl. Cryst. (1984). 17, 111-117    [doi:10.1107/S0021889884011080]

An assessment of diamond turning for the production of silicon X-ray optical elements

S. M. Abdul Gani, B. K. Tanner, T. G. McKenney, H. T. Tingle and D. K. Bowen


short communications



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J. Appl. Cryst. (1984). 17, 118-119    [doi:10.1107/S0021889884011092]

Optimum X-ray wavelength for protein crystallography

U. W. Arndt


laboratory notes



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J. Appl. Cryst. (1984). 17, 120    [doi:10.1107/S0021889884011109]

An optimized collimator for X-ray diffraction from very small samples using synchrotron radiation

H. D. Bartunik, T. Gehrmann and B. Robrahn



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J. Appl. Cryst. (1984). 17, 120-121    [doi:10.1107/S0021889884011110]

A device for the easy centering of a Gandolfi X-ray diffraction camera

H. de Bruiyn, W. A. van der Westhuizen and G. J. Beukes



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J. Appl. Cryst. (1984). 17, 122    [doi:10.1107/S0021889884011122]

Diffractometer detector aperture system with independently controlled jaws

A. McL Mathieson


crystallographers



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J. Appl. Cryst. (1984). 17, 122    [doi:10.1107/S0021889884011134]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1984). 17, 122    [doi:10.1107/S0021889884011146]

Appreciation of Co-editor's Service


book reviews



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J. Appl. Cryst. (1984). 17, 123    [doi:10.1107/S0021889884011158]

Crystals: growth, properties and applications. Vol. 7 and Vol. 8 edited by H. C. Freyhardt



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J. Appl. Cryst. (1984). 17, 123-124    [doi:10.1107/S002188988401116X]

Crystal lattices, interfaces, matrices by W. Bollmann


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