Journal of Applied Crystallography

Volume 17, Part 4 (August 1984)



research papers



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J. Appl. Cryst. (1984). 17, 219-225    [doi:10.1107/S0021889884011419]

Application of synchrotron radiation to anomalous scattering for structure analysis with a four-circle diffractometer

T. Sakamaki, S. Hosoya, T. Tagai, K. Ohsumi and Y. Satow



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J. Appl. Cryst. (1984). 17, 226-230    [doi:10.1107/S0021889884011420]

Absorption factor for cylindrical samples

V. F. Sears



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J. Appl. Cryst. (1984). 17, 231-237    [doi:10.1107/S0021889884011432]

Use of synchrotron radiation sources for X-ray diffraction topography of polytypic structures

G. R. Fisher and P. Barnes



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J. Appl. Cryst. (1984). 17, 238-243    [doi:10.1107/S0021889884011444]

Eigenvalue filtering in the refinement of crystal and orientation parameters for oscillation photography

G. N. Reeke Jnr



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J. Appl. Cryst. (1984). 17, 244-248    [doi:10.1107/S0021889884011456]

OMITMAP: An electron density map suitable for the examination of errors in a macromolecular model

T. N. Bhat and G. H. Cohen



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J. Appl. Cryst. (1984). 17, 249-256    [doi:10.1107/S0021889884011468]

Optimization of the experimental resolution for small-angle scattering

D. F. R. Mildner and J. M. Carpenter



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J. Appl. Cryst. (1984). 17, 257-264    [doi:10.1107/S002188988401147X]

High-resolution measurements of angle-resolved X-ray scattering from optically flat mirrors

T. Matsushita, T. Ishikawa and K. Kohra



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J. Appl. Cryst. (1984). 17, 265-268    [doi:10.1107/S0021889884011481]

Laue orientation and interpretation by microcomputer

P. F. Fewster



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J. Appl. Cryst. (1984). 17, 269-272    [doi:10.1107/S0021889884011493]

Determination of particle distribution in supported metal catalysts by small-angle scattering

D. Espinat, B. Moraweck, J. F. Larue and A. J. Renouprez



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J. Appl. Cryst. (1984). 17, 273-285    [doi:10.1107/S002188988401150X]

Accuracy and resolution in protein crystallography: a probabilistic approach

V. Luzzati and D. Taupin



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J. Appl. Cryst. (1984). 17, 286-292    [doi:10.1107/S0021889884011511]

Détermination des indices hkl en rayonnement polychromatique par la méthode des marqueurs de longueurs d'onde. Application à l'étude de structures modulées

J.-C. Marmeggi


short communications



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J. Appl. Cryst. (1984). 17, 293-294    [doi:10.1107/S0021889884011523]

Comments on Small-angle scattering at a pulsed neutron source: comparison with a steady-state reactor

D. F. R. Mildner


laboratory notes



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J. Appl. Cryst. (1984). 17, 294-296    [doi:10.1107/S0021889884011535]

An X-ray microdiffractometer for the analysis of small specimens, and its use in a forensic science laboratory

R. C. Banks, D. F. Rendle and J. R. Russell


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