Journal of Applied Crystallography
Volume 17, Part 5 (October 1984)
J. Appl. Cryst. (1984). 17, 297-306 [doi:10.1107/S0021889884011547]
The effect of profile-step counting time on the determination of crystal structure parameters by X-ray Rietveld analysis
R. J. Hill and I. C. Madsen
J. Appl. Cryst. (1984). 17, 307-314 [doi:10.1107/S0021889884011559]
The many-beam moiré effect in electron micrographs of epitaxic Sn/SnTe layers
K. Kranjc, D. Kunstelj, P. Pecina and V. Marinkovic
J. Appl. Cryst. (1984). 17, 315-319 [doi:10.1107/S0021889884011560]
Vibrating crystals as possible neutron monochromators
A. D. Stoica and M. Popovici
J. Appl. Cryst. (1984). 17, 320-327 [doi:10.1107/S0021889884011572]
Dislocations in energetic materials. 2. Characterization of the growth-induced dislocation structure of pentaerythritol tetranitrate (PETN)
P. J. Halfpenny, K. J. Roberts and J. N. Sherwood
J. Appl. Cryst. (1984). 17, 328-330 [doi:10.1107/S0021889884011584]
The formation of macroscopic polytypic regions in ZnS crystals
S. Mardix
J. Appl. Cryst. (1984). 17, 331-333 [doi:10.1107/S0021889884011596]
The true unit cell of ammonium hydrogen sulfate, (NH4)3H(SO4)2
B. L. Davis and L. R. Johnson
J. Appl. Cryst. (1984). 17, 334-336 [doi:10.1107/S0021889884011602]
Enhancement of the `auto-indexing' method for cell determination in four-circle diffractometry
W. Clegg
J. Appl. Cryst. (1984). 17, 337-343 [doi:10.1107/S0021889884011614]
A new high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode, point-focusing collimation and a position-sensitive proportional counter
O. Yoda
J. Appl. Cryst. (1984). 17, 344-351 [doi:10.1107/S0021889884011626]
Determination of the anomalous scattering factors for Cu, Ni and Ti using the dispersion relation
J. J. Hoyt, D. de Fontaine and W. K. Warburton
J. Appl. Cryst. (1984). 17, 352-357 [doi:10.1107/S0021889884011638]
A Voigtian as profile shape function in Rietveld refinement
M. Ahtee, L. Unonius, M. Nurmela and P. Suortti
J. Appl. Cryst. (1984). 17, 358-359 [doi:10.1107/S002188988401164X]
A low-temperature cooler for protein crystallography
K. J. Machin, G. S. Begg and N. W. Isaacs
J. Appl. Cryst. (1984). 17, 359-360 [doi:10.1107/S0021889884011651]
Thermal expansion coefficients of a binary alloy Ni80Zr20 at elevated temperatures
S. K. Shadangi, U. K. Shadangi and S. C. Panda
J. Appl. Cryst. (1984). 17, 361-362 [doi:10.1107/S0021889884011663]
A segment description for the unique set of reflections in non-centrosymmetric crystal classes
H. D. Flack
J. Appl. Cryst. (1984). 17, 362 [doi:10.1107/S0021889884011675]
Some aspects of the X-ray structural characterization of (Ga1-xAlxAs)n1(GaAs)n2/GaAs(001) superlattices: erratum
J. Kervarec, M. Baudet, J. Caulet, P. Auvrey, J. Y. Emery and A. Regreny
J. Appl. Cryst. (1984). 17, 363 [doi:10.1107/S0021889884011687]
Crystal data for triuraniumpentoxide pyrophosphate, U3O5P2O7
H. Barten
J. Appl. Cryst. (1984). 17, 363 [doi:10.1107/S0021889884011699]
Crystal data for 7HgI2Fe(C5H5)2
J. Votinský, L. Benes, J. Klikorka, J. Kalousová, J. Horák and P. Losták
J. Appl. Cryst. (1984). 17, 364-366 [doi:10.1107/S0021889884011705]
On the automatic extension of incomplete models by iterative Fourier calculation
A. J. Kinneging and R. A. G. de Graaff
J. Appl. Cryst. (1984). 17, 366-368 [doi:10.1107/S0021889884011717]
An enhanced interactive PLUTO78 for molecular display
K. M. Crennell and G. M. Crisp
J. Appl. Cryst. (1984). 17, 369 [doi:10.1107/S0021889884011729]
Recommendations of the Ad hoc committee on criteria for publication of charge density studies
P. J. Becker, P. Coppens and F. L. Hirshfeld
J. Appl. Cryst. (1984). 17, 369-370 [doi:10.1107/S0021889884011730]
A sample holder for cutting single crystals along any desired X-ray oriented plane
C. F. Desai and V. P. Bhatt
J. Appl. Cryst. (1984). 17, 370 [doi:10.1107/S0021889884011742]
Use of a one-dimensional position-sensitive detector with a Kratky camera
E. W. Kaler
J. Appl. Cryst. (1984). 17, 371 [doi:10.1107/S0021889884011754]
The use of silicones in protein crystallizations involving single or multiple growth cycles
W. J. Ray Jnr and J. M. Puvathingal
J. Appl. Cryst. (1984). 17, 372 [doi:10.1107/S0021889884011766]
A technique for the preparation of low-temperature powder samples of noxious materials
H. F. Nieman, J. C. Evans, K. M. Heal and B. M. Powell
J. Appl. Cryst. (1984). 17, 372-373 [doi:10.1107/S0021889884011778]
The 50th anniversary of the pepsin X-ray photograph
G. Dodson
J. Appl. Cryst. (1984). 17, 373 [doi:10.1107/S002188988401178X]
Crystallographers
J. Appl. Cryst. (1984). 17, 373-374 [doi:10.1107/S0021889884011791]
Notes and News
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