Journal of Applied Crystallography

Volume 17, Part 5 (October 1984)



research papers



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J. Appl. Cryst. (1984). 17, 297-306    [doi:10.1107/S0021889884011547]

The effect of profile-step counting time on the determination of crystal structure parameters by X-ray Rietveld analysis

R. J. Hill and I. C. Madsen



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J. Appl. Cryst. (1984). 17, 307-314    [doi:10.1107/S0021889884011559]

The many-beam moiré effect in electron micrographs of epitaxic Sn/SnTe layers

K. Kranjc, D. Kunstelj, P. Pecina and V. Marinkovic



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J. Appl. Cryst. (1984). 17, 315-319    [doi:10.1107/S0021889884011560]

Vibrating crystals as possible neutron monochromators

A. D. Stoica and M. Popovici



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J. Appl. Cryst. (1984). 17, 320-327    [doi:10.1107/S0021889884011572]

Dislocations in energetic materials. 2. Characterization of the growth-induced dislocation structure of pentaerythritol tetranitrate (PETN)

P. J. Halfpenny, K. J. Roberts and J. N. Sherwood



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J. Appl. Cryst. (1984). 17, 328-330    [doi:10.1107/S0021889884011584]

The formation of macroscopic polytypic regions in ZnS crystals

S. Mardix



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J. Appl. Cryst. (1984). 17, 331-333    [doi:10.1107/S0021889884011596]

The true unit cell of ammonium hydrogen sulfate, (NH4)3H(SO4)2

B. L. Davis and L. R. Johnson



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J. Appl. Cryst. (1984). 17, 334-336    [doi:10.1107/S0021889884011602]

Enhancement of the `auto-indexing' method for cell determination in four-circle diffractometry

W. Clegg



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J. Appl. Cryst. (1984). 17, 337-343    [doi:10.1107/S0021889884011614]

A new high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode, point-focusing collimation and a position-sensitive proportional counter

O. Yoda



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J. Appl. Cryst. (1984). 17, 344-351    [doi:10.1107/S0021889884011626]

Determination of the anomalous scattering factors for Cu, Ni and Ti using the dispersion relation

J. J. Hoyt, D. de Fontaine and W. K. Warburton



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J. Appl. Cryst. (1984). 17, 352-357    [doi:10.1107/S0021889884011638]

A Voigtian as profile shape function in Rietveld refinement

M. Ahtee, L. Unonius, M. Nurmela and P. Suortti


short communications



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J. Appl. Cryst. (1984). 17, 358-359    [doi:10.1107/S002188988401164X]

A low-temperature cooler for protein crystallography

K. J. Machin, G. S. Begg and N. W. Isaacs



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J. Appl. Cryst. (1984). 17, 359-360    [doi:10.1107/S0021889884011651]

Thermal expansion coefficients of a binary alloy Ni80Zr20 at elevated temperatures

S. K. Shadangi, U. K. Shadangi and S. C. Panda



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J. Appl. Cryst. (1984). 17, 361-362    [doi:10.1107/S0021889884011663]

A segment description for the unique set of reflections in non-centrosymmetric crystal classes

H. D. Flack



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J. Appl. Cryst. (1984). 17, 362    [doi:10.1107/S0021889884011675]

Some aspects of the X-ray structural characterization of (Ga1-xAlxAs)n1(GaAs)n2/GaAs(001) superlattices: erratum

J. Kervarec, M. Baudet, J. Caulet, P. Auvrey, J. Y. Emery and A. Regreny


crystal data



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J. Appl. Cryst. (1984). 17, 363    [doi:10.1107/S0021889884011687]

Crystal data for triuraniumpentoxide pyrophosphate, U3O5P2O7

H. Barten



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J. Appl. Cryst. (1984). 17, 363    [doi:10.1107/S0021889884011699]

Crystal data for 7HgI2Fe(C5H5)2

J. Votinský, L. Benes, J. Klikorka, J. Kalousová, J. Horák and P. Losták


computer programs



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J. Appl. Cryst. (1984). 17, 364-366    [doi:10.1107/S0021889884011705]

On the automatic extension of incomplete models by iterative Fourier calculation

A. J. Kinneging and R. A. G. de Graaff



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J. Appl. Cryst. (1984). 17, 366-368    [doi:10.1107/S0021889884011717]

An enhanced interactive PLUTO78 for molecular display

K. M. Crennell and G. M. Crisp


letters to the editor



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J. Appl. Cryst. (1984). 17, 369    [doi:10.1107/S0021889884011729]

Recommendations of the Ad hoc committee on criteria for publication of charge density studies

P. J. Becker, P. Coppens and F. L. Hirshfeld


laboratory notes



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J. Appl. Cryst. (1984). 17, 369-370    [doi:10.1107/S0021889884011730]

A sample holder for cutting single crystals along any desired X-ray oriented plane

C. F. Desai and V. P. Bhatt



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J. Appl. Cryst. (1984). 17, 370    [doi:10.1107/S0021889884011742]

Use of a one-dimensional position-sensitive detector with a Kratky camera

E. W. Kaler



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J. Appl. Cryst. (1984). 17, 371    [doi:10.1107/S0021889884011754]

The use of silicones in protein crystallizations involving single or multiple growth cycles

W. J. Ray Jnr and J. M. Puvathingal



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J. Appl. Cryst. (1984). 17, 372    [doi:10.1107/S0021889884011766]

A technique for the preparation of low-temperature powder samples of noxious materials

H. F. Nieman, J. C. Evans, K. M. Heal and B. M. Powell


meeting reports



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J. Appl. Cryst. (1984). 17, 372-373    [doi:10.1107/S0021889884011778]

The 50th anniversary of the pepsin X-ray photograph

G. Dodson


crystallographers



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J. Appl. Cryst. (1984). 17, 373    [doi:10.1107/S002188988401178X]

Crystallographers


notes and news



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J. Appl. Cryst. (1984). 17, 373-374    [doi:10.1107/S0021889884011791]

Notes and News


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