Journal of Applied Crystallography

Volume 18, Part 1 (February 1985)



international union of crystallography



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J. Appl. Cryst. (1985). 18, 1-2    [doi:10.1107/S0021889885011013]

Checklist for Authors of Papers Submitted to Journal of Applied Crystallography


research papers



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J. Appl. Cryst. (1985). 18, 3-7    [doi:10.1107/S0021889885009670]

Two new X-ray films: conditions for optimum development and calibration of response

W. C. Phillips and G. N. Jr Phillips



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J. Appl. Cryst. (1985). 18, 8-15    [doi:10.1107/S0021889885009682]

Differential X-ray diffraction: a theoretical basis for a technique based on wavelength variation

M. C. Nichols, D. K. Smith and Q. Johnson



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J. Appl. Cryst. (1985). 18, 16-19    [doi:10.1107/S0021889885009694]

Focusing monochromators for pulsed neutron sources

C. J. Carlile and R. C. Ward



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J. Appl. Cryst. (1985). 18, 20-26    [doi:10.1107/S0021889885009700]

Single-crystal diffractometry: strategy for rapidly decaying poorly diffracting crystals

J. Fischer, D. Moras and J. C. Thierry



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J. Appl. Cryst. (1985). 18, 27-32    [doi:10.1107/S0021889885009712]

A new method for surface analysis of crystals using X-ray diffraction under the specular reflection conditions

P. A. Aleksandrov, A. M. Afanas'ev, A. L. Golovin, R. M. Imamov, D. V. Novikov and S. A. Stepanov



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J. Appl. Cryst. (1985). 18, 33-36    [doi:10.1107/S0021889885009724]

Angle and index calculations for `z-axis' X-ray diffractometer

J. M. Bloch



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J. Appl. Cryst. (1985). 18, 37-41    [doi:10.1107/S0021889885009736]

A new high-pressure phase of uranium nitride studied by X-ray diffraction and synchrotron radiation

J. Staun Olsen, L. Gerward and U. Benedict



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J. Appl. Cryst. (1985). 18, 42-46    [doi:10.1107/S0021889885009748]

A treatment of instrumental smearing effects in circularly symmetric small-angle scattering

V. Ramakrishnan


short communications



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J. Appl. Cryst. (1985). 18, 47-48    [doi:10.1107/S002188988500975X]

On the structure of the M' phase in Al-Zn-Mg alloys

J. H. Auld and S. M. Cousland



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J. Appl. Cryst. (1985). 18, 48-50    [doi:10.1107/S0021889885009761]

Rietveld analysis of powder neutron diffraction data displaying anisotropic crystallite size broadening

C. Greaves


computer programs



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J. Appl. Cryst. (1985). 18, 51-53    [doi:10.1107/S0021889885009773]

The GX crystallographic program system

P. R. Mallinson and K. W. Muir


crystallographers



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J. Appl. Cryst. (1985). 18, 53    [doi:10.1107/S0021889885009785]

Crystallographers


book reviews



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J. Appl. Cryst. (1985). 18, 53-54    [doi:10.1107/S0021889885009797]

Structure of crystalline polymers edited by I. H. Hall


books received



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J. Appl. Cryst. (1985). 18, 54    [doi:10.1107/S0021889885009803]

Molecular beam epitaxy of III-V compounds: a comprehensive bibliography, 1958-1983 edited by K. Ploog



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J. Appl. Cryst. (1985). 18, 54    [doi:10.1107/S0021889885009815]

Dry etching for microelectronics edited by R. A. Powell


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