Journal of Applied Crystallography
Volume 18, Part 1 (February 1985)
J. Appl. Cryst. (1985). 18, 1-2 [doi:10.1107/S0021889885011013]
Checklist for Authors of Papers Submitted to Journal of Applied Crystallography
J. Appl. Cryst. (1985). 18, 3-7 [doi:10.1107/S0021889885009670]
Two new X-ray films: conditions for optimum development and calibration of response
W. C. Phillips and G. N. Jr Phillips
J. Appl. Cryst. (1985). 18, 8-15 [doi:10.1107/S0021889885009682]
Differential X-ray diffraction: a theoretical basis for a technique based on wavelength variation
M. C. Nichols, D. K. Smith and Q. Johnson
J. Appl. Cryst. (1985). 18, 16-19 [doi:10.1107/S0021889885009694]
Focusing monochromators for pulsed neutron sources
C. J. Carlile and R. C. Ward
J. Appl. Cryst. (1985). 18, 20-26 [doi:10.1107/S0021889885009700]
Single-crystal diffractometry: strategy for rapidly decaying poorly diffracting crystals
J. Fischer, D. Moras and J. C. Thierry
J. Appl. Cryst. (1985). 18, 27-32 [doi:10.1107/S0021889885009712]
A new method for surface analysis of crystals using X-ray diffraction under the specular reflection conditions
P. A. Aleksandrov, A. M. Afanas'ev, A. L. Golovin, R. M. Imamov, D. V. Novikov and S. A. Stepanov
J. Appl. Cryst. (1985). 18, 33-36 [doi:10.1107/S0021889885009724]
Angle and index calculations for `z-axis' X-ray diffractometer
J. M. Bloch
J. Appl. Cryst. (1985). 18, 37-41 [doi:10.1107/S0021889885009736]
A new high-pressure phase of uranium nitride studied by X-ray diffraction and synchrotron radiation
J. Staun Olsen, L. Gerward and U. Benedict
J. Appl. Cryst. (1985). 18, 42-46 [doi:10.1107/S0021889885009748]
A treatment of instrumental smearing effects in circularly symmetric small-angle scattering
V. Ramakrishnan
J. Appl. Cryst. (1985). 18, 47-48 [doi:10.1107/S002188988500975X]
On the structure of the M' phase in Al-Zn-Mg alloys
J. H. Auld and S. M. Cousland
J. Appl. Cryst. (1985). 18, 48-50 [doi:10.1107/S0021889885009761]
Rietveld analysis of powder neutron diffraction data displaying anisotropic crystallite size broadening
C. Greaves
J. Appl. Cryst. (1985). 18, 51-53 [doi:10.1107/S0021889885009773]
The GX crystallographic program system
P. R. Mallinson and K. W. Muir
J. Appl. Cryst. (1985). 18, 53 [doi:10.1107/S0021889885009785]
Crystallographers
J. Appl. Cryst. (1985). 18, 53-54 [doi:10.1107/S0021889885009797]
Structure of crystalline polymers edited by I. H. Hall
J. Appl. Cryst. (1985). 18, 54 [doi:10.1107/S0021889885009803]
Molecular beam epitaxy of III-V compounds: a comprehensive bibliography, 1958-1983 edited by K. Ploog
J. Appl. Cryst. (1985). 18, 54 [doi:10.1107/S0021889885009815]
Dry etching for microelectronics edited by R. A. Powell
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