Journal of Applied Crystallography
Volume 18, Part 2 (April 1985)
J. Appl. Cryst. (1985). 18, 55-60 [doi:10.1107/S0021889885009827]
Relationship between counting modes, absolute noise term and the errors of structure functions in the interpretation of small-angle X-ray scattering data
U. Lembke and T. Gerber
J. Appl. Cryst. (1985). 18, 61-64 [doi:10.1107/S0021889885009839]
Incoherent scattering corrections for forward scattering of neutrons by aqueous buffers. Temperature dependence and influence of absorbing salts
W. Knoll, G. Schmidt and K. Ibel
J. Appl. Cryst. (1985). 18, 65-70 [doi:10.1107/S0021889885009840]
The inverse contrast variation in small-angle neutron scattering: a sensitive technique for the evaluation of lipid phase diagrams
W. Knoll, G. Schmidt and K. Ibel
J. Appl. Cryst. (1985). 18, 71-74 [doi:10.1107/S0021889885009852]
Borrmann effect for alignment of a four-circle diffractometer
W. J. Murphy, L. D. Chapman, J.-L. Staudenmann and G. L. Liedl
J. Appl. Cryst. (1985). 18, 75-79 [doi:10.1107/S0021889885009864]
ABSORB: An absorption correction program for crystals enclosed in capillaries with trapped mother liquor
G. T. DeTitta
J. Appl. Cryst. (1985). 18, 80-84 [doi:10.1107/S0021889885009876]
Semiquantitative X-ray diffraction method for phase analysis using additions of a foreign component
B. Grzeta and S. Popovic
J. Appl. Cryst. (1985). 18, 85-92 [doi:10.1107/S0021889885009888]
The use of an array processor for the simulation of X-ray topographs
A. Soyer, Y. Epelboin and F. Morris
J. Appl. Cryst. (1985). 18, 93-105 [doi:10.1107/S002188988500989X]
Experimental and computer simulation study of the variation with depth of the X-ray section topograph images of a dislocation
A. Authier, M. Lefeld-Sosnowska, Y. Epelboin and A. Soyer
J. Appl. Cryst. (1985). 18, 106-109 [doi:10.1107/S0021889885009906]
In situ alignment procedure for X-ray topography
R. A. Forman and S. Mayo
J. Appl. Cryst. (1985). 18, 110-113 [doi:10.1107/S0021889885009918]
Large-angle convergent-beam electron diffraction; a simple technique for the study of modulated structures with application to V2D
J. Taftø and T. H. Metzger
J. Appl. Cryst. (1985). 18, 114-119 [doi:10.1107/S002188988500992X]
Detectability of two overlapping Pearson VII peaks in simulated X-ray diffraction patterns
H. Van de Velde and G. Platbrood
J. Appl. Cryst. (1985). 18, 120-122 [doi:10.1107/S0021889885009931]
A two-crystal X-ray interferometer from different pieces of silicon material
P. Becker
J. Appl. Cryst. (1985). 18, 122-125 [doi:10.1107/S0021889885009943]
Computer program for the evaluation of radial distribution functions in Rayleigh scattering of Mössbauer radiation experiments
A. Deriu and F. Ugozzoli
J. Appl. Cryst. (1985). 18, 126-130 [doi:10.1107/S0021889885009955]
Computer simulation of convergent-beam electron diffraction patterns from bicrystals
N. S. Blom and F. W. Schapink
J. Appl. Cryst. (1985). 18, 130 [doi:10.1107/S0021889885009967]
Electro-optical and magneto-optical properties of liquid crystals by L. M. Blinov
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