Journal of Applied Crystallography

Volume 18, Part 2 (April 1985)



research papers



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J. Appl. Cryst. (1985). 18, 55-60    [doi:10.1107/S0021889885009827]

Relationship between counting modes, absolute noise term and the errors of structure functions in the interpretation of small-angle X-ray scattering data

U. Lembke and T. Gerber



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J. Appl. Cryst. (1985). 18, 61-64    [doi:10.1107/S0021889885009839]

Incoherent scattering corrections for forward scattering of neutrons by aqueous buffers. Temperature dependence and influence of absorbing salts

W. Knoll, G. Schmidt and K. Ibel



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J. Appl. Cryst. (1985). 18, 65-70    [doi:10.1107/S0021889885009840]

The inverse contrast variation in small-angle neutron scattering: a sensitive technique for the evaluation of lipid phase diagrams

W. Knoll, G. Schmidt and K. Ibel



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J. Appl. Cryst. (1985). 18, 71-74    [doi:10.1107/S0021889885009852]

Borrmann effect for alignment of a four-circle diffractometer

W. J. Murphy, L. D. Chapman, J.-L. Staudenmann and G. L. Liedl



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J. Appl. Cryst. (1985). 18, 75-79    [doi:10.1107/S0021889885009864]

ABSORB: An absorption correction program for crystals enclosed in capillaries with trapped mother liquor

G. T. DeTitta



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J. Appl. Cryst. (1985). 18, 80-84    [doi:10.1107/S0021889885009876]

Semiquantitative X-ray diffraction method for phase analysis using additions of a foreign component

B. Grzeta and S. Popovic



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J. Appl. Cryst. (1985). 18, 85-92    [doi:10.1107/S0021889885009888]

The use of an array processor for the simulation of X-ray topographs

A. Soyer, Y. Epelboin and F. Morris



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J. Appl. Cryst. (1985). 18, 93-105    [doi:10.1107/S002188988500989X]

Experimental and computer simulation study of the variation with depth of the X-ray section topograph images of a dislocation

A. Authier, M. Lefeld-Sosnowska, Y. Epelboin and A. Soyer



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J. Appl. Cryst. (1985). 18, 106-109    [doi:10.1107/S0021889885009906]

In situ alignment procedure for X-ray topography

R. A. Forman and S. Mayo



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J. Appl. Cryst. (1985). 18, 110-113    [doi:10.1107/S0021889885009918]

Large-angle convergent-beam electron diffraction; a simple technique for the study of modulated structures with application to V2D

J. Taftø and T. H. Metzger



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J. Appl. Cryst. (1985). 18, 114-119    [doi:10.1107/S002188988500992X]

Detectability of two overlapping Pearson VII peaks in simulated X-ray diffraction patterns

H. Van de Velde and G. Platbrood


short communications



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J. Appl. Cryst. (1985). 18, 120-122    [doi:10.1107/S0021889885009931]

A two-crystal X-ray interferometer from different pieces of silicon material

P. Becker


computer programs



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J. Appl. Cryst. (1985). 18, 122-125    [doi:10.1107/S0021889885009943]

Computer program for the evaluation of radial distribution functions in Rayleigh scattering of Mössbauer radiation experiments

A. Deriu and F. Ugozzoli



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J. Appl. Cryst. (1985). 18, 126-130    [doi:10.1107/S0021889885009955]

Computer simulation of convergent-beam electron diffraction patterns from bicrystals

N. S. Blom and F. W. Schapink


book reviews



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J. Appl. Cryst. (1985). 18, 130    [doi:10.1107/S0021889885009967]

Electro-optical and magneto-optical properties of liquid crystals by L. M. Blinov


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