Journal of Applied Crystallography

Volume 18, Part 4 (August 1985)



research papers



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J. Appl. Cryst. (1985). 18, 191-196    [doi:10.1107/S0021889885010147]

Calculation of intensity distribution in the case of oblique texture electron diffraction

A. Plançon, S. I. Tsipurski and V. A. Drits



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J. Appl. Cryst. (1985). 18, 197-204    [doi:10.1107/S0021889885010159]

Electron optical study of rutile

R. C. Creek and A. E. C. Spargo



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J. Appl. Cryst. (1985). 18, 205-213    [doi:10.1107/S0021889885010160]

Particle size distribution from small-angle X-ray scattering data

G. Walter, R. Kranold, T. Gerber, J. Baldrian and M. Steinhart



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J. Appl. Cryst. (1985). 18, 214-218    [doi:10.1107/S0021889885010172]

LASIP: a liquid and amorphous structure investigation package

P. Lecante, A. Mosset and J. Galy



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J. Appl. Cryst. (1985). 18, 219-229    [doi:10.1107/S0021889885010184]

Parameterizations of scattering intensities and values of the angularities and of the interphase surfaces for three-component amorphous samples

S. Ciccariello and A. Benedetti



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J. Appl. Cryst. (1985). 18, 230-236    [doi:10.1107/S0021889885010196]

A comparison of the merits of isotopic substitution in neutron small-angle scattering and anomalous X-ray scattering for the evaluation of partial structure functions in a ternary alloy

J. P. Simon, O. Lyon and D. de Fontaine



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J. Appl. Cryst. (1985). 18, 237-240    [doi:10.1107/S0021889885010202]

The structural chirality and optical activity of [alpha]-LiIO3

K. Stadnicka, A. M. Glazer and J. R. L. Moxon



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J. Appl. Cryst. (1985). 18, 241-247    [doi:10.1107/S0021889885010214]

The model resolution function - a technique for estimating the quality of approximation of particles by models in small-angle X-ray or neutron scattering

J. J. Müller, G. Damaschun and P. W. Schmidt



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J. Appl. Cryst. (1985). 18, 248-252    [doi:10.1107/S0021889885010226]

Lissage d'un profil de raie de diffraction pour analyse de Fourier

B. Bourniquel and J. Feron



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J. Appl. Cryst. (1985). 18, 253-257    [doi:10.1107/S0021889885010238]

Some geometrical problems related to the rotation camera. I. X-ray diffraction pattern generation

D. Taupin


computer programs



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J. Appl. Cryst. (1985). 18, 258-262    [doi:10.1107/S002188988501024X]

STRUPLO84, a Fortran plot program for crystal structure illustrations in polyhedral representation

R. X. Fischer


computer program abstracts



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J. Appl. Cryst. (1985). 18, 263    [doi:10.1107/S0021889885010251]

XTAL: a program system for crystallographic calculations

J. M. Stewart and S. R. Hall



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J. Appl. Cryst. (1985). 18, 263-264    [doi:10.1107/S0021889885010263]

GENEV, GENSIN, GENTAN: phase determination within the XTAL system

S. R. Hall


crystallographers



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J. Appl. Cryst. (1985). 18, 264    [doi:10.1107/S0021889885010275]

Crystallographers


book reviews



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J. Appl. Cryst. (1985). 18, 264-265    [doi:10.1107/S0021889885010287]

Industrial crystallization edited by Grootscholten Jancic P. A. M.



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J. Appl. Cryst. (1985). 18, 265    [doi:10.1107/S0021889885010299]

Industrial crystallization 84 edited by S. J. Jancic and E. J. de Jong



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J. Appl. Cryst. (1985). 18, 265-266    [doi:10.1107/S0021889885010305]

Current topics in materials sceince. Vol. 10 edited by E. Kaldis


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