Journal of Applied Crystallography

Volume 18, Part 5 (October 1985)



research papers



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J. Appl. Cryst. (1985). 18, 267-271    [doi:10.1107/S0021889885010317]

X-ray diffraction by cathodically charged austenitic stainless steel

L. S. Zevin and Z. Melamed



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J. Appl. Cryst. (1985). 18, 272-274    [doi:10.1107/S0021889885010329]

Parallel-beam geometry for single-crystal diffraction

P. Suortti



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J. Appl. Cryst. (1985). 18, 275-278    [doi:10.1107/S0021889885010330]

Growth defects in quartz druses, <a> pseudo-basal dislocations

E. Scandale and F. Stasi



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J. Appl. Cryst. (1985). 18, 279-295    [doi:10.1107/S0021889885010342]

Odd-order O.D.F. expansion coefficient determination. Case of diffraction strain measurements on cubic materials under macrostress loading

C. M. Brakman



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J. Appl. Cryst. (1985). 18, 296-300    [doi:10.1107/S0021889885010354]

Synchrotron X-radiation protein crystallography: CEA film absorption factor as a function of wavelength 0.3<=[lambda]<=

I. J. Clifton, D. W. J. Cruickshank, G. Diakun, M. Elder, J. Habash, J. R. Helliwell, R. C. Liddington, P. A. Machin and M. Z. Papiz



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J. Appl. Cryst. (1985). 18, 301-307    [doi:10.1107/S0021889885010366]

Calculation of diffraction line profiles in the case of a major size effect: application to boehmite A1OOH

D. Grebille and J.-F. Bérar



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J. Appl. Cryst. (1985). 18, 308-315    [doi:10.1107/S0021889885010378]

Error analysis of a smeared SAXS curve of polystyrene in benzene

O. Kube and J. Springer



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J. Appl. Cryst. (1985). 18, 316-319    [doi:10.1107/S002188988501038X]

Programmed crystal growth on a diffractometer with focused heat radiation

D. Brodalla, D. Mootz, R. Boese and W. Osswald



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J. Appl. Cryst. (1985). 18, 320-325    [doi:10.1107/S0021889885010391]

Analysis of diffuse scattering in neutron powder diagrams. Application to glassy carbon

H. Boysen



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J. Appl. Cryst. (1985). 18, 326-333    [doi:10.1107/S0021889885010408]

Neutron interferometry: antiphasing effects caused by geometrical aberrations

U. Kischko and U. Bonse



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J. Appl. Cryst. (1985). 18, 334-338    [doi:10.1107/S002188988501041X]

Alignment of double-crystal diffractometers

P. F. Fewster



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J. Appl. Cryst. (1985). 18, 339-341    [doi:10.1107/S0021889885010421]

The crystal structure and the equation of state of thorium nitride for pressures up to 47 GPa

L. Gerward, J. Staun Olsen, U. Benedict, J.-P. Itié and J. C. Spirlet



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J. Appl. Cryst. (1985). 18, 342-350    [doi:10.1107/S0021889885010433]

Strategy for data collection from protein crystals using a multiwire counter area detector diffractometer

N. H. Xuong, C. Nielsen, R. Hamlin and D. Anderson



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J. Appl. Cryst. (1985). 18, 351-358    [doi:10.1107/S0021889885010445]

The effects of profile-function truncation in X-ray powder-pattern fitting

H. Toraya



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J. Appl. Cryst. (1985). 18, 359-361    [doi:10.1107/S0021889885010457]

The observation of resonant neutron diffraction

C. J. Carlile, R. C. Ward and B. T. M. Willis



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J. Appl. Cryst. (1985). 18, 362-364    [doi:10.1107/S0021889885010469]

Moiré patterns in electron diffraction from lanthanum oxide iodide (LaOI)

T. R. Welberry and T. B. Williams


short communications



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J. Appl. Cryst. (1985). 18, 365    [doi:10.1107/S0021889885010470]

A method for precision lattice-parameter measurement of single crystals. Erratum

H. Berger



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J. Appl. Cryst. (1985). 18, 365    [doi:10.1107/S0021889885010482]

Analysis of anisotrophy of small-angle neutron scattering of polyethylene single crystals. Erratum

D. M. Sadler


crystal data



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J. Appl. Cryst. (1985). 18, 366    [doi:10.1107/S0021889885010494]

Données crystallographiques sur les composés Ni(C15H11N3) X2.nH2O,X=Cl-,NO2-,NCO-

R. Cortes, M. I. Arriortua, J. L. Mesa et T. Rojo



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J. Appl. Cryst. (1985). 18, 366    [doi:10.1107/S0021889885010500]

New X-ray powder diffraction data for beryllium gallate, BeGa2O4

M. Machida, H. Tabata, S. Kawakami and E. Ishii


computer programs



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J. Appl. Cryst. (1985). 18, 367-370    [doi:10.1107/S0021889885010512]

TREOR, a semi-exhaustive trial-and-error powder indexing program for all symmetries

P.-E. Werner, L. Eriksson and M. Westdahl


computer program abstracts



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J. Appl. Cryst. (1985). 18, 370    [doi:10.1107/S0021889885010524]

NEWMAN, program for calculating and plotting Newman projections from atomic coordinates and cell constants

H. Schenk, N. P. Brandenburg, B. van. Santen, E. Y. Kragten and B. O. Loopstra



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J. Appl. Cryst. (1985). 18, 370-371    [doi:10.1107/S0021889885010536]

TYPIST - a program for the tabulation of crystallographic results

M. Tomassini


laboratory notes



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J. Appl. Cryst. (1985). 18, 371-372    [doi:10.1107/S0021889885010548]

A lathe-like crystal grinder for grinding pre-aligned crystals into cylindrical cross section

R. A. Wood, G. E. Tode and T. R. Walberry



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J. Appl. Cryst. (1985). 18, 373    [doi:10.1107/S002188988501055X]

Precise orientation of semiconductor surfaces by the back-reflection Laue technique

C. Schiller


crystallographers



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J. Appl. Cryst. (1985). 18, 373-374    [doi:10.1107/S0021889885010561]

Crystallographers


new commercial products



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J. Appl. Cryst. (1985). 18, 374-376    [doi:10.1107/S0021889885010573]

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