Journal of Applied Crystallography

Volume 18, Part 5 (October 1985)

research papers
short communications
crystal data
computer programs
computer program abstracts
laboratory notes
crystallographers
new commercial products

research papers

J. Appl. Cryst. (1985). 18, 267-271 [doi:10.1107/S0021889885010317]

X-ray diffraction by cathodically charged austenitic stainless steel

L. S. Zevin and Z. Melamed

J. Appl. Cryst. (1985). 18, 272-274 [doi:10.1107/S0021889885010329]

Parallel-beam geometry for single-crystal diffraction

P. Suortti

J. Appl. Cryst. (1985). 18, 275-278 [doi:10.1107/S0021889885010330]

Growth defects in quartz druses, <a> pseudo-basal dislocations

E. Scandale and F. Stasi

J. Appl. Cryst. (1985). 18, 279-295 [doi:10.1107/S0021889885010342]

Odd-order O.D.F. expansion coefficient determination. Case of diffraction strain measurements on cubic materials under macrostress loading

C. M. Brakman

J. Appl. Cryst. (1985). 18, 296-300 [doi:10.1107/S0021889885010354]

Synchrotron X-radiation protein crystallography: CEA film absorption factor as a function of wavelength 0.32Å

I. J. Clifton, D. W. J. Cruickshank, G. Diakun, M. Elder, J. Habash, J. R. Helliwell, R. C. Liddington, P. A. Machin and M. Z. Papiz

J. Appl. Cryst. (1985). 18, 301-307 [doi:10.1107/S0021889885010366]

Calculation of diffraction line profiles in the case of a major size effect: application to boehmite A1OOH

D. Grebille and J.-F. Bérar

J. Appl. Cryst. (1985). 18, 308-315 [doi:10.1107/S0021889885010378]

Error analysis of a smeared SAXS curve of polystyrene in benzene

O. Kube and J. Springer

J. Appl. Cryst. (1985). 18, 316-319 [doi:10.1107/S002188988501038X]

Programmed crystal growth on a diffractometer with focused heat radiation

D. Brodalla, D. Mootz, R. Boese and W. Osswald

J. Appl. Cryst. (1985). 18, 320-325 [doi:10.1107/S0021889885010391]

Analysis of diffuse scattering in neutron powder diagrams. Application to glassy carbon

H. Boysen

J. Appl. Cryst. (1985). 18, 326-333 [doi:10.1107/S0021889885010408]

Neutron interferometry: antiphasing effects caused by geometrical aberrations

U. Kischko and U. Bonse

J. Appl. Cryst. (1985). 18, 334-338 [doi:10.1107/S002188988501041X]

Alignment of double-crystal diffractometers

P. F. Fewster

J. Appl. Cryst. (1985). 18, 339-341 [doi:10.1107/S0021889885010421]

The crystal structure and the equation of state of thorium nitride for pressures up to 47 GPa

L. Gerward, J. Staun Olsen, U. Benedict, J.-P. Itié and J. C. Spirlet

J. Appl. Cryst. (1985). 18, 342-350 [doi:10.1107/S0021889885010433]

Strategy for data collection from protein crystals using a multiwire counter area detector diffractometer

N. H. Xuong, C. Nielsen, R. Hamlin and D. Anderson

J. Appl. Cryst. (1985). 18, 351-358 [doi:10.1107/S0021889885010445]

The effects of profile-function truncation in X-ray powder-pattern fitting

H. Toraya

J. Appl. Cryst. (1985). 18, 359-361 [doi:10.1107/S0021889885010457]

The observation of resonant neutron diffraction

C. J. Carlile, R. C. Ward and B. T. M. Willis

J. Appl. Cryst. (1985). 18, 362-364 [doi:10.1107/S0021889885010469]

Moiré patterns in electron diffraction from lanthanum oxide iodide (LaOI)

T. R. Welberry and T. B. Williams

short communications

J. Appl. Cryst. (1985). 18, 365 [doi:10.1107/S0021889885010470]

A method for precision lattice-parameter measurement of single crystals. Erratum

H. Berger

J. Appl. Cryst. (1985). 18, 365 [doi:10.1107/S0021889885010482]

Analysis of anisotrophy of small-angle neutron scattering of polyethylene single crystals. Erratum

D. M. Sadler

crystal data

J. Appl. Cryst. (1985). 18, 366 [doi:10.1107/S0021889885010494]

Données crystallographiques sur les composés Ni(C₁₅H₁₁N₃) X₂.nH₂O,X=Cl^-,NO₂^-,NCO^-

R. Cortes, M. I. Arriortua, J. L. Mesa et T. Rojo

J. Appl. Cryst. (1985). 18, 366 [doi:10.1107/S0021889885010500]

New X-ray powder diffraction data for beryllium gallate, BeGa₂O₄

M. Machida, H. Tabata, S. Kawakami and E. Ishii

computer programs

J. Appl. Cryst. (1985). 18, 367-370 [doi:10.1107/S0021889885010512]

TREOR, a semi-exhaustive trial-and-error powder indexing program for all symmetries

P.-E. Werner, L. Eriksson and M. Westdahl

computer program abstracts

J. Appl. Cryst. (1985). 18, 370 [doi:10.1107/S0021889885010524]

NEWMAN, program for calculating and plotting Newman projections from atomic coordinates and cell constants

H. Schenk, N. P. Brandenburg, B. van. Santen, E. Y. Kragten and B. O. Loopstra

J. Appl. Cryst. (1985). 18, 370-371 [doi:10.1107/S0021889885010536]

TYPIST - a program for the tabulation of crystallographic results

M. Tomassini

laboratory notes

J. Appl. Cryst. (1985). 18, 371-372 [doi:10.1107/S0021889885010548]

A lathe-like crystal grinder for grinding pre-aligned crystals into cylindrical cross section

R. A. Wood, G. E. Tode and T. R. Walberry

J. Appl. Cryst. (1985). 18, 373 [doi:10.1107/S002188988501055X]

Precise orientation of semiconductor surfaces by the back-reflection Laue technique

C. Schiller

crystallographers

J. Appl. Cryst. (1985). 18, 373-374 [doi:10.1107/S0021889885010561]

Crystallographers

new commercial products

J. Appl. Cryst. (1985). 18, 374-376 [doi:10.1107/S0021889885010573]