Journal of Applied Crystallography
Volume 19, Part 1 (February 1986)
J. Appl. Cryst. (1986). 19, 1-6 [doi:10.1107/S002188988609009X]
A new radiative single-crystal diffractometer microfurnace incorporating MgO as a high-temperature cement and internal temperature calibrant
D. K. Swanson and C. T. Prewitt
J. Appl. Cryst. (1986). 19, 7-9 [doi:10.1107/S0021889886090088]
The influence of high hydrostatic pressure on lattice parameters of a single crystal of BaTiO3
M. Malinowski, K. Lukaszewicz and S. Åsbrink
J. Appl. Cryst. (1986). 19, 10-18 [doi:10.1107/S0021889886090076]
The effect of profile step width on the determination of crystal structure parameters and estimated standard deviations by X-ray Rietveld analysis
R. J. Hill and I. C. Madsen
J. Appl. Cryst. (1986). 19, 19-24 [doi:10.1107/S0021889886090064]
Anomalous small-angle scattering in metallurgy: a feasibility experiment with an Al-Zn alloy
P. Goudeau, A. Fontaine, A. Naudon and C. E. Williams
J. Appl. Cryst. (1986). 19, 25-27 [doi:10.1107/S0021889886090052]
Scattering exponents for polydisperse surface and mass fractals
J. E. Martin
J. Appl. Cryst. (1986). 19, 28-33 [doi:10.1107/S0021889886090040]
A real-time interactive graphics program to determine crystal orientation for the analysis of oscillation diffraction photographs
P. Dumas and R. Ripp
J. Appl. Cryst. (1986). 19, 34-38 [doi:10.1107/S0021889886090039]
Systematic errors in precision lattice-parameter determination of single crystals caused by asymmetric line profiles
H. Berger
J. Appl. Cryst. (1986). 19, 39-50 [doi:10.1107/S0021889886090027]
Information content and retrieval in solution scattering studies. II. Evaluation of accuracy and resolution
V. Luzzati and D. Taupin
J. Appl. Cryst. (1986). 19, 51-60 [doi:10.1107/S0021889886090015]
Accuracy and resolution in small-angle crystallographic analyses. A comparison with solution scattering studies
V. Luzzati and D. Taupin
J. Appl. Cryst. (1986). 19, 61-62 [doi:10.1107/S0021889886090003]
Strategies for collecting screen-less oscillation data
S. K. Munshi and M. R. N. Murthy
J. Appl. Cryst. (1986). 19, 63-64 [doi:10.1107/S0021889886089999]
Powder diffraction peak shapes. Parameterization of the pseudo-Voigt as a Voigt function
W. I. F. David
J. Appl. Cryst. (1986). 19, 65 [doi:10.1107/S0021889886089987]
Crystal data for p-bromochlorobenzene and p-dichlorobenzene/p-bromochlorobenzene mixed crystals at 293
K. Erratum
M. Labrador, E. Tauler, Y. Haget, T. Calvet, M. A. Cuevas and E. Estop
J. Appl. Cryst. (1986). 19, 65-66 [doi:10.1107/S0021889886089975]
PITMOS - a system of interactive computer programs for visualization of crystal packing
S. Pérez and R. P. Scaringe
J. Appl. Cryst. (1986). 19, 67 [doi:10.1107/S0021889886089963]
Crystallographers
J. Appl. Cryst. (1986). 19, 67 [doi:10.1107/S0021889886089951]
Notes and News
J. Appl. Cryst. (1986). 19, 67-68 [doi:10.1107/S002188988608994X]
New Commercial Products
J. Appl. Cryst. (1986). 19, 68 [doi:10.1107/S0021889886089938]
Semiconductor physics: an introduction by K. Seeger
J. Appl. Cryst. (1986). 19, 68 [doi:10.1107/S0021889886089926]
Metamorphic reactions: kinetics, textures and deformation edited by A. B. Thompson and D. C. Rubie
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