Journal of Applied Crystallography

Volume 19, Part 1 (February 1986)



research papers



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J. Appl. Cryst. (1986). 19, 1-6    [doi:10.1107/S002188988609009X]

A new radiative single-crystal diffractometer microfurnace incorporating MgO as a high-temperature cement and internal temperature calibrant

D. K. Swanson and C. T. Prewitt



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J. Appl. Cryst. (1986). 19, 7-9    [doi:10.1107/S0021889886090088]

The influence of high hydrostatic pressure on lattice parameters of a single crystal of BaTiO3

M. Malinowski, K. Lukaszewicz and S. Åsbrink



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J. Appl. Cryst. (1986). 19, 10-18    [doi:10.1107/S0021889886090076]

The effect of profile step width on the determination of crystal structure parameters and estimated standard deviations by X-ray Rietveld analysis

R. J. Hill and I. C. Madsen



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J. Appl. Cryst. (1986). 19, 19-24    [doi:10.1107/S0021889886090064]

Anomalous small-angle scattering in metallurgy: a feasibility experiment with an Al-Zn alloy

P. Goudeau, A. Fontaine, A. Naudon and C. E. Williams



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J. Appl. Cryst. (1986). 19, 25-27    [doi:10.1107/S0021889886090052]

Scattering exponents for polydisperse surface and mass fractals

J. E. Martin



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J. Appl. Cryst. (1986). 19, 28-33    [doi:10.1107/S0021889886090040]

A real-time interactive graphics program to determine crystal orientation for the analysis of oscillation diffraction photographs

P. Dumas and R. Ripp



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J. Appl. Cryst. (1986). 19, 34-38    [doi:10.1107/S0021889886090039]

Systematic errors in precision lattice-parameter determination of single crystals caused by asymmetric line profiles

H. Berger



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J. Appl. Cryst. (1986). 19, 39-50    [doi:10.1107/S0021889886090027]

Information content and retrieval in solution scattering studies. II. Evaluation of accuracy and resolution

V. Luzzati and D. Taupin



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J. Appl. Cryst. (1986). 19, 51-60    [doi:10.1107/S0021889886090015]

Accuracy and resolution in small-angle crystallographic analyses. A comparison with solution scattering studies

V. Luzzati and D. Taupin


short communications



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J. Appl. Cryst. (1986). 19, 61-62    [doi:10.1107/S0021889886090003]

Strategies for collecting screen-less oscillation data

S. K. Munshi and M. R. N. Murthy



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J. Appl. Cryst. (1986). 19, 63-64    [doi:10.1107/S0021889886089999]

Powder diffraction peak shapes. Parameterization of the pseudo-Voigt as a Voigt function

W. I. F. David


crystal data



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J. Appl. Cryst. (1986). 19, 65    [doi:10.1107/S0021889886089987]

Crystal data for p-bromochlorobenzene and p-dichlorobenzene/p-bromochlorobenzene mixed crystals at 293 K. Erratum

M. Labrador, E. Tauler, Y. Haget, T. Calvet, M. A. Cuevas and E. Estop


computer programs



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J. Appl. Cryst. (1986). 19, 65-66    [doi:10.1107/S0021889886089975]

PITMOS - a system of interactive computer programs for visualization of crystal packing

S. Pérez and R. P. Scaringe


crystallographers



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J. Appl. Cryst. (1986). 19, 67    [doi:10.1107/S0021889886089963]

Crystallographers


notes and news



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J. Appl. Cryst. (1986). 19, 67    [doi:10.1107/S0021889886089951]

Notes and News


new commercial products



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J. Appl. Cryst. (1986). 19, 67-68    [doi:10.1107/S002188988608994X]

New Commercial Products


books received



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J. Appl. Cryst. (1986). 19, 68    [doi:10.1107/S0021889886089938]

Semiconductor physics: an introduction by K. Seeger



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J. Appl. Cryst. (1986). 19, 68    [doi:10.1107/S0021889886089926]

Metamorphic reactions: kinetics, textures and deformation edited by A. B. Thompson and D. C. Rubie


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