Journal of Applied Crystallography

Volume 19, Part 2 (April 1986)



research papers



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J. Appl. Cryst. (1986). 19, 69-72    [doi:10.1107/S0021889886089914]

Bravais-lattice determination for automatic data collection

C. Katayama



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J. Appl. Cryst. (1986). 19, 73-76    [doi:10.1107/S0021889886089902]

A test of the accuracy of high-pressure measurements using a Merrill-Bassett diamond-anvil cell

A. Katrusiak and R. J. Nelmes



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J. Appl. Cryst. (1986). 19, 77-79    [doi:10.1107/S0021889886089896]

The generalized equation of pseudo-Kossel lines

W. E. Mayo



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J. Appl. Cryst. (1986). 19, 80-85    [doi:10.1107/S0021889886089884]

Einfluss der Valenzelektronenkonzentration auf die Bildung der Phasen vom Ni2In-Strukturtyp am Beispiel der ternären Verbindungen Mn2Ga0.5As0.5(m),Fe3GaAs und Co2Ga0.5As0.5

M. Ellner und M. El-Boragy



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J. Appl. Cryst. (1986). 19, 86-89    [doi:10.1107/S0021889886089872]

Lattice thermal expansion behaviour of spinel HgCr2Se4

P. Kistaiah, C. V. Reddy and K. S. Murthy



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J. Appl. Cryst. (1986). 19, 90-91    [doi:10.1107/S0021889886089860]

CAMAL - a new component of the Cambridge Structural Database software system

R. Taylor



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J. Appl. Cryst. (1986). 19, 92-100    [doi:10.1107/S0021889886089859]

Synchrotron X-ray polycrystalline diffractometry

W. Parrish, M. Hart and T. C. Huang



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J. Appl. Cryst. (1986). 19, 101-104    [doi:10.1107/S0021889886089847]

Interactive graphics for rapid indexing of oscillation films from large unit cells

P. C. Moews, T. Sakamaki and J. R. Knox



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J. Appl. Cryst. (1986). 19, 105-107    [doi:10.1107/S0021889886089835]

A nitrogen-gas-stream cryostat for general X-ray diffraction studies

J. Cosier and A. M. Glazer



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J. Appl. Cryst. (1986). 19, 108-122    [doi:10.1107/S0021889886089823]

On the origin of optical activity in crystal structures

A. M. Glazer and K. Stadnicka



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J. Appl. Cryst. (1986). 19, 123-130    [doi:10.1107/S0021889886089811]

High-reflectivity multilayer monochromators for neutrons

A. M. Saxena



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J. Appl. Cryst. (1986). 19, 131-133    [doi:10.1107/S002188988608980X]

The determination of molecular orientation: an efficient reciprocal-space algorithm for the small computer

D. A. Langs



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J. Appl. Cryst. (1986). 19, 134-139    [doi:10.1107/S0021889886089793]

Post-refinement of oscillation diffraction data collected at a synchrotron radiation source

G. Vriend, M. G. Rossmann, E. Arnold, M. Luo, J. P. Griffith and K. Moffat



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J. Appl. Cryst. (1986). 19, 140-141    [doi:10.1107/S0021889886089781]

Identification of Burgers vectors along <111> in in-doped GaAs, by X-ray transmission topography and image simulation

N. Burle-Durbec, B. Pichaud, F. Minari, A. Soyer and Y. Epelboin


crystal data



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J. Appl. Cryst. (1986). 19, 142    [doi:10.1107/S002188988608977X]

Crystal data for 1-4-epoxy-4-[(4-nitrophenyl)methyl]-1-phenyl-1H-2,3-benzodioxepin-5(4H)-one (C22H15NO6) and 1,4-epoxy-4-[(4-bromophenyl)methyl]-1-phenyl-1H-2,3-benzodioxepin-5(4H)-one (C22H15BrO4)

D. F. Mullica, J. S. Belew and E. L. Sappenfield



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J. Appl. Cryst. (1986). 19, 142    [doi:10.1107/S0021889886089768]

Crystal data for di-[mu]-chloro-bis[2-(di-tert-butylphosphino)-2-methylpropyl]dipalladium(II) (C24H52Cl2P2Pd2) and [2(di-tert-butylphosphino)-2-methylpropyl]triphenylarsinopalladium(II) chloride (C30H41AsClPPd)

D. F. Mullica and E. L. Sappenfield


laboratory notes



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J. Appl. Cryst. (1986). 19, 143    [doi:10.1107/S0021889886089756]

A comparison of the source emissivity distributions for two standard X-ray tubes

A. W. Stevenson, A. M. Mathieson and A. H. White


book reviews



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J. Appl. Cryst. (1986). 19, 144    [doi:10.1107/S0021889886089744]

Phase separation in glass edited by O. V. Mazurin and E. A. Porai-Koshits


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