Journal of Applied Crystallography
Volume 19, Part 4 (August 1986)
J. Appl. Cryst. (1986). 19, 205-207 [doi:10.1107/S0021889886089574]
Martin Julian Buerger, 1903-1986
L. V. Azároff
J. Appl. Cryst. (1986). 19, 208-213 [doi:10.1107/S0021889886089562]
Collection and processing of X-ray diffraction data from protein crystals at high pressure
C. E. Kundrot and F. M. Richards
J. Appl. Cryst. (1986). 19, 214-216 [doi:10.1107/S0021889886089550]
Determination of crystallite size and strain in ![[zeta]](/logos/entities/zeta_rmgif.gif)
-manganese dioxide - an X-ray diffraction study
B. S. Acharya and L. D. Pradhan
J. Appl. Cryst. (1986). 19, 217-221 [doi:10.1107/S0021889886089549]
A Monte Carlo error simulation applied to calibration-free X-ray diffraction phase analysis
G. E. Braun
J. Appl. Cryst. (1986). 19, 222-223 [doi:10.1107/S0021889886089537]
Correction for detector misalignment in a four-circle diffractometer
J.-P. Declercq, B. Tinant and M. Van Meerssche
J. Appl. Cryst. (1986). 19, 224-228 [doi:10.1107/S0021889886089525]
Developments in computer simulation of X-ray diffraction contrast images of stacking faults
G. Kowalski and A. R. Lang
J. Appl. Cryst. (1986). 19, 229-242 [doi:10.1107/S0021889886089513]
The time-of-flight small-angle scattering spectrometer SAN at the KENS pulsed cold neutron source
Y. Ishikawa, M. Furusaka, N. Niimura, M. Arai and K. Hasegawa
J. Appl. Cryst. (1986). 19, 243-245 [doi:10.1107/S0021889886089501]
Analysis of slit-distorted small-angle X-ray scattering intensities without desmearing
J. Goodisman, F. Delaglio and H. Brumberger
J. Appl. Cryst. (1986). 19, 246-248 [doi:10.1107/S0021889886089495]
Interference line pattern caused by diffuse scattering of X-rays in a cholesteryl 2,2,3,3-tetrafluoropropionate (CTFP) crystal
Y. Yoshimura, K. Shimaoka, N. Nakamura and S. Yano
J. Appl. Cryst. (1986). 19, 249-254 [doi:10.1107/S0021889886089483]
Calculation of diffraction line profiles in the case of coupled stacking fault and size-effect broadening: application to boehmite AlOOH
D. Grebille and J. F. Bérar
J. Appl. Cryst. (1986). 19, 255-261 [doi:10.1107/S0021889886089471]
The determination of label positions in membrane proteins by neutron and anomalous X-ray diffraction of powder samples
H.-J. Plöhn and G. Büldt
J. Appl. Cryst. (1986). 19, 262-266 [doi:10.1107/S002188988608946X]
Collection of Bragg data with a neutron flat-cone diffractometer
D. Hohlwein, A. Hoser and W. Prandl
J. Appl. Cryst. (1986). 19, 267-272 [doi:10.1107/S0021889886089458]
Correction of intensities for preferred orientation in powder diffractometry: application of the March model
W. A. Dollase
J. Appl. Cryst. (1986). 19, 273-274 [doi:10.1107/S0021889886089446]
Determination of the thermal expansion of orthorhombic sulfur
J. Wallis, I. Sigalas and S. Hart
J. Appl. Cryst. (1986). 19, 274 [doi:10.1107/S0021889886089434]
The true unit cell of ammonium hydrogen sulfate, (NH4)3H(SO4)2. Errata
B. L. Davis and L. R. Johnson
J. Appl. Cryst. (1986). 19, 275-276 [doi:10.1107/S0021889886089422]
Optimum geometry for asymmetric small-angle scattering
D. F. R. Mildner
J. Appl. Cryst. (1986). 19, 276-278 [doi:10.1107/S0021889886089410]
On the separation of split diffuse intensity maxima from a disordered Cu-Au alloy by an X-ray counter method
K.-I. Ohshima, J. Harada and S. C. Moss
J. Appl. Cryst. (1986). 19, 279 [doi:10.1107/S0021889886089409]
Diffusion bonding of ductile single crystals for strain-free mounting
D. R. Black, H. E. Burdette and J. G. Early
J. Appl. Cryst. (1986). 19, 280 [doi:10.1107/S0021889886089392]
Crystallographers
J. Appl. Cryst. (1986). 19, 280 [doi:10.1107/S0021889886089380]
International Union of Crystallography announces the Ewald Prize
J. Appl. Cryst. (1986). 19, 281 [doi:10.1107/S0021889886089379]
New Commercial Products
J. Appl. Cryst. (1986). 19, 281 [doi:10.1107/S0021889886089367]
Rapidly quenched metals, Vols. I and II edited by S. Steeb and H. Warlimont
J. Appl. Cryst. (1986). 19, 281-282 [doi:10.1107/S0021889886089355]
The kinetics of industrial crystallisation by J. Nývlt, O. Söhnel, M. Matuchová and M. Broul
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