Journal of Applied Crystallography
Volume 19, Part 5 (October 1986)
J. Appl. Cryst. (1986). 19, 283-286 [doi:10.1107/S0021889886089343]
An orientation-matrix approach to Laue indexing
R. A. Jacobson
J. Appl. Cryst. (1986). 19, 287-299 [doi:10.1107/S0021889886089331]
Small-angle X-ray scattering analysis of catalysts: comparison and evaluation of models
H. Brumberger, F. Delaglio, J. Goodisman and M. Whitfield
J. Appl. Cryst. (1986). 19, 300-307 [doi:10.1107/S002188988608932X]
The accuracy of stress measurement using the X-ray diffraction method
D. Lonsdale
J. Appl. Cryst. (1986). 19, 308-310 [doi:10.1107/S0021889886089318]
Structural stability and equation of state of thorium carbide for pressures up to 36 GPa
L. Gerward, J. Staun Olsen, U. Benedict, J.-P. Itíe and J. C. Spirlet
J. Appl. Cryst. (1986). 19, 311-319 [doi:10.1107/S0021889886089306]
Measurement and calculation of resolution of time-of-flight small-angle neutron scattering
D. F. R. Mildner, J. M. Carpenter and D. L. Worcester
J. Appl. Cryst. (1986). 19, 320-323 [doi:10.1107/S002188988608929X]
The inclination angle of nonisotropic inhomogeneities determined by SANS
B. Hammouda, D. F. R. Mildner, R. A. Bubeck and M. T. Malanga
J. Appl. Cryst. (1986). 19, 324-330 [doi:10.1107/S0021889886089288]
The spatial condensation of the neutron beam by an asymmetric diffraction in thermal-neutron monochromatization
P. Mikula, J. Kulda, L. Horalík, B. Chalupa and P. Lukás
J. Appl. Cryst. (1986). 19, 331-335 [doi:10.1107/S0021889886089276]
Reconciliation of valency ambiguity in V2TiO5 using XANES spectroscopy
S. Åsbrink, G. N. Greaves, P. D. Hatton and K. Garg
J. Appl. Cryst. (1986). 19, 336-342 [doi:10.1107/S0021889886089264]
An X-ray spectrometer for inelastic scattering experiments. I. Curved-crystal X-ray optics
P. Suortti, P. Pattison and W. Weyrich
J. Appl. Cryst. (1986). 19, 343-352 [doi:10.1107/S0021889886089240]
An X-ray spectrometer for inelastic scattering experiments. II. Spectral flux and resolution
P. Suortti, P. Pattison and W. Weyrich
J. Appl. Cryst. (1986). 19, 353-363 [doi:10.1107/S0021889886089239]
An X-ray spectrometer for inelastic scattering experiments. III. Design and performance
P. Pattison, P. Suortti and W. Weyrich
J. Appl. Cryst. (1986). 19, 364-371 [doi:10.1107/S0021889886089227]
X-ray anomalous scattering difference patterns in qualitative and quantitative powder diffraction analysis
I. G. Wood, L. Nicholls and G. Brown
J. Appl. Cryst. (1986). 19, 372-373 [doi:10.1107/S0021889886089215]
A thermoelectric device for temperature-controlled single-crystal diffractometry
G. M. Fraase Storm and F. Tuinstra
J. Appl. Cryst. (1986). 19, 374-376 [doi:10.1107/S0021889886089203]
Phase transition at 555 K in nonlinear optic Pb5Cr3F19
S. Arquis-Canouet, J. Ravez and S. C. Abrahams
J. Appl. Cryst. (1986). 19, 377-381 [doi:10.1107/S0021889886089197]
Improvement of the accuracy of HAUP, high-accuracy universal polarimeter: application to ferroelectric [N(CH3)4]ZnCl4
J. Kobayashi, H. Kumomi and K. Saito
J. Appl. Cryst. (1986). 19, 382-389 [doi:10.1107/S0021889886089185]
Multi-site correlations and the atomic size effect
T. R. Welberry
J. Appl. Cryst. (1986). 19, 390-394 [doi:10.1107/S0021889886089173]
Mounting a 10 K cooling device without rotating seals on a four-circle diffractometer
K. Henriksen, F. K. Larsen and S. E. Rasmussen
J. Appl. Cryst. (1986). 19, 395-399 [doi:10.1107/S0021889886089161]
Structure study of amorphous lead titanate by the energy-dispersive X-ray diffraction method
H. Ozawa and R. Uno
J. Appl. Cryst. (1986). 19, 400-409 [doi:10.1107/S002188988608915X]
Oscillation camera data processing. 4. Results and recommendations for the processing of synchrotron radiation data in macromolecular crystallography
T. J. Greenhough and F. L. Suddath
J. Appl. Cryst. (1986). 19, 410 [doi:10.1107/S0021889886089148]
Crystal data for D-methionine CH3SCH2CH2CH(NH2)COOH and D-tyrosine HOC6H4CH2CH(NH2)COOH
B. Khawas
J. Appl. Cryst. (1986). 19, 410 [doi:10.1107/S0021889886089136]
Crystal data for Sr2Te3O8
Y. Elerman and M. Koçak
J. Appl. Cryst. (1986). 19, 410 [doi:10.1107/S0021889886089124]
Crystal data for 4-bromo-4'-fluorobiphenyl
F. Brown, J. N. Low and P. Tollin
J. Appl. Cryst. (1986). 19, 411 [doi:10.1107/S0021889886089112]
Crystal data for Mo3.25Ir at 293 K and 12.5 K
R. Koksbang and S. E. Rasmussen
J. Appl. Cryst. (1986). 19, 411-412 [doi:10.1107/S0021889886089100]
PATMET - program for determination of orientation and position of a known fragment in the unit cell
C. C. Wilson and P. Tollin
J. Appl. Cryst. (1986). 19, 412 [doi:10.1107/S0021889886089094]
DREAM - data reduction and error analysis routines for accurate single-crystal diffraction intensity measurements
R. H. Blessing
J. Appl. Cryst. (1986). 19, 412-413 [doi:10.1107/S0021889886089082]
Goniometer-head attachments for crystal characterization in Weissenberg or precession geometry
A. Okazaki and Y. Soejima
J. Appl. Cryst. (1986). 19, 413-414 [doi:10.1107/S0021889886089070]
Conversion of a high-temperature Guiner camera to a low-temperature device
S. E. Rasmussen and F. K. Larsen
J. Appl. Cryst. (1986). 19, 414 [doi:10.1107/S0021889886089069]
Crystallographers
J. Appl. Cryst. (1986). 19, 414 [doi:10.1107/S0021889886089057]
Commission on Journals - Authors grievance procedure
J. Appl. Cryst. (1986). 19, 414-415 [doi:10.1107/S0021889886089045]
New Commercial Products
J. Appl. Cryst. (1986). 19, 415-416 [doi:10.1107/S0021889886089033]
Current topics in materials sceince. Vol. 11 edited by E. Kaldis
J. Appl. Cryst. (1986). 19, 416 [doi:10.1107/S0021889886089021]
Current topics in materials sceince. Vol. 12 edited by E. Kaldis
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