Journal of Applied Crystallography

Volume 19, Part 5 (October 1986)



research papers



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J. Appl. Cryst. (1986). 19, 283-286    [doi:10.1107/S0021889886089343]

An orientation-matrix approach to Laue indexing

R. A. Jacobson



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J. Appl. Cryst. (1986). 19, 287-299    [doi:10.1107/S0021889886089331]

Small-angle X-ray scattering analysis of catalysts: comparison and evaluation of models

H. Brumberger, F. Delaglio, J. Goodisman and M. Whitfield



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J. Appl. Cryst. (1986). 19, 300-307    [doi:10.1107/S002188988608932X]

The accuracy of stress measurement using the X-ray diffraction method

D. Lonsdale



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J. Appl. Cryst. (1986). 19, 308-310    [doi:10.1107/S0021889886089318]

Structural stability and equation of state of thorium carbide for pressures up to 36 GPa

L. Gerward, J. Staun Olsen, U. Benedict, J.-P. Itíe and J. C. Spirlet



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J. Appl. Cryst. (1986). 19, 311-319    [doi:10.1107/S0021889886089306]

Measurement and calculation of resolution of time-of-flight small-angle neutron scattering

D. F. R. Mildner, J. M. Carpenter and D. L. Worcester



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J. Appl. Cryst. (1986). 19, 320-323    [doi:10.1107/S002188988608929X]

The inclination angle of nonisotropic inhomogeneities determined by SANS

B. Hammouda, D. F. R. Mildner, R. A. Bubeck and M. T. Malanga



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J. Appl. Cryst. (1986). 19, 324-330    [doi:10.1107/S0021889886089288]

The spatial condensation of the neutron beam by an asymmetric diffraction in thermal-neutron monochromatization

P. Mikula, J. Kulda, L. Horalík, B. Chalupa and P. Lukás



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J. Appl. Cryst. (1986). 19, 331-335    [doi:10.1107/S0021889886089276]

Reconciliation of valency ambiguity in V2TiO5 using XANES spectroscopy

S. Åsbrink, G. N. Greaves, P. D. Hatton and K. Garg



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J. Appl. Cryst. (1986). 19, 336-342    [doi:10.1107/S0021889886089264]

An X-ray spectrometer for inelastic scattering experiments. I. Curved-crystal X-ray optics

P. Suortti, P. Pattison and W. Weyrich



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J. Appl. Cryst. (1986). 19, 343-352    [doi:10.1107/S0021889886089240]

An X-ray spectrometer for inelastic scattering experiments. II. Spectral flux and resolution

P. Suortti, P. Pattison and W. Weyrich



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J. Appl. Cryst. (1986). 19, 353-363    [doi:10.1107/S0021889886089239]

An X-ray spectrometer for inelastic scattering experiments. III. Design and performance

P. Pattison, P. Suortti and W. Weyrich



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J. Appl. Cryst. (1986). 19, 364-371    [doi:10.1107/S0021889886089227]

X-ray anomalous scattering difference patterns in qualitative and quantitative powder diffraction analysis

I. G. Wood, L. Nicholls and G. Brown



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J. Appl. Cryst. (1986). 19, 372-373    [doi:10.1107/S0021889886089215]

A thermoelectric device for temperature-controlled single-crystal diffractometry

G. M. Fraase Storm and F. Tuinstra



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J. Appl. Cryst. (1986). 19, 374-376    [doi:10.1107/S0021889886089203]

Phase transition at 555 K in nonlinear optic Pb5Cr3F19

S. Arquis-Canouet, J. Ravez and S. C. Abrahams



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J. Appl. Cryst. (1986). 19, 377-381    [doi:10.1107/S0021889886089197]

Improvement of the accuracy of HAUP, high-accuracy universal polarimeter: application to ferroelectric [N(CH3)4]ZnCl4

J. Kobayashi, H. Kumomi and K. Saito



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J. Appl. Cryst. (1986). 19, 382-389    [doi:10.1107/S0021889886089185]

Multi-site correlations and the atomic size effect

T. R. Welberry



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J. Appl. Cryst. (1986). 19, 390-394    [doi:10.1107/S0021889886089173]

Mounting a 10 K cooling device without rotating seals on a four-circle diffractometer

K. Henriksen, F. K. Larsen and S. E. Rasmussen



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J. Appl. Cryst. (1986). 19, 395-399    [doi:10.1107/S0021889886089161]

Structure study of amorphous lead titanate by the energy-dispersive X-ray diffraction method

H. Ozawa and R. Uno



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J. Appl. Cryst. (1986). 19, 400-409    [doi:10.1107/S002188988608915X]

Oscillation camera data processing. 4. Results and recommendations for the processing of synchrotron radiation data in macromolecular crystallography

T. J. Greenhough and F. L. Suddath


crystal data



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J. Appl. Cryst. (1986). 19, 410    [doi:10.1107/S0021889886089148]

Crystal data for D-methionine CH3SCH2CH2CH(NH2)COOH and D-tyrosine HOC6H4CH2CH(NH2)COOH

B. Khawas



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J. Appl. Cryst. (1986). 19, 410    [doi:10.1107/S0021889886089136]

Crystal data for Sr2Te3O8

Y. Elerman and M. Koçak



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J. Appl. Cryst. (1986). 19, 410    [doi:10.1107/S0021889886089124]

Crystal data for 4-bromo-4'-fluorobiphenyl

F. Brown, J. N. Low and P. Tollin



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J. Appl. Cryst. (1986). 19, 411    [doi:10.1107/S0021889886089112]

Crystal data for Mo3.25Ir at 293 K and 12.5 K

R. Koksbang and S. E. Rasmussen


computer program abstracts



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J. Appl. Cryst. (1986). 19, 411-412    [doi:10.1107/S0021889886089100]

PATMET - program for determination of orientation and position of a known fragment in the unit cell

C. C. Wilson and P. Tollin



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J. Appl. Cryst. (1986). 19, 412    [doi:10.1107/S0021889886089094]

DREAM - data reduction and error analysis routines for accurate single-crystal diffraction intensity measurements

R. H. Blessing


laboratory notes



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J. Appl. Cryst. (1986). 19, 412-413    [doi:10.1107/S0021889886089082]

Goniometer-head attachments for crystal characterization in Weissenberg or precession geometry

A. Okazaki and Y. Soejima



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J. Appl. Cryst. (1986). 19, 413-414    [doi:10.1107/S0021889886089070]

Conversion of a high-temperature Guiner camera to a low-temperature device

S. E. Rasmussen and F. K. Larsen


crystallographers



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J. Appl. Cryst. (1986). 19, 414    [doi:10.1107/S0021889886089069]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1986). 19, 414    [doi:10.1107/S0021889886089057]

Commission on Journals - Authors grievance procedure


new commercial products



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J. Appl. Cryst. (1986). 19, 414-415    [doi:10.1107/S0021889886089045]

New Commercial Products


book reviews



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J. Appl. Cryst. (1986). 19, 415-416    [doi:10.1107/S0021889886089033]

Current topics in materials sceince. Vol. 11 edited by E. Kaldis



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J. Appl. Cryst. (1986). 19, 416    [doi:10.1107/S0021889886089021]

Current topics in materials sceince. Vol. 12 edited by E. Kaldis


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