Journal of Applied Crystallography

Volume 19, Part 6 (December 1986)



research papers



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J. Appl. Cryst. (1986). 19, 417-419    [doi:10.1107/S002188988608901X]

X-ray determination of the atomic displacements in NbC0.72

M. Morinaga, K. Ohshima, J. Harada and S. Otani



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J. Appl. Cryst. (1986). 19, 420-426    [doi:10.1107/S0021889886089008]

Rapid collection of X-ray powder data for pattern analysis by a cylindrical position-sensitive detector

S. Shishiguchi, I. Minato and H. Hashizume



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J. Appl. Cryst. (1986). 19, 427-439    [doi:10.1107/S0021889886088994]

The small-angle neutron scattering spectrometer at the National Bureau of Standards

C. J. Glinka, J. M. Rowe and J. G. LaRock



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J. Appl. Cryst. (1986). 19, 440-447    [doi:10.1107/S0021889886088982]

Whole-powder-pattern fitting without reference to a structural model: application to X-ray powder diffraction data

H. Toraya



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J. Appl. Cryst. (1986). 19, 448-452    [doi:10.1107/S0021889886088970]

Crystal structure analysis of cytochrome c' by the multiwavelength anomalous diffraction method using synchrotron radiation

S. Harada, M. Yasui, K. Murakawa, N. Kasai and Y. Satow



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J. Appl. Cryst. (1986). 19, 453-455    [doi:10.1107/S0021889886088969]

A conical-type X-ray guide tube for diffraction experiments with small crystals

H. Nozaki and H. Nakazawa



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J. Appl. Cryst. (1986). 19, 456-458    [doi:10.1107/S0021889886088957]

A simple adjustable mount for a two-stage cryorefrigerator on an Eulerian cradle

J. M. Archer and M. S. Lehmann



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J. Appl. Cryst. (1986). 19, 459-466    [doi:10.1107/S0021889886088945]

Truncation in diffraction pattern analysis. I. Concept of a diffraction line profile and its range

R. Delhez, Th. de Keijser, E. J. Mittemeijer and J. I. Langford



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J. Appl. Cryst. (1986). 19, 467-472    [doi:10.1107/S0021889886088933]

Simultaneous measurement of several X-ray pole figures

J. J. Heizmann and C. Laruelle



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J. Appl. Cryst. (1986). 19, 473-476    [doi:10.1107/S0021889886088921]

Diffraction pattern near the Bragg angle for an asymmetrically cut crystal

K. T. Kotsis and N. G. Alexandropoulos



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J. Appl. Cryst. (1986). 19, 477-481    [doi:10.1107/S002188988608891X]

Observation of defects and the incommensurate phase in berlinite crystals by high-temperature X-ray topography

A. Zarka, B. Capelle, E. Philippot and J. C. Jumas


short communications



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J. Appl. Cryst. (1986). 19, 482-484    [doi:10.1107/S0021889886088908]

A new method for determination of the crystal setting matrix for interpreting oscillation photographs

R. Sarma, B. McKeever, R. Gallo and J. Scuderi



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J. Appl. Cryst. (1986). 19, 484-485    [doi:10.1107/S0021889886088891]

An X-ray determination of the thermal expansion of [alpha]-phase Ag-Al alloys at high temperatures

S. K. Pradhan and M. De


crystal data



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J. Appl. Cryst. (1986). 19, 486    [doi:10.1107/S002188988608888X]

Crystal data for uranium phosphorus pentoxide, UPO5, and uranium arsenic pentoxide, UAsO5

H. Barten


computer programs



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J. Appl. Cryst. (1986). 19, 486-488    [doi:10.1107/S0021889886088878]

Use of a new array processor in the restrained least-squares procedure of Hendrickson and Konnert

G. H. Cohen



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J. Appl. Cryst. (1986). 19, 488-491    [doi:10.1107/S0021889886088866]

XFPS, a program for automatic Fourier, Patterson and superposition methods

F. Pavelcík


letters to the editor



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J. Appl. Cryst. (1986). 19, 491    [doi:10.1107/S0021889886088854]

Errors in a recent critique of the Borie-Sparks method in diffuse scattering

J. B. Cohen


international union of crystallography



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J. Appl. Cryst. (1986). 19, 491-492    [doi:10.1107/S0021889886088842]

Prices of Acta Crystallographica and Journal of Applied Crystallography


J. Appl. Cryst. (1986). 19, 493-496

Subject index to volume 19 (1986)


J. Appl. Cryst. (1986). 19, 497-500

Author index to volume 19 (1986)


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