Journal of Applied Crystallography

Volume 19, Part 6 (December 1986)

research papers
short communications
crystal data
computer programs
letters to the editor
international union of crystallography

research papers

J. Appl. Cryst. (1986). 19, 417-419 [doi:10.1107/S002188988608901X]

X-ray determination of the atomic displacements in NbC_0.72

M. Morinaga, K. Ohshima, J. Harada and S. Otani

J. Appl. Cryst. (1986). 19, 420-426 [doi:10.1107/S0021889886089008]

Rapid collection of X-ray powder data for pattern analysis by a cylindrical position-sensitive detector

S. Shishiguchi, I. Minato and H. Hashizume

J. Appl. Cryst. (1986). 19, 427-439 [doi:10.1107/S0021889886088994]

The small-angle neutron scattering spectrometer at the National Bureau of Standards

C. J. Glinka, J. M. Rowe and J. G. LaRock

J. Appl. Cryst. (1986). 19, 440-447 [doi:10.1107/S0021889886088982]

Whole-powder-pattern fitting without reference to a structural model: application to X-ray powder diffraction data

H. Toraya

J. Appl. Cryst. (1986). 19, 448-452 [doi:10.1107/S0021889886088970]

Crystal structure analysis of cytochrome c' by the multiwavelength anomalous diffraction method using synchrotron radiation

S. Harada, M. Yasui, K. Murakawa, N. Kasai and Y. Satow

J. Appl. Cryst. (1986). 19, 453-455 [doi:10.1107/S0021889886088969]

A conical-type X-ray guide tube for diffraction experiments with small crystals

H. Nozaki and H. Nakazawa

J. Appl. Cryst. (1986). 19, 456-458 [doi:10.1107/S0021889886088957]

A simple adjustable mount for a two-stage cryorefrigerator on an Eulerian cradle

J. M. Archer and M. S. Lehmann

J. Appl. Cryst. (1986). 19, 459-466 [doi:10.1107/S0021889886088945]

Truncation in diffraction pattern analysis. I. Concept of a diffraction line profile and its range

R. Delhez, Th. de Keijser, E. J. Mittemeijer and J. I. Langford

J. Appl. Cryst. (1986). 19, 467-472 [doi:10.1107/S0021889886088933]

Simultaneous measurement of several X-ray pole figures

J. J. Heizmann and C. Laruelle

J. Appl. Cryst. (1986). 19, 473-476 [doi:10.1107/S0021889886088921]

Diffraction pattern near the Bragg angle for an asymmetrically cut crystal

K. T. Kotsis and N. G. Alexandropoulos

J. Appl. Cryst. (1986). 19, 477-481 [doi:10.1107/S002188988608891X]

Observation of defects and the incommensurate phase in berlinite crystals by high-temperature X-ray topography

A. Zarka, B. Capelle, E. Philippot and J. C. Jumas

short communications

J. Appl. Cryst. (1986). 19, 482-484 [doi:10.1107/S0021889886088908]

A new method for determination of the crystal setting matrix for interpreting oscillation photographs

R. Sarma, B. McKeever, R. Gallo and J. Scuderi

J. Appl. Cryst. (1986). 19, 484-485 [doi:10.1107/S0021889886088891]

An X-ray determination of the thermal expansion of -phase Ag-Al alloys at high temperatures

S. K. Pradhan and M. De

crystal data

J. Appl. Cryst. (1986). 19, 486 [doi:10.1107/S002188988608888X]

Crystal data for uranium phosphorus pentoxide, UPO₅, and uranium arsenic pentoxide, UAsO₅

H. Barten

computer programs

J. Appl. Cryst. (1986). 19, 486-488 [doi:10.1107/S0021889886088878]

Use of a new array processor in the restrained least-squares procedure of Hendrickson and Konnert

G. H. Cohen

J. Appl. Cryst. (1986). 19, 488-491 [doi:10.1107/S0021889886088866]

XFPS, a program for automatic Fourier, Patterson and superposition methods

F. Pavelcík

letters to the editor

J. Appl. Cryst. (1986). 19, 491 [doi:10.1107/S0021889886088854]

Errors in a recent critique of the Borie-Sparks method in diffuse scattering

J. B. Cohen

international union of crystallography

J. Appl. Cryst. (1986). 19, 491-492 [doi:10.1107/S0021889886088842]

Prices of Acta Crystallographica and Journal of Applied Crystallography

J. Appl. Cryst. (1986). 19, 493-496

Subject index to volume 19 (1986)

J. Appl. Cryst. (1986). 19, 497-500