Journal of Applied Crystallography

Volume 20, Part 2 (April 1987)



research papers



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J. Appl. Cryst. (1987). 20, 61-78    [doi:10.1107/S0021889887087107]

Scattering from fractals

J. E. Martin and A. J. Hurd



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J. Appl. Cryst. (1987). 20, 79-83    [doi:10.1107/S0021889887087090]

Rietveld refinement of Debye-Scherrer synchrotron X-ray data from Al2O3

P. Thompson, D. E. Cox and J. B. Hastings



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J. Appl. Cryst. (1987). 20, 84-89    [doi:10.1107/S0021889887087089]

Measurement of intensity of directionally diffuse streaks on a four-circle diffractometer: divergence correction factors for bisecting setting

D. Pandey, L. Prasad, S. Lele and J. P. Gauthier



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J. Appl. Cryst. (1987). 20, 90-101    [doi:10.1107/S0021889887087077]

Optics of curved-crystal neutron spectrometers. I. Three-axis spectrometers

M. Popovici, A. D. Stoica and I. Ionitã



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J. Appl. Cryst. (1987). 20, 102-104    [doi:10.1107/S0021889887087065]

Crystal chemistry and thermoelectric properties of Gd2Te3

J. S. Swinnea, H. Steinfink and L. R. Danielson



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J. Appl. Cryst. (1987). 20, 105-110    [doi:10.1107/S0021889887087053]

Three-isotopic-substitutions method in small-angle neutron scattering

M. Y. Pavlov and I. N. Serdyuk



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J. Appl. Cryst. (1987). 20, 111-116    [doi:10.1107/S0021889887087041]

Imperfections in (Ga1-xAlxAs)n1-(GaAs)n2/GaAs supperlattices as observed by X-ray diffraction techniques

J. F. Petroff, M. Sauvage-Simkin, S. Bensoussan, B. Capelle, P. Auvray and M. Baudet



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J. Appl. Cryst. (1987). 20, 117-119    [doi:10.1107/S002188988708703X]

Single-crystal time-of-flight neutron diffraction of Cr3Si and MnF2 comparison with monochromatic-beam techniques

W. Jauch, A. J. Schultz and G. Heger



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J. Appl. Cryst. (1987). 20, 120-122    [doi:10.1107/S0021889887087028]

Determination of the neutron absorption cross section for hydrogen as a function of wavelength with a pulsed neutron source

J. A. K. Howard, O. Johnson, A. J. Schultz and A. M. Stringer



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J. Appl. Cryst. (1987). 20, 123-129    [doi:10.1107/S0021889887087016]

Structure determination by use of pattern decomposition and the Rietveld method on synchrotron X-ray and neutron powder data; the structures of Al2Y4O9 and T2O4

M. S. Lehmann, A. N. Christensen, H. Fjellvåg, R. Feidenhans'l and M. Nielsen


short communications



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J. Appl. Cryst. (1987). 20, 130-132    [doi:10.1107/S0021889887087004]

Greatly reduced radiation damage in ribonuclease crystals mounted on glass fibers

J. C. Dewan and R. F. Tilton


crystal data



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J. Appl. Cryst. (1987). 20, 133    [doi:10.1107/S0021889887086990]

Caractérisation du dihydro-9,10 anthracène par analyse X sur poudres

C. Caranoni et J. P. Reboul



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J. Appl. Cryst. (1987). 20, 133    [doi:10.1107/S0021889887086989]

Crystal data for 14 fluorides LnMoF7 (Ln=lanthanide)

J. Angenault, J. C. Couturier, Y. Mary and M. Quarton


computer programs



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J. Appl. Cryst. (1987). 20, 134-139    [doi:10.1107/S0021889887086977]

UNISOFT - a program package for lattice-dynamical calculations

G. Eckold, M. Stein-Arsic and H. J. Weber



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J. Appl. Cryst. (1987). 20, 139-143    [doi:10.1107/S0021889887086965]

STRUCTURE TIDY - a computer program to standardize crystal structure data

L. M. Gelato and E. Parthé


laboratory notes



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J. Appl. Cryst. (1987). 20, 144    [doi:10.1107/S0021889887086953]

X-ray diffraction using combined film and microprocessor techniques

E. J. Samuelsen


crystallographers



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J. Appl. Cryst. (1987). 20, 144-145    [doi:10.1107/S0021889887086941]

Crystallographers


new commercial products



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J. Appl. Cryst. (1987). 20, 145    [doi:10.1107/S002188988708693X]

New Commercial Products


book reviews



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J. Appl. Cryst. (1987). 20, 145-146    [doi:10.1107/S0021889887086928]

Kristallstruktur und chemische Bindung by A. Weiss and H. Witte


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