Journal of Applied Crystallography

Volume 20, Part 2 (April 1987)

research papers
short communications
crystal data
computer programs
laboratory notes
crystallographers
new commercial products
book reviews

research papers

J. Appl. Cryst. (1987). 20, 61-78 [doi:10.1107/S0021889887087107]

Scattering from fractals

J. E. Martin and A. J. Hurd

J. Appl. Cryst. (1987). 20, 79-83 [doi:10.1107/S0021889887087090]

Rietveld refinement of Debye-Scherrer synchrotron X-ray data from Al₂O₃

P. Thompson, D. E. Cox and J. B. Hastings

J. Appl. Cryst. (1987). 20, 84-89 [doi:10.1107/S0021889887087089]

Measurement of intensity of directionally diffuse streaks on a four-circle diffractometer: divergence correction factors for bisecting setting

D. Pandey, L. Prasad, S. Lele and J. P. Gauthier

J. Appl. Cryst. (1987). 20, 90-101 [doi:10.1107/S0021889887087077]

Optics of curved-crystal neutron spectrometers. I. Three-axis spectrometers

M. Popovici, A. D. Stoica and I. Ionitã

J. Appl. Cryst. (1987). 20, 102-104 [doi:10.1107/S0021889887087065]

Crystal chemistry and thermoelectric properties of Gd₂Te₃

J. S. Swinnea, H. Steinfink and L. R. Danielson

J. Appl. Cryst. (1987). 20, 105-110 [doi:10.1107/S0021889887087053]

Three-isotopic-substitutions method in small-angle neutron scattering

M. Y. Pavlov and I. N. Serdyuk

J. Appl. Cryst. (1987). 20, 111-116 [doi:10.1107/S0021889887087041]

Imperfections in (Ga_1-xAl_xAs)n₁-(GaAs)n₂/GaAs supperlattices as observed by X-ray diffraction techniques

J. F. Petroff, M. Sauvage-Simkin, S. Bensoussan, B. Capelle, P. Auvray and M. Baudet

J. Appl. Cryst. (1987). 20, 117-119 [doi:10.1107/S002188988708703X]

Single-crystal time-of-flight neutron diffraction of Cr₃Si and MnF₂ comparison with monochromatic-beam techniques

W. Jauch, A. J. Schultz and G. Heger

J. Appl. Cryst. (1987). 20, 120-122 [doi:10.1107/S0021889887087028]

Determination of the neutron absorption cross section for hydrogen as a function of wavelength with a pulsed neutron source

J. A. K. Howard, O. Johnson, A. J. Schultz and A. M. Stringer

J. Appl. Cryst. (1987). 20, 123-129 [doi:10.1107/S0021889887087016]

Structure determination by use of pattern decomposition and the Rietveld method on synchrotron X-ray and neutron powder data; the structures of Al₂Y₄O₉ and T₂O₄

M. S. Lehmann, A. N. Christensen, H. Fjellvåg, R. Feidenhans'l and M. Nielsen

short communications

J. Appl. Cryst. (1987). 20, 130-132 [doi:10.1107/S0021889887087004]

Greatly reduced radiation damage in ribonuclease crystals mounted on glass fibers

J. C. Dewan and R. F. Tilton

crystal data

J. Appl. Cryst. (1987). 20, 133 [doi:10.1107/S0021889887086990]

Caractérisation du dihydro-9,10 anthracène par analyse X sur poudres

C. Caranoni et J. P. Reboul

J. Appl. Cryst. (1987). 20, 133 [doi:10.1107/S0021889887086989]

Crystal data for 14 fluorides LnMoF₇ (Ln=lanthanide)

J. Angenault, J. C. Couturier, Y. Mary and M. Quarton

computer programs

J. Appl. Cryst. (1987). 20, 134-139 [doi:10.1107/S0021889887086977]

UNISOFT - a program package for lattice-dynamical calculations

G. Eckold, M. Stein-Arsic and H. J. Weber

J. Appl. Cryst. (1987). 20, 139-143 [doi:10.1107/S0021889887086965]

STRUCTURE TIDY - a computer program to standardize crystal structure data

L. M. Gelato and E. Parthé

laboratory notes

J. Appl. Cryst. (1987). 20, 144 [doi:10.1107/S0021889887086953]

X-ray diffraction using combined film and microprocessor techniques

E. J. Samuelsen

crystallographers

J. Appl. Cryst. (1987). 20, 144-145 [doi:10.1107/S0021889887086941]

Crystallographers

new commercial products

J. Appl. Cryst. (1987). 20, 145 [doi:10.1107/S002188988708693X]

New Commercial Products

book reviews

J. Appl. Cryst. (1987). 20, 145-146 [doi:10.1107/S0021889887086928]