Journal of Applied Crystallography

Volume 20, Part 3 (June 1987)



research papers



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J. Appl. Cryst. (1987). 20, 147-160    [doi:10.1107/S0021889887086916]

Reflection electron microscopy

K. Yagi



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J. Appl. Cryst. (1987). 20, 161-165    [doi:10.1107/S0021889887086904]

On the estimation of the unit-cell volume from powder diffraction data

W. Paszkowicz



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J. Appl. Cryst. (1987). 20, 166-172    [doi:10.1107/S0021889887086898]

Application of optimization to powder-pattern indexing

W. Paszkowicz



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J. Appl. Cryst. (1987). 20, 173-178    [doi:10.1107/S0021889887086886]

A powder diffractometer for a synchrotron source

T. M. Sabine



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J. Appl. Cryst. (1987). 20, 179-181    [doi:10.1107/S0021889887086874]

The primitive function for slit-height desmearing in SAXS

M. Deutsch and M. Luban



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J. Appl. Cryst. (1987). 20, 182-186    [doi:10.1107/S0021889887086862]

Intensity expression for short-range-order diffuse scattering with ordering energies in a ternary alloy system

S. Hashimoto



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J. Appl. Cryst. (1987). 20, 187-190    [doi:10.1107/S0021889887086850]

The distribution of carbon among interstitial sites of the f.c.c. iron-alloy lattice

G. Mazzone



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J. Appl. Cryst. (1987). 20, 191-194    [doi:10.1107/S0021889887086849]

Layer-disordered wurtzite (ZnS-2H): diffuse X-ray scattering recorded by c-axis precession photography

M. E. Fleet



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J. Appl. Cryst. (1987). 20, 195-199    [doi:10.1107/S0021889887086837]

A high-pressure single-crystal X-ray diffraction study of V3O5 including the phase transition at 6.2 GPa

S. Åsbrink and M. Malinowski



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J. Appl. Cryst. (1987). 20, 200-209    [doi:10.1107/S0021889887086825]

Resolution corrections in diffuse scattering experiments

H. Boysen and W. Adlhart



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J. Appl. Cryst. (1987). 20, 210-221    [doi:10.1107/S0021889887086813]

Buerger precession camera and overall characterization of thin films and flat-plate crystals

J.-L. Staudenmann, R. D. Horning and R. D. Knox



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J. Appl. Cryst. (1987). 20, 222-229    [doi:10.1107/S0021889887086801]

Sensitivity of X-ray diffractometry for strain depth profiling in III-V heterostructures

S. Bensoussan, C. Malgrange and M. Sauvage-Simkin



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J. Appl. Cryst. (1987). 20, 230-234    [doi:10.1107/S0021889887086795]

X-ray diffraction evidence for transient composition effects in MOVPE multilayer growth for Ga1-xAlxAs alloys

S. Bensoussan, C. Malgrange, M. Sauvage-Simkin, K. N'Guessan and P. Gibart



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J. Appl. Cryst. (1987). 20, 235-242    [doi:10.1107/S0021889887086783]

A system for collection and on-line integration of X-ray diffraction data from a multiwire area detector

M. Blum, P. Metcalf, S. C. Harrison and D. C. Wiley



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J. Appl. Cryst. (1987). 20, 243-245    [doi:10.1107/S0021889887086771]

A simple method of absorption and decay correction in intensities measured by area-detector X-ray diffractometer

F. Takusagawa



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J. Appl. Cryst. (1987). 20, 246-255    [doi:10.1107/S002188988708676X]

A computer-based method of measuring the integrated intensities of the reflections on the X-ray diffraction photograph of an oriented crystalline polymer

I. H. Hall, J. Z. Neisser and M. Elder


short communications



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J. Appl. Cryst. (1987). 20, 256-258    [doi:10.1107/S0021889887086758]

Expressions for first and second derivatives in least-squares refinements including extinction

M. A. Spackman



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J. Appl. Cryst. (1987). 20, 258-259    [doi:10.1107/S0021889887086746]

Lorentz-polarization factor for correction of diffraction-line profiles

W. Yinghua



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J. Appl. Cryst. (1987). 20, 260-261    [doi:10.1107/S0021889887086734]

Matrix formulation of the iterative method of phase analysis

M. Cernanský


computer programs



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J. Appl. Cryst. (1987). 20, 261-264    [doi:10.1107/S0021889887086722]

An automated full-symmetry Patterson search method

J. Rius and C. Miravitlles



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J. Appl. Cryst. (1987). 20, 264-269    [doi:10.1107/S0021889887086710]

Computer derivation of the symmetry elements implied in a structure description

Y. Le Page



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J. Appl. Cryst. (1987). 20, 269-270    [doi:10.1107/S0021889887086709]

IMAGE, an interactive computer program for the visualization of molecular structures

C. Nayl, L. Lazzerini and M. Pierrot


crystallographers



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J. Appl. Cryst. (1987). 20, 271    [doi:10.1107/S0021889887086692]

Crystallographers


new commercial products



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J. Appl. Cryst. (1987). 20, 271-272    [doi:10.1107/S0021889887086680]

New Commercial Products


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