Journal of Applied Crystallography
Volume 20, Part 4 (August 1987)
J. Appl. Cryst. (1987). 20, 273-279 [doi:10.1107/S0021889887086679]
Resolution of time-of-flight small-angle neutron diffractometers
R. P. Hjelm Jnr
J. Appl. Cryst. (1987). 20, 280-288 [doi:10.1107/S0021889887086667]
Optical transforms of disordered systems displaying diffuse intensity loci
T. R. Welberry and R. L. Withers
J. Appl. Cryst. (1987). 20, 289-294 [doi:10.1107/S0021889887086655]
A method for checking X-ray diffractometer stability and its application
G. V. Fetisov and V. T. Markov
J. Appl. Cryst. (1987). 20, 295-299 [doi:10.1107/S0021889887086643]
The information available from anomalous scattering on fibres at different wavelengths
C. Nave
J. Appl. Cryst. (1987). 20, 300-305 [doi:10.1107/S0021889887086631]
The structure of Pt particles on
-Al2O3 support
M. Pan, J. M. Cowley and I. Y. Chan
J. Appl. Cryst. (1987). 20, 306-315 [doi:10.1107/S002188988708662X]
Crystal orientation and X-ray pattern prediction routines for area-detector diffractometer systems in macromolecular crystallography
A. Messerschmidt and J. W. Pflugrath
J. Appl. Cryst. (1987). 20, 316-319 [doi:10.1107/S0021889887086618]
The probabilistic determination of intensities of completely overlapping reflections in powder diffraction patterns
W. I. F. David
J. Appl. Cryst. (1987). 20, 319-320 [doi:10.1107/S0021889887086606]
Cell volumes of LaPO4-CePO4 solid solutions
R. S. de Biasi, A. A. R. Fernandes and J. C. S. Oliveira
J. Appl. Cryst. (1987). 20, 320-322 [doi:10.1107/S002188988708659X]
Rietveld refinement of 3CaO.Al2O3.6H2O
L. Smrcok
J. Appl. Cryst. (1987). 20, 323 [doi:10.1107/S0021889887086588]
Crystal data for ternary compounds of the system Cu-As2Se3
C. A. Majid and M. A. Hussain
J. Appl. Cryst. (1987). 20, 324 [doi:10.1107/S0021889887086576]
EDDA - program for predicting energy-dispersive powder diffraction spectra
L. Gerward and J. Staun Olsen
J. Appl. Cryst. (1987). 20, 324-325 [doi:10.1107/S0021889887086564]
Crystallographers
J. Appl. Cryst. (1987). 20, 325 [doi:10.1107/S0021889887086552]
The Ewald Prize
J. Appl. Cryst. (1987). 20, 325-326 [doi:10.1107/S0021889887086540]
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