Journal of Applied Crystallography

Volume 20, Part 5 (October 1987)



research papers



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J. Appl. Cryst. (1987). 20, 327-329    [doi:10.1107/S0021889887086539]

SAXS study of the porous fractal structure of tricalcium silicate dry gels

A. F. Craievich



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J. Appl. Cryst. (1987). 20, 330-337    [doi:10.1107/S0021889887086527]

Angle calculations for a five-circle diffractometer used for surface X-ray diffraction

E. Vlieg, J. F. Van der Veen, J. E. Macdonald and M. Miller



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J. Appl. Cryst. (1987). 20, 338-343    [doi:10.1107/S0021889887086515]

Determination of the orientation of a randomly placed crystal from a single oscillation photograph

G. Vriend and M. G. Rossmann



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J. Appl. Cryst. (1987). 20, 344-348    [doi:10.1107/S0021889887086503]

Equi-lattice-spacing mapping X-ray topography

T. Ishikawa, T. Kitano and J. Matsui



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J. Appl. Cryst. (1987). 20, 349-355    [doi:10.1107/S0021889887086497]

X-ray scattering from a Troponin C solution and its interpretation with a dumbbell-shaped-molecule model

T. Fujisawa, T. Ueki, Y. Inoko and M. Kataoka



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J. Appl. Cryst. (1987). 20, 356-361    [doi:10.1107/S0021889887086485]

The use of the Durbin-Watson d statistic in Rietveld analysis

R. J. Hill and H. D. Flack



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J. Appl. Cryst. (1987). 20, 362-365    [doi:10.1107/S0021889887086473]

Solvent background subtraction for small-angle neutron scattering from samples in aqueous solution

P. H. Stothart



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J. Appl. Cryst. (1987). 20, 366-373    [doi:10.1107/S0021889887086461]

Experiments with automated protein crystallization

M. J. Cox and P. C. Weber



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J. Appl. Cryst. (1987). 20, 374-378    [doi:10.1107/S002188988708645X]

Application of X-ray diffraction topography with a monochromatic divergent beam to the study of distorted crystals

M. Polcarová and J. Brádler



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J. Appl. Cryst. (1987). 20, 379-382    [doi:10.1107/S0021889887086448]

A diamond-anvil high-pressure cell for X-ray diffraction on a single crystal

M. Malinowski



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J. Appl. Cryst. (1987). 20, 383-387    [doi:10.1107/S0021889887086436]

The use of an imaging proportional counter in macromolecular crystallography

A. J. Howard, G. L. Gilliland, B. C. Finzel, T. L. Poulos, D. H. Ohlendorf and F. R. Salemme



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J. Appl. Cryst. (1987). 20, 388-393    [doi:10.1107/S0021889887086424]

A vector-averaging method for locating small differences between nearly identical protein structures

I. T. Weber



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J. Appl. Cryst. (1987). 20, 394-401    [doi:10.1107/S0021889887086412]

Refinement of simple crystal structures from synchrotron radiation powder diffraction data

G. Will, N. Masciocchi, W. Parrish and M. Hart



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J. Appl. Cryst. (1987). 20, 402-405    [doi:10.1107/S0021889887086400]

On the treatment of superimposed powder reflections: application to neutron diffraction analysis of membrane proteins

W. Jauch



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J. Appl. Cryst. (1987). 20, 406-410    [doi:10.1107/S0021889887086394]

Synchrotron-radiation study of phase transitions in phosphorus at high pressures and temperatures

T. Kikegawa, H. Iwasaki, T. Fujimura, S. Endo, Y. Akahama, T. Akai, O. Shimomura, T. Yagi, S. Akimoto and I. Shirotani



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J. Appl. Cryst. (1987). 20, 411-418    [doi:10.1107/S0021889887086382]

Rietveld analysis of powder patterns obtained by TOF neutron diffraction using cold neutron sources

F. Izumi, H. Asano, H. Murata and N. Watanabe



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J. Appl. Cryst. (1987). 20, 419-424    [doi:10.1107/S0021889887086370]

Resolution of small-angle scattering with Soller collimation

D. F. R. Mildner and J. M. Carpenter


short communications



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J. Appl. Cryst. (1987). 20, 425-427    [doi:10.1107/S0021889887086369]

Determination of the crystal symmetry of two Al-Fe-Si phases by convergent-beam electron diffraction

P. Liu and G. L. Dunlop



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J. Appl. Cryst. (1987). 20, 427-428    [doi:10.1107/S0021889887086357]

Data averaging with normal down-weighting of outliers

R. H. Blessing and D. A. Langs



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J. Appl. Cryst. (1987). 20, 428-430    [doi:10.1107/S0021889887086345]

An experimental test of an elastically bent silicon crystal as a thermal-neutron monochromator

P. Mikula, P. Lukás and R. Michalec


computer programs



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J. Appl. Cryst. (1987). 20, 430-436    [doi:10.1107/S0021889887086333]

Diffraction peak shapes: a profile refinement method for badly resolved powder diagrams

V. Tran and A. Buléon



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J. Appl. Cryst. (1987). 20, 436-439    [doi:10.1107/S0021889887086321]

CRYSRULER, an integrated system of computer programs for crystal structure analysis on personal computers

C. Rizzoli, V. Sangermano, G. Calestani and G. D. Andreetti



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J. Appl. Cryst. (1987). 20, 439-440    [doi:10.1107/S002188988708631X]

A computer program for the evaluation of orientation relationships from simple electron-diffraction spot patterns

W. Prantl



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J. Appl. Cryst. (1987). 20, 440-441    [doi:10.1107/S0021889887086308]

A computer program for trace analyses in transmission electron microscopy

W. Prantl



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J. Appl. Cryst. (1987). 20, 442-444    [doi:10.1107/S0021889887086291]

The multislice program for use on a PC-style desktop computer

D. F. Lynch and L. C. Qin


laboratory notes



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J. Appl. Cryst. (1987). 20, 445    [doi:10.1107/S002188988708628X]

A miniature Peltier-effect goniometer-head attachment

U. W. Arndt and S. J. Stubbings


computer program abstracts



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J. Appl. Cryst. (1987). 20, 445-446    [doi:10.1107/S0021889887086278]

EASY-REFINE, X-ray powder diffraction refinement program

J. L. Gautier, S. Zapata and J. Ortiz


crystallographers



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J. Appl. Cryst. (1987). 20, 446-447    [doi:10.1107/S0021889887086266]

Crystallographers


new commercial products



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J. Appl. Cryst. (1987). 20, 447-449    [doi:10.1107/S0021889887086254]

New Commercial Products


book reviews



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J. Appl. Cryst. (1987). 20, 449-450    [doi:10.1107/S0021889887086242]

Tunable solid-state lasers II edited by A. B. Budgor, L. Esterowitz and L. G. De Shazer


books received



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J. Appl. Cryst. (1987). 20, 450    [doi:10.1107/S0021889887086230]

Recent advances in X-ray characterisation of materials edited by P. Krishna


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