Journal of Applied Crystallography

Volume 20, Part 6 (December 1987)



obituaries



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J. Appl. Cryst. (1987). 20, 451-452    [doi:10.1107/S0021889887085984]

Louis de Broglie, 1892-1987

A. Guinier


research papers



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J. Appl. Cryst. (1987). 20, 453-456    [doi:10.1107/S0021889887086229]

Correction of integrated X-ray intensities for preferred orientation in quantitative phase analysis

V. Valvoda



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J. Appl. Cryst. (1987). 20, 457-460    [doi:10.1107/S0021889887086217]

A standardless X-ray diffraction method for the quantitative analysis of multiphase mixtures

J. Rius, F. Plana and A. Palanques



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J. Appl. Cryst. (1987). 20, 461-466    [doi:10.1107/S0021889887086205]

A method for analyzing powder patterns of phases of low symmetry

L. S. Bartell and J. C. Caillat



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J. Appl. Cryst. (1987). 20, 467-474    [doi:10.1107/S0021889887086199]

Quantitative phase analysis from neutron powder diffraction data using the Rietveld method

R. J. Hill and C. J. Howard



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J. Appl. Cryst. (1987). 20, 475-478    [doi:10.1107/S0021889887086187]

Coupled neutron - [gamma]-ray diffraction: a method for accurate measurement of strains. Application to the study of the ferroelectric phase transition of KH2PO4

P. Bastie, F. Troussaut, M. Vallade and C. M. E. Zeyen



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J. Appl. Cryst. (1987). 20, 479-487    [doi:10.1107/S0021889887086175]

Residual stress analysis using overlapping diffraction peaks. Case of textured cubic materials

C. M. Brakman



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J. Appl. Cryst. (1987). 20, 488-490    [doi:10.1107/S0021889887086163]

A toolkit for computational molecular biology. III. MICRYFON - a (fairly) general program for input of protein coordinate files

A. M. Lesk



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J. Appl. Cryst. (1987). 20, 491-498    [doi:10.1107/S0021889887086151]

Etude de la structure d'une multicouche synthétique par la méthode de diffraction par dispersion d'énergie des rayons X

J. C. Malaurent, H. Duval et A. Fert



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J. Appl. Cryst. (1987). 20, 499-504    [doi:10.1107/S002188988708614X]

X-ray topographic study of dislocation around indents on {111} surfaces of indium antimonide

M. R. Surowiec and B. K. Tanner



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J. Appl. Cryst. (1987). 20, 505-506    [doi:10.1107/S0021889887086138]

Electron microscope study of superconductor YBa2Cu3O6+[delta]

K. Lukaszewicz, J. Stepién-Damm, R. Horyn, Z. Bukowski and M. Kowalski



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J. Appl. Cryst. (1987). 20, 507-511    [doi:10.1107/S0021889887086126]

A global approach to the n-dimensional traveling salesman problem: application to the optimization of crystallographic data collection

J. B. Weinrach and D. W. Bennett



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J. Appl. Cryst. (1987). 20, 512-516    [doi:10.1107/S0021889887086114]

A synchrotron radiation study of modulated [(CH3)4N]2ZnCl4 crystals

A. El-Korashy, K. J. Roberts, T. Scheffen-Lauenroth and B. Dam



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J. Appl. Cryst. (1987). 20, 517-521    [doi:10.1107/S0021889887086102]

Experiences with a new translation-function program

M. Fujinaga and R. J. Read



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J. Appl. Cryst. (1987). 20, 522-528    [doi:10.1107/S0021889887086096]

X-ray diffraction with a four-reflection monochromator

S. E. G. Slusky and A. T. Macrander


short communications



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J. Appl. Cryst. (1987). 20, 529    [doi:10.1107/S0021889887086084]

On the estimation of the unit-cell volume from powder diffraction data. Erratum

W. Paszkowicz



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J. Appl. Cryst. (1987). 20, 530-532    [doi:10.1107/S0021889887086072]

X-ray powder spectroscopy to determine easy axis in colloidal magnetic particles

E. Briggs and A. C. Nunes


computer program abstracts



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J. Appl. Cryst. (1987). 20, 532-535    [doi:10.1107/S0021889887086060]

TABLES, a program to display space-group symmetry information in three dimensions

C. Abad-Zapatero and T. J. O'Donnell


crystallographers



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J. Appl. Cryst. (1987). 20, 536    [doi:10.1107/S0021889887086059]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1987). 20, 536-537    [doi:10.1107/S0021889887085972]

Prices of Acta Crystallographica and Journal of Applied Crystallography



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J. Appl. Cryst. (1987). 20, 537    [doi:10.1107/S0021889887085960]

Commission on Powder Diffraction


notes and news



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J. Appl. Cryst. (1987). 20, 537-538    [doi:10.1107/S0021889887086047]

Standard Crystallographic File Structure-87


new commercial products



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J. Appl. Cryst. (1987). 20, 538    [doi:10.1107/S0021889887086035]

New Commercial products


J. Appl. Cryst. (1987). 20, 539-543

Subject index to volume 20 (1987)


J. Appl. Cryst. (1987). 20, 544-547

Author index to volume 20 (1987)


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