Journal of Applied Crystallography
Volume 21, Part 1 (February 1988)
J. Appl. Cryst. (1988). 21, 1-4 [doi:10.1107/S0021889887008148]
Four-circle angle calculations for surface diffraction
S. G. J. Mochrie
J. Appl. Cryst. (1988). 21, 4-10 [doi:10.1107/S0021889887008173]
A fixture for X-ray crystallographic studies of biomolecules under high gas pressure
R. F. Tilton Jnr
J. Appl. Cryst. (1988). 21, 10-15 [doi:10.1107/S0021889887008185]
The tensor of compositional deformation. A new crystallographic way to analyse syncrystallization
N. B. Chanh, J. Clastre, J. Gaultier, Y. Haget, A. Meresse, J. Lajzerowicz, A. Filhol and M. Thomas
J. Appl. Cryst. (1988). 21, 15-22 [doi:10.1107/S0021889887008239]
X-ray absorption spectroscopy in the dispersive mode with synchrotron radiation: optical considerations
H. Tolentino, E. Dartyge, A. Fontaine and G. Tourillon
J. Appl. Cryst. (1988). 21, 22-28 [doi:10.1107/S0021889887008331]
Simultaneous structure refinement of neutron, synchrotron and X-ray powder diffraction patterns
J. K. Maichle, J. Ihringer and W. Prandl
J. Appl. Cryst. (1988). 21, 28-33 [doi:10.1107/S0021889887008343]
A position-sensitive detector for neutron diffraction topography
J. Baruchel, K. Kuroda, P. Liaud, A. Michalowicz and D. Sillou
J. Appl. Cryst. (1988). 21, 33-38 [doi:10.1107/S0021889887008653]
A new version of a medium-resolution double-crystal diffractometer for the study of small-angle neutron scattering (SANS)
P. Mikula, P. Lukás and F. Eichhorn
J. Appl. Cryst. (1988). 21, 38-41 [doi:10.1107/S0021889887008860]
The effect of sample position on the determination of triaxial stress by X-ray diffraction
R. H. Fenn and A. M. Jones
J. Appl. Cryst. (1988). 21, 41-47 [doi:10.1107/S0021889887008975]
X-ray determination of static displacements of atoms in alloyed Ni3Al
M. Morinaga, K. Sone, T. Kamimura, K. Ohtaka and N. Yukawa
J. Appl. Cryst. (1988). 21, 47-54 [doi:10.1107/S0021889887009178]
Asymmetric X-ray line broadening of plastically deformed crystals. I. Theory
I. Groma, T. Ungár and M. Wilkens
J. Appl. Cryst. (1988). 21, 54-59 [doi:10.1107/S0021889887009579]
Mirror and Bragg reflections of neutrons at a nuclear resonance
C. M. Batigun and R. M. Brugger
J. Appl. Cryst. (1988). 21, 59-66 [doi:10.1107/S0021889887009580]
X-ray diffraction line broadening due to dislocations in non-cubic materials. I. General considerations and the case of elastic isotropy applied to hexagonal crystals
P. Klimanek and R. Kuzel Jnr
J. Appl. Cryst. (1988). 21, 67-72 [doi:10.1107/S0021889887009737]
Automatic indexing of rotation diffraction patterns
W. Kabsch
J. Appl. Cryst. (1988). 21, 72-74 [doi:10.1107/S0021889887008197]
Evidence of a single-q incommensurate phase in quartz by synchrotron X-ray diffraction
A. Zarka, B. Capelle, M. Petit, G. Dolino, P. Bastie and B. Berge
J. Appl. Cryst. (1988). 21, 74-75 [doi:10.1107/S0021889887010070]
New crystal data (neutron) for phase II rubidium nitrate at 513 K
M. Shamsuzzoha and B. W. Lucas
J. Appl. Cryst. (1988). 21, 75 [doi:10.1107/S0021889887008665]
MOLDRAW - program for the graphical manipulation of molecules on personal computers
P. Ugliengo, G. Borzani and D. Viterbo
J. Appl. Cryst. (1988). 21, 75-76 [doi:10.1107/S0021889887011671]
Crystallographers
J. Appl. Cryst. (1988). 21, 76 [doi:10.1107/S0021889888099777]
Publish your Crystallographic Computer Programs
J. Appl. Cryst. (1988). 21, 76-78 [doi:10.1107/S0021889888099765]
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