Journal of Applied Crystallography

Volume 21, Part 1 (February 1988)



research papers



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J. Appl. Cryst. (1988). 21, 1-4    [doi:10.1107/S0021889887008148]

Four-circle angle calculations for surface diffraction

S. G. J. Mochrie



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J. Appl. Cryst. (1988). 21, 4-10    [doi:10.1107/S0021889887008173]

A fixture for X-ray crystallographic studies of biomolecules under high gas pressure

R. F. Tilton Jnr



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J. Appl. Cryst. (1988). 21, 10-15    [doi:10.1107/S0021889887008185]

The tensor of compositional deformation. A new crystallographic way to analyse syncrystallization

N. B. Chanh, J. Clastre, J. Gaultier, Y. Haget, A. Meresse, J. Lajzerowicz, A. Filhol and M. Thomas



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J. Appl. Cryst. (1988). 21, 15-22    [doi:10.1107/S0021889887008239]

X-ray absorption spectroscopy in the dispersive mode with synchrotron radiation: optical considerations

H. Tolentino, E. Dartyge, A. Fontaine and G. Tourillon



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J. Appl. Cryst. (1988). 21, 22-28    [doi:10.1107/S0021889887008331]

Simultaneous structure refinement of neutron, synchrotron and X-ray powder diffraction patterns

J. K. Maichle, J. Ihringer and W. Prandl



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J. Appl. Cryst. (1988). 21, 28-33    [doi:10.1107/S0021889887008343]

A position-sensitive detector for neutron diffraction topography

J. Baruchel, K. Kuroda, P. Liaud, A. Michalowicz and D. Sillou



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J. Appl. Cryst. (1988). 21, 33-38    [doi:10.1107/S0021889887008653]

A new version of a medium-resolution double-crystal diffractometer for the study of small-angle neutron scattering (SANS)

P. Mikula, P. Lukás and F. Eichhorn



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J. Appl. Cryst. (1988). 21, 38-41    [doi:10.1107/S0021889887008860]

The effect of sample position on the determination of triaxial stress by X-ray diffraction

R. H. Fenn and A. M. Jones



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J. Appl. Cryst. (1988). 21, 41-47    [doi:10.1107/S0021889887008975]

X-ray determination of static displacements of atoms in alloyed Ni3Al

M. Morinaga, K. Sone, T. Kamimura, K. Ohtaka and N. Yukawa



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J. Appl. Cryst. (1988). 21, 47-54    [doi:10.1107/S0021889887009178]

Asymmetric X-ray line broadening of plastically deformed crystals. I. Theory

I. Groma, T. Ungár and M. Wilkens



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J. Appl. Cryst. (1988). 21, 54-59    [doi:10.1107/S0021889887009579]

Mirror and Bragg reflections of neutrons at a nuclear resonance

C. M. Batigun and R. M. Brugger



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J. Appl. Cryst. (1988). 21, 59-66    [doi:10.1107/S0021889887009580]

X-ray diffraction line broadening due to dislocations in non-cubic materials. I. General considerations and the case of elastic isotropy applied to hexagonal crystals

P. Klimanek and R. Kuzel Jnr



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J. Appl. Cryst. (1988). 21, 67-72    [doi:10.1107/S0021889887009737]

Automatic indexing of rotation diffraction patterns

W. Kabsch


short communications



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J. Appl. Cryst. (1988). 21, 72-74    [doi:10.1107/S0021889887008197]

Evidence of a single-q incommensurate phase in quartz by synchrotron X-ray diffraction

A. Zarka, B. Capelle, M. Petit, G. Dolino, P. Bastie and B. Berge


crystal data



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J. Appl. Cryst. (1988). 21, 74-75    [doi:10.1107/S0021889887010070]

New crystal data (neutron) for phase II rubidium nitrate at 513 K

M. Shamsuzzoha and B. W. Lucas


computer program abstracts



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J. Appl. Cryst. (1988). 21, 75    [doi:10.1107/S0021889887008665]

MOLDRAW - program for the graphical manipulation of molecules on personal computers

P. Ugliengo, G. Borzani and D. Viterbo


crystallographers



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J. Appl. Cryst. (1988). 21, 75-76    [doi:10.1107/S0021889887011671]

Crystallographers


notes and news



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J. Appl. Cryst. (1988). 21, 76    [doi:10.1107/S0021889888099777]

Publish your Crystallographic Computer Programs


new commercial products



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J. Appl. Cryst. (1988). 21, 76-78    [doi:10.1107/S0021889888099765]

New Commercial Products


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