Journal of Applied Crystallography

Volume 21, Part 3 (June 1988)



research papers



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J. Appl. Cryst. (1988). 21, 213-217    [doi:10.1107/S0021889888000421]

The three-dimensional dynamic DuMond diagram for X-ray diffraction analysis of nearly perfect crystals

S. Xu and R. Li



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J. Appl. Cryst. (1988). 21, 218-223    [doi:10.1107/S0021889887011841]

Analysis of single- and double-crystal spectrometers using three-dimensional DuMond diagrams and the high-precision measurement of the Cu K[alpha]1 line profile

S. Xu, J. Chen and R. Li



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J. Appl. Cryst. (1988). 21, 224-227    [doi:10.1107/S0021889888000603]

Determination of crystal structures with large known fragments directly from measured X-ray powder diffraction intensities

J. Rius and C. Miravitlles



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J. Appl. Cryst. (1988). 21, 228-239    [doi:10.1107/S0021889888001013]

Profile fitting and the two-stage method in neutron powder diffractometry for structure and texture analysis

E. Jansen, W. Schäfer and G. Will



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J. Appl. Cryst. (1988). 21, 240-244    [doi:10.1107/S0021889888001025]

Investigation of (Ga,In)(As,P)/InP single heterostructures by means of extremely asymmetrical Bragg diffraction using synchrotron radiation

H.-G. Brühl, U. Pietsch and B. Lengeler



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J. Appl. Cryst. (1988). 21, 245-251    [doi:10.1107/S0021889888000779]

Precise relative X-ray measurement of the lattice parameter of silicon crystals with growth striations

J. Kubena and V. Holý



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J. Appl. Cryst. (1988). 21, 252-257    [doi:10.1107/S0021889888001177]

High-resolution X-ray diffraction studies of multilayers

F. E. Christensen, A. Hornstrup and H. W. Schnopper



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J. Appl. Cryst. (1988). 21, 258-265    [doi:10.1107/S0021889888001293]

Interpretation of bent-crystal rocking curves

M. Popovici, A. D. Stoica, B. Chalupa and P. Mikula



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J. Appl. Cryst. (1988). 21, 266-271    [doi:10.1107/S0021889888002134]

Time-resolved powder diffraction as an analytical tool for diffusion studies in microporous topologies

B. F. Mentzen


short communications



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J. Appl. Cryst. (1988). 21, 272-273    [doi:10.1107/S0021889888001463]

A novel method of mounting a protein crystal on a surface perpendicular to the X-ray capillary

M. Przybylska


computer programs



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J. Appl. Cryst. (1988). 21, 273-278    [doi:10.1107/S0021889887012299]

MERLOT, an integrated package of computer programs for the determination of crystal structures by molecular replacement

P. M. D. Fitzgerald



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J. Appl. Cryst. (1988). 21, 279-281    [doi:10.1107/S0021889887012755]

Calculation of an OMIT map

T. N. Bhat


laboratory notes



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J. Appl. Cryst. (1988). 21, 282    [doi:10.1107/S0021889888000433]

A backlash-free high-precision rotation stage based on flexure strips

R. Cathie and S. Janky


computer program abstracts



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J. Appl. Cryst. (1988). 21, 282-283    [doi:10.1107/S002188988800192X]

ENDIX - a program to simulate energy-dispersive X-ray powder diffraction diagrams

E. Hovestreydt, E. Parthé and U. Benedict


crystallographers



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J. Appl. Cryst. (1988). 21, 283-284    [doi:10.1107/S0021889888002675]

Crystallographers


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