Journal of Applied Crystallography
Volume 21, Part 4 (August 1988)
J. Appl. Cryst. (1988). 21, 285-304 [doi:10.1107/S0021889888000275]
Some basic concepts of texture analysis and comparison of three methods to calculate orientation distributions from pole figures
S. Matthies, H.-R. Wenk and G. W. Vinel
J. Appl. Cryst. (1988). 21, 305-310 [doi:10.1107/S0021889888002092]
The ab initio structure determination of Sigma-2 (a new clathrasil phase) from synchrotron powder diffraction data
L. McCusker
J. Appl. Cryst. (1988). 21, 311-316 [doi:10.1107/S0021889888002316]
Statistical treatment of measured orientation relationships in orientation space
E. Werner and W. Prantl
J. Appl. Cryst. (1988). 21, 317-321 [doi:10.1107/S002188988800247X]
Determination of specific volumes in multilayers by anomalous X-ray scattering
J. P. Simon, O. Lyon, A. Bruson, G. Marchal and M. Piecuch
J. Appl. Cryst. (1988). 21, 322-325 [doi:10.1107/S0021889888002547]
Sampling-theorem expressions in membrane diffraction
C. R. Worthington
J. Appl. Cryst. (1988). 21, 326-329 [doi:10.1107/S0021889888002614]
A new X-ray topographic defect contrast on swept quartz crystals
M. T. Sebastian, A. Zarka and B. Capelle
J. Appl. Cryst. (1988). 21, 330-339 [doi:10.1107/S0021889888002821]
The 6 m point-focusing small-angle X-ray scattering camera at the high-intensity X-ray laboratory of Kyoto University
H. Hayashi, F. Hamada, S. Suehiro, N. Masaki, T. Ogawa and H. Miyaji
J. Appl. Cryst. (1988). 21, 340-348 [doi:10.1107/S0021889888002948]
Determination of and the effect of heat treatment on the ![[chi]](/logos/entities/chi_rmgif.gif)
parameter of 18R1 martensite in Cu-Zn-Al alloys
J. Gui, R. Wang and Y. Zhao
J. Appl. Cryst. (1988). 21, 349-354 [doi:10.1107/S0021889888003024]
Exploitation of the Fourier chopper in neutron diffractometry at pulsed sources
P. Hiismäki, H. Pöyry and A. Tiitta
J. Appl. Cryst. (1988). 21, 355-362 [doi:10.1107/S002188988800319X]
Structural information on proteins obtainable from small-angle X-ray scattering with heavy-atom labeling. Application to solubilized bacteriorhodopsin
M. Kataoka, M. Nakasako and F. Tokunaga
J. Appl. Cryst. (1988). 21, 363-368 [doi:10.1107/S002188988800336X]
X-ray diffraction line broadening due to dislocations in non-cubic materials. II. The case of elastic anisotropy applied to hexagonal crystals
R. Kuzel Jnr and P. Klimanek
J. Appl. Cryst. (1988). 21, 369-371 [doi:10.1107/S0021889888002304]
Feasibility of running the dynamical HREM multislice program on a 16-bit minicomputer
X. Zeng, Y. Wang and Z. Jing
J. Appl. Cryst. (1988). 21, 371-372 [doi:10.1107/S0021889888002390]
A Fortran program for anisotropic scaling
T.-H. Lu, T.-S. Young and S.-H. Kim
J. Appl. Cryst. (1988). 21, 373-379 [doi:10.1107/S0021889888002651]
Calculation of small-angle scattering from models for surfactant systems
I. S. Barnes and T. N. Zemb
J. Appl. Cryst. (1988). 21, 380 [doi:10.1107/S002188988800281X]
CRYSPLANES - description of the bounding faces of a polyhedral crystal
N. W. Alcock and M. Pennington
J. Appl. Cryst. (1988). 21, 380-381 [doi:10.1107/S0021889888005655]
Crystallographers
J. Appl. Cryst. (1988). 21, 381 [doi:10.1107/S002188988809973X]
Synchrotron Radiation News
J. Appl. Cryst. (1988). 21, 381-382 [doi:10.1107/S0021889888003656]
Computer program for calculation of interface structures
J. Appl. Cryst. (1988). 21, 382 [doi:10.1107/S0021889888006053]
The Kathleen Lonsdale Lecture
J. Appl. Cryst. (1988). 21, 382 [doi:10.1107/S0021889888099728]
New Commercial Products
J. Appl. Cryst. (1988). 21, 383-384 [doi:10.1107/S0021889887010756]
Gem and crystal treasures by P. Bancroft
J. Appl. Cryst. (1988). 21, 384 [doi:10.1107/S0021889888001244]
Quartz by M. O'Donohue
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