Journal of Applied Crystallography
Volume 21, Part 5 (October 1988)
J. Appl. Cryst. (1988). 21, 385 [doi:10.1107/S0021889888008258]
Mauritius Renninger, 1905-1987
H. Burzlaff and P. Buck
J. Appl. Cryst. (1988). 21, 386-392 [doi:10.1107/S0021889888003188]
Investigation of the compositional depth profile in epitaxial submicrometer layers of AIIIBV heterostructures
T. Baumbach, H.-G. Brühl, H. Rhan and U. Pietsch
J. Appl. Cryst. (1988). 21, 393-397 [doi:10.1107/S0021889888003371]
A texture correction for quantitative X-ray powder diffraction analysis of cellulose
T. Paakkari, M. Blomberg, R. Serimaa and M. Järvinen
J. Appl. Cryst. (1988). 21, 398-405 [doi:10.1107/S0021889888003474]
Effect of divergence and receiving slit dimensions on peak profile parameters in Rietveld analysis of X-ray diffractometer data
I. C. Madsen and R. J. Hill
J. Appl. Cryst. (1988). 21, 406-415 [doi:10.1107/S002188988800408X]
Synchrotron Laue topography studies of pseudo-hexagonal twinning
R. Docherty, A. El-Korashy, H.-D. Jennissen, H. Klapper, K. J. Roberts and T. Scheffen-Lauenroth
J. Appl. Cryst. (1988). 21, 416-425 [doi:10.1107/S0021889888004091]
Bimodal distributions of profile-broadening effects in Rietveld refinement
R. A. Young and A. Sakthivel
J. Appl. Cryst. (1988). 21, 426-429 [doi:10.1107/S0021889888004108]
The transfer of protein crystals from their original mother liquor to a solution with a completely different precipitant
H. A. Schreuder, H. Groendijk, J. M. van der Laan and R. K. Wierenga
J. Appl. Cryst. (1988). 21, 430-437 [doi:10.1107/S002188988800411X]
Peak shape and resolution in conventional diffractometry with monochromatic X-rays
D. Louër and J. I. Langford
J. Appl. Cryst. (1988). 21, 438-451 [doi:10.1107/S0021889888004273]
Instrumental resolution effects in small-angle neutron scattering
G. D. Wignall, D. K. Christen and V. Ramakrishnan
J. Appl. Cryst. (1988). 21, 452-457 [doi:10.1107/S0021889888004625]
Synchrotron X-ray and neutron powder diffraction studies of the structure of
-CrPO4
J. P. Attfield, A. K. Cheetham, D. E. Cox and A. W. Sleight
J. Appl. Cryst. (1988). 21, 458-465 [doi:10.1107/S0021889888004637]
An electron diffraction and lattice-dynamical study of the diffuse scattering in
-cristobalite, SiO2
G. L. Hua, T. R. Welberry, R. L. Withers and J. G. Thompson
J. Appl. Cryst. (1988). 21, 466-470 [doi:10.1107/S0021889888005345]
A transportable surface-science chamber for glancing-angle X-ray diffraction
P. Zschack, J. B. Cohen and Y. W. Chung
J. Appl. Cryst. (1988). 21, 471-478 [doi:10.1107/S0021889888005400]
Integration of single-crystal reflections using area multidetectors
C. Wilkinson, H. W. Khamis, R. F. D. Stansfield and G. J. McIntyre
J. Appl. Cryst. (1988). 21, 479-484 [doi:10.1107/S0021889888005503]
Evaluation of the systematic errors of polarimetric measurements: application to measurements of the gyration tensors of
-quartz by the HAUP
J. Kobayashi, T. Asahi, S. Takahashi and A. M. Glazer
J. Appl. Cryst. (1988). 21, 485-489 [doi:10.1107/S0021889888005618]
Information in powder pattern indexing
D. Taupin
J. Appl. Cryst. (1988). 21, 490-495 [doi:10.1107/S002188988800562X]
A phased translation function
R. J. Read and A. J. Schierbeek
J. Appl. Cryst. (1988). 21, 496-503 [doi:10.1107/S0021889888005643]
Principles of differential energy-dispersive X-ray spectroscopy (DEDXS)
C. S. G. Cousins
J. Appl. Cryst. (1988). 21, 504-511 [doi:10.1107/S0021889888005758]
Nuclear and magnetic diffuse scattering of neutrons from
-ferrous oxalate dihydrate
I. Sledzinska and A. Murasik
J. Appl. Cryst. (1988). 21, 512-515 [doi:10.1107/S0021889888005813]
Use of a shared-memory parallel processor in the restrained least-squares procedure of Hendrickson and Konnert
K. N. Pillai, B. W. Suter and M. Carson
J. Appl. Cryst. (1988). 21, 516-520 [doi:10.1107/S0021889888006120]
High-energy double-crystal X-ray diffraction
V. Holý, S. Cummings and M. Hart
J. Appl. Cryst. (1988). 21, 521-523 [doi:10.1107/S0021889888006314]
Rationale of a quick adjustment method for crystal orientation in oscillation photography
I.-H. Suh, J.-M. Suh, T.-S. Ko, K. Aoki and H. Yamazaki
J. Appl. Cryst. (1988). 21, 524-529 [doi:10.1107/S0021889888006569]
Interface roughness and period variations in MQW structures determined by X-ray diffraction
P. F. Fewster
J. Appl. Cryst. (1988). 21, 530-535 [doi:10.1107/S0021889888006648]
A modification of the de Wolff figure of merit for reliability of powder pattern indexing
E. Wu
J. Appl. Cryst. (1988). 21, 536-542 [doi:10.1107/S0021889888006612]
A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology
S. Enzo, G. Fagherazzi, A. Benedetti and S. Polizzi
J. Appl. Cryst. (1988). 21, 543-549 [doi:10.1107/S0021889888006624]
A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. II. Application and discussion of the methodology
A. Benedetti, G. Fagherazzi, S. Enzo and M. Battagliarin
J. Appl. Cryst. (1988). 21, 550-557 [doi:10.1107/S0021889888006764]
Smearing effects in `pinhole' collimation with one-dimensional detection
R. A. Register and S. L. Cooper
J. Appl. Cryst. (1988). 21, 558-561 [doi:10.1107/S0021889888007034]
K-edge anomalous scattering in zinc tartrate hydrate
L. K. Templeton and D. H. Templeton
J. Appl. Cryst. (1988). 21, 562-568 [doi:10.1107/S0021889888007083]
Irradiation-induced texture variations and atomic displacements in Au and NbN layers
V. Jung
J. Appl. Cryst. (1988). 21, 569-570 [doi:10.1107/S0021889888005886]
Elimination of dispersive line broadening due to a second-axis crystal with an (n, -n, n) diffraction
spectrometer
R. C. Buschert and A. E. Merlini
J. Appl. Cryst. (1988). 21, 571-572 [doi:10.1107/S0021889888005394]
Developments in the MITHRIL direct methods program
C. J. Gilmore and S. R. Brown
J. Appl. Cryst. (1988). 21, 572-576 [doi:10.1107/S0021889888005746]
RIBBON: a stereo cartoon drawing program for proteins
J. P. Priestle
J. Appl. Cryst. (1988). 21, 577 [doi:10.1107/S0021889888006132]
Miniature ionization chambers
U. W. Arndt and S. J. Stubbings
J. Appl. Cryst. (1988). 21, 578 [doi:10.1107/S0021889888005825]
BSRIBBON - program for producing 3D ribbon models of macromolecules suitable for interactive graphics display
M. Carson and C. E. Bugg
J. Appl. Cryst. (1988). 21, 578-579 [doi:10.1107/S002188988800490X]
LEPAGE - an MS-DOS program for the determination of the metrical symmetry of a translation lattice
A. L. Spek
J. Appl. Cryst. (1988). 21, 579 [doi:10.1107/S0021889888009926]
Crystallographers
J. Appl. Cryst. (1988). 21, 579 [doi:10.1107/S0021889888099716]
Acta A - a new look for 1989
J. Appl. Cryst. (1988). 21, 579-580 [doi:10.1107/S0021889888099704]
New Commercial Products
J. Appl. Cryst. (1988). 21, 580 [doi:10.1107/S0021889888006296]
Organic solid state chemistry edited by G. R. Desiraju
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