Journal of Applied Crystallography

Volume 21, Part 5 (October 1988)



obituaries



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J. Appl. Cryst. (1988). 21, 385    [doi:10.1107/S0021889888008258]

Mauritius Renninger, 1905-1987

H. Burzlaff and P. Buck


research papers



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J. Appl. Cryst. (1988). 21, 386-392    [doi:10.1107/S0021889888003188]

Investigation of the compositional depth profile in epitaxial submicrometer layers of AIIIBV heterostructures

T. Baumbach, H.-G. Brühl, H. Rhan and U. Pietsch



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J. Appl. Cryst. (1988). 21, 393-397    [doi:10.1107/S0021889888003371]

A texture correction for quantitative X-ray powder diffraction analysis of cellulose

T. Paakkari, M. Blomberg, R. Serimaa and M. Järvinen



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J. Appl. Cryst. (1988). 21, 398-405    [doi:10.1107/S0021889888003474]

Effect of divergence and receiving slit dimensions on peak profile parameters in Rietveld analysis of X-ray diffractometer data

I. C. Madsen and R. J. Hill



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J. Appl. Cryst. (1988). 21, 406-415    [doi:10.1107/S002188988800408X]

Synchrotron Laue topography studies of pseudo-hexagonal twinning

R. Docherty, A. El-Korashy, H.-D. Jennissen, H. Klapper, K. J. Roberts and T. Scheffen-Lauenroth



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J. Appl. Cryst. (1988). 21, 416-425    [doi:10.1107/S0021889888004091]

Bimodal distributions of profile-broadening effects in Rietveld refinement

R. A. Young and A. Sakthivel



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J. Appl. Cryst. (1988). 21, 426-429    [doi:10.1107/S0021889888004108]

The transfer of protein crystals from their original mother liquor to a solution with a completely different precipitant

H. A. Schreuder, H. Groendijk, J. M. van der Laan and R. K. Wierenga



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J. Appl. Cryst. (1988). 21, 430-437    [doi:10.1107/S002188988800411X]

Peak shape and resolution in conventional diffractometry with monochromatic X-rays

D. Louër and J. I. Langford



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J. Appl. Cryst. (1988). 21, 438-451    [doi:10.1107/S0021889888004273]

Instrumental resolution effects in small-angle neutron scattering

G. D. Wignall, D. K. Christen and V. Ramakrishnan



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J. Appl. Cryst. (1988). 21, 452-457    [doi:10.1107/S0021889888004625]

Synchrotron X-ray and neutron powder diffraction studies of the structure of [alpha]-CrPO4

J. P. Attfield, A. K. Cheetham, D. E. Cox and A. W. Sleight



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J. Appl. Cryst. (1988). 21, 458-465    [doi:10.1107/S0021889888004637]

An electron diffraction and lattice-dynamical study of the diffuse scattering in [beta]-cristobalite, SiO2

G. L. Hua, T. R. Welberry, R. L. Withers and J. G. Thompson



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J. Appl. Cryst. (1988). 21, 466-470    [doi:10.1107/S0021889888005345]

A transportable surface-science chamber for glancing-angle X-ray diffraction

P. Zschack, J. B. Cohen and Y. W. Chung



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J. Appl. Cryst. (1988). 21, 471-478    [doi:10.1107/S0021889888005400]

Integration of single-crystal reflections using area multidetectors

C. Wilkinson, H. W. Khamis, R. F. D. Stansfield and G. J. McIntyre



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J. Appl. Cryst. (1988). 21, 479-484    [doi:10.1107/S0021889888005503]

Evaluation of the systematic errors of polarimetric measurements: application to measurements of the gyration tensors of [alpha]-quartz by the HAUP

J. Kobayashi, T. Asahi, S. Takahashi and A. M. Glazer



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J. Appl. Cryst. (1988). 21, 485-489    [doi:10.1107/S0021889888005618]

Information in powder pattern indexing

D. Taupin



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J. Appl. Cryst. (1988). 21, 490-495    [doi:10.1107/S002188988800562X]

A phased translation function

R. J. Read and A. J. Schierbeek



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J. Appl. Cryst. (1988). 21, 496-503    [doi:10.1107/S0021889888005643]

Principles of differential energy-dispersive X-ray spectroscopy (DEDXS)

C. S. G. Cousins



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J. Appl. Cryst. (1988). 21, 504-511    [doi:10.1107/S0021889888005758]

Nuclear and magnetic diffuse scattering of neutrons from [beta]-ferrous oxalate dihydrate

I. Sledzinska and A. Murasik



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J. Appl. Cryst. (1988). 21, 512-515    [doi:10.1107/S0021889888005813]

Use of a shared-memory parallel processor in the restrained least-squares procedure of Hendrickson and Konnert

K. N. Pillai, B. W. Suter and M. Carson



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J. Appl. Cryst. (1988). 21, 516-520    [doi:10.1107/S0021889888006120]

High-energy double-crystal X-ray diffraction

V. Holý, S. Cummings and M. Hart



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J. Appl. Cryst. (1988). 21, 521-523    [doi:10.1107/S0021889888006314]

Rationale of a quick adjustment method for crystal orientation in oscillation photography

I.-H. Suh, J.-M. Suh, T.-S. Ko, K. Aoki and H. Yamazaki



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J. Appl. Cryst. (1988). 21, 524-529    [doi:10.1107/S0021889888006569]

Interface roughness and period variations in MQW structures determined by X-ray diffraction

P. F. Fewster



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J. Appl. Cryst. (1988). 21, 530-535    [doi:10.1107/S0021889888006648]

A modification of the de Wolff figure of merit for reliability of powder pattern indexing

E. Wu



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J. Appl. Cryst. (1988). 21, 536-542    [doi:10.1107/S0021889888006612]

A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology

S. Enzo, G. Fagherazzi, A. Benedetti and S. Polizzi



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J. Appl. Cryst. (1988). 21, 543-549    [doi:10.1107/S0021889888006624]

A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. II. Application and discussion of the methodology

A. Benedetti, G. Fagherazzi, S. Enzo and M. Battagliarin



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J. Appl. Cryst. (1988). 21, 550-557    [doi:10.1107/S0021889888006764]

Smearing effects in `pinhole' collimation with one-dimensional detection

R. A. Register and S. L. Cooper



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J. Appl. Cryst. (1988). 21, 558-561    [doi:10.1107/S0021889888007034]

K-edge anomalous scattering in zinc tartrate hydrate

L. K. Templeton and D. H. Templeton



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J. Appl. Cryst. (1988). 21, 562-568    [doi:10.1107/S0021889888007083]

Irradiation-induced texture variations and atomic displacements in Au and NbN layers

V. Jung


short communications



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J. Appl. Cryst. (1988). 21, 569-570    [doi:10.1107/S0021889888005886]

Elimination of dispersive line broadening due to a second-axis crystal with an (n, -n, n) diffraction spectrometer

R. C. Buschert and A. E. Merlini


computer programs



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J. Appl. Cryst. (1988). 21, 571-572    [doi:10.1107/S0021889888005394]

Developments in the MITHRIL direct methods program

C. J. Gilmore and S. R. Brown



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J. Appl. Cryst. (1988). 21, 572-576    [doi:10.1107/S0021889888005746]

RIBBON: a stereo cartoon drawing program for proteins

J. P. Priestle


laboratory notes



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J. Appl. Cryst. (1988). 21, 577    [doi:10.1107/S0021889888006132]

Miniature ionization chambers

U. W. Arndt and S. J. Stubbings


computer program abstracts



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J. Appl. Cryst. (1988). 21, 578    [doi:10.1107/S0021889888005825]

BSRIBBON - program for producing 3D ribbon models of macromolecules suitable for interactive graphics display

M. Carson and C. E. Bugg



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J. Appl. Cryst. (1988). 21, 578-579    [doi:10.1107/S002188988800490X]

LEPAGE - an MS-DOS program for the determination of the metrical symmetry of a translation lattice

A. L. Spek


crystallographers



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J. Appl. Cryst. (1988). 21, 579    [doi:10.1107/S0021889888009926]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1988). 21, 579    [doi:10.1107/S0021889888099716]

Acta A - a new look for 1989


new commercial products



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J. Appl. Cryst. (1988). 21, 579-580    [doi:10.1107/S0021889888099704]

New Commercial Products


book reviews



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J. Appl. Cryst. (1988). 21, 580    [doi:10.1107/S0021889888006296]

Organic solid state chemistry edited by G. R. Desiraju


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