Journal of Applied Crystallography
Volume 22, Part 1 (February 1989)
J. Appl. Cryst. (1989). 22, 1-8 [doi:10.1107/S0021889888009550]
Testing the method of crystallographic refinement using molecular dynamics
M. Fujinaga, P. Gros and W. F. van Gunsteren
J. Appl. Cryst. (1989). 22, 9-18 [doi:10.1107/S0021889888009562]
The processing of diffraction data taken on a screenless Weissenberg camera for macromolecular crystallography
T. Higashi
J. Appl. Cryst. (1989). 22, 19-22 [doi:10.1107/S0021889888009057]
Some computer drawings of molecular and solid-state structures
E. Keller
J. Appl. Cryst. (1989). 22, 23-25 [doi:10.1107/S0021889888009574]
Critical temperatures of superconductivity and neutron diffraction studies at 293 and at 10 K of molybdenum-iridium single crystals of A15 structure
R. Koksbang, S. E. Rasmussen and R. G. Hazell
J. Appl. Cryst. (1989). 22, 26-34 [doi:10.1107/S0021889888009720]
Asymmetric X-ray line broadening of plastically deformed crystals. II. Evaluation procedure and application to [001]-Cu crystals
T. Ungár, I. Groma and M. Wilkens
J. Appl. Cryst. (1989). 22, 35-41 [doi:10.1107/S0021889888010003]
Discrete thin-film multilayer design for X-ray and neutron supermirrors
J. B. Hayter and H. A. Mook
J. Appl. Cryst. (1989). 22, 42-45 [doi:10.1107/S002188988801060X]
An X-ray diffractometer for studying the effect of external fields on the structure and electron distribution of single crystals
L. A. Aslanov, V. A. Trunov, G. V. Fetisov, V. A. Priemyshev, V. B. Rybakov, Ya. A. Kasman and A. P. Bulkin
J. Appl. Cryst. (1989). 22, 46-52 [doi:10.1107/S0021889888010817]
Mass attenuation coefficients of the elements Ti, V, Fe, Co, Ni, Cu and Zn for the K emission lines between 4.51 and 10.98 keV
L. Unonius and P. Suortti
J. Appl. Cryst. (1989). 22, 53-60 [doi:10.1107/S0021889888010878]
Auto-indexing oscillation photographs
S. Kim
J. Appl. Cryst. (1989). 22, 61-63 [doi:10.1107/S002188988801091X]
Crystal structure and the equation of state of thorium monophosphide for pressures up to 50 GPa
J. S. Olsen, L. Gerward, U. Benedict, H. Luo and O. Vogt
J. Appl. Cryst. (1989). 22, 64-69 [doi:10.1107/S0021889888011392]
A high-resolution multiple-crystal multiple-reflection diffractometer
P. F. Fewster
J. Appl. Cryst. (1989). 22, 70 [doi:10.1107/S002188988801386X]
Synchrotron X-ray and neutron powder diffraction studies of the structure of ![[alpha]](/logos/entities/alpha_rmgif.gif)
-CrPO4.
Erratum
J. P. Attfield, A. K. Cheetham, D. E. Cox and A. W. Sleight
J. Appl. Cryst. (1989). 22, 70 [doi:10.1107/S0021889888013871]
Developments in the MITHRIL direct methods program. Erratum
C. J. Gilmore and S. R. Brown
J. Appl. Cryst. (1989). 22, 70-72 [doi:10.1107/S0021889888009847]
A multiple-slit collimator for synchrotron white-beam section topography
S. R. Stock, Y. H. Chung and Z. U. Rek
J. Appl. Cryst. (1989). 22, 72-74 [doi:10.1107/S0021889888009963]
Rapid small-angle X-ray diffraction of a tonically contracting molluscan smooth muscle recorded with imaging plates
Y. Tajima, K. Okada, O. Yoshida, T. Seto and Y. Amemiya
J. Appl. Cryst. (1989). 22, 75 [doi:10.1107/S0021889888009872]
L'octadécanol-1: un composé étalon en diffraction aux petits angles
N. Nakamura, G. Gebel et P. Aldebert
J. Appl. Cryst. (1989). 22, 75 [doi:10.1107/S0021889888011173]
Controlling the Philips PW1100 diffractometer by an IBM-compatible personal computer
G. J. van Hummel and H. Graafsma
J. Appl. Cryst. (1989). 22, 76 [doi:10.1107/S0021889888011835]
A three-dimensional space-group model
C. H. L. Kennard
J. Appl. Cryst. (1989). 22, 76-77 [doi:10.1107/S0021889888012099]
Crystallographers
J. Appl. Cryst. (1989). 22, 77 [doi:10.1107/S0021889889099838]
Report on the IUCr Logo Design Contest
J. Appl. Cryst. (1989). 22, 77-78 [doi:10.1107/S0021889888013883]
European Microbeam Analysis Society
J. Appl. Cryst. (1989). 22, 78 [doi:10.1107/S0021889889099826]
New Commercial Products
Copyright © International Union of Crystallography
IUCr Webmaster