Journal of Applied Crystallography
Volume 22, Part 2 (April 1989)
J. Appl. Cryst. (1989). 22, 79-83 [doi:10.1107/S0021889888010015]
Background-filtered transmission diffraction with internal intensity calibration
P. Hiismäki
J. Appl. Cryst. (1989). 22, 84-86 [doi:10.1107/S0021889888010908]
A synchrotron radiation monochromator suppressing harmonics
W. Treimer and G. Hildebrandt
J. Appl. Cryst. (1989). 22, 87-95 [doi:10.1107/S0021889888011203]
An optical transform and Monte Carlo study of the disorder in
-cristobalite SiO2
T. R. Welberry, G. L. Hua and R. L. Withers
J. Appl. Cryst. (1989). 22, 96-99 [doi:10.1107/S0021889888011409]
Polytypism in a decagonal quasicrystalline Al-Co phase
J. Menon, C. Suryanarayana and G. Singh
J. Appl. Cryst. (1989). 22, 100-104 [doi:10.1107/S0021889888011410]
Localizing adsorption sites in zeolitic materials by X-ray powder diffraction: pyridine sorbed in B.ZSM-5
B. F. Mentzen
J. Appl. Cryst. (1989). 22, 105-109 [doi:10.1107/S0021889888011859]
Temperature dependence of spontaneous strain in ferroelastic thallous nitrate
M. S. Somayazulu and V. K. Wadhawan
J. Appl. Cryst. (1989). 22, 110-114 [doi:10.1107/S0021889888012257]
Integration of Bragg reflections with an Anger camera area detector
C. Wilkinson and A. J. Schultz
J. Appl. Cryst. (1989). 22, 115-118 [doi:10.1107/S0021889888012270]
A double cell for controlling nucleation and growth of protein crystals
M. Przybylska
J. Appl. Cryst. (1989). 22, 119-122 [doi:10.1107/S0021889888012336]
A high-pressure study of Ti3O5 by X-ray diffraction and synchrotron radiation. 1. Pressures up to 38.6 GPa
S. Åsbrink, L. Gerward and J. S. Olsen
J. Appl. Cryst. (1989). 22, 123-137 [doi:10.1107/S0021889888012348]
Calibration tests and use of a Nicolet/Xentronics imaging proportional chamber mounted on a conventional source for protein crystallography
Z. Derewenda and J. R. Helliwell
J. Appl. Cryst. (1989). 22, 138-143 [doi:10.1107/S002188988801297X]
Constructing rings of specified pucker
R. P. Millane and E. U. Nzewi
J. Appl. Cryst. (1989). 22, 144-149 [doi:10.1107/S0021889888013007]
Absolute configuration, polarity, morphology and optical activity of
-LiIO3
H.-g. Yang, D.-f. Zhang, W.-c. Chen and Y.-y. Li
J. Appl. Cryst. (1989). 22, 150-154 [doi:10.1107/S0021889888013214]
Layer thickness determinations with X-ray diffraction
D. E. Anderson and W. J. Thomson
J. Appl. Cryst. (1989). 22, 155-161 [doi:10.1107/S0021889888013433]
Changes of pH during biomacromolecule crystallization by vapor diffusion using ammonium sulfate as the precipitant
V. Mikol, J.-L. Rodeau and R. Giegé
J. Appl. Cryst. (1989). 22, 162-172 [doi:10.1107/S0021889888013603]
Diffractometer alignment and polarization determination of X-ray beams by means of the Borrmann effect
J.-L. Staudenmann and L. D. Chapman
J. Appl. Cryst. (1989). 22, 173-180 [doi:10.1107/S0021889888013913]
Structure refinement of an FeCl3 crystal using a thin plate sample
S. Hashimoto, K. Forster and S. C. Moss
J. Appl. Cryst. (1989). 22, 181-182 [doi:10.1107/S0021889888010532]
The heavy-atom method without Patterson. A symmetry sum function
F. Pavelcík
J. Appl. Cryst. (1989). 22, 182-183 [doi:10.1107/S0021889888011847]
Easy and economic ways of handling air-sensitive crystals for X-ray diffraction studies
Ch. P. Rao
J. Appl. Cryst. (1989). 22, 183-184 [doi:10.1107/S0021889889001421]
Rationale of a quick adjustment method for crystal orientation in oscillation photography. Erratum
I.-H. Suh, J.-M. Suh, T.-S. Ko, K. Aoki and H. Yamazaki
J. Appl. Cryst. (1989). 22, 184 [doi:10.1107/S0021889888014803]
A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology. Erratum
S. Enzo, G. Fagherazzi, A. Benedetti and S. Polizzi
J. Appl. Cryst. (1989). 22, 184-185 [doi:10.1107/S0021889888011185]
SWATAB, a program to obtain required tables for publication from SHELX76 final output
K. Swaminathan
J. Appl. Cryst. (1989). 22, 186 [doi:10.1107/S0021889889099814]
PLOTMD - an interactive program to modify molecular plots on a graphics terminal
J. Luo, H. L. Ammon and G. L. Gilliland
J. Appl. Cryst. (1989). 22, 186-187 [doi:10.1107/S0021889889099802]
INDEXING - program for indexing powder patterns of cubic, tetragonal, hexagonal and orthorhombic substances on personal computers
W. Paszkowicz
J. Appl. Cryst. (1989). 22, 187 [doi:10.1107/S002188988900141X]
Crystallographers
J. Appl. Cryst. (1989). 22, 187 [doi:10.1107/S0021889889099796]
Nominations for the Ewald Prize
J. Appl. Cryst. (1989). 22, 187-188 [doi:10.1107/S0021889889099784]
New Commercial Products
Copyright © International Union of Crystallography
IUCr Webmaster