Journal of Applied Crystallography

Volume 22, Part 2 (April 1989)



research papers



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J. Appl. Cryst. (1989). 22, 79-83    [doi:10.1107/S0021889888010015]

Background-filtered transmission diffraction with internal intensity calibration

P. Hiismäki



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J. Appl. Cryst. (1989). 22, 84-86    [doi:10.1107/S0021889888010908]

A synchrotron radiation monochromator suppressing harmonics

W. Treimer and G. Hildebrandt



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J. Appl. Cryst. (1989). 22, 87-95    [doi:10.1107/S0021889888011203]

An optical transform and Monte Carlo study of the disorder in [beta]-cristobalite SiO2

T. R. Welberry, G. L. Hua and R. L. Withers



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J. Appl. Cryst. (1989). 22, 96-99    [doi:10.1107/S0021889888011409]

Polytypism in a decagonal quasicrystalline Al-Co phase

J. Menon, C. Suryanarayana and G. Singh



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J. Appl. Cryst. (1989). 22, 100-104    [doi:10.1107/S0021889888011410]

Localizing adsorption sites in zeolitic materials by X-ray powder diffraction: pyridine sorbed in B.ZSM-5

B. F. Mentzen



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J. Appl. Cryst. (1989). 22, 105-109    [doi:10.1107/S0021889888011859]

Temperature dependence of spontaneous strain in ferroelastic thallous nitrate

M. S. Somayazulu and V. K. Wadhawan



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J. Appl. Cryst. (1989). 22, 110-114    [doi:10.1107/S0021889888012257]

Integration of Bragg reflections with an Anger camera area detector

C. Wilkinson and A. J. Schultz



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J. Appl. Cryst. (1989). 22, 115-118    [doi:10.1107/S0021889888012270]

A double cell for controlling nucleation and growth of protein crystals

M. Przybylska



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J. Appl. Cryst. (1989). 22, 119-122    [doi:10.1107/S0021889888012336]

A high-pressure study of Ti3O5 by X-ray diffraction and synchrotron radiation. 1. Pressures up to 38.6 GPa

S. Åsbrink, L. Gerward and J. S. Olsen



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J. Appl. Cryst. (1989). 22, 123-137    [doi:10.1107/S0021889888012348]

Calibration tests and use of a Nicolet/Xentronics imaging proportional chamber mounted on a conventional source for protein crystallography

Z. Derewenda and J. R. Helliwell



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J. Appl. Cryst. (1989). 22, 138-143    [doi:10.1107/S002188988801297X]

Constructing rings of specified pucker

R. P. Millane and E. U. Nzewi



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J. Appl. Cryst. (1989). 22, 144-149    [doi:10.1107/S0021889888013007]

Absolute configuration, polarity, morphology and optical activity of [alpha]-LiIO3

H.-g. Yang, D.-f. Zhang, W.-c. Chen and Y.-y. Li



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J. Appl. Cryst. (1989). 22, 150-154    [doi:10.1107/S0021889888013214]

Layer thickness determinations with X-ray diffraction

D. E. Anderson and W. J. Thomson



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J. Appl. Cryst. (1989). 22, 155-161    [doi:10.1107/S0021889888013433]

Changes of pH during biomacromolecule crystallization by vapor diffusion using ammonium sulfate as the precipitant

V. Mikol, J.-L. Rodeau and R. Giegé



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J. Appl. Cryst. (1989). 22, 162-172    [doi:10.1107/S0021889888013603]

Diffractometer alignment and polarization determination of X-ray beams by means of the Borrmann effect

J.-L. Staudenmann and L. D. Chapman



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J. Appl. Cryst. (1989). 22, 173-180    [doi:10.1107/S0021889888013913]

Structure refinement of an FeCl3 crystal using a thin plate sample

S. Hashimoto, K. Forster and S. C. Moss


short communications



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J. Appl. Cryst. (1989). 22, 181-182    [doi:10.1107/S0021889888010532]

The heavy-atom method without Patterson. A symmetry sum function

F. Pavelcík



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J. Appl. Cryst. (1989). 22, 182-183    [doi:10.1107/S0021889888011847]

Easy and economic ways of handling air-sensitive crystals for X-ray diffraction studies

Ch. P. Rao



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J. Appl. Cryst. (1989). 22, 183-184    [doi:10.1107/S0021889889001421]

Rationale of a quick adjustment method for crystal orientation in oscillation photography. Erratum

I.-H. Suh, J.-M. Suh, T.-S. Ko, K. Aoki and H. Yamazaki



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J. Appl. Cryst. (1989). 22, 184    [doi:10.1107/S0021889888014803]

A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology. Erratum

S. Enzo, G. Fagherazzi, A. Benedetti and S. Polizzi


computer programs



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J. Appl. Cryst. (1989). 22, 184-185    [doi:10.1107/S0021889888011185]

SWATAB, a program to obtain required tables for publication from SHELX76 final output

K. Swaminathan



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J. Appl. Cryst. (1989). 22, 186    [doi:10.1107/S0021889889099814]

PLOTMD - an interactive program to modify molecular plots on a graphics terminal

J. Luo, H. L. Ammon and G. L. Gilliland



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J. Appl. Cryst. (1989). 22, 186-187    [doi:10.1107/S0021889889099802]

INDEXING - program for indexing powder patterns of cubic, tetragonal, hexagonal and orthorhombic substances on personal computers

W. Paszkowicz


crystallographers



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J. Appl. Cryst. (1989). 22, 187    [doi:10.1107/S002188988900141X]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1989). 22, 187    [doi:10.1107/S0021889889099796]

Nominations for the Ewald Prize


new commercial products



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J. Appl. Cryst. (1989). 22, 187-188    [doi:10.1107/S0021889889099784]

New Commercial Products


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