Journal of Applied Crystallography

Volume 22, Part 3 (June 1989)



research papers



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J. Appl. Cryst. (1989). 22, 189-200    [doi:10.1107/S0021889888013342]

Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2

K. Z. Baba-Kishi and D. J. Dingley



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J. Appl. Cryst. (1989). 22, 201-204    [doi:10.1107/S0021889888013925]

The application of synchrotron radiation to X-ray multiple-diffraction studies

B. Brown, G. F. Clark, C. Dineen, B. J. Isherwood, E. Pantos, K. J. Roberts and T. Scheffen-Lauenroth



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J. Appl. Cryst. (1989). 22, 205-208    [doi:10.1107/S0021889888014025]

The influence of texture on the radial distribution function of solid carbons

Z. Kaszkur



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J. Appl. Cryst. (1989). 22, 209-215    [doi:10.1107/S0021889888014062]

A high-resolution diffuse X-ray scattering study of defects in dislocation-free silicon crystals grown by the float-zone method and comparison with Czochralski-grown crystals

K. Lal and G. Bhagavannarayana



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J. Appl. Cryst. (1989). 22, 216-221    [doi:10.1107/S0021889888014141]

On the selection of measurement directions in second-rank tensor (e.g. elastic strain) determination of single crystals

B. Ortner



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J. Appl. Cryst. (1989). 22, 222-230    [doi:10.1107/S0021889888014256]

Characterization of crystallites in carbon fibres by wide-angle X-ray diffraction

M. Shioya and A. Takaku



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J. Appl. Cryst. (1989). 22, 231-237    [doi:10.1107/S0021889888014281]

Distance information derived from neutron low-Q scattering

R. P. May and V. Nowotny



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J. Appl. Cryst. (1989). 22, 238-243    [doi:10.1107/S0021889888014487]

The use of direct convolution products in profile and pattern fitting algorithms. I. Development of algorithms

S. A. Howard and R. L. Snyder



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J. Appl. Cryst. (1989). 22, 244-251    [doi:10.1107/S0021889888014499]

The use of direct convolution products in profile and pattern fitting algorithms. II. Application of the algorithms

J. K. Yau and S. A. Howard



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J. Appl. Cryst. (1989). 22, 252-255    [doi:10.1107/S0021889888014736]

The effect of gravity on the resolution of small-angle neutron scattering

A. T. Boothroyd



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J. Appl. Cryst. (1989). 22, 256-260    [doi:10.1107/S002188988801430X]

The application of the Rietveld method to a highly strained material with microtwins: TiFeD1.9

P. Thompson, J. J. Reilly and J. M. Hastings



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J. Appl. Cryst. (1989). 22, 261-268    [doi:10.1107/S0021889889000725]

Correction for preferred orientation in Rietveld refinement

M. Ahtee, M. Nurmela, P. Suortti and M. Järvinen



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J. Appl. Cryst. (1989). 22, 269-276    [doi:10.1107/S0021889888014773]

Determination of epitaxic-layer composition and thickness by double-crystal X-ray diffraction

I. C. Bassignana and C. C. Tan



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J. Appl. Cryst. (1989). 22, 277-282    [doi:10.1107/S0021889889001494]

High-resolution electron microscopy on incommensurate long-period superstructures of hexagonal-close-packed Cu-Sb alloy

T. Onozuka, S. Kakehashi, T. Takahashi and M. Hirabayashi


short communications



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J. Appl. Cryst. (1989). 22, 283-284    [doi:10.1107/S0021889888013937]

Thermal-expansion coefficients of yttria-stabilized cubic zirconias

S. P. Terblanche



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J. Appl. Cryst. (1989). 22, 284-286    [doi:10.1107/S0021889889000518]

Dramatic increase in ferritin crystal lifetime with monochromatic synchrotron X-radiation tuned to a wavelength above the iron K absorption edge

J. M. A. Smith, D. W. Rice, J. L. White, G. C. Ford and P. M. Harrison


computer programs



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J. Appl. Cryst. (1989). 22, 287-293    [doi:10.1107/S0021889888014888]

LATTICEPATCH - an interactive graphics program to design data measurement strategies for area detectors

A. L. Klinger and R. H. Kretsinger


computer program abstracts



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J. Appl. Cryst. (1989). 22, 294    [doi:10.1107/S0021889888014785]

CFFT: a package of tools for Fourier analysis, written in C for UNIX machines

P. L. Bellon and S. Lanzavecchia



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J. Appl. Cryst. (1989). 22, 295    [doi:10.1107/S0021889889000506]

JOGGING2 - a second version enabling the extraction of the absorption from the X-ray reflectivity spectra

B. Poumellec and R. Cortés



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J. Appl. Cryst. (1989). 22, 295-296    [doi:10.1107/S0021889889001627]

IMAP - a program for manipulation and analysis of atomic positions for macromolecules using Tektronix compatible terminals

J. H. Everett, D. Groves and D. Prax


crystallographers



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J. Appl. Cryst. (1989). 22, 296-297    [doi:10.1107/S0021889889003936]

Crystallographers


new commercial products



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J. Appl. Cryst. (1989). 22, 297-298    [doi:10.1107/S0021889889004000]

New Commercial Products


books received



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J. Appl. Cryst. (1989). 22, 298    [doi:10.1107/S0021889889099772]

Thermotropic liquid crystals. (Critical reports on applied chemistry, Vol. 22.) edited by G. W. Gray


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