Journal of Applied Crystallography
Volume 22, Part 3 (June 1989)
J. Appl. Cryst. (1989). 22, 189-200 [doi:10.1107/S0021889888013342]
Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2
K. Z. Baba-Kishi and D. J. Dingley
J. Appl. Cryst. (1989). 22, 201-204 [doi:10.1107/S0021889888013925]
The application of synchrotron radiation to X-ray multiple-diffraction studies
B. Brown, G. F. Clark, C. Dineen, B. J. Isherwood, E. Pantos, K. J. Roberts and T. Scheffen-Lauenroth
J. Appl. Cryst. (1989). 22, 205-208 [doi:10.1107/S0021889888014025]
The influence of texture on the radial distribution function of solid carbons
Z. Kaszkur
J. Appl. Cryst. (1989). 22, 209-215 [doi:10.1107/S0021889888014062]
A high-resolution diffuse X-ray scattering study of defects in dislocation-free silicon crystals grown by the float-zone method and comparison with Czochralski-grown crystals
K. Lal and G. Bhagavannarayana
J. Appl. Cryst. (1989). 22, 216-221 [doi:10.1107/S0021889888014141]
On the selection of measurement directions in second-rank tensor (e.g. elastic strain) determination of single crystals
B. Ortner
J. Appl. Cryst. (1989). 22, 222-230 [doi:10.1107/S0021889888014256]
Characterization of crystallites in carbon fibres by wide-angle X-ray diffraction
M. Shioya and A. Takaku
J. Appl. Cryst. (1989). 22, 231-237 [doi:10.1107/S0021889888014281]
Distance information derived from neutron low-Q scattering
R. P. May and V. Nowotny
J. Appl. Cryst. (1989). 22, 238-243 [doi:10.1107/S0021889888014487]
The use of direct convolution products in profile and pattern fitting algorithms. I. Development of algorithms
S. A. Howard and R. L. Snyder
J. Appl. Cryst. (1989). 22, 244-251 [doi:10.1107/S0021889888014499]
The use of direct convolution products in profile and pattern fitting algorithms. II. Application of the algorithms
J. K. Yau and S. A. Howard
J. Appl. Cryst. (1989). 22, 252-255 [doi:10.1107/S0021889888014736]
The effect of gravity on the resolution of small-angle neutron scattering
A. T. Boothroyd
J. Appl. Cryst. (1989). 22, 256-260 [doi:10.1107/S002188988801430X]
The application of the Rietveld method to a highly strained material with microtwins: TiFeD1.9
P. Thompson, J. J. Reilly and J. M. Hastings
J. Appl. Cryst. (1989). 22, 261-268 [doi:10.1107/S0021889889000725]
Correction for preferred orientation in Rietveld refinement
M. Ahtee, M. Nurmela, P. Suortti and M. Järvinen
J. Appl. Cryst. (1989). 22, 269-276 [doi:10.1107/S0021889888014773]
Determination of epitaxic-layer composition and thickness by double-crystal X-ray diffraction
I. C. Bassignana and C. C. Tan
J. Appl. Cryst. (1989). 22, 277-282 [doi:10.1107/S0021889889001494]
High-resolution electron microscopy on incommensurate long-period superstructures of hexagonal-close-packed Cu-Sb alloy
T. Onozuka, S. Kakehashi, T. Takahashi and M. Hirabayashi
J. Appl. Cryst. (1989). 22, 283-284 [doi:10.1107/S0021889888013937]
Thermal-expansion coefficients of yttria-stabilized cubic zirconias
S. P. Terblanche
J. Appl. Cryst. (1989). 22, 284-286 [doi:10.1107/S0021889889000518]
Dramatic increase in ferritin crystal lifetime with monochromatic synchrotron X-radiation tuned to a wavelength above the iron K absorption edge
J. M. A. Smith, D. W. Rice, J. L. White, G. C. Ford and P. M. Harrison
J. Appl. Cryst. (1989). 22, 287-293 [doi:10.1107/S0021889888014888]
LATTICEPATCH - an interactive graphics program to design data measurement strategies for area detectors
A. L. Klinger and R. H. Kretsinger
J. Appl. Cryst. (1989). 22, 294 [doi:10.1107/S0021889888014785]
CFFT: a package of tools for Fourier analysis, written in C for UNIX machines
P. L. Bellon and S. Lanzavecchia
J. Appl. Cryst. (1989). 22, 295 [doi:10.1107/S0021889889000506]
JOGGING2 - a second version enabling the extraction of the absorption from the X-ray reflectivity spectra
B. Poumellec and R. Cortés
J. Appl. Cryst. (1989). 22, 295-296 [doi:10.1107/S0021889889001627]
IMAP - a program for manipulation and analysis of atomic positions for macromolecules using Tektronix compatible terminals
J. H. Everett, D. Groves and D. Prax
J. Appl. Cryst. (1989). 22, 296-297 [doi:10.1107/S0021889889003936]
Crystallographers
J. Appl. Cryst. (1989). 22, 297-298 [doi:10.1107/S0021889889004000]
New Commercial Products
J. Appl. Cryst. (1989). 22, 298 [doi:10.1107/S0021889889099772]
Thermotropic liquid crystals. (Critical reports on applied chemistry, Vol. 22.) edited by G. W. Gray
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