Journal of Applied Crystallography

Volume 23, Part 1 (February 1990)



research papers



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J. Appl. Cryst. (1990). 23, 1-5    [doi:10.1107/S0021889889008484]

Treatment of SANS data from hot stretched polystyrene chains

D. Bradford, B. Hammouda, R. A. Bubeck, J. R. Schroeder, C. J. Glinka and P. Thiyagarajan



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J. Appl. Cryst. (1990). 23, 6-10    [doi:10.1107/S0021889889009210]

The interpretation of powder diffraction patterns by numerical and computer-graphics systems

G. Berti, G. Di Guglielmo and Y. Marzoni Fecia Di Cossato



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J. Appl. Cryst. (1990). 23, 11-17    [doi:10.1107/S0021889889009283]

Multiple scattering of X-rays in the case of isotropic samples

R. Serimaa, T. Pitkänen, S. Vahvaselkä and T. Paakkari



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J. Appl. Cryst. (1990). 23, 18-20    [doi:10.1107/S002188988901023X]

K-edge anomalous scattering in rubidium hydrogen tartrate

L. K. Templeton and D. H. Templeton



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J. Appl. Cryst. (1990). 23, 21-25    [doi:10.1107/S0021889889010514]

Measurement of anisotropic diffuse scattering with synchrotron radiation

E. Rosshirt, F. Frey, V. Kupcik and G. Miehe



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J. Appl. Cryst. (1990). 23, 26-34    [doi:10.1107/S0021889889010526]

The highly resolved excess electron distance distribution of biopolymers in solution - calculation from intermediate-angle X-ray scattering and interpretation

J. J. Müller, G. Damaschun and H. Schrauber



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J. Appl. Cryst. (1990). 23, 35-42    [doi:10.1107/S0021889889010800]

X-ray reflectivity of bent perfect crystals in Bragg and Laue geometry

E. Erola, V. Eteläniemi, P. Suortti, P. Pattison and W. Thomlinson



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J. Appl. Cryst. (1990). 23, 43-54    [doi:10.1107/S002188988901085X]

Transmission electron microscope studies of phase transitions in single crystals and ceramics of ferroelectric Pb(Sc1/2Ta1/2)O3

K. Z. Baba-Kishi and D. J. Barber



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J. Appl. Cryst. (1990). 23, 55-62    [doi:10.1107/S0021889889011441]

High-resolution electron microscopic study on long-period superstructures with 6H stacking sequence in Au3Cd alloys

K. H. Lee, D. Shindo, K. Hiraga and M. Hirabayashi



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J. Appl. Cryst. (1990). 23, 63-69    [doi:10.1107/S0021889889011623]

A fast high-accuracy lattice-parameter comparator

D. Häusermann and M. Hart


short communications



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J. Appl. Cryst. (1990). 23, 70-71    [doi:10.1107/S0021889889010241]

Time modulation of small-angle neutron scattering in the longitudinally vibrating double-crystal system

R. Michalec and J. Saroun



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J. Appl. Cryst. (1990). 23, 71-73    [doi:10.1107/S0021889889010484]

Closed-form expressions for Fourier-Bessel transform of Slater-type functions

Z. Su and P. Coppens


computer programs



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J. Appl. Cryst. (1990). 23, 73-76    [doi:10.1107/S0021889889011386]

MINREF - a new computer program for neutron refinement of incommensurate multiphase nuclear and magnetic structures

O. Elsenhans


laboratory notes



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J. Appl. Cryst. (1990). 23, 77    [doi:10.1107/S0021889889011118]

A versatile new cryostat for obtaining X-ray diffuse intensity data from thin flat single crystals

Y. Kuroiwa, K. Ohshima and H. Maeta



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J. Appl. Cryst. (1990). 23, 77-78    [doi:10.1107/S0021889889011635]

Radiographic test of sample arrangement in synchrotron radiation

A. Lindegaard-Andersen


crystallographers



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J. Appl. Cryst. (1990). 23, 78    [doi:10.1107/S0021889889012264]

Crystallographers


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