Journal of Applied Crystallography

Volume 23, Part 1 (February 1990)

research papers
short communications
computer programs
laboratory notes
crystallographers

research papers

J. Appl. Cryst. (1990). 23, 1-5 [doi:10.1107/S0021889889008484]

Treatment of SANS data from hot stretched polystyrene chains

D. Bradford, B. Hammouda, R. A. Bubeck, J. R. Schroeder, C. J. Glinka and P. Thiyagarajan

J. Appl. Cryst. (1990). 23, 6-10 [doi:10.1107/S0021889889009210]

The interpretation of powder diffraction patterns by numerical and computer-graphics systems

G. Berti, G. Di Guglielmo and Y. Marzoni Fecia Di Cossato

J. Appl. Cryst. (1990). 23, 11-17 [doi:10.1107/S0021889889009283]

Multiple scattering of X-rays in the case of isotropic samples

R. Serimaa, T. Pitkänen, S. Vahvaselkä and T. Paakkari

J. Appl. Cryst. (1990). 23, 18-20 [doi:10.1107/S002188988901023X]

K-edge anomalous scattering in rubidium hydrogen tartrate

L. K. Templeton and D. H. Templeton

J. Appl. Cryst. (1990). 23, 21-25 [doi:10.1107/S0021889889010514]

Measurement of anisotropic diffuse scattering with synchrotron radiation

E. Rosshirt, F. Frey, V. Kupcik and G. Miehe

J. Appl. Cryst. (1990). 23, 26-34 [doi:10.1107/S0021889889010526]

The highly resolved excess electron distance distribution of biopolymers in solution - calculation from intermediate-angle X-ray scattering and interpretation

J. J. Müller, G. Damaschun and H. Schrauber

J. Appl. Cryst. (1990). 23, 35-42 [doi:10.1107/S0021889889010800]

X-ray reflectivity of bent perfect crystals in Bragg and Laue geometry

E. Erola, V. Eteläniemi, P. Suortti, P. Pattison and W. Thomlinson

J. Appl. Cryst. (1990). 23, 43-54 [doi:10.1107/S002188988901085X]

Transmission electron microscope studies of phase transitions in single crystals and ceramics of ferroelectric Pb(Sc_1/2Ta_1/2)O₃

K. Z. Baba-Kishi and D. J. Barber

J. Appl. Cryst. (1990). 23, 55-62 [doi:10.1107/S0021889889011441]

High-resolution electron microscopic study on long-period superstructures with 6H stacking sequence in Au₃Cd alloys

K. H. Lee, D. Shindo, K. Hiraga and M. Hirabayashi

J. Appl. Cryst. (1990). 23, 63-69 [doi:10.1107/S0021889889011623]

A fast high-accuracy lattice-parameter comparator

D. Häusermann and M. Hart

short communications

J. Appl. Cryst. (1990). 23, 70-71 [doi:10.1107/S0021889889010241]

Time modulation of small-angle neutron scattering in the longitudinally vibrating double-crystal system

R. Michalec and J. Saroun

J. Appl. Cryst. (1990). 23, 71-73 [doi:10.1107/S0021889889010484]

Closed-form expressions for Fourier-Bessel transform of Slater-type functions

Z. Su and P. Coppens

computer programs

J. Appl. Cryst. (1990). 23, 73-76 [doi:10.1107/S0021889889011386]

MINREF - a new computer program for neutron refinement of incommensurate multiphase nuclear and magnetic structures

O. Elsenhans

laboratory notes

J. Appl. Cryst. (1990). 23, 77 [doi:10.1107/S0021889889011118]

A versatile new cryostat for obtaining X-ray diffuse intensity data from thin flat single crystals

Y. Kuroiwa, K. Ohshima and H. Maeta

J. Appl. Cryst. (1990). 23, 77-78 [doi:10.1107/S0021889889011635]

Radiographic test of sample arrangement in synchrotron radiation

A. Lindegaard-Andersen

crystallographers

J. Appl. Cryst. (1990). 23, 78 [doi:10.1107/S0021889889012264]