Journal of Applied Crystallography

Volume 23, Part 3 (June 1990)



research papers



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J. Appl. Cryst. (1990). 23, 147-150    [doi:10.1107/S0021889889013415]

Double-crystal X-ray rocking-curve peak splitting due to interference in triple-layer epitaxic structures

Shufan Cui and Zhenhong Mai



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J. Appl. Cryst. (1990). 23, 151-160    [doi:10.1107/S0021889889014020]

Calculation of the lattice deformation at the phase transitions of [Fe(ptz)6](BF4)2 from powder diffraction patterns

L. Wiehl, H. Spiering, P. Gütlich and K. Knorr



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J. Appl. Cryst. (1990). 23, 161-168    [doi:10.1107/S0021889890000334]

Focusing optics for laboratory sources in X-ray crystallography

U. W. Arndt



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J. Appl. Cryst. (1990). 23, 169-174    [doi:10.1107/S0021889890000346]

Laue film integration and deconvolution of spatially overlapping reflections

A. K. Shrive, I. J. Clifton, J. Hajdu and T. J. Greenhough



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J. Appl. Cryst. (1990). 23, 175-179    [doi:10.1107/S0021889890000358]

A small 50 K cooling device for a quarter-circle Eulerian cradle diffractometer

D. Zobel and P. Luger



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J. Appl. Cryst. (1990). 23, 180-185    [doi:10.1107/S002188989000036X]

Convolutional approach to the normalization of intensity scattered by polycrystalline substances

Z. Kaszkur



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J. Appl. Cryst. (1990). 23, 186-198    [doi:10.1107/S0021889890000371]

Neutron topography as a tool for studying reactive organic crystals: a feasibility study

M. Dudley, J. Baruchel and J. N. Sherwood



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J. Appl. Cryst. (1990). 23, 199-208    [doi:10.1107/S002188989000098X]

Design and performance of the multiwire area X-ray diffractometer at the University of Virginia

S. E. Sobottka, R. J. Chandross, G. G. Cornick, R. H. Kretsinger and R. G. Rains



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J. Appl. Cryst. (1990). 23, 209-210    [doi:10.1107/S0021889890001327]

Spatial coal structure models

H. Grigoriew and G. Cichowska


short communications



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J. Appl. Cryst. (1990). 23, 211-212    [doi:10.1107/S002188988901352X]

Absolute polarity of [alpha]-lithium iodate

S. C. Abrahams, R. Liminga and J. Albertsson



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J. Appl. Cryst. (1990). 23, 212-214    [doi:10.1107/S0021889889014329]

An omega-scan artifact observed in Nicolet P3F diffractometers

P. J. Loll, R. A. Sparks and E. E. Lattman



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J. Appl. Cryst. (1990). 23, 215-218    [doi:10.1107/S0021889890001893]

Enhancement in resolution and lack of radiation damage in a rapidly frozen lysozyme crystal subjected to high-intensity synchrotron radiation

A. C. M. Young, J. C. Dewan, A. W. Thompson and C. Nave


computer programs



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J. Appl. Cryst. (1990). 23, 218-221    [doi:10.1107/S0021889889014378]

CONEXN - a procedure to generate ideal groups for stereochemically restrained refinement of protein models

A. Pähler and W. A. Hendrickson


computer program abstracts



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J. Appl. Cryst. (1990). 23, 222-223    [doi:10.1107/S0021889890001716]

EDAUTOCAL - a program to calibrate EDXRD detector systems

D. Häusermann


crystallographers



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J. Appl. Cryst. (1990). 23, 223    [doi:10.1107/S0021889890004046]

Crystallographers


new commercial products



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J. Appl. Cryst. (1990). 23, 223-224    [doi:10.1107/S0021889890099885]

New Commercial Products


book reviews



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J. Appl. Cryst. (1990). 23, 224    [doi:10.1107/S0021889890001170]

The physics of quasicrystals edited by P. J. Steinhardt and S. Ostlund


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