Journal of Applied Crystallography
Volume 23, Part 3 (June 1990)
J. Appl. Cryst. (1990). 23, 147-150 [doi:10.1107/S0021889889013415]
Double-crystal X-ray rocking-curve peak splitting due to interference in triple-layer epitaxic structures
Shufan Cui and Zhenhong Mai
J. Appl. Cryst. (1990). 23, 151-160 [doi:10.1107/S0021889889014020]
Calculation of the lattice deformation at the phase transitions of [Fe(ptz)6](BF4)2
from powder diffraction patterns
L. Wiehl, H. Spiering, P. Gütlich and K. Knorr
J. Appl. Cryst. (1990). 23, 161-168 [doi:10.1107/S0021889890000334]
Focusing optics for laboratory sources in X-ray crystallography
U. W. Arndt
J. Appl. Cryst. (1990). 23, 169-174 [doi:10.1107/S0021889890000346]
Laue film integration and deconvolution of spatially overlapping reflections
A. K. Shrive, I. J. Clifton, J. Hajdu and T. J. Greenhough
J. Appl. Cryst. (1990). 23, 175-179 [doi:10.1107/S0021889890000358]
A small 50 K cooling device for a quarter-circle Eulerian cradle diffractometer
D. Zobel and P. Luger
J. Appl. Cryst. (1990). 23, 180-185 [doi:10.1107/S002188989000036X]
Convolutional approach to the normalization of intensity scattered by polycrystalline substances
Z. Kaszkur
J. Appl. Cryst. (1990). 23, 186-198 [doi:10.1107/S0021889890000371]
Neutron topography as a tool for studying reactive organic crystals: a feasibility study
M. Dudley, J. Baruchel and J. N. Sherwood
J. Appl. Cryst. (1990). 23, 199-208 [doi:10.1107/S002188989000098X]
Design and performance of the multiwire area X-ray diffractometer at the University of Virginia
S. E. Sobottka, R. J. Chandross, G. G. Cornick, R. H. Kretsinger and R. G. Rains
J. Appl. Cryst. (1990). 23, 209-210 [doi:10.1107/S0021889890001327]
Spatial coal structure models
H. Grigoriew and G. Cichowska
J. Appl. Cryst. (1990). 23, 211-212 [doi:10.1107/S002188988901352X]
Absolute polarity of ![[alpha]](/logos/entities/alpha_rmgif.gif)
-lithium iodate
S. C. Abrahams, R. Liminga and J. Albertsson
J. Appl. Cryst. (1990). 23, 212-214 [doi:10.1107/S0021889889014329]
An omega-scan artifact observed in Nicolet P3F diffractometers
P. J. Loll, R. A. Sparks and E. E. Lattman
J. Appl. Cryst. (1990). 23, 215-218 [doi:10.1107/S0021889890001893]
Enhancement in resolution and lack of radiation damage in a rapidly frozen lysozyme crystal subjected to high-intensity synchrotron radiation
A. C. M. Young, J. C. Dewan, A. W. Thompson and C. Nave
J. Appl. Cryst. (1990). 23, 218-221 [doi:10.1107/S0021889889014378]
CONEXN - a procedure to generate ideal groups for stereochemically restrained refinement of protein models
A. Pähler and W. A. Hendrickson
J. Appl. Cryst. (1990). 23, 222-223 [doi:10.1107/S0021889890001716]
EDAUTOCAL - a program to calibrate EDXRD detector systems
D. Häusermann
J. Appl. Cryst. (1990). 23, 223 [doi:10.1107/S0021889890004046]
Crystallographers
J. Appl. Cryst. (1990). 23, 223-224 [doi:10.1107/S0021889890099885]
New Commercial Products
J. Appl. Cryst. (1990). 23, 224 [doi:10.1107/S0021889890001170]
The physics of quasicrystals edited by P. J. Steinhardt and S. Ostlund
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