Journal of Applied Crystallography

Volume 23, Part 4 (August 1990)



research papers



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J. Appl. Cryst. (1990). 23, 225-227    [doi:10.1107/S0021889890000322]

A procedure for the generation of the symmetry of the multiple implication function from the crystal symmetry

F. Pavelcík



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J. Appl. Cryst. (1990). 23, 228-233    [doi:10.1107/S0021889890001704]

Extreme asymmetric X-ray Bragg reflection of semiconductor heterostructures near the edge of total external reflection

H.-G. Brühl, T. Baumbach, V. Gottschalch, U. Pietsch and B. Lengeler



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J. Appl. Cryst. (1990). 23, 234-240    [doi:10.1107/S0021889890001881]

Factors affecting data reproducibility on an area detector

J. P. Rose and B.-C. Wang



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J. Appl. Cryst. (1990). 23, 241-245    [doi:10.1107/S0021889890001984]

Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating system

G. D. Wignall, J. S. Lin and S. Spooner



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J. Appl. Cryst. (1990). 23, 246-252    [doi:10.1107/S0021889890002382]

Simultaneous structure and size-strain refinement by the Rietveld method

L. Lutterotti and P. Scardi



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J. Appl. Cryst. (1990). 23, 253-257    [doi:10.1107/S0021889890002461]

Auto-indexing of oscillation images

T. Higashi



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J. Appl. Cryst. (1990). 23, 258-262    [doi:10.1107/S0021889890002473]

Time-resolved neutron diffraction analyses of hydrothermal syntheses using a novel autoclave cell

E. Polak, J. Munn, P. Barnes, S. E. Tarling and C. Ritter



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J. Appl. Cryst. (1990). 23, 263-265    [doi:10.1107/S0021889890002485]

A new crystal growth form of vaterite, CaCO3

A. M. Shaikh



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J. Appl. Cryst. (1990). 23, 266-276    [doi:10.1107/S0021889890002655]

Anomalous small-angle X-ray scattering study of the early stages of decomposition in Cu-15wt%Ni-8wt%Sn

Ph. Goudeau, A. Naudon and J.-M. Welter



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J. Appl. Cryst. (1990). 23, 277-281    [doi:10.1107/S0021889890002709]

Study of ferroelastic domains in HTMA crystals at the ferroelectric-ferroelastic transition

M. Ribet, S. Léon, F. Lefaucheux and M. C. Robert



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J. Appl. Cryst. (1990). 23, 282-285    [doi:10.1107/S0021889890001996]

Simultaneous peak-shift correction in the least-squares determination of unit-cell parameters of a sample with standard reference material

H. Toraya and M. Kitamura



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J. Appl. Cryst. (1990). 23, 286-291    [doi:10.1107/S0021889890003636]

Lattice-parameter determination for powders using synchrotron radiation

M. Hart, R. J. Cernik, W. Parrish and H. Toraya



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J. Appl. Cryst. (1990). 23, 292-296    [doi:10.1107/S0021889890003648]

A two-circle powder diffractometer for synchrotron radiation with a closed loop encoder feedback system

R. J. Cernik, P. K. Murray, P. Pattison and A. N. Fitch



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J. Appl. Cryst. (1990). 23, 297-302    [doi:10.1107/S0021889890003260]

An automated system for micro-batch protein crystallization and screening

N. E. Chayen, P. D. Shaw Stewart, D. L. Maeder and D. M. Blow



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J. Appl. Cryst. (1990). 23, 303-314    [doi:10.1107/S002188989000379X]

Optical transforms of disordered systems containing symmetry-related scattering sites

T. R. Welberry and R. L. Withers



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J. Appl. Cryst. (1990). 23, 315-320    [doi:10.1107/S0021889890003879]

Quantitative X-ray powder diffraction analysis applied to transmission diffraction

B. L. Davis and M. N. Spilde



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J. Appl. Cryst. (1990). 23, 321-333    [doi:10.1107/S0021889890003946]

Analytical treatment of the resolution function for small-angle scattering

J. S. Pedersen, D. Posselt and K. Mortensen



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J. Appl. Cryst. (1990). 23, 334-339    [doi:10.1107/S0021889890004009]

An automatic diffraction data collection system with an imaging plate

I. Tanaka, M. Yao, M. Suzuki, K. Hikichi, T. Matsumoto, M. Kozasa and C. Katayama


short communications



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J. Appl. Cryst. (1990). 23, 340-341    [doi:10.1107/S0021889890002710]

Low-temperature X-ray diffraction examination of In2Se3

B. Grzeta, S. Popovic, N. Cowlam and B. Celustka



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J. Appl. Cryst. (1990). 23, 341-343    [doi:10.1107/S002188989000365X]

A convenient translation-function parameterization

C. C. Wilson


computer programs



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J. Appl. Cryst. (1990). 23, 344-346    [doi:10.1107/S0021889890002801]

Calculation of small-angle scattering profiles using Monte Carlo simulation

S. Hansen



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J. Appl. Cryst. (1990). 23, 347-348    [doi:10.1107/S0021889890004265]

TEXCAM - an interpretation aid for cylindrical texture camera X-ray diffraction patterns

K. D. Rogers


crystallographers



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J. Appl. Cryst. (1990). 23, 349-350    [doi:10.1107/S0021889890005726]

Crystallographers


new commercial products



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J. Appl. Cryst. (1990). 23, 350    [doi:10.1107/S0021889890099873]

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