Journal of Applied Crystallography

Volume 23, Part 4 (August 1990)

research papers
short communications
computer programs
crystallographers
new commercial products

research papers

J. Appl. Cryst. (1990). 23, 225-227 [doi:10.1107/S0021889890000322]

A procedure for the generation of the symmetry of the multiple implication function from the crystal symmetry

F. Pavelcík

J. Appl. Cryst. (1990). 23, 228-233 [doi:10.1107/S0021889890001704]

Extreme asymmetric X-ray Bragg reflection of semiconductor heterostructures near the edge of total external reflection

H.-G. Brühl, T. Baumbach, V. Gottschalch, U. Pietsch and B. Lengeler

J. Appl. Cryst. (1990). 23, 234-240 [doi:10.1107/S0021889890001881]

Factors affecting data reproducibility on an area detector

J. P. Rose and B.-C. Wang

J. Appl. Cryst. (1990). 23, 241-245 [doi:10.1107/S0021889890001984]

Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating system

G. D. Wignall, J. S. Lin and S. Spooner

J. Appl. Cryst. (1990). 23, 246-252 [doi:10.1107/S0021889890002382]

Simultaneous structure and size-strain refinement by the Rietveld method

L. Lutterotti and P. Scardi

J. Appl. Cryst. (1990). 23, 253-257 [doi:10.1107/S0021889890002461]

Auto-indexing of oscillation images

T. Higashi

J. Appl. Cryst. (1990). 23, 258-262 [doi:10.1107/S0021889890002473]

Time-resolved neutron diffraction analyses of hydrothermal syntheses using a novel autoclave cell

E. Polak, J. Munn, P. Barnes, S. E. Tarling and C. Ritter

J. Appl. Cryst. (1990). 23, 263-265 [doi:10.1107/S0021889890002485]

A new crystal growth form of vaterite, CaCO₃

A. M. Shaikh

J. Appl. Cryst. (1990). 23, 266-276 [doi:10.1107/S0021889890002655]

Anomalous small-angle X-ray scattering study of the early stages of decomposition in Cu-15wt%Ni-8wt%Sn

Ph. Goudeau, A. Naudon and J.-M. Welter

J. Appl. Cryst. (1990). 23, 277-281 [doi:10.1107/S0021889890002709]

Study of ferroelastic domains in HTMA crystals at the ferroelectric-ferroelastic transition

M. Ribet, S. Léon, F. Lefaucheux and M. C. Robert

J. Appl. Cryst. (1990). 23, 282-285 [doi:10.1107/S0021889890001996]

Simultaneous peak-shift correction in the least-squares determination of unit-cell parameters of a sample with standard reference material

H. Toraya and M. Kitamura

J. Appl. Cryst. (1990). 23, 286-291 [doi:10.1107/S0021889890003636]

Lattice-parameter determination for powders using synchrotron radiation

M. Hart, R. J. Cernik, W. Parrish and H. Toraya

J. Appl. Cryst. (1990). 23, 292-296 [doi:10.1107/S0021889890003648]

A two-circle powder diffractometer for synchrotron radiation with a closed loop encoder feedback system

R. J. Cernik, P. K. Murray, P. Pattison and A. N. Fitch

J. Appl. Cryst. (1990). 23, 297-302 [doi:10.1107/S0021889890003260]

An automated system for micro-batch protein crystallization and screening

N. E. Chayen, P. D. Shaw Stewart, D. L. Maeder and D. M. Blow

J. Appl. Cryst. (1990). 23, 303-314 [doi:10.1107/S002188989000379X]

Optical transforms of disordered systems containing symmetry-related scattering sites

T. R. Welberry and R. L. Withers

J. Appl. Cryst. (1990). 23, 315-320 [doi:10.1107/S0021889890003879]

Quantitative X-ray powder diffraction analysis applied to transmission diffraction

B. L. Davis and M. N. Spilde

J. Appl. Cryst. (1990). 23, 321-333 [doi:10.1107/S0021889890003946]

Analytical treatment of the resolution function for small-angle scattering

J. S. Pedersen, D. Posselt and K. Mortensen

J. Appl. Cryst. (1990). 23, 334-339 [doi:10.1107/S0021889890004009]

An automatic diffraction data collection system with an imaging plate

I. Tanaka, M. Yao, M. Suzuki, K. Hikichi, T. Matsumoto, M. Kozasa and C. Katayama

short communications

J. Appl. Cryst. (1990). 23, 340-341 [doi:10.1107/S0021889890002710]

Low-temperature X-ray diffraction examination of In₂Se₃

B. Grzeta, S. Popovic, N. Cowlam and B. Celustka

J. Appl. Cryst. (1990). 23, 341-343 [doi:10.1107/S002188989000365X]

A convenient translation-function parameterization

C. C. Wilson

computer programs

J. Appl. Cryst. (1990). 23, 344-346 [doi:10.1107/S0021889890002801]

Calculation of small-angle scattering profiles using Monte Carlo simulation

S. Hansen

J. Appl. Cryst. (1990). 23, 347-348 [doi:10.1107/S0021889890004265]

TEXCAM - an interpretation aid for cylindrical texture camera X-ray diffraction patterns

K. D. Rogers

crystallographers

J. Appl. Cryst. (1990). 23, 349-350 [doi:10.1107/S0021889890005726]

Crystallographers

new commercial products

J. Appl. Cryst. (1990). 23, 350 [doi:10.1107/S0021889890099873]