Journal of Applied Crystallography

Volume 23, Part 5 (October 1990)



research papers



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J. Appl. Cryst. (1990). 23, 351-354    [doi:10.1107/S0021889890004216]

A high-resolution Weissenberg camera for X-ray synchrotron radiation

D. Hohlwein and J. D. Axe



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J. Appl. Cryst. (1990). 23, 355-358    [doi:10.1107/S0021889890004320]

Bragg and diffuse components of X-ray reflection measured using acoustic excitation of an Si crystal with oxide precipitates

I. R. Entin, V. I. Khrupa and L. I. Datsenko



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J. Appl. Cryst. (1990). 23, 359-365    [doi:10.1107/S0021889890004939]

A fitting method for the determination of crystallinity by means of X-ray diffraction

S. Polizzi, G. Fagherazzi, A. Benedetti, M. Battagliarin and T. Asano



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J. Appl. Cryst. (1990). 23, 366-373    [doi:10.1107/S0021889890005027]

The internal structure of layered colloidal particles determined with SANS

M. H. G. Duits, R. P. May and C. G. de Kruif



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J. Appl. Cryst. (1990). 23, 374-377    [doi:10.1107/S002188989000512X]

The rotation rate field and geometry of orientation space

A. Morawiec



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J. Appl. Cryst. (1990). 23, 378-386    [doi:10.1107/S0021889890005258]

Improvements to the Chebyshev expansion of attenuation correction factors for cylindrical samples

D. F. R. Mildner and J. M. Carpenter



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J. Appl. Cryst. (1990). 23, 387-391    [doi:10.1107/S0021889890005568]

Mounting of crystals for macromolecular crystallography in a free-standing thin film

T.-Y. Teng



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J. Appl. Cryst. (1990). 23, 392-396    [doi:10.1107/S0021889890005635]

The effect of diffraction by the diamonds of a diamond-anvil cell on single-crystal sample intensities

J. S. Loveday, M. I. McMahon and R. J. Nelmes



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J. Appl. Cryst. (1990). 23, 397-400    [doi:10.1107/S0021889890005702]

High-pressure single-crystal study on AlPO4 with synchrotron radiation

H. Sowa, K. Reithmayer, J. Macavei, W. Rieck, H. Schulz and V. Kupcik



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J. Appl. Cryst. (1990). 23, 401-405    [doi:10.1107/S0021889890005787]

Small-angle X-ray scattering at high energies

D. P. Siddons, C. Riekel and J. B. Hastings



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J. Appl. Cryst. (1990). 23, 406-411    [doi:10.1107/S0021889890005775]

A robust alternative to [eta] refinement for assessing the hand of chiral compounds

Y. Le Page, E. J. Gabe and G. J. Gainsford



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J. Appl. Cryst. (1990). 23, 412-417    [doi:10.1107/S0021889890006082]

Characteristic X-ray flux from sealed Cr, Cu, Mo, Ag and W tubes

V. Honkimäki, J. Sleight and P. Suortti



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J. Appl. Cryst. (1990). 23, 418-423    [doi:10.1107/S0021889890006379]

Structural study of Cd(S,Se) doped glasses. High-resolution transmission electron microscopy (HRTEM) assisted by image processing

M. Allais and M. Gandais



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J. Appl. Cryst. (1990). 23, 424-429    [doi:10.1107/S0021889890006483]

Characterization of a chromia-alumina catalyst using small-angle neutron scattering

D. R. Acharya, T. L. Crowley, R. Hughes, C. L. Koon, M. Menendez and F. Rieutord


short communications



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J. Appl. Cryst. (1990). 23, 430    [doi:10.1107/S0021889890008160]

Absolute polarity of [alpha]-lithium iodate. Erratum

S. C. Abrahams, R. Liminga and J. Albertsson



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J. Appl. Cryst. (1990). 23, 430-432    [doi:10.1107/S0021889890005167]

Silicon photodiode detector for small-angle X-ray scattering

P. R. Jemian and G. G. Long



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J. Appl. Cryst. (1990). 23, 432-433    [doi:10.1107/S0021889890005647]

Modernization of the Philips PW1100 single-crystal diffractometer computer control system

M. W. Grigg and Z. Barnea


computer programs



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J. Appl. Cryst. (1990). 23, 434-436    [doi:10.1107/S0021889890004228]

PAP: a protein analysis package

T. Callahan, W. B. Gleason and T. P. Lybrand



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J. Appl. Cryst. (1990). 23, 436-439    [doi:10.1107/S0021889890005301]

ABSCOR: a scaling and absorption correction program for the FAST area detector diffractometer

A. Messerschmidt, M. Schneider and R. Huber



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J. Appl. Cryst. (1990). 23, 439-440    [doi:10.1107/S0021889890005441]

BIRCH, a program for fitting PV data to an Eulerian finite-strain equation of state

C. R. Ross II and S. L. Webb


fast communications



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J. Appl. Cryst. (1990). 23, 441-443    [doi:10.1107/S0021889890008500]

Sub-nanosecond X-ray powder diffraction

N. C. Woolsey, J. S. Wark and D. Riley


computer program abstracts



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J. Appl. Cryst. (1990). 23, 444-445    [doi:10.1107/S0021889890004666]

PROFAN-PC: a PC program for powder peak profile analysis

P. Merz, E. Jansen, W. Schäfer and G. Will


crystallographers



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J. Appl. Cryst. (1990). 23, 445    [doi:10.1107/S0021889890007129]

Crystallographers


notes and news



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J. Appl. Cryst. (1990). 23, 445-446    [doi:10.1107/S0021889890099861]

The Dorothy Hodgkin Prize of the British Crystallographic Association


new commercial products



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J. Appl. Cryst. (1990). 23, 446    [doi:10.1107/S002188989009985X]

New Commercial Products


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