Journal of Applied Crystallography

Volume 24, Part 1 (February 1991)



research papers



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J. Appl. Cryst. (1991). 24, 1-5    [doi:10.1107/S0021889890008391]

E.s.d.'s and estimated probable error obtained in Rietveld refinements with local correlations

J.-F. Bérar and P. Lelann



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J. Appl. Cryst. (1991). 24, 6-13    [doi:10.1107/S0021889890008408]

Localization of impurity atoms in garnet cystals by the double-channel X-ray standing-wave method

E. Kh. Mukhamedzhanov, A. V. Maslov, R. M. Imamov, A. A. Bzhaumikhov, E. A. Fedorov and S. A. Kobzareva



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J. Appl. Cryst. (1991). 24, 14-17    [doi:10.1107/S002188989000841X]

Absorption contrast effects in the quantitative XRD analysis of powders by full multiphase profile refinement

J. C. Taylor and C. E. Matulis



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J. Appl. Cryst. (1991). 24, 18-29    [doi:10.1107/S0021889890008494]

The rôle of phase in diffuse diffraction patterns and its effect on real-space structure

T. R. Welberry and R. L. Withers



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J. Appl. Cryst. (1991). 24, 30-37    [doi:10.1107/S0021889890009256]

High-resolution small-angle X-ray scattering camera for anomalous scattering

G. G. Long, P. R. Jemian, J. R. Weertman, D. R. Black, H. E. Burdette and R. Spal



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J. Appl. Cryst. (1991). 24, 38-47    [doi:10.1107/S0021889890010147]

A study of the breakdown of Friedel's law in electron backscatter Kikuchi diffraction patterns: application to zincblende-type structures

K. Z. Baba-Kishi



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J. Appl. Cryst. (1991). 24, 48-60    [doi:10.1107/S0021889890009104]

The application of synchrotron X-radiation for the study of phase transitions in lipid model membrane systems

L. J. Lis and P. J. Quinn


short communications



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J. Appl. Cryst. (1991). 24, 61-63    [doi:10.1107/S0021889890008780]

A multimode high-angular-resolution powder diffractometer

M. Kurahashi, K. Honda, M. Goto, Y. Inari and C. Katayama



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J. Appl. Cryst. (1991). 24, 63    [doi:10.1107/S0021889890010159]

Absolute structures: is your diffractometer right-handed?

Y. Le Page and E. J. Gabe


computer programs



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J. Appl. Cryst. (1991). 24, 64-66    [doi:10.1107/S0021889890006616]

Visualization software for X-ray diffraction data from area detectors

D. H. Ohlendorf



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J. Appl. Cryst. (1991). 24, 66-70    [doi:10.1107/S0021889890009116]

Restrained refinement and results analysis for incommensurate crystal structures

W. A. Paciorek, G. Madariaga and F. J. Zúñiga



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J. Appl. Cryst. (1991). 24, 70-72    [doi:10.1107/S0021889890009943]

POWABS: a computer program for the automatic determination of reflection conditions in powder diffraction patterns

P. G. Byrom and B. W. Lucas


laboratory notes



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J. Appl. Cryst. (1991). 24, 72-73    [doi:10.1107/S0021889890009955]

A simple densitometer for X-ray powder photographs

N. J. Calos and C. H. L. Kennard



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J. Appl. Cryst. (1991). 24, 73    [doi:10.1107/S0021889890009967]

Use of a Hewlett-Packard ScanJet image digitizer as an X-ray powder photograph densitometer

N. J. Calos and C. H. L. Kennard


fast communications



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J. Appl. Cryst. (1991). 24, 74-76    [doi:10.1107/S0021889890010160]

The influence of laser radiation on X-ray diffraction in ferroelectric crystals with nonlinear optical properties

S. G. Zhukov, G. V. Fetisov and L. A. Aslanov


crystallographers



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J. Appl. Cryst. (1991). 24, 77-78    [doi:10.1107/S0021889890013048]

Crystallographers


new commercial products



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J. Appl. Cryst. (1991). 24, 78    [doi:10.1107/S0021889891099922]

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