Journal of Applied Crystallography
Volume 24, Part 1 (February 1991)
J. Appl. Cryst. (1991). 24, 1-5 [doi:10.1107/S0021889890008391]
E.s.d.'s and estimated probable error obtained in Rietveld refinements with local correlations
J.-F. Bérar and P. Lelann
J. Appl. Cryst. (1991). 24, 6-13 [doi:10.1107/S0021889890008408]
Localization of impurity atoms in garnet cystals by the double-channel X-ray standing-wave method
E. Kh. Mukhamedzhanov, A. V. Maslov, R. M. Imamov, A. A. Bzhaumikhov, E. A. Fedorov and S. A. Kobzareva
J. Appl. Cryst. (1991). 24, 14-17 [doi:10.1107/S002188989000841X]
Absorption contrast effects in the quantitative XRD analysis of powders by full multiphase profile refinement
J. C. Taylor and C. E. Matulis
J. Appl. Cryst. (1991). 24, 18-29 [doi:10.1107/S0021889890008494]
The rôle of phase in diffuse diffraction patterns and its effect on real-space structure
T. R. Welberry and R. L. Withers
J. Appl. Cryst. (1991). 24, 30-37 [doi:10.1107/S0021889890009256]
High-resolution small-angle X-ray scattering camera for anomalous scattering
G. G. Long, P. R. Jemian, J. R. Weertman, D. R. Black, H. E. Burdette and R. Spal
J. Appl. Cryst. (1991). 24, 38-47 [doi:10.1107/S0021889890010147]
A study of the breakdown of Friedel's law in electron backscatter Kikuchi diffraction patterns: application to zincblende-type structures
K. Z. Baba-Kishi
J. Appl. Cryst. (1991). 24, 48-60 [doi:10.1107/S0021889890009104]
The application of synchrotron X-radiation for the study of phase transitions in lipid model membrane systems
L. J. Lis and P. J. Quinn
J. Appl. Cryst. (1991). 24, 61-63 [doi:10.1107/S0021889890008780]
A multimode high-angular-resolution powder diffractometer
M. Kurahashi, K. Honda, M. Goto, Y. Inari and C. Katayama
J. Appl. Cryst. (1991). 24, 63 [doi:10.1107/S0021889890010159]
Absolute structures: is your diffractometer right-handed?
Y. Le Page and E. J. Gabe
J. Appl. Cryst. (1991). 24, 64-66 [doi:10.1107/S0021889890006616]
Visualization software for X-ray diffraction data from area detectors
D. H. Ohlendorf
J. Appl. Cryst. (1991). 24, 66-70 [doi:10.1107/S0021889890009116]
Restrained refinement and results analysis for incommensurate crystal structures
W. A. Paciorek, G. Madariaga and F. J. Zúñiga
J. Appl. Cryst. (1991). 24, 70-72 [doi:10.1107/S0021889890009943]
POWABS: a computer program for the automatic determination of reflection conditions in powder diffraction patterns
P. G. Byrom and B. W. Lucas
J. Appl. Cryst. (1991). 24, 72-73 [doi:10.1107/S0021889890009955]
A simple densitometer for X-ray powder photographs
N. J. Calos and C. H. L. Kennard
J. Appl. Cryst. (1991). 24, 73 [doi:10.1107/S0021889890009967]
Use of a Hewlett-Packard ScanJet image digitizer as an X-ray powder photograph densitometer
N. J. Calos and C. H. L. Kennard
J. Appl. Cryst. (1991). 24, 74-76 [doi:10.1107/S0021889890010160]
The influence of laser radiation on X-ray diffraction in ferroelectric crystals with nonlinear optical properties
S. G. Zhukov, G. V. Fetisov and L. A. Aslanov
J. Appl. Cryst. (1991). 24, 77-78 [doi:10.1107/S0021889890013048]
Crystallographers
J. Appl. Cryst. (1991). 24, 78 [doi:10.1107/S0021889891099922]
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