Journal of Applied Crystallography

Volume 24, Part 2 (April 1991)



lead articles



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J. Appl. Cryst. (1991). 24, 79-90    [doi:10.1107/S0021889890011013]

Nanocrystalline solids

H. Gleiter


research papers



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J. Appl. Cryst. (1991). 24, 91-95    [doi:10.1107/S0021889890010718]

A simplex optimization method for the precise determination of symmetry-constrained lattice constants from diffractometer data

J. B. Weinrach and D. W. Bennett



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J. Appl. Cryst. (1991). 24, 96-101    [doi:10.1107/S0021889890010822]

Accurate determination of the deviation from coincidence orientation for grain boundaries in hexagonal materials

S. Lay, P. Ayed, J. Vicens and G. Nouet



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J. Appl. Cryst. (1991). 24, 102-107    [doi:10.1107/S0021889890010834]

Effects of tetragonal distortion in thin expitaxic films on electron channeling patterns in scanning electron microscopy

J. A. Kozubowski, R. R. Keller and W. W. Gerberich



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J. Appl. Cryst. (1991). 24, 108-110    [doi:10.1107/S0021889890011104]

Critical temperature of superconductivity and X-ray crystallographic studies of Nb0.78Al0.17Ge0.05 of A15 structure

K. N. Christensen, S. E. Rasmussen and J. Thygesen



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J. Appl. Cryst. (1991). 24, 111-118    [doi:10.1107/S0021889890011153]

Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction

T. Yamanaka and K. Ogata



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J. Appl. Cryst. (1991). 24, 119-125    [doi:10.1107/S0021889890011384]

Identification of planar defects by etch pits formed on the mantle surface of cylindrical single crystals

TranHuu Loi and J. P. Morniroli



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J. Appl. Cryst. (1991). 24, 126-128    [doi:10.1107/S0021889890011438]

Application of the maximum-entropy method to the inverse-pole-figure determination of cubic materials

F. Wang, J. Xu and Z. Liang



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J. Appl. Cryst. (1991). 24, 129-134    [doi:10.1107/S0021889890011451]

Gypsum grown under pressure from dense suspension of CaSO4.0.67H2O

C. Rinaudo and R. Boistelle



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J. Appl. Cryst. (1991). 24, 135-141    [doi:10.1107/S0021889890011530]

Kinetics of pH changes in the vapor diffusion method of protein crystallization using ammonium sulfate as the precipitant

J.-L. Rodeau, V. Mikol, R. Geigé and P. Lutun



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J. Appl. Cryst. (1991). 24, 142-145    [doi:10.1107/S0021889890011542]

Problems of studying the crystal structure of Ce1-xLax11B6 solid solutions by high-resolution powder neutron diffraction

V. A. Trunov, A. L. Malyshev, D. Yu. Chernyshov, A. I. Kurbakov, M. M. Korsukova, V. N. Gurin, O. Antson and P. Hiismäki



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J. Appl. Cryst. (1991). 24, 146-148    [doi:10.1107/S0021889890010846]

Laue diffraction from protein crystals using a sealed-tube X-ray source

I. Brooks and K. Moffat



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J. Appl. Cryst. (1991). 24, 149-155    [doi:10.1107/S0021889890012092]

High-resolution powder diffraction studies of copper(II) oxide

J. I. Langford and D. Louër



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J. Appl. Cryst. (1991). 24, 156-163    [doi:10.1107/S0021889890011633]

Anomalous small-angle X-ray diffraction of an Nd-Fe multilayer

J. P. Simon, O. Lyon, A. Bruson and F. Rieutord



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J. Appl. Cryst. (1991). 24, 164-170    [doi:10.1107/S0021889890011700]

Compositional deformation of crystal lattices of molecular alloys in the series of p-disubstituted benzene derivatives. I. Method of calculation and experimental results

L. Bonpunt, R. Courchinoux, Y. Haget, E. Estop, T. Calvet, M. A. Cuevas-Diarte and M. Labrador



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J. Appl. Cryst. (1991). 24, 171-174    [doi:10.1107/S0021889890012468]

Calculation of the refractive indices of molecular crystals

S. de Jong, F. Groeneweg and F. van Voorst Vader



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J. Appl. Cryst. (1991). 24, 175-177    [doi:10.1107/S002188989001247X]

On the third-order elastic constants of polycrystalline media

T. P. Srinivasan and J. Glorium Arulraj



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J. Appl. Cryst. (1991). 24, 178-183    [doi:10.1107/S0021889890013085]

Combining high-resolution X-ray diffractometry and topography

P. F. Fewster


short communications



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J. Appl. Cryst. (1991). 24, 184    [doi:10.1107/S0021889891000511]

Short-range-order determination in quenched NbC0.73 by elastic diffuse neutron scattering. Erratum

B. Beuneu, T. Priem, C. H. de Novion, S. Lefebvre, J. Chevrier and A. N. Christensen



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J. Appl. Cryst. (1991). 24, 184-187    [doi:10.1107/S0021889890012249]

Experimentally determined anomalous scattering factors for Mn, Fe, Ni, Cu, Zn and Hg using the Kramers-Kronig relation

J. P. Quintana, B. D. Butler and D. R. Haeffner



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J. Appl. Cryst. (1991). 24, 187-189    [doi:10.1107/S0021889890012304]

Eine auf Fouriermethoden basierende Lückensuchfunktion

J. Rius



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J. Appl. Cryst. (1991). 24, 189-190    [doi:10.1107/S0021889890013097]

Lattice-parameter determination for powders using synchrotron radiation

M. Hart



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J. Appl. Cryst. (1991). 24, 190-193    [doi:10.1107/S0021889890012365]

Diffractometer devices controlled by a personal computer

J. Lange and H. Burzlaff


computer programs



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J. Appl. Cryst. (1991). 24, 193-195    [doi:10.1107/S002188989000989X]

C3DCON: a stereo 3D electron-density cage contouring and atomic structure plotting program

R.-S. Zhou, M. M. Teeter and R. L. Snyder


computer program abstracts



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J. Appl. Cryst. (1991). 24, 196    [doi:10.1107/S0021889890010676]

XENVIEW - an interactive program to display and analyze electronic area detector data

I. Kaplan, D. J. Bacon, O. Herzberg and G. L. Gilliland


crystallographers



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J. Appl. Cryst. (1991). 24, 196    [doi:10.1107/S0021889891001383]

Crystallographers


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