Journal of Applied Crystallography
Volume 24, Part 2 (April 1991)
J. Appl. Cryst. (1991). 24, 79-90 [doi:10.1107/S0021889890011013]
Nanocrystalline solids
H. Gleiter
J. Appl. Cryst. (1991). 24, 91-95 [doi:10.1107/S0021889890010718]
A simplex optimization method for the precise determination of symmetry-constrained lattice constants from diffractometer data
J. B. Weinrach and D. W. Bennett
J. Appl. Cryst. (1991). 24, 96-101 [doi:10.1107/S0021889890010822]
Accurate determination of the deviation from coincidence orientation for grain boundaries in hexagonal materials
S. Lay, P. Ayed, J. Vicens and G. Nouet
J. Appl. Cryst. (1991). 24, 102-107 [doi:10.1107/S0021889890010834]
Effects of tetragonal distortion in thin expitaxic films on electron channeling patterns in scanning electron microscopy
J. A. Kozubowski, R. R. Keller and W. W. Gerberich
J. Appl. Cryst. (1991). 24, 108-110 [doi:10.1107/S0021889890011104]
Critical temperature of superconductivity and X-ray crystallographic studies of Nb0.78Al0.17Ge0.05 of A15 structure
K. N. Christensen, S. E. Rasmussen and J. Thygesen
J. Appl. Cryst. (1991). 24, 111-118 [doi:10.1107/S0021889890011153]
Structure refinement of GeO2 polymorphs at high pressures and temperatures by energy-dispersive spectra of powder diffraction
T. Yamanaka and K. Ogata
J. Appl. Cryst. (1991). 24, 119-125 [doi:10.1107/S0021889890011384]
Identification of planar defects by etch pits formed on the mantle surface of cylindrical single crystals
TranHuu Loi and J. P. Morniroli
J. Appl. Cryst. (1991). 24, 126-128 [doi:10.1107/S0021889890011438]
Application of the maximum-entropy method to the inverse-pole-figure determination of cubic materials
F. Wang, J. Xu and Z. Liang
J. Appl. Cryst. (1991). 24, 129-134 [doi:10.1107/S0021889890011451]
Gypsum grown under pressure from dense suspension of CaSO4.0.67H2O
C. Rinaudo and R. Boistelle
J. Appl. Cryst. (1991). 24, 135-141 [doi:10.1107/S0021889890011530]
Kinetics of pH changes in the vapor diffusion method of protein crystallization using ammonium sulfate as the precipitant
J.-L. Rodeau, V. Mikol, R. Geigé and P. Lutun
J. Appl. Cryst. (1991). 24, 142-145 [doi:10.1107/S0021889890011542]
Problems of studying the crystal structure of Ce1-xLax11B6 solid solutions by high-resolution powder neutron diffraction
V. A. Trunov, A. L. Malyshev, D. Yu. Chernyshov, A. I. Kurbakov, M. M. Korsukova, V. N. Gurin, O. Antson and P. Hiismäki
J. Appl. Cryst. (1991). 24, 146-148 [doi:10.1107/S0021889890010846]
Laue diffraction from protein crystals using a sealed-tube X-ray source
I. Brooks and K. Moffat
J. Appl. Cryst. (1991). 24, 149-155 [doi:10.1107/S0021889890012092]
High-resolution powder diffraction studies of copper(II) oxide
J. I. Langford and D. Louër
J. Appl. Cryst. (1991). 24, 156-163 [doi:10.1107/S0021889890011633]
Anomalous small-angle X-ray diffraction of an Nd-Fe multilayer
J. P. Simon, O. Lyon, A. Bruson and F. Rieutord
J. Appl. Cryst. (1991). 24, 164-170 [doi:10.1107/S0021889890011700]
Compositional deformation of crystal lattices of molecular alloys in the series of p-disubstituted benzene derivatives. I. Method of calculation and experimental
results
L. Bonpunt, R. Courchinoux, Y. Haget, E. Estop, T. Calvet, M. A. Cuevas-Diarte and M. Labrador
J. Appl. Cryst. (1991). 24, 171-174 [doi:10.1107/S0021889890012468]
Calculation of the refractive indices of molecular crystals
S. de Jong, F. Groeneweg and F. van Voorst Vader
J. Appl. Cryst. (1991). 24, 175-177 [doi:10.1107/S002188989001247X]
On the third-order elastic constants of polycrystalline media
T. P. Srinivasan and J. Glorium Arulraj
J. Appl. Cryst. (1991). 24, 178-183 [doi:10.1107/S0021889890013085]
Combining high-resolution X-ray diffractometry and topography
P. F. Fewster
J. Appl. Cryst. (1991). 24, 184 [doi:10.1107/S0021889891000511]
Short-range-order determination in quenched NbC0.73 by elastic diffuse neutron scattering. Erratum
B. Beuneu, T. Priem, C. H. de Novion, S. Lefebvre, J. Chevrier and A. N. Christensen
J. Appl. Cryst. (1991). 24, 184-187 [doi:10.1107/S0021889890012249]
Experimentally determined anomalous scattering factors for Mn, Fe, Ni, Cu, Zn and Hg using the Kramers-Kronig relation
J. P. Quintana, B. D. Butler and D. R. Haeffner
J. Appl. Cryst. (1991). 24, 187-189 [doi:10.1107/S0021889890012304]
Eine auf Fouriermethoden basierende Lückensuchfunktion
J. Rius
J. Appl. Cryst. (1991). 24, 189-190 [doi:10.1107/S0021889890013097]
Lattice-parameter determination for powders using synchrotron radiation
M. Hart
J. Appl. Cryst. (1991). 24, 190-193 [doi:10.1107/S0021889890012365]
Diffractometer devices controlled by a personal computer
J. Lange and H. Burzlaff
J. Appl. Cryst. (1991). 24, 193-195 [doi:10.1107/S002188989000989X]
C3DCON: a stereo 3D electron-density cage contouring and atomic structure plotting program
R.-S. Zhou, M. M. Teeter and R. L. Snyder
J. Appl. Cryst. (1991). 24, 196 [doi:10.1107/S0021889890010676]
XENVIEW - an interactive program to display and analyze electronic area detector data
I. Kaplan, D. J. Bacon, O. Herzberg and G. L. Gilliland
J. Appl. Cryst. (1991). 24, 196 [doi:10.1107/S0021889891001383]
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