Journal of Applied Crystallography
Volume 24, Part 4 (August 1991)
J. Appl. Cryst. (1991). 24, 267-277 [doi:10.1107/S0021889890013863]
Experimental strategies in Laue crystallography
I. J. Clifton, M. Elder and J. Hajdu
J. Appl. Cryst. (1991). 24, 278-285 [doi:10.1107/S0021889891001322]
Use of the sampling theorem for collimation corrections in small-angle X-ray scattering
T. Gerber, G. Walter and P. W. Schmidt
J. Appl. Cryst. (1991). 24, 286-292 [doi:10.1107/S0021889891001334]
Structure determination of magnesium boron nitride, Mg3BN3, from X-ray powder diffraction data
H. Hiraguchi, H. Hashizume, O. Fukunaga, A. Takenaka and M. Sakata
J. Appl. Cryst. (1991). 24, 293-297 [doi:10.1107/S0021889891001590]
Modelling of Bragg intensity profiles. 2. Allowance for thermal diffuse scattering
A. V. Laktionov, G. V. Fetisov, L. A. Aslanov, A. I. Chulichkov and N. M. Chulichkova
J. Appl. Cryst. (1991). 24, 298-303 [doi:10.1107/S0021889891001607]
Focusing double bent crystal (DBC) diffractometer for medium-resolution small-angle neutron scattering (SANS) experiments
P. Mikula, V. Wagner and R. Scherm
J. Appl. Cryst. (1991). 24, 304-311 [doi:10.1107/S0021889891001619]
Dislocation images in X-ray section topographs of curved crystals
G. S. Green, N. Loxley and B. K. Tanner
J. Appl. Cryst. (1991). 24, 312-315 [doi:10.1107/S0021889891002005]
Neutron diffraction intensities from arrays of isotopically substituted particles in an invisible matrix
P. M. G. Curmi and R. A. Mendelson
J. Appl. Cryst. (1991). 24, 316-323 [doi:10.1107/S0021889891002030]
Strain field due to a slip band near a grain boundary in an Fe-6at.% Si bicrystal. I. Elastic strain of a slip band meeting the free surface
J. Gemperlová, M. Polcarová and J. Brádler
J. Appl. Cryst. (1991). 24, 324-330 [doi:10.1107/S0021889891002042]
Strain field due to a slip band near a grain boundary in an Fe-6at.% Si bicrystal. II. Interpretation of double-crystal topographs
M. Polcarová, J. Gemperlová and J. Brádler
J. Appl. Cryst. (1991). 24, 331-339 [doi:10.1107/S0021889891002054]
Strain field due to a slip band near a grain boundary in an Fe-6at.% Si bicrystal. III. Simulation of the orientation contrast
M. Polcarová, J. Gemperlová and J. Brádler
J. Appl. Cryst. (1991). 24, 340-348 [doi:10.1107/S0021889891002133]
Development of a system to analyse the structure of a submicrometre-sized single crystal by synchrotron X-ray diffraction
K. Ohsumi, K. Hagiya and M. Ohmasa
J. Appl. Cryst. (1991). 24, 349-351 [doi:10.1107/S0021889891002480]
The effect of inhomogeneity size and concentration on the analysis of small-angle scattering data
M. R. Baig, S. Gupta, S. Messoloras and R. J. Stewart
J. Appl. Cryst. (1991). 24, 352-354 [doi:10.1107/S0021889891002492]
Sucrose, a convenient test crystal for absolute structures
R. C. Hynes and Y. Le Page
J. Appl. Cryst. (1991). 24, 355-364 [doi:10.1107/S0021889891002820]
A fast X-ray diffraction method for the surface orientation analysis of large polycrystalline samples
P. Andonov
J. Appl. Cryst. (1991). 24, 365-368 [doi:10.1107/S0021889891003680]
Determination of the direction of the propagation vector for incommensurate structures from neutron powder diffraction patterns
C. Wilkinson, G. Lautenschläger, R. Hock and H. Weitzel
J. Appl. Cryst. (1991). 24, 369-402 [doi:10.1107/S0021889891003473]
Powder Diffraction Program Information 1990 Program List
J. Appl. Cryst. (1991). 24, 403-404 [doi:10.1107/S0021889891002017]
Spatial intensity profile of an X-ray beam reflected from nearly perfect silicon and diffuse scattering measurements
I. R. Entin and V. I. Khrupa
J. Appl. Cryst. (1991). 24, 405-406 [doi:10.1107/S0021889890013887]
FRDICT - a computer program to generate a molecular dictionary for use in FRODO/ TOM
V. Prasad and M. V. Hosur
J. Appl. Cryst. (1991). 24, 406-408 [doi:10.1107/S0021889891001644]
Protein crystal growth in the presence of poly(vinylidene difluoride) membrane
J. S. Punzi, J. Luft and V. Cody
J. Appl. Cryst. (1991). 24, 409-411 [doi:10.1107/S0021889891004430]
Sparse matrix sampling: a screening method for crystallization of proteins
J. Jancarik and S.-H. Kim
J. Appl. Cryst. (1991). 24, 412 [doi:10.1107/S0021889891006040]
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