Journal of Applied Crystallography

Volume 24, Part 4 (August 1991)



research papers



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J. Appl. Cryst. (1991). 24, 267-277    [doi:10.1107/S0021889890013863]

Experimental strategies in Laue crystallography

I. J. Clifton, M. Elder and J. Hajdu



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J. Appl. Cryst. (1991). 24, 278-285    [doi:10.1107/S0021889891001322]

Use of the sampling theorem for collimation corrections in small-angle X-ray scattering

T. Gerber, G. Walter and P. W. Schmidt



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J. Appl. Cryst. (1991). 24, 286-292    [doi:10.1107/S0021889891001334]

Structure determination of magnesium boron nitride, Mg3BN3, from X-ray powder diffraction data

H. Hiraguchi, H. Hashizume, O. Fukunaga, A. Takenaka and M. Sakata



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J. Appl. Cryst. (1991). 24, 293-297    [doi:10.1107/S0021889891001590]

Modelling of Bragg intensity profiles. 2. Allowance for thermal diffuse scattering

A. V. Laktionov, G. V. Fetisov, L. A. Aslanov, A. I. Chulichkov and N. M. Chulichkova



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J. Appl. Cryst. (1991). 24, 298-303    [doi:10.1107/S0021889891001607]

Focusing double bent crystal (DBC) diffractometer for medium-resolution small-angle neutron scattering (SANS) experiments

P. Mikula, V. Wagner and R. Scherm



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J. Appl. Cryst. (1991). 24, 304-311    [doi:10.1107/S0021889891001619]

Dislocation images in X-ray section topographs of curved crystals

G. S. Green, N. Loxley and B. K. Tanner



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J. Appl. Cryst. (1991). 24, 312-315    [doi:10.1107/S0021889891002005]

Neutron diffraction intensities from arrays of isotopically substituted particles in an invisible matrix

P. M. G. Curmi and R. A. Mendelson



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J. Appl. Cryst. (1991). 24, 316-323    [doi:10.1107/S0021889891002030]

Strain field due to a slip band near a grain boundary in an Fe-6at.% Si bicrystal. I. Elastic strain of a slip band meeting the free surface

J. Gemperlová, M. Polcarová and J. Brádler



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J. Appl. Cryst. (1991). 24, 324-330    [doi:10.1107/S0021889891002042]

Strain field due to a slip band near a grain boundary in an Fe-6at.% Si bicrystal. II. Interpretation of double-crystal topographs

M. Polcarová, J. Gemperlová and J. Brádler



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J. Appl. Cryst. (1991). 24, 331-339    [doi:10.1107/S0021889891002054]

Strain field due to a slip band near a grain boundary in an Fe-6at.% Si bicrystal. III. Simulation of the orientation contrast

M. Polcarová, J. Gemperlová and J. Brádler



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J. Appl. Cryst. (1991). 24, 340-348    [doi:10.1107/S0021889891002133]

Development of a system to analyse the structure of a submicrometre-sized single crystal by synchrotron X-ray diffraction

K. Ohsumi, K. Hagiya and M. Ohmasa



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J. Appl. Cryst. (1991). 24, 349-351    [doi:10.1107/S0021889891002480]

The effect of inhomogeneity size and concentration on the analysis of small-angle scattering data

M. R. Baig, S. Gupta, S. Messoloras and R. J. Stewart



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J. Appl. Cryst. (1991). 24, 352-354    [doi:10.1107/S0021889891002492]

Sucrose, a convenient test crystal for absolute structures

R. C. Hynes and Y. Le Page



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J. Appl. Cryst. (1991). 24, 355-364    [doi:10.1107/S0021889891002820]

A fast X-ray diffraction method for the surface orientation analysis of large polycrystalline samples

P. Andonov



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J. Appl. Cryst. (1991). 24, 365-368    [doi:10.1107/S0021889891003680]

Determination of the direction of the propagation vector for incommensurate structures from neutron powder diffraction patterns

C. Wilkinson, G. Lautenschläger, R. Hock and H. Weitzel


crystallographers



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J. Appl. Cryst. (1991). 24, 369-402    [doi:10.1107/S0021889891003473]

Powder Diffraction Program Information 1990 Program List


short communications



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J. Appl. Cryst. (1991). 24, 403-404    [doi:10.1107/S0021889891002017]

Spatial intensity profile of an X-ray beam reflected from nearly perfect silicon and diffuse scattering measurements

I. R. Entin and V. I. Khrupa


computer programs



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J. Appl. Cryst. (1991). 24, 405-406    [doi:10.1107/S0021889890013887]

FRDICT - a computer program to generate a molecular dictionary for use in FRODO/ TOM

V. Prasad and M. V. Hosur


laboratory notes



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J. Appl. Cryst. (1991). 24, 406-408    [doi:10.1107/S0021889891001644]

Protein crystal growth in the presence of poly(vinylidene difluoride) membrane

J. S. Punzi, J. Luft and V. Cody


fast communications



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J. Appl. Cryst. (1991). 24, 409-411    [doi:10.1107/S0021889891004430]

Sparse matrix sampling: a screening method for crystallization of proteins

J. Jancarik and S.-H. Kim


crystallographers



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J. Appl. Cryst. (1991). 24, 412    [doi:10.1107/S0021889891006040]

Crystallographers


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