Journal of Applied Crystallography
Volume 25, Part 2 (April 1992)
J. Appl. Cryst. (1992). 25, 87 [doi:10.1107/S0021889892099898]
Editorial. New Section of Acta Crystallographica
J. Appl. Cryst. (1992). 25, 88-91 [doi:10.1107/S0021889891010531]
Determination of crystal imperfection by X-ray diffraction in a strong acoustic field
E. Zolotoyabko, I. Polikarpov, V. Panov and D. Schvarkov
J. Appl. Cryst. (1992). 25, 92-96 [doi:10.1107/S0021889891010634]
Indexing in single-crystal diffractometry with an obstinate list of reflections
A. J. M. Duisenberg
J. Appl. Cryst. (1992). 25, 97-104 [doi:10.1107/S0021889891010786]
Whole-pattern fitting in energy-dispersive powder diffraction
V. Honkimäki and P. Suortti
J. Appl. Cryst. (1992). 25, 105-108 [doi:10.1107/S0021889891010798]
Determination of thermal-motion parameters using energy-dispersive powder diffraction
V. Honkimäki and P. Suortti
J. Appl. Cryst. (1992). 25, 109-121 [doi:10.1107/S0021889891010804]
A fundamental parameters approach to X-ray line-profile fitting
R. W. Cheary and A. Coelho
J. Appl. Cryst. (1992). 25, 122-128 [doi:10.1107/S0021889891010890]
Planar defects in ![[beta]](/logos/entities/beta_rmgif.gif)
-iron disilicide (-FeSi2) analyzed by transmission electron microscopy and modeling
Y. Zheng, A. Taccoen and J. F. Petroff
J. Appl. Cryst. (1992). 25, 129-145 [doi:10.1107/S0021889891010907]
Model-independent determination of the surface scattering-length-density profile from specular reflectivity data
J. S. Pedersen
J. Appl. Cryst. (1992). 25, 146-154 [doi:10.1107/S0021889891010956]
Experience with commercial area detectors: a `buyer's' perspective
K. L. Krause and G. N. Phillips Jnr
J. Appl. Cryst. (1992). 25, 155-165 [doi:10.1107/S0021889891011093]
A new polarized target for neutron scattering studies on biomolecules: first results from apoferritin and the deuterated 50S subunit of ribosomes
W. Knop, M. Hirai, H.-J. Schink, H. B. Stuhrmann, R. Wagner, J. Zhao, O. Schärpf, R. R. Crichton, M. Krumpolc, K. H. Nierhaus, A. Rijllart and T. O. Niinikoski
J. Appl. Cryst. (1992). 25, 166-180 [doi:10.1107/S002188989101141X]
Molecular replacement real-space averaging
M. G. Rossmann, R. McKenna, L. Tong, D. Xia, J. Dai, H. Wu, H. K. Choi and R. E. Lynch
J. Appl. Cryst. (1992). 25, 181-191 [doi:10.1107/S0021889891011421]
The inertia-equivalent ellipsoid: a link between atomic structure and low-resolution models of small globular proteins determined by small-angle X-ray scattering
J. J. Müller and H. Schrauber
J. Appl. Cryst. (1992). 25, 192-194 [doi:10.1107/S0021889891011445]
The X-ray diffraction station at the ADONE wiggler facility: preliminary results (including crystal perfection)
M. Colapietro, G. Cappuccio, C. Marciante, A. Pifferi, R. Spagna and J. R. Helliwell
J. Appl. Cryst. (1992). 25, 195-198 [doi:10.1107/S0021889891011640]
Phase identification of single crystals using a self-consistent indexing scheme based on the Laue method
J. Pan
J. Appl. Cryst. (1992). 25, 199-204 [doi:10.1107/S0021889891011871]
The defects and intergrowth of lead oxides revealed by HRTEM
Y. G. Wang, H. Q. Ye, K. H. Kuo and J. G. Guo
J. Appl. Cryst. (1992). 25, 205-210 [doi:10.1107/S0021889891011986]
Resolution of a protein sequence ambiguity by X-ray crystallographic and mass spectrometric methods
L. J. Keefe, E. E. Lattman, C. Wolkow, A. Woods, M. Chevrier and R. J. Cotter
J. Appl. Cryst. (1992). 25, 211-213 [doi:10.1107/S0021889891012074]
The lens equation for Bragg diffraction optics. The general case of asymmetrical reflection
F. N. Chukhovskii and M. Krisch
J. Appl. Cryst. (1992). 25, 214-220 [doi:10.1107/S0021889891012086]
Logiciel de génération et représentation de structures cristallines
A. Soyer et A. Rimsky
J. Appl. Cryst. (1992). 25, 221-230 [doi:10.1107/S0021889891012098]
Multiple small-angle scattering from a statistical medium
S. Mazumder and A. Sequeira
J. Appl. Cryst. (1992). 25, 231-236 [doi:10.1107/S0021889891012104]
On the determination of accurate intensities from powder diffraction data. I. Whole-pattern fitting with a least-squares procedure
J. Jansen, R. Peschar and H. Schenk
J. Appl. Cryst. (1992). 25, 237-243 [doi:10.1107/S0021889891012128]
On the determination of accurate intensities from powder diffraction data. II. Estimation of intensities of overlapping reflections
J. Jansen, R. Peschar and H. Schenk
J. Appl. Cryst. (1992). 25, 244-250 [doi:10.1107/S0021889891012116]
Energy-dispersive diffuse X-ray scattering apparatus
J. S. Reid and S. G. Clackson
J. Appl. Cryst. (1992). 25, 251-258 [doi:10.1107/S0021889891012384]
Using CPS120 (curved position-sensitive detector covering 120°) powder diffraction data in Rietveld analysis. The dehydration process in the zeolite thomsonite
K. Ståhl and R. Thomasson
J. Appl. Cryst. (1992). 25, 259-267 [doi:10.1107/S0021889891012499]
The iterative series-expansion method for quantitative texture analysis. II. Applications
M. Dahms
J. Appl. Cryst. (1992). 25, 268-273 [doi:10.1107/S0021889891012517]
Compton scattering experiments with monochromatic W K![[alpha]](/logos/entities/alpha_rmgif.gif)
1
radiation
S. Manninen, V. Honkimäki and P. Suortti
J. Appl. Cryst. (1992). 25, 274-280 [doi:10.1107/S0021889891012785]
X-ray diffraction study of KTP (KTiOPO4) crystals under a static electric field
M. T. Sebastian, H. Klapper and R. J. Bolt
J. Appl. Cryst. (1992). 25, 281-284 [doi:10.1107/S0021889891012773]
Fast rigid-body refinement for molecular-replacement techniques
E. E. Castellano, G. Oliva and J. Navaza
J. Appl. Cryst. (1992). 25, 285-293 [doi:10.1107/S0021889891012797]
Estimation of dmin, ![[lambda]](/logos/entities/lambda_rmgif.gif)
min and max from the gnomonic projections of Laue patterns
D. W. J. Cruickshank, P. D. Carr and M. M. Harding
J. Appl. Cryst. (1992). 25, 294-308 [doi:10.1107/S0021889891012803]
The determination of unit-cell parameters from Laue diffraction patterns using their gnomonic projections
P. D. Carr, D. W. J. Cruickshank and M. M. Harding
J. Appl. Cryst. (1992). 25, 309-310 [doi:10.1107/S002188989101395X]
Concentration dependence of Debye temperature in mixed KxRb1-xCl
J. Bashir, M. M. Beg, N. M. Butt, Q. H. Khan and M. Nasir Khan
J. Appl. Cryst. (1992). 25, 310-317 [doi:10.1107/S0021889891013134]
SIRPOW.91 - a direct-methods package optimized for powder data
G. Cascarano, L. Favia and C. Giacovazzo
J. Appl. Cryst. (1992). 25, 317-322 [doi:10.1107/S0021889891013328]
A new algorithm for incommensurate structure refinement
W. A. Paciorek and G. Chapuis
J. Appl. Cryst. (1992). 25, 323-324 [doi:10.1107/S0021889891011342]
Soaking of crystals for macromolecular crystallography in a capillary
L. Lebioda and E. Zhang
J. Appl. Cryst. (1992). 25, 324-325 [doi:10.1107/S0021889891011354]
HANGMAN: a macromolecular hanging-drop vapor-diffusion technique
J. R. Luft and G. T. DeTitta
J. Appl. Cryst. (1992). 25, 326-327 [doi:10.1107/S0021889891010919]
REFORM - an interactive program for the manipulation of crystallographic coordinates from macromolecular structures
U. Heinemann
J. Appl. Cryst. (1992). 25, 327-328 [doi:10.1107/S0021889891012815]
OMITMAP for UNIX
M. Carson
J. Appl. Cryst. (1992). 25, 328-329 [doi:10.1107/S0021889891013067]
XFPS - a program for automatic solution of crystal structures by Patterson, Fourier and superposition methods. Recent developments
F. Pavelcík, J. Sivý, C. Rizzoli and G. D. Andreetti
J. Appl. Cryst. (1992). 25, 329 [doi:10.1107/S0021889891013584]
Crystallographers
J. Appl. Cryst. (1992). 25, 329 [doi:10.1107/S0021889892099886]
Oxford Cryosystems Award during ECM-14
J. Appl. Cryst. (1992). 25, 329 [doi:10.1107/S0021889892099874]
Nominations for the Ewald Prize
J. Appl. Cryst. (1992). 25, 329-330 [doi:10.1107/S0021889892099862]
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