Journal of Applied Crystallography

Volume 25, Part 2 (April 1992)



international union of crystallography



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J. Appl. Cryst. (1992). 25, 87    [doi:10.1107/S0021889892099898]

Editorial. New Section of Acta Crystallographica


research papers



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J. Appl. Cryst. (1992). 25, 88-91    [doi:10.1107/S0021889891010531]

Determination of crystal imperfection by X-ray diffraction in a strong acoustic field

E. Zolotoyabko, I. Polikarpov, V. Panov and D. Schvarkov



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J. Appl. Cryst. (1992). 25, 92-96    [doi:10.1107/S0021889891010634]

Indexing in single-crystal diffractometry with an obstinate list of reflections

A. J. M. Duisenberg



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J. Appl. Cryst. (1992). 25, 97-104    [doi:10.1107/S0021889891010786]

Whole-pattern fitting in energy-dispersive powder diffraction

V. Honkimäki and P. Suortti



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J. Appl. Cryst. (1992). 25, 105-108    [doi:10.1107/S0021889891010798]

Determination of thermal-motion parameters using energy-dispersive powder diffraction

V. Honkimäki and P. Suortti



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J. Appl. Cryst. (1992). 25, 109-121    [doi:10.1107/S0021889891010804]

A fundamental parameters approach to X-ray line-profile fitting

R. W. Cheary and A. Coelho



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J. Appl. Cryst. (1992). 25, 122-128    [doi:10.1107/S0021889891010890]

Planar defects in [beta]-iron disilicide ([beta]-FeSi2) analyzed by transmission electron microscopy and modeling

Y. Zheng, A. Taccoen and J. F. Petroff



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J. Appl. Cryst. (1992). 25, 129-145    [doi:10.1107/S0021889891010907]

Model-independent determination of the surface scattering-length-density profile from specular reflectivity data

J. S. Pedersen



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J. Appl. Cryst. (1992). 25, 146-154    [doi:10.1107/S0021889891010956]

Experience with commercial area detectors: a `buyer's' perspective

K. L. Krause and G. N. Phillips Jnr



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J. Appl. Cryst. (1992). 25, 155-165    [doi:10.1107/S0021889891011093]

A new polarized target for neutron scattering studies on biomolecules: first results from apoferritin and the deuterated 50S subunit of ribosomes

W. Knop, M. Hirai, H.-J. Schink, H. B. Stuhrmann, R. Wagner, J. Zhao, O. Schärpf, R. R. Crichton, M. Krumpolc, K. H. Nierhaus, A. Rijllart and T. O. Niinikoski



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J. Appl. Cryst. (1992). 25, 166-180    [doi:10.1107/S002188989101141X]

Molecular replacement real-space averaging

M. G. Rossmann, R. McKenna, L. Tong, D. Xia, J. Dai, H. Wu, H. K. Choi and R. E. Lynch



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J. Appl. Cryst. (1992). 25, 181-191    [doi:10.1107/S0021889891011421]

The inertia-equivalent ellipsoid: a link between atomic structure and low-resolution models of small globular proteins determined by small-angle X-ray scattering

J. J. Müller and H. Schrauber



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J. Appl. Cryst. (1992). 25, 192-194    [doi:10.1107/S0021889891011445]

The X-ray diffraction station at the ADONE wiggler facility: preliminary results (including crystal perfection)

M. Colapietro, G. Cappuccio, C. Marciante, A. Pifferi, R. Spagna and J. R. Helliwell



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J. Appl. Cryst. (1992). 25, 195-198    [doi:10.1107/S0021889891011640]

Phase identification of single crystals using a self-consistent indexing scheme based on the Laue method

J. Pan



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J. Appl. Cryst. (1992). 25, 199-204    [doi:10.1107/S0021889891011871]

The defects and intergrowth of lead oxides revealed by HRTEM

Y. G. Wang, H. Q. Ye, K. H. Kuo and J. G. Guo



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J. Appl. Cryst. (1992). 25, 205-210    [doi:10.1107/S0021889891011986]

Resolution of a protein sequence ambiguity by X-ray crystallographic and mass spectrometric methods

L. J. Keefe, E. E. Lattman, C. Wolkow, A. Woods, M. Chevrier and R. J. Cotter



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J. Appl. Cryst. (1992). 25, 211-213    [doi:10.1107/S0021889891012074]

The lens equation for Bragg diffraction optics. The general case of asymmetrical reflection

F. N. Chukhovskii and M. Krisch



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J. Appl. Cryst. (1992). 25, 214-220    [doi:10.1107/S0021889891012086]

Logiciel de génération et représentation de structures cristallines

A. Soyer et A. Rimsky



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J. Appl. Cryst. (1992). 25, 221-230    [doi:10.1107/S0021889891012098]

Multiple small-angle scattering from a statistical medium

S. Mazumder and A. Sequeira



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J. Appl. Cryst. (1992). 25, 231-236    [doi:10.1107/S0021889891012104]

On the determination of accurate intensities from powder diffraction data. I. Whole-pattern fitting with a least-squares procedure

J. Jansen, R. Peschar and H. Schenk



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J. Appl. Cryst. (1992). 25, 237-243    [doi:10.1107/S0021889891012128]

On the determination of accurate intensities from powder diffraction data. II. Estimation of intensities of overlapping reflections

J. Jansen, R. Peschar and H. Schenk



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J. Appl. Cryst. (1992). 25, 244-250    [doi:10.1107/S0021889891012116]

Energy-dispersive diffuse X-ray scattering apparatus

J. S. Reid and S. G. Clackson



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J. Appl. Cryst. (1992). 25, 251-258    [doi:10.1107/S0021889891012384]

Using CPS120 (curved position-sensitive detector covering 120°) powder diffraction data in Rietveld analysis. The dehydration process in the zeolite thomsonite

K. Ståhl and R. Thomasson



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J. Appl. Cryst. (1992). 25, 259-267    [doi:10.1107/S0021889891012499]

The iterative series-expansion method for quantitative texture analysis. II. Applications

M. Dahms



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J. Appl. Cryst. (1992). 25, 268-273    [doi:10.1107/S0021889891012517]

Compton scattering experiments with monochromatic W K[alpha]1 radiation

S. Manninen, V. Honkimäki and P. Suortti



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J. Appl. Cryst. (1992). 25, 274-280    [doi:10.1107/S0021889891012785]

X-ray diffraction study of KTP (KTiOPO4) crystals under a static electric field

M. T. Sebastian, H. Klapper and R. J. Bolt



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J. Appl. Cryst. (1992). 25, 281-284    [doi:10.1107/S0021889891012773]

Fast rigid-body refinement for molecular-replacement techniques

E. E. Castellano, G. Oliva and J. Navaza



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J. Appl. Cryst. (1992). 25, 285-293    [doi:10.1107/S0021889891012797]

Estimation of dmin, [lambda]min and [lambda]max from the gnomonic projections of Laue patterns

D. W. J. Cruickshank, P. D. Carr and M. M. Harding



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J. Appl. Cryst. (1992). 25, 294-308    [doi:10.1107/S0021889891012803]

The determination of unit-cell parameters from Laue diffraction patterns using their gnomonic projections

P. D. Carr, D. W. J. Cruickshank and M. M. Harding


short communications



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J. Appl. Cryst. (1992). 25, 309-310    [doi:10.1107/S002188989101395X]

Concentration dependence of Debye temperature in mixed KxRb1-xCl

J. Bashir, M. M. Beg, N. M. Butt, Q. H. Khan and M. Nasir Khan


computer programs



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J. Appl. Cryst. (1992). 25, 310-317    [doi:10.1107/S0021889891013134]

SIRPOW.91 - a direct-methods package optimized for powder data

G. Cascarano, L. Favia and C. Giacovazzo



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J. Appl. Cryst. (1992). 25, 317-322    [doi:10.1107/S0021889891013328]

A new algorithm for incommensurate structure refinement

W. A. Paciorek and G. Chapuis


laboratory notes



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J. Appl. Cryst. (1992). 25, 323-324    [doi:10.1107/S0021889891011342]

Soaking of crystals for macromolecular crystallography in a capillary

L. Lebioda and E. Zhang



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J. Appl. Cryst. (1992). 25, 324-325    [doi:10.1107/S0021889891011354]

HANGMAN: a macromolecular hanging-drop vapor-diffusion technique

J. R. Luft and G. T. DeTitta


computer program abstracts



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J. Appl. Cryst. (1992). 25, 326-327    [doi:10.1107/S0021889891010919]

REFORM - an interactive program for the manipulation of crystallographic coordinates from macromolecular structures

U. Heinemann



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J. Appl. Cryst. (1992). 25, 327-328    [doi:10.1107/S0021889891012815]

OMITMAP for UNIX

M. Carson



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J. Appl. Cryst. (1992). 25, 328-329    [doi:10.1107/S0021889891013067]

XFPS - a program for automatic solution of crystal structures by Patterson, Fourier and superposition methods. Recent developments

F. Pavelcík, J. Sivý, C. Rizzoli and G. D. Andreetti


crystallographers



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J. Appl. Cryst. (1992). 25, 329    [doi:10.1107/S0021889891013584]

Crystallographers


notes and news



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J. Appl. Cryst. (1992). 25, 329    [doi:10.1107/S0021889892099886]

Oxford Cryosystems Award during ECM-14


international union of crystallography



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J. Appl. Cryst. (1992). 25, 329    [doi:10.1107/S0021889892099874]

Nominations for the Ewald Prize


new commercial products



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J. Appl. Cryst. (1992). 25, 329-330    [doi:10.1107/S0021889892099862]

New Commercial Products


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