Journal of Applied Crystallography

Volume 25, Part 3 (June 1992)



research papers



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J. Appl. Cryst. (1992). 25, 331-335    [doi:10.1107/S0021889891011433]

Line shifts in crystal powder diffractometers

M. Popovici and A. D. Stoica



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J. Appl. Cryst. (1992). 25, 336-339    [doi:10.1107/S0021889891012372]

The application of cluster analysis in X-ray diffraction phase analysis

B. Liao and J. Chen



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J. Appl. Cryst. (1992). 25, 340-347    [doi:10.1107/S0021889891012876]

An X-ray spectrometer with an energy resolution of 54 meV

W. Hofmann, J. Kalus and U. Schmelzer



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J. Appl. Cryst. (1992). 25, 348-357    [doi:10.1107/S0021889891012955]

A high-speed data-collection system for large-unit-cell crystals using an imaging plate as a detector

M. Sato, M. Yamamoto, K. Imada, Y. Katsube, N. Tanaka and T. Higashi



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J. Appl. Cryst. (1992). 25, 358-365    [doi:10.1107/S0021889891014048]

The effect of absorption on the integrated reflectivity of defective single crystals

P. D. Moran and R. J. Matyi



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J. Appl. Cryst. (1992). 25, 366-371    [doi:10.1107/S0021889892000888]

Simulation of Renninger scans for heteroepitaxic layers

C. A. B. Salles da Costa, L. P. Cardoso, V. L. Mazzocchi and C. B. R. Parente



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J. Appl. Cryst. (1992). 25, 372-376    [doi:10.1107/S0021889891014164]

Accurate determination of strain tensors from small shifts of reflections measured on a four-circle diffractometer

H. Graafsma



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J. Appl. Cryst. (1992). 25, 377-383    [doi:10.1107/S0021889891014231]

Angular measurements with X-ray interferometry

D. Windisch and P. Becker



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J. Appl. Cryst. (1992). 25, 384-390    [doi:10.1107/S002188989101422X]

The control of geometrical sources of error in X-ray diffraction applied to stress analysis

F. Convert and B. Miege



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J. Appl. Cryst. (1992). 25, 391-399    [doi:10.1107/S0021889891014322]

Calculation of diffuse scattering from simulated disordered crystals: a comparison with optical transforms

B. D. Butler and T. R. Welberry



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J. Appl. Cryst. (1992). 25, 400-408    [doi:10.1107/S0021889891014553]

Caractérisation de la texture de recristallisation primaire et de la spécialité des joints de grains de tôles de Fe-3%Si par diffraction des electrons rétrodiffusés

T. Baudin, P. Paillard et R. Penelle



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J. Appl. Cryst. (1992). 25, 409-413    [doi:10.1107/S0021889891014814]

On the apparent response of photographic emulsions according to least-squares determinations of the `blackness correction' from gas electron diffraction data

S. Gundersen, T. G. Strand and H. V. Volden



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J. Appl. Cryst. (1992). 25, 414-423    [doi:10.1107/S0021889891014826]

Quantitive analysis of Laue diffraction patterns recorded with a 120 ps exposure from an X-ray undulator

D. M. E. Szebenyi, D. H. Bilderback, A. LeGrand, K. Moffat, W. Schildkamp, B. Smith Temple and T. Teng



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J. Appl. Cryst. (1992). 25, 424-431    [doi:10.1107/S0021889892000116]

Precise X-ray relative measurement of lattice parameters of silicon wafers by multiple-crystal Bragg-case diffractometry. Computer simulation of the experiment

F. Cembali, R. Fabbri, M. Servidori, A. Zani, G. Basile, G. Cavagnero, A. Bergamin and G. Zosi



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J. Appl. Cryst. (1992). 25, 432-438    [doi:10.1107/S0021889892000839]

Bent-crystal monochromator for 150 keV synchrotron radiation

P. Suortti, D. Chapman, J. R. Schneider and T. Tschentscher


short communications



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J. Appl. Cryst. (1992). 25, 439    [doi:10.1107/S0021889892003091]

Influence of first-order approximations in the incidence parameter on the simulation of symmetric and asymmetric X-ray rocking curves of heteroepitactic structures. Erratum

M. Servidori, F. Cembali, R. Fabbri and A. Zani



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J. Appl. Cryst. (1992). 25, 440-443    [doi:10.1107/S0021889891015157]

A Laue diffractometer with [delta] geometry

J. Lange and H. Burzlaff


computer programs



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J. Appl. Cryst. (1992). 25, 443-447    [doi:10.1107/S0021889891013389]

FOURDEM: a program written as an aid to teaching the elements of Fourier synthesis and other crystallographic concepts

T. R. Welberry and K. Owen



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J. Appl. Cryst. (1992). 25, 447-451    [doi:10.1107/S0021889891013122]

MRIA - a program for a full profile analysis of powder multiphase neutron-diffraction time-of-flight (direct and Fourier) spectra

V. B. Zlokazov and V. V. Chernyshev



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J. Appl. Cryst. (1992). 25, 451-454    [doi:10.1107/S0021889891014243]

Software and methods for precise X-ray analysis

V. V. Chernyshev, G. V. Fetisov, A. V. Laktionov, V. T. Markov, A. P. Nesterenko and S. G. Zhukov



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J. Appl. Cryst. (1992). 25, 455-459    [doi:10.1107/S0021889892000384]

DIFRAC, single-crystal diffractometer output-conversion software

H. D. Flack, E. Blanc and D. Schwarzenbach



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J. Appl. Cryst. (1992). 25, 459-462    [doi:10.1107/S0021889892001122]

LSI - a computer program for simultaneous refinement of material structure and microstructure

L. Lutterotti, P. Scardi and P. Maistrelli


crystallographers



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J. Appl. Cryst. (1992). 25, 463    [doi:10.1107/S0021889892003777]

Crystallographers


book reviews



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J. Appl. Cryst. (1992). 25, 463-464    [doi:10.1107/S0021889892000797]

High-resolution transmission electron microscopy edited by P. Buseck, J. Cowley and L. Eyring


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