Journal of Applied Crystallography
Volume 25, Part 5 (October 1992)
J. Appl. Cryst. (1992). 25, 545-548 [doi:10.1107/S0021889892004023]
A flame-heated gas-flow furnace for single-crystal X-ray diffraction
R. C. Peterson
J. Appl. Cryst. (1992). 25, 549-558 [doi:10.1107/S0021889892004035]
Correcting spatial distortions and nonuniform response in area detectors
M. Stanton, W. C. Phillips, Y. Li and K. Kalata
J. Appl. Cryst. (1992). 25, 559-570 [doi:10.1107/S0021889892004084]
Profile fitting of X-ray diffraction lines and Fourier analysis of broadening
D. Balzar
J. Appl. Cryst. (1992). 25, 571-577 [doi:10.1107/S0021889892004102]
Powder diffraction in the range of milliseconds
P. U. Pennartz, U. Löchner, H. Fuess and T. Wroblewski
J. Appl. Cryst. (1992). 25, 578-581 [doi:10.1107/S0021889892004096]
X-ray diffraction investigations of CaF2 at high pressure
L. Gerward, J. S. Olsen, S. Steenstrup, M. Malinowski, S. Åsbrink and A. Waskowska
J. Appl. Cryst. (1992). 25, 582-588 [doi:10.1107/S0021889892004412]
Phase analysis of bulk samples using sample-tilting X-ray diffractometry
Q. Cong
J. Appl. Cryst. (1992). 25, 589-610 [doi:10.1107/S0021889892003649]
Rietveld refinement round robin. I. Analysis of standard X-ray and neutron data for PbSO4
R. J. Hill
J. Appl. Cryst. (1992). 25, 611-616 [doi:10.1107/S0021889892004795]
Texture in Rietveld refinement
N. C. Popa
J. Appl. Cryst. (1992). 25, 617-623 [doi:10.1107/S0021889892004801]
Crystal structure determination of lithium diborate hydrate, LiB2O3(OH).H2O, from X-ray
powder diffraction data collected with a curved position-sensitive detector
D. Louër, M. Louër and M. Touboul
J. Appl. Cryst. (1992). 25, 624-627 [doi:10.1107/S0021889892005077]
Determination of texture inhomogeneity in near-surface layers. Experimental verification
J. Bonarski and A. Morawiec
J. Appl. Cryst. (1992). 25, 628-631 [doi:10.1107/S0021889892004850]
Measurement of powder diffraction sample absorption coefficients using monochromated radiation and transmission geometry
C. R. Ross II
J. Appl. Cryst. (1992). 25, 632-637 [doi:10.1107/S0021889892005363]
Projection matrices for Niggli-reduced cells
W. A. Paciorek and M. Bonin
J. Appl. Cryst. (1992). 25, 638-645 [doi:10.1107/S0021889892005211]
The detective quantum efficiency of CCD and vidicon-based detectors for X-ray crystallographic applications
M. Stanton, W. C. Phillips, Y. Li and K. Kalata
J. Appl. Cryst. (1992). 25, 646-647 [doi:10.1107/S0021889892004813]
Background correction of the SAXS intensities scattered by semicrystalline materials
C. Meng
J. Appl. Cryst. (1992). 25, 648 [doi:10.1107/S0021889892005351]
Crystal setting by Bairsto's method
J. A. D. Jeffreys
J. Appl. Cryst. (1992). 25, 648-652 [doi:10.1107/S0021889892004667]
QUASI2D: a program written to demonstrate quasiperiodicity and phason fluctuation
T. R. Welberry, A. Lee and K. Owen
J. Appl. Cryst. (1992). 25, 652-653 [doi:10.1107/S0021889892004655]
Microcomputer-based acquisition system for the Philips PW1050 powder diffractometer
M. W. Grigg, A. Keating, A. Brockwell and Z. Barnea
J. Appl. Cryst. (1992). 25, 654-657 [doi:10.1107/S0021889892007076]
Valence-contrast studies by resonant diffraction with synchrotron radiation; the rôle of X-ray absorption measurements
A. P. Wilkinson and A. K. Cheetham
J. Appl. Cryst. (1992). 25, 657-660 [doi:10.1107/S0021889892007490]
High-resolution direct observation of the carbon-cage structure of C60 buckyballs
A. V. Narlikar, S. B. Samanta, P. K. Dutta, L. S. Grigoryan and A. K. Majumdar
J. Appl. Cryst. (1992). 25, 661-662 [doi:10.1107/S0021889892006290]
About the primitivity theorem
Y. Le Page
J. Appl. Cryst. (1992). 25, 663 [doi:10.1107/S0021889892002474]
CSDSHL - a utility for converting Cambridge Structural Database atom coordinate files to SHELX format
D. R. Powell
J. Appl. Cryst. (1992). 25, 663 [doi:10.1107/S0021889892008483]
Crystallographers
J. Appl. Cryst. (1992). 25, 663-664 [doi:10.1107/S0021889892099850]
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