Journal of Applied Crystallography

Volume 25, Part 6 (December 1992)



research papers



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J. Appl. Cryst. (1992). 25, 665-673    [doi:10.1107/S0021889892004849]

Evolution of crystallographic texture in thin wires

T. Montesin and J. J. Heizmann



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J. Appl. Cryst. (1992). 25, 674-693    [doi:10.1107/S0021889892005053]

X-ray diffraction of bent crystals in Bragg geometry. I. Perfect-crystal modelling

C. T. Chantler



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J. Appl. Cryst. (1992). 25, 694-713    [doi:10.1107/S0021889892005065]

X-ray diffraction of bent crystals in Bragg geometry. II. Non-ideally imperfect crystals, modelling and results

C. T. Chantler



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J. Appl. Cryst. (1992). 25, 714-723    [doi:10.1107/S002188989200534X]

The simulation and interpretation of diffraction profiles from partially relaxed layer structures

P. F. Fewster



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J. Appl. Cryst. (1992). 25, 724-730    [doi:10.1107/S0021889892005375]

Numbering the crystallographic variants in phase transformation

M. Humbert, F. Wagner and C. Esling



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J. Appl. Cryst. (1992). 25, 731-736    [doi:10.1107/S0021889892005648]

A layer-coupling model for neutron reflectivity and transmissivity calculation in deformed mosaic crystals

H.-C. Hu



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J. Appl. Cryst. (1992). 25, 737-743    [doi:10.1107/S0021889892005715]

Electron microscopy of the mineral chalcopyrite, CuFeS2

K. Z. Baba-Kishi



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J. Appl. Cryst. (1992). 25, 744-750    [doi:10.1107/S0021889892005727]

Assessment of material perfection and observation of vibration modes in lithium tantalate by X-ray topography

A. Zarka, B. Capelle, Y. Zheng, J. Détaint, J. Schwartzel, C. Joly and D. Cochet-Muchy



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J. Appl. Cryst. (1992). 25, 751-755    [doi:10.1107/S0021889892004874]

Elastic properties of polycrystals in the Voigt-Reuss-Hill approximation

L. Zuo, M. Humbert and C. Esling



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J. Appl. Cryst. (1992). 25, 756-760    [doi:10.1107/S0021889892005387]

Practical aspects of calculating the elastic properties of polycrystals from the texture according to different models

J. Diz and M. Humbert



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J. Appl. Cryst. (1992). 25, 761-765    [doi:10.1107/S0021889892005776]

Angle calculations for a vertical-axis X-ray diffractometer

H.-H. Hung



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J. Appl. Cryst. (1992). 25, 766-769    [doi:10.1107/S0021889892006265]

Texture analysis by the Schulz reflection method: defocalization corrections for thin films

D. Chateigner, P. Germi and M. Pernet



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J. Appl. Cryst. (1992). 25, 770-777    [doi:10.1107/S0021889892006320]

Preferred orientation in erbium thin films observed using synchrotron radiation

M. A. Player, G. V. Marr, E. Gu, H. Savaloni, N. Öncan and I. H. Munro



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J. Appl. Cryst. (1992). 25, 778-784    [doi:10.1107/S0021889892006368]

The isoscattering point in X-ray scattering curves of globular solute particles measured by the contrast-variation method

T. Kawaguchi and T. Hamanaka



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J. Appl. Cryst. (1992). 25, 785-788    [doi:10.1107/S0021889892007064]

A multilayer analyser suitable for linear detection of anomalous small-angle X-ray scattering

J. P. Simon, J. Mainville, E. Ziegler and O. Lyon



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J. Appl. Cryst. (1992). 25, 789-796    [doi:10.1107/S0021889892004072]

Improvement of neutron reflectivity of an Ni-Ti multilayer by hydrogenation of titanium layers

M. Mâcaza, Z. Jiang, F. Samuel, B. Farnoux and B. Vidal



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J. Appl. Cryst. (1992). 25, 797-799    [doi:10.1107/S0021889892007416]

Determination of the Debye-Waller factor of molybdenum by powder neutron diffraction

J. Bashir, N. M. Butt, M. Nasir Khan, Q. H. Khan, B. Zhang, J. Yang, Y. Ding and C. Ye


short communications



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J. Appl. Cryst. (1992). 25, 800-801    [doi:10.1107/S0021889892004837]

On the interpretation of X-ray diffraction effects in ferroelectric crystals subjected to laser irradiation

S. G. Zhukov, G. V. Fetisov and L. A. Aslanov



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J. Appl. Cryst. (1992). 25, 801-802    [doi:10.1107/S0021889892010367]

Calculation of diffuse scattering from simulated disordered crystals: a comparison with optical transforms. Erratum

B. D. Butler and T. R. Welberry


computer programs



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J. Appl. Cryst. (1992). 25, 803-806    [doi:10.1107/S0021889892006733]

The database BIOSCAT: a tool for structure research by scattering and hydrodynamic methods

J. J. Müller, H. Pankow, B. Poppe and G. Damaschun


laboratory notes



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J. Appl. Cryst. (1992). 25, 807-808    [doi:10.1107/S0021889892006551]

Orientation attachment for crystallographic apparatus

S. G. Clackson and J. S. Reid


fast communications



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J. Appl. Cryst. (1992). 25, 809-811    [doi:10.1107/S0021889892008410]

The Weissenberg method for the collection of X-ray diffraction data from macromolecular crystals: modifications to the data-processing program WEIS

B. A. Fields, J. M. Guss, M. C. Lawrence and A. Nakagawa


international union of crystallography



pdf version free

J. Appl. Cryst. (1992). 25, 812    [doi:10.1107/S0021889892099849]

Prices of Acta Crystallographica and Journal of Applied Crystallography


J. Appl. Cryst. (1992). 25, 813-817

Subject index to volume 25 (1992)


J. Appl. Cryst. (1992). 25, 818-822

Author index to volume 25 (1992)


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