Journal of Applied Crystallography
Volume 25, Part 6 (December 1992)
J. Appl. Cryst. (1992). 25, 665-673 [doi:10.1107/S0021889892004849]
Evolution of crystallographic texture in thin wires
T. Montesin and J. J. Heizmann
J. Appl. Cryst. (1992). 25, 674-693 [doi:10.1107/S0021889892005053]
X-ray diffraction of bent crystals in Bragg geometry. I. Perfect-crystal modelling
C. T. Chantler
J. Appl. Cryst. (1992). 25, 694-713 [doi:10.1107/S0021889892005065]
X-ray diffraction of bent crystals in Bragg geometry. II. Non-ideally imperfect crystals, modelling and results
C. T. Chantler
J. Appl. Cryst. (1992). 25, 714-723 [doi:10.1107/S002188989200534X]
The simulation and interpretation of diffraction profiles from partially relaxed layer structures
P. F. Fewster
J. Appl. Cryst. (1992). 25, 724-730 [doi:10.1107/S0021889892005375]
Numbering the crystallographic variants in phase transformation
M. Humbert, F. Wagner and C. Esling
J. Appl. Cryst. (1992). 25, 731-736 [doi:10.1107/S0021889892005648]
A layer-coupling model for neutron reflectivity and transmissivity calculation in deformed mosaic crystals
H.-C. Hu
J. Appl. Cryst. (1992). 25, 737-743 [doi:10.1107/S0021889892005715]
Electron microscopy of the mineral chalcopyrite, CuFeS2
K. Z. Baba-Kishi
J. Appl. Cryst. (1992). 25, 744-750 [doi:10.1107/S0021889892005727]
Assessment of material perfection and observation of vibration modes in lithium tantalate by X-ray topography
A. Zarka, B. Capelle, Y. Zheng, J. Détaint, J. Schwartzel, C. Joly and D. Cochet-Muchy
J. Appl. Cryst. (1992). 25, 751-755 [doi:10.1107/S0021889892004874]
Elastic properties of polycrystals in the Voigt-Reuss-Hill approximation
L. Zuo, M. Humbert and C. Esling
J. Appl. Cryst. (1992). 25, 756-760 [doi:10.1107/S0021889892005387]
Practical aspects of calculating the elastic properties of polycrystals from the texture according to different models
J. Diz and M. Humbert
J. Appl. Cryst. (1992). 25, 761-765 [doi:10.1107/S0021889892005776]
Angle calculations for a vertical-axis X-ray diffractometer
H.-H. Hung
J. Appl. Cryst. (1992). 25, 766-769 [doi:10.1107/S0021889892006265]
Texture analysis by the Schulz reflection method: defocalization corrections for thin films
D. Chateigner, P. Germi and M. Pernet
J. Appl. Cryst. (1992). 25, 770-777 [doi:10.1107/S0021889892006320]
Preferred orientation in erbium thin films observed using synchrotron radiation
M. A. Player, G. V. Marr, E. Gu, H. Savaloni, N. Öncan and I. H. Munro
J. Appl. Cryst. (1992). 25, 778-784 [doi:10.1107/S0021889892006368]
The isoscattering point in X-ray scattering curves of globular solute particles measured by the contrast-variation method
T. Kawaguchi and T. Hamanaka
J. Appl. Cryst. (1992). 25, 785-788 [doi:10.1107/S0021889892007064]
A multilayer analyser suitable for linear detection of anomalous small-angle X-ray scattering
J. P. Simon, J. Mainville, E. Ziegler and O. Lyon
J. Appl. Cryst. (1992). 25, 789-796 [doi:10.1107/S0021889892004072]
Improvement of neutron reflectivity of an Ni-Ti multilayer by hydrogenation of titanium layers
M. Mâcaza, Z. Jiang, F. Samuel, B. Farnoux and B. Vidal
J. Appl. Cryst. (1992). 25, 797-799 [doi:10.1107/S0021889892007416]
Determination of the Debye-Waller factor of molybdenum by powder neutron diffraction
J. Bashir, N. M. Butt, M. Nasir Khan, Q. H. Khan, B. Zhang, J. Yang, Y. Ding and C. Ye
J. Appl. Cryst. (1992). 25, 800-801 [doi:10.1107/S0021889892004837]
On the interpretation of X-ray diffraction effects in ferroelectric crystals subjected to laser irradiation
S. G. Zhukov, G. V. Fetisov and L. A. Aslanov
J. Appl. Cryst. (1992). 25, 801-802 [doi:10.1107/S0021889892010367]
Calculation of diffuse scattering from simulated disordered crystals: a comparison with optical transforms. Erratum
B. D. Butler and T. R. Welberry
J. Appl. Cryst. (1992). 25, 803-806 [doi:10.1107/S0021889892006733]
The database BIOSCAT: a tool for structure research by scattering and hydrodynamic methods
J. J. Müller, H. Pankow, B. Poppe and G. Damaschun
J. Appl. Cryst. (1992). 25, 807-808 [doi:10.1107/S0021889892006551]
Orientation attachment for crystallographic apparatus
S. G. Clackson and J. S. Reid
J. Appl. Cryst. (1992). 25, 809-811 [doi:10.1107/S0021889892008410]
The Weissenberg method for the collection of X-ray diffraction data from macromolecular crystals: modifications to the data-processing program WEIS
B. A. Fields, J. M. Guss, M. C. Lawrence and A. Nakagawa
J. Appl. Cryst. (1992). 25, 812 [doi:10.1107/S0021889892099849]
Prices of Acta Crystallographica and Journal of Applied Crystallography
J. Appl. Cryst. (1992). 25, 813-817
Subject index to volume 25 (1992)
J. Appl. Cryst. (1992). 25, 818-822
Author index to volume 25 (1992)
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