Journal of Applied Crystallography

Volume 26, Part 1 (February 1993)



research papers



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J. Appl. Cryst. (1993). 26, 1-4    [doi:10.1107/S0021889892006009]

A 109 high-pressure cell for X-ray and optical measurements

M. Leszczynski, S. Podlasin and T. Suski



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J. Appl. Cryst. (1993). 26, 5-8    [doi:10.1107/S0021889892006010]

On the least-squares determination of lattice dimensions: a modified singular value decomposition approach to ill-conditioned cases

U. Anselmi-Tamburini and G. Spinolo



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J. Appl. Cryst. (1993). 26, 9-14    [doi:10.1107/S0021889892007088]

A data-acquisition system for area detectors

B. P. Schoenborn, H. Wang, M. A. Kelley, G. Dimmler and S. Rankowitz



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J. Appl. Cryst. (1993). 26, 15-21    [doi:10.1107/S0021889892007295]

Patterson-map interpretation with noncrystallographic symmetry

L. Tong and M. G. Rossmann



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J. Appl. Cryst. (1993). 26, 22-33    [doi:10.1107/S0021889892007684]

The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide

J. I. Langford, A. Boultif, J. P. Auffrédic and D. Louër



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J. Appl. Cryst. (1993). 26, 34-40    [doi:10.1107/S0021889892007799]

Grazing-incidence X-ray diffraction on ion-implanted silicon

S. Rugel, G. Wallner, H. Metzger and J. Peisl



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J. Appl. Cryst. (1993). 26, 41-46    [doi:10.1107/S0021889892007921]

Effect of variation in PbI2 doping on the polytypism of dendritic CdI2 single crystals

B. Kumar and G. C. Trigunayat



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J. Appl. Cryst. (1993). 26, 47-60    [doi:10.1107/S0021889892008240]

Quality control of protein models: directional atomic contact analysis

G. Vriend and C. Sander



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J. Appl. Cryst. (1993). 26, 61-67    [doi:10.1107/S0021889892008252]

A new neutron diffractometer with multiple detectors combining the advantages of time-of-flight and double-axis diffractometers

W. Turba, T. Peterlin-Neumaier and E. Steichele



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J. Appl. Cryst. (1993). 26, 68-70    [doi:10.1107/S0021889892008434]

Protein symmetry: metric and crystal (a precautionary note)

A. D. Mighell, J. R. Rodgers and V. L. Karen



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J. Appl. Cryst. (1993). 26, 71-76    [doi:10.1107/S0021889892008744]

Twinning of LaGaO3 single crystals

I. K. Bdikin, I. M. Shmyt'ko, A. M. Balbashov and A. V. Kazansky



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J. Appl. Cryst. (1993). 26, 77-81    [doi:10.1107/S002188989200877X]

High-temperature X-ray diffraction: solutions to uncertainties in temperature and sample position

N. E. Brown, S. M. Swapp, C. L. Bennett and A. Navrotsky



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J. Appl. Cryst. (1993). 26, 82-91    [doi:10.1107/S0021889892008781]

Computer processing and analysis of X-ray fibre diffraction data

M. Lorenz and K. C. Holmes



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J. Appl. Cryst. (1993). 26, 92-96    [doi:10.1107/S0021889892008793]

Preparation of protein crystallization buffers with a computer-controlled motorized pipette: PIPEX

J.-L. Eiselé



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J. Appl. Cryst. (1993). 26, 97-103    [doi:10.1107/S0021889892008987]

Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks

D. Balzar and H. Ledbetter



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J. Appl. Cryst. (1993). 26, 104-111    [doi:10.1107/S0021889892009142]

One-dimensional contrast modulations in [001] high-resolution reverse images of Bi2Sr2(Ca1-xNdx)Cu2O8+[delta] ceramics

T. Onozuka



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J. Appl. Cryst. (1993). 26, 112-121    [doi:10.1107/S0021889892009270]

Towards statistics of crystal orientations in quantitative texture anaylsis

H. Schaeben



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J. Appl. Cryst. (1993). 26, 122-127    [doi:10.1107/S0021889892009415]

Study of Brazil twin boundaries in synthetic quartz by means of simulations of X-ray topographs

M. González-Mañas, M. A. Caballero, B. Capelle and Y. Epelboin


short communications



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J. Appl. Cryst. (1993). 26, 128-129    [doi:10.1107/S0021889892009725]

Modeling of line-shape asymmetry in powder diffraction

J.-F. Bérar and G. Baldinozzi



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J. Appl. Cryst. (1993). 26, 130-132    [doi:10.1107/S0021889892008732]

The use of soft X-rays of very long wavelengths for small-angle scattering at the Aladdin storage ring

J. S. Tse, D. D. Klug and B. X. Yang



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J. Appl. Cryst. (1993). 26, 132-134    [doi:10.1107/S0021889892009257]

Microabsorption of scattered X-rays and its dependence on incidence angle in the nonsymmetric reflection case

W. Pitschke, H. Hermann and N. Mattern



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J. Appl. Cryst. (1993). 26, 135-137    [doi:10.1107/S0021889892009269]

Cryostat for synchrotron powder diffraction with sample rotation and controlled gas atmosphere in the sample chamber

J. Ihringer and A. Küster


computer programs



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J. Appl. Cryst. (1993). 26, 137-139    [doi:10.1107/S0021889892007611]

POLISH: computer program for improving the accuracy of structure-factor magnitudes obtained from powder data

P. G. Byrom and B. W. Lucas



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J. Appl. Cryst. (1993). 26, 140-141    [doi:10.1107/S0021889892008070]

DIFK91: a program for the modelling of powder diffraction patterns on a PC

L. Smrcok and Z. Weiss


letters to the editor



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J. Appl. Cryst. (1993). 26, 142-143    [doi:10.1107/S0021889892011774]

Hazards of oblique coordinate systems: a reminder

K. W. Muir and P. R. Mallinson


computer program abstracts



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J. Appl. Cryst. (1993). 26, 144    [doi:10.1107/S0021889892007751]

XTALLAB and POWDER - computer assisted instruction in elementary crystallographic methods

C. L. Day and R. A. Jacobson


crystallographers



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J. Appl. Cryst. (1993). 26, 144    [doi:10.1107/S0021889892012329]

Crystallographers


new commercial products



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J. Appl. Cryst. (1993). 26, 144-145    [doi:10.1107/S0021889893099662]

New Commercial Products


book reviews



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J. Appl. Cryst. (1993). 26, 145-146    [doi:10.1107/S0021889892008355]

Stuctural and chemical analysis of materials. X-ray, electron, and neutron diffraction; X-ray, electron, and ion spectrometry; electron microscopy by J. P. Eberhart


international union of crystallography



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J. Appl. Cryst. (1993). 26, 146-150    [doi:10.1107/S0021889893099650]

Journal of Applied Crystallography. Notes for Authors


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