Journal of Applied Crystallography
Volume 26, Part 1 (February 1993)
J. Appl. Cryst. (1993). 26, 1-4 [doi:10.1107/S0021889892006009]
A 109 high-pressure cell for X-ray and optical measurements
M. Leszczynski, S. Podlasin and T. Suski
J. Appl. Cryst. (1993). 26, 5-8 [doi:10.1107/S0021889892006010]
On the least-squares determination of lattice dimensions: a modified singular value decomposition approach to ill-conditioned cases
U. Anselmi-Tamburini and G. Spinolo
J. Appl. Cryst. (1993). 26, 9-14 [doi:10.1107/S0021889892007088]
A data-acquisition system for area detectors
B. P. Schoenborn, H. Wang, M. A. Kelley, G. Dimmler and S. Rankowitz
J. Appl. Cryst. (1993). 26, 15-21 [doi:10.1107/S0021889892007295]
Patterson-map interpretation with noncrystallographic symmetry
L. Tong and M. G. Rossmann
J. Appl. Cryst. (1993). 26, 22-33 [doi:10.1107/S0021889892007684]
The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide
J. I. Langford, A. Boultif, J. P. Auffrédic and D. Louër
J. Appl. Cryst. (1993). 26, 34-40 [doi:10.1107/S0021889892007799]
Grazing-incidence X-ray diffraction on ion-implanted silicon
S. Rugel, G. Wallner, H. Metzger and J. Peisl
J. Appl. Cryst. (1993). 26, 41-46 [doi:10.1107/S0021889892007921]
Effect of variation in PbI2 doping on the polytypism of dendritic CdI2 single crystals
B. Kumar and G. C. Trigunayat
J. Appl. Cryst. (1993). 26, 47-60 [doi:10.1107/S0021889892008240]
Quality control of protein models: directional atomic contact analysis
G. Vriend and C. Sander
J. Appl. Cryst. (1993). 26, 61-67 [doi:10.1107/S0021889892008252]
A new neutron diffractometer with multiple detectors combining the advantages of time-of-flight and double-axis diffractometers
W. Turba, T. Peterlin-Neumaier and E. Steichele
J. Appl. Cryst. (1993). 26, 68-70 [doi:10.1107/S0021889892008434]
Protein symmetry: metric and crystal (a precautionary note)
A. D. Mighell, J. R. Rodgers and V. L. Karen
J. Appl. Cryst. (1993). 26, 71-76 [doi:10.1107/S0021889892008744]
Twinning of LaGaO3 single crystals
I. K. Bdikin, I. M. Shmyt'ko, A. M. Balbashov and A. V. Kazansky
J. Appl. Cryst. (1993). 26, 77-81 [doi:10.1107/S002188989200877X]
High-temperature X-ray diffraction: solutions to uncertainties in temperature and sample position
N. E. Brown, S. M. Swapp, C. L. Bennett and A. Navrotsky
J. Appl. Cryst. (1993). 26, 82-91 [doi:10.1107/S0021889892008781]
Computer processing and analysis of X-ray fibre diffraction data
M. Lorenz and K. C. Holmes
J. Appl. Cryst. (1993). 26, 92-96 [doi:10.1107/S0021889892008793]
Preparation of protein crystallization buffers with a computer-controlled motorized pipette: PIPEX
J.-L. Eiselé
J. Appl. Cryst. (1993). 26, 97-103 [doi:10.1107/S0021889892008987]
Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks
D. Balzar and H. Ledbetter
J. Appl. Cryst. (1993). 26, 104-111 [doi:10.1107/S0021889892009142]
One-dimensional contrast modulations in [001] high-resolution reverse images of Bi2Sr2(Ca1-xNdx)Cu2O8+![[delta]](/logos/entities/delta_rmgif.gif)
ceramics
T. Onozuka
J. Appl. Cryst. (1993). 26, 112-121 [doi:10.1107/S0021889892009270]
Towards statistics of crystal orientations in quantitative texture anaylsis
H. Schaeben
J. Appl. Cryst. (1993). 26, 122-127 [doi:10.1107/S0021889892009415]
Study of Brazil twin boundaries in synthetic quartz by means of simulations of X-ray topographs
M. González-Mañas, M. A. Caballero, B. Capelle and Y. Epelboin
J. Appl. Cryst. (1993). 26, 128-129 [doi:10.1107/S0021889892009725]
Modeling of line-shape asymmetry in powder diffraction
J.-F. Bérar and G. Baldinozzi
J. Appl. Cryst. (1993). 26, 130-132 [doi:10.1107/S0021889892008732]
The use of soft X-rays of very long wavelengths for small-angle scattering at the Aladdin storage ring
J. S. Tse, D. D. Klug and B. X. Yang
J. Appl. Cryst. (1993). 26, 132-134 [doi:10.1107/S0021889892009257]
Microabsorption of scattered X-rays and its dependence on incidence angle in the nonsymmetric reflection case
W. Pitschke, H. Hermann and N. Mattern
J. Appl. Cryst. (1993). 26, 135-137 [doi:10.1107/S0021889892009269]
Cryostat for synchrotron powder diffraction with sample rotation and controlled gas atmosphere in the sample chamber
J. Ihringer and A. Küster
J. Appl. Cryst. (1993). 26, 137-139 [doi:10.1107/S0021889892007611]
POLISH: computer program for improving the accuracy of structure-factor magnitudes obtained from powder data
P. G. Byrom and B. W. Lucas
J. Appl. Cryst. (1993). 26, 140-141 [doi:10.1107/S0021889892008070]
DIFK91: a program for the modelling of powder diffraction patterns on a PC
L. Smrcok and Z. Weiss
J. Appl. Cryst. (1993). 26, 142-143 [doi:10.1107/S0021889892011774]
Hazards of oblique coordinate systems: a reminder
K. W. Muir and P. R. Mallinson
J. Appl. Cryst. (1993). 26, 144 [doi:10.1107/S0021889892007751]
XTALLAB and POWDER - computer assisted instruction in elementary crystallographic methods
C. L. Day and R. A. Jacobson
J. Appl. Cryst. (1993). 26, 144 [doi:10.1107/S0021889892012329]
Crystallographers
J. Appl. Cryst. (1993). 26, 144-145 [doi:10.1107/S0021889893099662]
New Commercial Products
J. Appl. Cryst. (1993). 26, 145-146 [doi:10.1107/S0021889892008355]
Stuctural and chemical analysis of materials. X-ray, electron, and neutron diffraction; X-ray, electron, and ion spectrometry; electron microscopy by J. P. Eberhart
J. Appl. Cryst. (1993). 26, 146-150 [doi:10.1107/S0021889893099650]
Journal of Applied Crystallography. Notes for Authors
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