Journal of Applied Crystallography
Volume 26, Part 2 (April 1993)
J. Appl. Cryst. (1993). 26, 151-158 [doi:10.1107/S0021889892010239]
A new technique for the observation of X-ray CTR scattering by using an imaging plate detector
T. Shimura and J. Harada
J. Appl. Cryst. (1993). 26, 159-165 [doi:10.1107/S0021889892010793]
Maximum-entropy-method analysis of neutron diffraction data
M. Sakata, T. Uno, M. Takata and C. J. Howard
J. Appl. Cryst. (1993). 26, 166-171 [doi:10.1107/S0021889892011592]
A method for the accurate determination of crystal truncation rod intensities by X-ray diffraction
E. D. Specht and F. J. Walker
J. Appl. Cryst. (1993). 26, 172-179 [doi:10.1107/S0021889892009038]
A four-point crystal bender for dispersive X-ray absorption spectroscopy
P. G. Allen, S. D. Conradson and J. E. Penner-Hahn
J. Appl. Cryst. (1993). 26, 180-184 [doi:10.1107/S0021889892009762]
X-ray powder diffraction analysis of silver behenate, a possible low-angle diffraction standard
T. C. Huang, H. Toraya, T. N. Blanton and Y. Wu
J. Appl. Cryst. (1993). 26, 185-191 [doi:10.1107/S0021889892009956]
X-ray diffraction studies of annealed Czochralski-grown silicon. I. Double-crystal diffractometry
S. Joksch, P. Zaumseil and W. Zulehner
J. Appl. Cryst. (1993). 26, 192-197 [doi:10.1107/S002188989201001X]
X-ray diffracton studies of annealed Czochralski-grown silicon. II. Triple-crystal diffractometry
P. Zaumseil, S. Joksch and W. Zulehner
J. Appl. Cryst. (1993). 26, 198-206 [doi:10.1107/S0021889892010069]
Measurement of the radii of gyration of ribosomal components in situ by neutron scattering
D. H. Harrison, R. P. May and P. B. Moore
J. Appl. Cryst. (1993). 26, 207-213 [doi:10.1107/S0021889892010136]
Determination of the total texture function from individual orientations modelled by a Lorentzian distribution
T. Baudin and R. Penelle
J. Appl. Cryst. (1993). 26, 214-218 [doi:10.1107/S0021889892010392]
The isoscattering point in X-ray scattering curves of globular solute particles measured by the contrast-variation method: the influence of additive penetration into the solute particles
T. Kawaguchi
J. Appl. Cryst. (1993). 26, 219-225 [doi:10.1107/S0021889892010422]
X-ray reconstruction topography for observation of the orientation distribution in a single crystal
Y. Chikaura and Y. Suzuki
J. Appl. Cryst. (1993). 26, 226-228 [doi:10.1107/S0021889892010677]
The use of carbon-composite cryostat chambers in low-temperature X-ray diffraction
D. D. Coppens, P. Coppens, R. Li and P. Lee
J. Appl. Cryst. (1993). 26, 229-242 [doi:10.1107/S0021889892010987]
On the morphology of normal alkane crystals with monoclinic structures: theory and observations
X. Y. Liu and P. Bennema
J. Appl. Cryst. (1993). 26, 243-250 [doi:10.1107/S0021889892011130]
Study of defects and structure in organic crystals of potassium hydrogen phthalate
Q. L. Zhao
J. Appl. Cryst. (1993). 26, 251-257 [doi:10.1107/S0021889892011750]
Neutron diffraction in flat and bent mosaic crystals for asymmetric geometry
H.-C. Hu and Y. Fang
J. Appl. Cryst. (1993). 26, 258-267 [doi:10.1107/S0021889892011828]
A direct indirect method of small-angle scattering data treatment
D. I. Svergun
J. Appl. Cryst. (1993). 26, 268-271 [doi:10.1107/S002188989201149X]
Estimation of the true orientation distribution function determination of the maximum-entropy method by the Taylor model
Y. Liu, F. Wang, J. Xu and Z. Liang
J. Appl. Cryst. (1993). 26, 272-276 [doi:10.1107/S0021889892011610]
On a small error in SRM640, SRM640a and SRM640b lattice parameters
D. Yoder-Short
J. Appl. Cryst. (1993). 26, 277-280 [doi:10.1107/S0021889892010665]
Indexing unit cells from synchrotron X-ray powder diffraction data
R. J. Cernik and D. Louër
J. Appl. Cryst. (1993). 26, 280-283 [doi:10.1107/S0021889892011282]
The lattice constant of a nonperfect crystal measured by X-ray diffraction
M. Leszczynski
J. Appl. Cryst. (1993). 26, 283-291 [doi:10.1107/S0021889892009944]
PROCHECK: a program to check the stereochemical quality of protein structures
R. A. Laskowski, M. W. MacArthur, D. S. Moss and J. M. Thornton
J. Appl. Cryst. (1993). 26, 291-294 [doi:10.1107/S0021889892009282]
The FROG PC series: programs for electron-density and model investigations for proteins
E. A. Vernoslova and V. Yu. Lunin
J. Appl. Cryst. (1993). 26, 295-302 [doi:10.1107/S0021889892010495]
PEDX: a program for radial-distribution-function analysis of energy-dispersive X-ray diffraction data from disordered systems
V. Petkov and Y. Waseda
J. Appl. Cryst. (1993). 26, 302-304 [doi:10.1107/S0021889892011749]
An effective algorithm for calculation of the Clebsch-Gordan coefficients
L. Zuo, M. Humbert and C. Esling
J. Appl. Cryst. (1993). 26, 305-306 [doi:10.1107/S0021889892011920]
A yokeless flow cell for Laue crystallography
S. L. Edwards
J. Appl. Cryst. (1993). 26, 307 [doi:10.1107/S002188989201241X]
The use of alternative filaments for the Rigaku RU 200 X-ray generator
R. Leidich and V. Bernal
J. Appl. Cryst. (1993). 26, 308 [doi:10.1107/S002188989200921X]
CPSR - an integrated software package of menu-driven computer programs for X-ray powder-pattern refinement
Yu. G. Andreev, N. I. Sorokin and A. K. Churakov
J. Appl. Cryst. (1993). 26, 308 [doi:10.1107/S0021889893099649]
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