Journal of Applied Crystallography

Volume 26, Part 2 (April 1993)



research papers



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J. Appl. Cryst. (1993). 26, 151-158    [doi:10.1107/S0021889892010239]

A new technique for the observation of X-ray CTR scattering by using an imaging plate detector

T. Shimura and J. Harada



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J. Appl. Cryst. (1993). 26, 159-165    [doi:10.1107/S0021889892010793]

Maximum-entropy-method analysis of neutron diffraction data

M. Sakata, T. Uno, M. Takata and C. J. Howard



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J. Appl. Cryst. (1993). 26, 166-171    [doi:10.1107/S0021889892011592]

A method for the accurate determination of crystal truncation rod intensities by X-ray diffraction

E. D. Specht and F. J. Walker



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J. Appl. Cryst. (1993). 26, 172-179    [doi:10.1107/S0021889892009038]

A four-point crystal bender for dispersive X-ray absorption spectroscopy

P. G. Allen, S. D. Conradson and J. E. Penner-Hahn



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J. Appl. Cryst. (1993). 26, 180-184    [doi:10.1107/S0021889892009762]

X-ray powder diffraction analysis of silver behenate, a possible low-angle diffraction standard

T. C. Huang, H. Toraya, T. N. Blanton and Y. Wu



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J. Appl. Cryst. (1993). 26, 185-191    [doi:10.1107/S0021889892009956]

X-ray diffraction studies of annealed Czochralski-grown silicon. I. Double-crystal diffractometry

S. Joksch, P. Zaumseil and W. Zulehner



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J. Appl. Cryst. (1993). 26, 192-197    [doi:10.1107/S002188989201001X]

X-ray diffracton studies of annealed Czochralski-grown silicon. II. Triple-crystal diffractometry

P. Zaumseil, S. Joksch and W. Zulehner



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J. Appl. Cryst. (1993). 26, 198-206    [doi:10.1107/S0021889892010069]

Measurement of the radii of gyration of ribosomal components in situ by neutron scattering

D. H. Harrison, R. P. May and P. B. Moore



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J. Appl. Cryst. (1993). 26, 207-213    [doi:10.1107/S0021889892010136]

Determination of the total texture function from individual orientations modelled by a Lorentzian distribution

T. Baudin and R. Penelle



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J. Appl. Cryst. (1993). 26, 214-218    [doi:10.1107/S0021889892010392]

The isoscattering point in X-ray scattering curves of globular solute particles measured by the contrast-variation method: the influence of additive penetration into the solute particles

T. Kawaguchi



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J. Appl. Cryst. (1993). 26, 219-225    [doi:10.1107/S0021889892010422]

X-ray reconstruction topography for observation of the orientation distribution in a single crystal

Y. Chikaura and Y. Suzuki



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J. Appl. Cryst. (1993). 26, 226-228    [doi:10.1107/S0021889892010677]

The use of carbon-composite cryostat chambers in low-temperature X-ray diffraction

D. D. Coppens, P. Coppens, R. Li and P. Lee



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J. Appl. Cryst. (1993). 26, 229-242    [doi:10.1107/S0021889892010987]

On the morphology of normal alkane crystals with monoclinic structures: theory and observations

X. Y. Liu and P. Bennema



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J. Appl. Cryst. (1993). 26, 243-250    [doi:10.1107/S0021889892011130]

Study of defects and structure in organic crystals of potassium hydrogen phthalate

Q. L. Zhao



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J. Appl. Cryst. (1993). 26, 251-257    [doi:10.1107/S0021889892011750]

Neutron diffraction in flat and bent mosaic crystals for asymmetric geometry

H.-C. Hu and Y. Fang



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J. Appl. Cryst. (1993). 26, 258-267    [doi:10.1107/S0021889892011828]

A direct indirect method of small-angle scattering data treatment

D. I. Svergun



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J. Appl. Cryst. (1993). 26, 268-271    [doi:10.1107/S002188989201149X]

Estimation of the true orientation distribution function determination of the maximum-entropy method by the Taylor model

Y. Liu, F. Wang, J. Xu and Z. Liang



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J. Appl. Cryst. (1993). 26, 272-276    [doi:10.1107/S0021889892011610]

On a small error in SRM640, SRM640a and SRM640b lattice parameters

D. Yoder-Short


short communications



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J. Appl. Cryst. (1993). 26, 277-280    [doi:10.1107/S0021889892010665]

Indexing unit cells from synchrotron X-ray powder diffraction data

R. J. Cernik and D. Louër



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J. Appl. Cryst. (1993). 26, 280-283    [doi:10.1107/S0021889892011282]

The lattice constant of a nonperfect crystal measured by X-ray diffraction

M. Leszczynski


computer programs



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J. Appl. Cryst. (1993). 26, 283-291    [doi:10.1107/S0021889892009944]

PROCHECK: a program to check the stereochemical quality of protein structures

R. A. Laskowski, M. W. MacArthur, D. S. Moss and J. M. Thornton



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J. Appl. Cryst. (1993). 26, 291-294    [doi:10.1107/S0021889892009282]

The FROG PC series: programs for electron-density and model investigations for proteins

E. A. Vernoslova and V. Yu. Lunin



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J. Appl. Cryst. (1993). 26, 295-302    [doi:10.1107/S0021889892010495]

PEDX: a program for radial-distribution-function analysis of energy-dispersive X-ray diffraction data from disordered systems

V. Petkov and Y. Waseda



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J. Appl. Cryst. (1993). 26, 302-304    [doi:10.1107/S0021889892011749]

An effective algorithm for calculation of the Clebsch-Gordan coefficients

L. Zuo, M. Humbert and C. Esling


laboratory notes



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J. Appl. Cryst. (1993). 26, 305-306    [doi:10.1107/S0021889892011920]

A yokeless flow cell for Laue crystallography

S. L. Edwards


letters to the editor



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J. Appl. Cryst. (1993). 26, 307    [doi:10.1107/S002188989201241X]

The use of alternative filaments for the Rigaku RU 200 X-ray generator

R. Leidich and V. Bernal


computer program abstracts



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J. Appl. Cryst. (1993). 26, 308    [doi:10.1107/S002188989200921X]

CPSR - an integrated software package of menu-driven computer programs for X-ray powder-pattern refinement

Yu. G. Andreev, N. I. Sorokin and A. K. Churakov


new commercial products



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J. Appl. Cryst. (1993). 26, 308    [doi:10.1107/S0021889893099649]

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