Journal of Applied Crystallography
Volume 26, Part 3 (June 1993)
J. Appl. Cryst. (1993). 26, 309-319 [doi:10.1107/S0021889892010070]
Comparison of radiation-induced decay and structure refinement from X-ray data collected from lysozyme crystals at low and ambient temperatures
A. C. M. Young, J. C. Dewan, C. Nave and R. F. Tilton
J. Appl. Cryst. (1993). 26, 320-326 [doi:10.1107/S0021889892008422]
Algorithm for sorting diffraction data from a sample consisting of several crystals enclosed in a sample environment apparatus
S. W. Johnson, M. Nicol and D. Schiferl
J. Appl. Cryst. (1993). 26, 327-333 [doi:10.1107/S002188989201032X]
Tunneling reflection with polarized slow neutrons: polarized-neutron total frustrated reflection
M. Mâaza, B. Pardo and F. Bridou
J. Appl. Cryst. (1993). 26, 334-342 [doi:10.1107/S0021889892010355]
Determination of diffusion coefficient D and activation energy Qa
of nickel into titanium in Ni-Ti multilayers by grazing-angle neutron reflectometry
M. Mâaza, C. Sella, J. P. Ambroise, M. Kâabouchi, M. Milôche, F. Wehling and M. Groos
J. Appl. Cryst. (1993). 26, 343-350 [doi:10.1107/S0021889892010331]
Completion and refinement of crystal structures with SIR92
A. Altomare, G. Cascarano, C. Giacovazzo and A. Guagliardi
J. Appl. Cryst. (1993). 26, 351-356 [doi:10.1107/S0021889892010781]
A theoretical model for the correction of intensity aberrations in Bragg-Brentano X-ray diffractometers - detailed description of the algorithm
C. E. Matulis and J. C. Taylor
J. Appl. Cryst. (1993). 26, 357-362 [doi:10.1107/S0021889892011063]
Multiple small-angle scattering: an experimental investigation
S. Mazumder, A. Sequeira, S. K. Roy and A. B. Biswas
J. Appl. Cryst. (1993). 26, 363-367 [doi:10.1107/S0021889892011762]
Location of rare-earth atoms in isomorphous series of complex oxides by employment of difference Fourier syntheses based on X-ray powder profile analysis: La3LnBaCu5O13+![[delta]](/logos/entities/delta_rmgif.gif)
(Ln = Y, La, Nd or
Gd) and LnBa2Cu3O7± (Ln = Y, Nd, Pr, Gd or Dy)
N. Rangavittal, T. N. Guru Row and C. N. R. Rao
J. Appl. Cryst. (1993). 26, 368-383 [doi:10.1107/S0021889892011944]
Powerful new software for the simulation of WAXS and SAXS diagrams
D. Espinat, F. Thevenot, J. Grimoud and K. El Malki
J. Appl. Cryst. (1993). 26, 384-387 [doi:10.1107/S0021889892012391]
The determination of unit-cell parameters from a Laue diffraction pattern
P. D. Carr, I. M. Dodd and M. M. Harding
J. Appl. Cryst. (1993). 26, 388-395 [doi:10.1107/S0021889892012408]
Evidence of a lamellar microstructure in ![[beta]](/logos/entities/beta_rmgif.gif)
-FeSi2 thin films grown on Si(111) by solid-phase
epitaxy: a transmission electron microscopy analysis
Y. Zheng, A. Taccoen, M. Gandais and J. F. Pétroff
J. Appl. Cryst. (1993). 26, 396-404 [doi:10.1107/S0021889892012871]
Improved treatment of severely or exactly overlapping Bragg reflections for the application of direct methods to powder data
M. A. Estermann and V. Gramlich
J. Appl. Cryst. (1993). 26, 405-412 [doi:10.1107/S0021889892013025]
X-ray reflection properties of elastically bent perfect crystals in Bragg geometry
I. Uschmann, E. Förster, K. Gäbel, G. Hölzer and M. Ensslen
J. Appl. Cryst. (1993). 26, 413-421 [doi:10.1107/S002188989201330X]
Analysis of time-resolved powder diffraction data using a pattern-decomposition method with restraints
J. Anwar
J. Appl. Cryst. (1993). 26, 422-425 [doi:10.1107/S0021889892013396]
Volume fractions of texture components in polycrystalline materials
L. Zuo, J. Muller and C. Esling
J. Appl. Cryst. (1993). 26, 426-430 [doi:10.1107/S0021889892013402]
Peak-width determination of step-scan profiles: the floating-baseline method
J. H. Reibenspies
J. Appl. Cryst. (1993). 26, 431-437 [doi:10.1107/S0021889892013517]
Morphology of -BaB2O4 (BBO) in relation to its crystal
structure and growth conditions
R. J. Bolt and P. Bennema
J. Appl. Cryst. (1993). 26, 438-447 [doi:10.1107/S0021889893000433]
The neutron transmission of single-crystal sapphire filters
D. F. R. Mildner, M. Arif, C. A. Stone and R. K. Crawford
J. Appl. Cryst. (1993). 26, 448-449 [doi:10.1107/S0021889892011622]
Statistics for rotation functions
T. O. Yeates
J. Appl. Cryst. (1993). 26, 449-452 [doi:10.1107/S0021889893000810]
Partial multiplicity factors for texture correction of cubic structures in the disc-shaped crystallite model
P. Capková, R. Peschar and H. Schenk
J. Appl. Cryst. (1993). 26, 453-457 [doi:10.1107/S0021889892012883]
MEED: a program package for electron-density-distribution calculation by the maximum-entropy method
S. Kumazawa, Y. Kubota, M. Takata, M. Sakata and Y. Ishibashi
J. Appl. Cryst. (1993). 26, 457-462 [doi:10.1107/S0021889892013165]
STRAT: a program to optimize X-ray data collection on an area detector system
X.-J. Zhang and B. W. Matthews
J. Appl. Cryst. (1993). 26, 462-465 [doi:10.1107/S0021889893000767]
A computer program for calculating the ring-puckering parameters for any five-membered ring from endocyclic torsion angles
F. Pavelcik
J. Appl. Cryst. (1993). 26, 465-466 [doi:10.1107/S0021889892012615]
A design of crystal mounting cell that allows the controlled variation of humidity at the protein crystal during X-ray diffraction
M. G. Pickford, E. F. Garman, E. Y. Jones and D. I. Stuart
J. Appl. Cryst. (1993). 26, 466-467 [doi:10.1107/S0021889892012627]
Protection against goniostat collisions for the Huber 511 goniostat used in conjunction with the San Diego multiwire area detector system
R. Leidich, P. Hamilton and V. Bernal
J. Appl. Cryst. (1993). 26, 467 [doi:10.1107/S0021889892013086]
An automatic four-circle diffractometer designed for precise lattice-parameter determination
D. Kucharczyk, A. Pietraszko and K. Lukaszewicz
J. Appl. Cryst. (1993). 26, 468 [doi:10.1107/S0021889893099637]
Editorial. Computer Programs for CIF Applications
J. Appl. Cryst. (1993). 26, 469-473 [doi:10.1107/S002188989300086X]
CIF applications. I. QUASAR: for extracting data from a CIF
S. R. Hall and R. Sievers
J. Appl. Cryst. (1993). 26, 474-479 [doi:10.1107/S0021889893000871]
CIF applications. II. CIFIO: for CIF input/output in the Xtal system
S. R. Hall
J. Appl. Cryst. (1993). 26, 480-481 [doi:10.1107/S0021889893000883]
CIF applications. III. CYCLOPS: for validating CIF data names
S. R. Hall
J. Appl. Cryst. (1993). 26, 482-494 [doi:10.1107/S0021889893050897]
CIF applications. IV. CIFtbx: a tool box for manipulating CIFs
S. R. Hall
J. Appl. Cryst. (1993). 26, 495 [doi:10.1107/S0021889892010343]
LMCTEP: software for crystal-structure representation
A. Soyer
J. Appl. Cryst. (1993). 26, 495-496 [doi:10.1107/S0021889892012548]
GEOM - a program to assess the reliability of a protein model
G. H. Cohen
J. Appl. Cryst. (1993). 26, 496-498 [doi:10.1107/S0021889892013153]
MACINPLOTII - an updated program to display electron density and atomic models on the Macintosh personal computer
T. J. Smith
J. Appl. Cryst. (1993). 26, 498 [doi:10.1107/S0021889893099625]
LAYERGPD - a program to visualize the three-dimensional layer group general position diagrams
S. Y. Litvin and D. B. Litvin
J. Appl. Cryst. (1993). 26, 498-499 [doi:10.1107/S0021889893099613]
New Commercial Products
J. Appl. Cryst. (1993). 26, 499 [doi:10.1107/S0021889893003358]
Crystallographers
J. Appl. Cryst. (1993). 26, 499 [doi:10.1107/S0021889893099601]
Executive Secretary
J. Appl. Cryst. (1993). 26, 499-500 [doi:10.1107/S0021889893002651]
Synchrotron radiation crystallography by P. Coppens
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