Journal of Applied Crystallography

Volume 26, Part 3 (June 1993)



research papers



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J. Appl. Cryst. (1993). 26, 309-319    [doi:10.1107/S0021889892010070]

Comparison of radiation-induced decay and structure refinement from X-ray data collected from lysozyme crystals at low and ambient temperatures

A. C. M. Young, J. C. Dewan, C. Nave and R. F. Tilton



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J. Appl. Cryst. (1993). 26, 320-326    [doi:10.1107/S0021889892008422]

Algorithm for sorting diffraction data from a sample consisting of several crystals enclosed in a sample environment apparatus

S. W. Johnson, M. Nicol and D. Schiferl



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J. Appl. Cryst. (1993). 26, 327-333    [doi:10.1107/S002188989201032X]

Tunneling reflection with polarized slow neutrons: polarized-neutron total frustrated reflection

M. Mâaza, B. Pardo and F. Bridou



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J. Appl. Cryst. (1993). 26, 334-342    [doi:10.1107/S0021889892010355]

Determination of diffusion coefficient D and activation energy Qa of nickel into titanium in Ni-Ti multilayers by grazing-angle neutron reflectometry

M. Mâaza, C. Sella, J. P. Ambroise, M. Kâabouchi, M. Milôche, F. Wehling and M. Groos



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J. Appl. Cryst. (1993). 26, 343-350    [doi:10.1107/S0021889892010331]

Completion and refinement of crystal structures with SIR92

A. Altomare, G. Cascarano, C. Giacovazzo and A. Guagliardi



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J. Appl. Cryst. (1993). 26, 351-356    [doi:10.1107/S0021889892010781]

A theoretical model for the correction of intensity aberrations in Bragg-Brentano X-ray diffractometers - detailed description of the algorithm

C. E. Matulis and J. C. Taylor



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J. Appl. Cryst. (1993). 26, 357-362    [doi:10.1107/S0021889892011063]

Multiple small-angle scattering: an experimental investigation

S. Mazumder, A. Sequeira, S. K. Roy and A. B. Biswas



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J. Appl. Cryst. (1993). 26, 363-367    [doi:10.1107/S0021889892011762]

Location of rare-earth atoms in isomorphous series of complex oxides by employment of difference Fourier syntheses based on X-ray powder profile analysis: La3LnBaCu5O13+[delta] (Ln = Y, La, Nd or Gd) and LnBa2Cu3O[delta] (Ln = Y, Nd, Pr, Gd or Dy)

N. Rangavittal, T. N. Guru Row and C. N. R. Rao



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J. Appl. Cryst. (1993). 26, 368-383    [doi:10.1107/S0021889892011944]

Powerful new software for the simulation of WAXS and SAXS diagrams

D. Espinat, F. Thevenot, J. Grimoud and K. El Malki



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J. Appl. Cryst. (1993). 26, 384-387    [doi:10.1107/S0021889892012391]

The determination of unit-cell parameters from a Laue diffraction pattern

P. D. Carr, I. M. Dodd and M. M. Harding



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J. Appl. Cryst. (1993). 26, 388-395    [doi:10.1107/S0021889892012408]

Evidence of a lamellar microstructure in [beta]-FeSi2 thin films grown on Si(111) by solid-phase epitaxy: a transmission electron microscopy analysis

Y. Zheng, A. Taccoen, M. Gandais and J. F. Pétroff



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J. Appl. Cryst. (1993). 26, 396-404    [doi:10.1107/S0021889892012871]

Improved treatment of severely or exactly overlapping Bragg reflections for the application of direct methods to powder data

M. A. Estermann and V. Gramlich



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J. Appl. Cryst. (1993). 26, 405-412    [doi:10.1107/S0021889892013025]

X-ray reflection properties of elastically bent perfect crystals in Bragg geometry

I. Uschmann, E. Förster, K. Gäbel, G. Hölzer and M. Ensslen



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J. Appl. Cryst. (1993). 26, 413-421    [doi:10.1107/S002188989201330X]

Analysis of time-resolved powder diffraction data using a pattern-decomposition method with restraints

J. Anwar



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J. Appl. Cryst. (1993). 26, 422-425    [doi:10.1107/S0021889892013396]

Volume fractions of texture components in polycrystalline materials

L. Zuo, J. Muller and C. Esling



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J. Appl. Cryst. (1993). 26, 426-430    [doi:10.1107/S0021889892013402]

Peak-width determination of step-scan profiles: the floating-baseline method

J. H. Reibenspies



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J. Appl. Cryst. (1993). 26, 431-437    [doi:10.1107/S0021889892013517]

Morphology of [beta]-BaB2O4 (BBO) in relation to its crystal structure and growth conditions

R. J. Bolt and P. Bennema



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J. Appl. Cryst. (1993). 26, 438-447    [doi:10.1107/S0021889893000433]

The neutron transmission of single-crystal sapphire filters

D. F. R. Mildner, M. Arif, C. A. Stone and R. K. Crawford


short communications



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J. Appl. Cryst. (1993). 26, 448-449    [doi:10.1107/S0021889892011622]

Statistics for rotation functions

T. O. Yeates



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J. Appl. Cryst. (1993). 26, 449-452    [doi:10.1107/S0021889893000810]

Partial multiplicity factors for texture correction of cubic structures in the disc-shaped crystallite model

P. Capková, R. Peschar and H. Schenk


computer programs



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J. Appl. Cryst. (1993). 26, 453-457    [doi:10.1107/S0021889892012883]

MEED: a program package for electron-density-distribution calculation by the maximum-entropy method

S. Kumazawa, Y. Kubota, M. Takata, M. Sakata and Y. Ishibashi



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J. Appl. Cryst. (1993). 26, 457-462    [doi:10.1107/S0021889892013165]

STRAT: a program to optimize X-ray data collection on an area detector system

X.-J. Zhang and B. W. Matthews



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J. Appl. Cryst. (1993). 26, 462-465    [doi:10.1107/S0021889893000767]

A computer program for calculating the ring-puckering parameters for any five-membered ring from endocyclic torsion angles

F. Pavelcik


laboratory notes



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J. Appl. Cryst. (1993). 26, 465-466    [doi:10.1107/S0021889892012615]

A design of crystal mounting cell that allows the controlled variation of humidity at the protein crystal during X-ray diffraction

M. G. Pickford, E. F. Garman, E. Y. Jones and D. I. Stuart



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J. Appl. Cryst. (1993). 26, 466-467    [doi:10.1107/S0021889892012627]

Protection against goniostat collisions for the Huber 511 goniostat used in conjunction with the San Diego multiwire area detector system

R. Leidich, P. Hamilton and V. Bernal



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J. Appl. Cryst. (1993). 26, 467    [doi:10.1107/S0021889892013086]

An automatic four-circle diffractometer designed for precise lattice-parameter determination

D. Kucharczyk, A. Pietraszko and K. Lukaszewicz


international union of crystallography



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J. Appl. Cryst. (1993). 26, 468    [doi:10.1107/S0021889893099637]

Editorial. Computer Programs for CIF Applications


cif applications



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J. Appl. Cryst. (1993). 26, 469-473    [doi:10.1107/S002188989300086X]

CIF applications. I. QUASAR: for extracting data from a CIF

S. R. Hall and R. Sievers



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J. Appl. Cryst. (1993). 26, 474-479    [doi:10.1107/S0021889893000871]

CIF applications. II. CIFIO: for CIF input/output in the Xtal system

S. R. Hall



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J. Appl. Cryst. (1993). 26, 480-481    [doi:10.1107/S0021889893000883]

CIF applications. III. CYCLOPS: for validating CIF data names

S. R. Hall



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J. Appl. Cryst. (1993). 26, 482-494    [doi:10.1107/S0021889893050897]

CIF applications. IV. CIFtbx: a tool box for manipulating CIFs

S. R. Hall


computer program abstracts



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J. Appl. Cryst. (1993). 26, 495    [doi:10.1107/S0021889892010343]

LMCTEP: software for crystal-structure representation

A. Soyer



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J. Appl. Cryst. (1993). 26, 495-496    [doi:10.1107/S0021889892012548]

GEOM - a program to assess the reliability of a protein model

G. H. Cohen



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J. Appl. Cryst. (1993). 26, 496-498    [doi:10.1107/S0021889892013153]

MACINPLOTII - an updated program to display electron density and atomic models on the Macintosh personal computer

T. J. Smith



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J. Appl. Cryst. (1993). 26, 498    [doi:10.1107/S0021889893099625]

LAYERGPD - a program to visualize the three-dimensional layer group general position diagrams

S. Y. Litvin and D. B. Litvin


new commercial products



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J. Appl. Cryst. (1993). 26, 498-499    [doi:10.1107/S0021889893099613]

New Commercial Products


crystallographers



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J. Appl. Cryst. (1993). 26, 499    [doi:10.1107/S0021889893003358]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1993). 26, 499    [doi:10.1107/S0021889893099601]

Executive Secretary


book reviews



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J. Appl. Cryst. (1993). 26, 499-500    [doi:10.1107/S0021889893002651]

Synchrotron radiation crystallography by P. Coppens


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