Journal of Applied Crystallography

Volume 26, Part 4 (August 1993)

research papers
short communications
computer programs
new commercial products
book reviews
books received

research papers

J. Appl. Cryst. (1993). 26, 501-511 [doi:10.1107/S0021889893000299]

Equations for diffuse scattering from pseudobinary sphalerite F $\overline{4}$ 3m systems

J. P. Quintana

J. Appl. Cryst. (1993). 26, 512-518 [doi:10.1107/S0021889893000561]

Indirect transformation in reciprocal space: desmearing of small-angle scattering data from partially ordered systems

O. Glatter and K. Gruber

J. Appl. Cryst. (1993). 26, 519-524 [doi:10.1107/S0021889893000755]

Fractal neutron optics multilayers in Cantor ternary set pattern

M. Mâaza, B. Pardo and T. Megademini

J. Appl. Cryst. (1993). 26, 525-531 [doi:10.1107/S0021889893001219]

Application of symmetrized harmonics expansion to correction of the preferred orientation effect

M. Järvinen

J. Appl. Cryst. (1993). 26, 532-538 [doi:10.1107/S0021889893000305]

Influence of misoriented substrates and dislocations on the diffraction patterns of superlattices

B. Rosner and H. Berger

J. Appl. Cryst. (1993). 26, 539-548 [doi:10.1107/S0021889893000160]

Remeasurement of the profile of the characteristic Cu K emission line with high precision and accuracy

J. Härtwig, G. Hölzer, J. Wolf and E. Förster

J. Appl. Cryst. (1993). 26, 549-554 [doi:10.1107/S002188989201286X]

Relation between the optical properties and structure of KLiSO₄ in the room-temperature phase

J. Ortega, J. Etxebarria and T. Breczewski

J. Appl. Cryst. (1993). 26, 555-557 [doi:10.1107/S0021889893001128]

The absolute optical chirality of KLiSO₄

K. Stadnicka, A. M. Glazer and S. Arzt

J. Appl. Cryst. (1993). 26, 558-562 [doi:10.1107/S0021889893001633]

ASTEC: an automated system for sitting-drop protein crystallization

T. M. B. Soriano and J. C. Fontecilla-Camps

J. Appl. Cryst. (1993). 26, 563-569 [doi:10.1107/S0021889893001670]

Potential of the INEL X-ray position-sensitive detector: a general study of the Debye-Scherrer setting

M. Evain, P. Deniard, A. Jouanneaux and R. Brec

J. Appl. Cryst. (1993). 26, 570-573 [doi:10.1107/S0021889893001517]

Twinning study of CdTe epitaxic layer by X-ray -scan measurement

C. Brizard, G. Rolland and F. Laugier

J. Appl. Cryst. (1993). 26, 574-582 [doi:10.1107/S0021889893001748]

Reduction of the interfacial diffusion in Ni-Ti neutron-optics multilayers by carburation of the Ni-Ti interfaces

M. Mâaza, B. Farnoux, F. Samuel, C. Sella, F. Wehling, F. Bridou, M. Groos, B. Pardo and G. Foulet

J. Appl. Cryst. (1993). 26, 583-590 [doi:10.1107/S0021889893001955]

The determination of unit-cell parameters from Bragg reflection data using a standard reference material but without a calibration curve

H. Toraya

J. Appl. Cryst. (1993). 26, 591-601 [doi:10.1107/S0021889893001980]

Possible improvements in the precision and accuracy of small-angle X-ray scattering measurements

M. Steinhart and J. Plestic

J. Appl. Cryst. (1993). 26, 602-605 [doi:10.1107/S0021889893001992]

Debye temperature and mean-square amplitudes of vibration of Ti₃ Al alloys

H. D. Shashikala, S. V. Suryanarayana and S. V. Nagender Naidu

J. Appl. Cryst. (1993). 26, 606-611 [doi:10.1107/S0021889893002195]

Relationship between symmetry and estimates of the volume of the unit cell in a powder diffraction pattern

E. Wu

short communications

J. Appl. Cryst. (1993). 26, 612-615 [doi:10.1107/S0021889893001335]

On the shape of the radial distribution function of an assembly of monodisperse ellipsoidal scatterers

E. Caponetti, M. A. Floriano, E. Di Dio and R. Triolo

J. Appl. Cryst. (1993). 26, 615-619 [doi:10.1107/S0021889893002018]

Crystal handling at low temperatures

T. Kottke and D. Stalke

J. Appl. Cryst. (1993). 26, 619 [doi:10.1107/S0021889893005515]

A 10⁹ Pa high-pressure cell for X-ray and optical measurements. Erratum

M. Leszczynski, S. Podlasin and T. Suski

computer programs

J. Appl. Cryst. (1993). 26, 620-621 [doi:10.1107/S0021889893001736]

CELLX - an interactive program for the display of unit cells and reciprocal space

K. D. Rogers

J. Appl. Cryst. (1993). 26, 622-624 [doi:10.1107/S0021889893002729]

TLSANL: TLS parameter-analysis program for segmented anisotropic refinement of macromolecular structures

B. Howlin, S. A. Butler, D. S. Moss, G. W. Harris and H. P. C. Driessen

new commercial products

J. Appl. Cryst. (1993). 26, 625 [doi:10.1107/S0021889893099595]

New Commercial Products

book reviews

J. Appl. Cryst. (1993). 26, 625-626 [doi:10.1107/S0021889893004145]

Inorganic materials edited by D. W. Bruce and D. O'Hare

books received

J. Appl. Cryst. (1993). 26, 626 [doi:10.1107/S0021889893099509]

Crystallography in modern chemistry. A resource book of crystal structures by T. C. W. Mak and G.-D. Zhou

J. Appl. Cryst. (1993). 26, 626 [doi:10.1107/S0021889893099583]