Journal of Applied Crystallography
Volume 26, Part 5 (October 1993)
J. Appl. Cryst. (1993). 26, 627-631 [doi:10.1107/S0021889893002511]
Application de la dispersion d'energie des rayons X à l'etude de la diffusion à petit angle
J. C. Malaurent et H. Duval
J. Appl. Cryst. (1993). 26, 632-635 [doi:10.1107/S0021889893002596]
A mirror furnace for neutron diffraction up to 2300 K
G. Lorenz, R. B. Neder, J. Marxreiter, F. Frey and J. Schneider


J. Appl. Cryst. (1993). 26, 636-644 [doi:10.1107/S0021889893002006]
The structure of zeolite ZSM-23 (MTT) refined from synchrotron X-ray powder data
B. Marler, C. Deroche, H. Gies, C. A. Fyfe, H. Grondey, G. T. Kokotailo, Y. Feng, S. Ernst, J. Weitkamp and D. E. Cox
J. Appl. Cryst. (1993). 26, 645-649 [doi:10.1107/S0021889893002390]
High-resolution X-ray diffraction of molecular-beam-epitaxy-grown InAlAs/InGaAs/InAlAs three-layer structures on (001)-oriented InP substrates
H.-G. Brühl, A. Poecker, H. Nickel, R. Lösch and W. Schlapp
J. Appl. Cryst. (1993). 26, 650-659 [doi:10.1107/S0021889893002791]
Applications of Fourier-synthesis methods to the analysis of specular reflectivity
N. Singh, M. Tirrell and F. S. Bates
J. Appl. Cryst. (1993). 26, 660-669 [doi:10.1107/S0021889893003267]
Angle-dispersive time-of-flight diffraction in a pulsed beam: an efficient technology to exploit the thermal-neutron spectrum - design of a JULIOS diffractometer and experimental tests
W. Schäfer, E. Jansen and G. Will
J. Appl. Cryst. (1993). 26, 670-676 [doi:10.1107/S0021889893003395]
X-ray determination of the Debye-Waller factors and order parameters of Ni3Al alloys
P. V. Mohan Rao, K. S. Murthy, S. V. Suryanarayana and S. V. N. Naidu
J. Appl. Cryst. (1993). 26, 677-682 [doi:10.1107/S0021889893004017]
Dislocation contrast in white-radiation synchrotron topography of silicon carbide
G. R. Fisher, P. Barnes and J. F. Kelly
J. Appl. Cryst. (1993). 26, 683-686 [doi:10.1107/S0021889893004091]
Recursive calculation of closed-form scattering factors for atomic orbitals
M. Deutsch
J. Appl. Cryst. (1993). 26, 687-696 [doi:10.1107/S0021889893004364]
Resolution correction for surface X-ray diffraction at high beam exit angles
C. Schamper, H. L. Meyerheim and W. Moritz
J. Appl. Cryst. (1993). 26, 697-705 [doi:10.1107/S0021889893003620]
Angle calculations for a five-circle diffractometer used in surface X-ray diffraction experiments
S.-K. Wang, P. Dai and H. Taub
J. Appl. Cryst. (1993). 26, 706-716 [doi:10.1107/S0021889893004868]
Angle calculations for a six-circle surface X-ray diffractometer
M. Lohmeier and E. Vlieg
J. Appl. Cryst. (1993). 26, 717-720 [doi:10.1107/S002188989300442X]
Fractal properties of a partially crystalline zirconium oxide aerogel
A. Benedetti, G. Fagherazzi, P. Riello, Y. W. Zeng, F. Pinna and M. Signoretto
J. Appl. Cryst. (1993). 26, 721-727 [doi:10.1107/S002188989300425X]
The focal length of neutron lenses using capillary optics
D. F. R. Mildner
J. Appl. Cryst. (1993). 26, 728-729 [doi:10.1107/S0021889893002833]
A personal-computer-controlled single-crystal diffractometer
C. Svensson and K. Ståhl
J. Appl. Cryst. (1993). 26, 730-733 [doi:10.1107/S0021889893004352]
A closed-shell furnace for neutron single-crystal diffraction
W. F. Kuhs, J. Archer and D. Doran
J. Appl. Cryst. (1993). 26, 733-735 [doi:10.1107/S0021889893005928]
A new blue-colored Imaging Plate: properties for X-ray recording in macromolecular crystallography
M. Sato, Y. Katsube and K. Hayashi
J. Appl. Cryst. (1993). 26, 736-745 [doi:10.1107/S0021889893003279]
A new routine for thinning, editing and fitting MIR maps using real-space molecular dynamics
D. G. Levitt and L. J. Banaszak
J. Appl. Cryst. (1993). 26, 745-747 [doi:10.1107/S0021889893005564]
A program to generate the Luzzati plot using Microsoft Excel
Y. W. Chen
J. Appl. Cryst. (1993). 26, 748-751 [doi:10.1107/S0021889893005631]
REPLACE, a suite of computer programs for molecular-replacement calculations
L. Tong
J. Appl. Cryst. (1993). 26, 752 [doi:10.1107/S0021889893005576]
ORTEX - an interactive version of ORTEP for use on a PC
P. McArdle
J. Appl. Cryst. (1993). 26, 752 [doi:10.1107/S0021889893008374]
Notes and News
J. Appl. Cryst. (1993). 26, 752 [doi:10.1107/S0021889893099492]
Mathematical crystallography - an introduction to the mathematical foundations of crystallography. Reviews in mineralogy by M. B. Boisen and G. V. Gibbs
J. Appl. Cryst. (1993). 26, 752 [doi:10.1107/0021889893099480]
Solids far from equilibrium edited by C. Godrèche
J. Appl. Cryst. (1993). 26, 752 [doi:10.1107/S0021889893099571]
Quantitative Data File for ore minerals edited by A. J. Criddle and C. J. Stanley
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