Journal of Applied Crystallography

Volume 26, Part 5 (October 1993)



research papers



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J. Appl. Cryst. (1993). 26, 627-631    [doi:10.1107/S0021889893002511]

Application de la dispersion d'energie des rayons X à l'etude de la diffusion à petit angle

J. C. Malaurent et H. Duval



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J. Appl. Cryst. (1993). 26, 632-635    [doi:10.1107/S0021889893002596]

A mirror furnace for neutron diffraction up to 2300 K

G. Lorenz, R. B. Neder, J. Marxreiter, F. Frey and J. Schneider



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J. Appl. Cryst. (1993). 26, 636-644    [doi:10.1107/S0021889893002006]

The structure of zeolite ZSM-23 (MTT) refined from synchrotron X-ray powder data

B. Marler, C. Deroche, H. Gies, C. A. Fyfe, H. Grondey, G. T. Kokotailo, Y. Feng, S. Ernst, J. Weitkamp and D. E. Cox



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J. Appl. Cryst. (1993). 26, 645-649    [doi:10.1107/S0021889893002390]

High-resolution X-ray diffraction of molecular-beam-epitaxy-grown InAlAs/InGaAs/InAlAs three-layer structures on (001)-oriented InP substrates

H.-G. Brühl, A. Poecker, H. Nickel, R. Lösch and W. Schlapp



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J. Appl. Cryst. (1993). 26, 650-659    [doi:10.1107/S0021889893002791]

Applications of Fourier-synthesis methods to the analysis of specular reflectivity

N. Singh, M. Tirrell and F. S. Bates



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J. Appl. Cryst. (1993). 26, 660-669    [doi:10.1107/S0021889893003267]

Angle-dispersive time-of-flight diffraction in a pulsed beam: an efficient technology to exploit the thermal-neutron spectrum - design of a JULIOS diffractometer and experimental tests

W. Schäfer, E. Jansen and G. Will



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J. Appl. Cryst. (1993). 26, 670-676    [doi:10.1107/S0021889893003395]

X-ray determination of the Debye-Waller factors and order parameters of Ni3Al alloys

P. V. Mohan Rao, K. S. Murthy, S. V. Suryanarayana and S. V. N. Naidu



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J. Appl. Cryst. (1993). 26, 677-682    [doi:10.1107/S0021889893004017]

Dislocation contrast in white-radiation synchrotron topography of silicon carbide

G. R. Fisher, P. Barnes and J. F. Kelly



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J. Appl. Cryst. (1993). 26, 683-686    [doi:10.1107/S0021889893004091]

Recursive calculation of closed-form scattering factors for atomic orbitals

M. Deutsch



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J. Appl. Cryst. (1993). 26, 687-696    [doi:10.1107/S0021889893004364]

Resolution correction for surface X-ray diffraction at high beam exit angles

C. Schamper, H. L. Meyerheim and W. Moritz



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J. Appl. Cryst. (1993). 26, 697-705    [doi:10.1107/S0021889893003620]

Angle calculations for a five-circle diffractometer used in surface X-ray diffraction experiments

S.-K. Wang, P. Dai and H. Taub



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J. Appl. Cryst. (1993). 26, 706-716    [doi:10.1107/S0021889893004868]

Angle calculations for a six-circle surface X-ray diffractometer

M. Lohmeier and E. Vlieg



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J. Appl. Cryst. (1993). 26, 717-720    [doi:10.1107/S002188989300442X]

Fractal properties of a partially crystalline zirconium oxide aerogel

A. Benedetti, G. Fagherazzi, P. Riello, Y. W. Zeng, F. Pinna and M. Signoretto



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J. Appl. Cryst. (1993). 26, 721-727    [doi:10.1107/S002188989300425X]

The focal length of neutron lenses using capillary optics

D. F. R. Mildner


short communications



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J. Appl. Cryst. (1993). 26, 728-729    [doi:10.1107/S0021889893002833]

A personal-computer-controlled single-crystal diffractometer

C. Svensson and K. Ståhl



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J. Appl. Cryst. (1993). 26, 730-733    [doi:10.1107/S0021889893004352]

A closed-shell furnace for neutron single-crystal diffraction

W. F. Kuhs, J. Archer and D. Doran



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J. Appl. Cryst. (1993). 26, 733-735    [doi:10.1107/S0021889893005928]

A new blue-colored Imaging Plate: properties for X-ray recording in macromolecular crystallography

M. Sato, Y. Katsube and K. Hayashi


computer programs



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J. Appl. Cryst. (1993). 26, 736-745    [doi:10.1107/S0021889893003279]

A new routine for thinning, editing and fitting MIR maps using real-space molecular dynamics

D. G. Levitt and L. J. Banaszak



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J. Appl. Cryst. (1993). 26, 745-747    [doi:10.1107/S0021889893005564]

A program to generate the Luzzati plot using Microsoft Excel

Y. W. Chen



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J. Appl. Cryst. (1993). 26, 748-751    [doi:10.1107/S0021889893005631]

REPLACE, a suite of computer programs for molecular-replacement calculations

L. Tong


computer program abstracts



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J. Appl. Cryst. (1993). 26, 752    [doi:10.1107/S0021889893005576]

ORTEX - an interactive version of ORTEP for use on a PC

P. McArdle


notes and news



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J. Appl. Cryst. (1993). 26, 752    [doi:10.1107/S0021889893008374]

Notes and News


books received



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J. Appl. Cryst. (1993). 26, 752    [doi:10.1107/S0021889893099492]

Mathematical crystallography - an introduction to the mathematical foundations of crystallography. Reviews in mineralogy by M. B. Boisen and G. V. Gibbs



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J. Appl. Cryst. (1993). 26, 752    [doi:10.1107/0021889893099480]

Solids far from equilibrium edited by C. Godrèche



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J. Appl. Cryst. (1993). 26, 752    [doi:10.1107/S0021889893099571]

Quantitative Data File for ore minerals edited by A. J. Criddle and C. J. Stanley


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