Journal of Applied Crystallography

Volume 26, Part 6 (December 1993)

research papers
short communications
crystallographers
international union of crystallography
new commercial products

research papers

J. Appl. Cryst. (1993). 26, 753-755 [doi:10.1107/S002188989300439X]

The half-widths of Bragg intensity profiles measured with a triple-crystal diffractometer at a synchrotron-radiation source. I. Derivation of a simple expression for the full width at half-maximum

E. Rossmanith

J. Appl. Cryst. (1993). 26, 756-762 [doi:10.1107/S0021889893004388]

The half-widths of Bragg intensity profiles measured with a triple-crystal diffractometer at a synchrotron-radiation source. II. The half-widths of YIG and Si single crystals

E. Rossmanith, M. Werner, G. Kumpat, G. Ulrich and K. Eichhorn

J. Appl. Cryst. (1993). 26, 763-773 [doi:10.1107/S002188989300487X]

Characterization of an image-plate detector used for quantitative small-angle-scattering studies

F. Né, D. Gazeau, J. Lambard, P. Lesieur, T. Zemb and A. Gabriel

J. Appl. Cryst. (1993). 26, 774-777 [doi:10.1107/S0021889893004881]

Intensity enhancement in asymmetric diffraction with parallel-beam synchrotron radiation

H. Toraya, T. C. Huang and Y. Wu

J. Appl. Cryst. (1993). 26, 778-786 [doi:10.1107/S0021889893005394]

Electron diffraction from phospholipids - an approximate correction for dynamical scattering and tests for a correct phase determination

D. L. Dorset, M. P. McCourt, W. F. Tivol and J. N. Turner

J. Appl. Cryst. (1993). 26, 787-794 [doi:10.1107/S0021889893005527]

A direct method of beam-height correction in small-angle X-ray scattering

M. A. Singh, S. S. Ghosh and R. F. Shannon Jnr

J. Appl. Cryst. (1993). 26, 795-800 [doi:10.1107/S0021889893005588]

Automatic processing of rotation diffraction data from crystals of initially unknown symmetry and cell constants

W. Kabsch

J. Appl. Cryst. (1993). 26, 801-811 [doi:10.1107/S0021889893005643]

An improved deviation parameter for the simulation of dynamical X-ray diffraction on epitaxic heterostructures

R. Zaus

J. Appl. Cryst. (1993). 26, 812-819 [doi:10.1107/S0021889893006259]

Interpretation of the diffuse scattering close to Bragg peaks by X-ray topography

P. F. Fewster and N. L. Andrew

J. Appl. Cryst. (1993). 26, 820-826 [doi:10.1107/S0021889893006296]

Evaluation of 3D small-angle scattering from non-spherical particles in single crystals

P. Fratzl, F. Langmayr and O. Paris

J. Appl. Cryst. (1993). 26, 827-836 [doi:10.1107/S0021889893003784]

Structure-refinement program for disordered carbons

H. Shi, J. N. Reimers and J. R. Dahn

short communications

J. Appl. Cryst. (1993). 26, 837-839 [doi:10.1107/S0021889893004376]

The importance of, and a method for, optimizing the calculation of rotation functions

C. C. Wilson

J. Appl. Cryst. (1993). 26, 839-842 [doi:10.1107/S0021889893005552]

A fast and portable microspectrophotometer for protein crystallography

A. Hadfield and J. Hajdu

J. Appl. Cryst. (1993). 26, 843-845 [doi:10.1107/S0021889893006120]

Improved calibtration curve for the Sm²⁺:BaFCl pressure sensor

P. Comodi and P. F. Zanazzi

J. Appl. Cryst. (1993). 26, 845 [doi:10.1107/S0021889893010660]

Remeasurement of the profile of the characteristic Cu K emission line with high precision and accuracy. Erratum

J. Härtwig, G. Hölzer, J. Wolf and E. Förster

crystallographers

J. Appl. Cryst. (1993). 26, 846 [doi:10.1107/S0021889893010672]

Crystallographers

international union of crystallography

J. Appl. Cryst. (1993). 26, 846 [doi:10.1107/S002188989309956X]

Education and Teaching in Crystallography. Call for papers

J. Appl. Cryst. (1993). 26, 846-847 [doi:10.1107/S0021889893010684]

Prices of Acta Crystallographica and Journal of Applied Crystallography

new commercial products

J. Appl. Cryst. (1993). 26, 847-848 [doi:10.1107/S0021889893099558]

New Commercial Products

J. Appl. Cryst. (1993). 26, 849-853

Subject index to volume 26 (1993)

J. Appl. Cryst. (1993). 26, 854-859