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Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 27| Part 1
ISSN: 1600-5767

February 1994 issue

Highlighted illustration

Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G. Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore.

editorial

J. Appl. Cryst. (1994). 27, 1
doi: 10.1107/S0021889893011720
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Editorial

A. M. Glazer
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international union of crystallography

J. Appl. Cryst. (1994). 27, 2-6
doi: 10.1107/S0021889894099723
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Notes for Authors

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research papers

J. Appl. Cryst. (1994). 27, 7-12
doi: 10.1107/S0021889893005618
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Fourier-coefficient method of X-ray rocking-curve interpretation

A. A. Stepanov
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J. Appl. Cryst. (1994). 27, 13-19
doi: 10.1107/S0021889894099589
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Standard stereographic diagrams and indexing of X-ray Laue diffraction spots of an icosahedral quasicrystal

W. Zhou, R. Wang, J. Gui, J. Zhao and J. Jiang
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J. Appl. Cryst. (1994). 27, 20-24
doi: 10.1107/S0021889893006247
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Small-angle X-ray scattering of systems with inhomogeneous particles

R. Itri and L. Q. Amaral
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J. Appl. Cryst. (1994). 27, 25-28
doi: 10.1107/S0021889893006284
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A consistent formalism for partial structure functions

E. Sváb and F. Hajdu
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J. Appl. Cryst. (1994). 27, 29-35
doi: 10.1107/S0021889893006260
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Analysis of neutron and X-ray reflectivity data. I. Theory

I. W. Hamley and J. S. Pedersen
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J. Appl. Cryst. (1994). 27, 36-49
doi: 10.1107/S0021889893006272
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Analysis of neutron and X-ray reflectivity data. II. Constrained least-squares methods

J. S. Pedersen and I. W. Hamley
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J. Appl. Cryst. (1994). 27, 50-55
doi: 10.1107/S0021889893006387
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The three-dimensional resolution function of the four-reflection monochromator: a route to a higher intensity

P. van der Sluis
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J. Appl. Cryst. (1994). 27, 56-66
doi: 10.1107/S002188989300651X
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Characterization of thin nickel electrocoatings by the low-incident-beam-angle diffraction method

K. Van Acker, L. De Buyser, J. P. Celis and P. Van Houtte
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J. Appl. Cryst. (1994). 27, 67-73
doi: 10.1107/S0021889893006600
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Electron diffraction and microscope studies of zirconium oxides stabilized by several metal oxides

R. Miida, M. Tanaka, H. Arashi and M. Ishigame
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J. Appl. Cryst. (1994). 27, 74-79
doi: 10.1107/S0021889893006727
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KI7: a program written in vectorial Fortran for the simulation of powder diffraction patterns

A. Martorana, G. Deganello and D. Duca
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J. Appl. Cryst. (1994). 27, 80-88
doi: 10.1107/S0021889893006831
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Optimization of a double bent-crystal diffractometer for neutron small-angle scattering experiments

J. Šaroun, P. Lukáš, P. Mikula and B. Alefield
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J. Appl. Cryst. (1994). 27, 89-91
doi: 10.1107/S0021889893007009
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On the evaluation of integrals useful for calculating the electrostatic potential and its derivatives from pseudo-atoms

Z. Su and P. Coppens
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J. Appl. Cryst. (1994). 27, 92-95
doi: 10.1107/S0021889893007472
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A single-crystal orientation technique using doubly exposed Weissenberg photographs

I. Tanaka, M. Yao, N. Kamiya and H. Iwasaki
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J. Appl. Cryst. (1994). 27, 96-102
doi: 10.1107/S0021889893006946
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High-resolution transmission-electron-microscopy observation of the ultra-fine structure of natural magnetite

Y. G. Wang, D. H. Ping and J. G. Guo
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J. Appl. Cryst. (1994). 27, 103-110
doi: 10.1107/S0021889893007484
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Fitting of rocking curves from ion-implanted semiconductors

J. G. E. Klappe and P. F. Fewster
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J. Appl. Cryst. (1994). 27, 111-121
doi: 10.1107/S0021889893006752
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Laue image analysis. II. Variable radial elliptical masking and its application in studies involving inherently streaked Laue exposures

T. J. Greenhough and A. K. Shrive
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computer programs

J. Appl. Cryst. (1994). 27, 122-124
doi: 10.1107/S0021889893005849
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Programs for translation searches with two independent models simultaneously

A. G. Urzhumtsev and A. D. Podjarny
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J. Appl. Cryst. (1994). 27, 124-127
doi: 10.1107/S0021889893006843
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DIMS – a direct-method program for incommensurate modulated structures

Z. Fu and H. Fan
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laboratory notes

J. Appl. Cryst. (1994). 27, 127-128
doi: 10.1107/S0021889893008702
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A rotating sample mounting device for a Guinier powder diffractometer

G. Brüderl, H. Burzlaff and B. Perdikatsis
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J. Appl. Cryst. (1994). 27, 129-130
doi: 10.1107/S0021889893008957
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Using energy discrimination in reduction of fluorescence radiation in X-ray powder diffraction

P. Norby
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computer program abstracts

J. Appl. Cryst. (1994). 27, 131
doi: 10.1107/S002188989300857X
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PSL + SEARCHER and DIRECTER – automatic structure analysis of organic compounds using a PC

K. Okada
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international union of crystallography

J. Appl. Cryst. (1994). 27, 131
doi: 10.1107/S0021889894099711
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Restructuring of the IUCr editorial office

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book reviews

J. Appl. Cryst. (1994). 27, 131-132
doi: 10.1107/S0021889893011410
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Structure of electrified interfaces edited by J. Lipkowski and P. N. Ross

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books received

J. Appl. Cryst. (1994). 27, 132
doi: 10.1107/S0021889893011264
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Infrared transmission spectra of carbonate minerals by G. C. Jones and B. Jackson

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