Journal of Applied Crystallography
Volume 27, Part 1 (February 1994)
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Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G.
Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore. |
editorial
J. Appl. Cryst. (1994). 27, 1 [doi:10.1107/S0021889893011720]
Editorial
A. M. Glazer
international union of crystallography
J. Appl. Cryst. (1994). 27, 2-6 [doi:10.1107/S0021889894099723]
Notes for Authors
research papers
J. Appl. Cryst. (1994). 27, 7-12 [doi:10.1107/S0021889893005618]
Fourier-coefficient method of X-ray rocking-curve interpretation
A. A. Stepanov
J. Appl. Cryst. (1994). 27, 13-19 [doi:10.1107/S0021889894099589]
Standard stereographic diagrams and indexing of X-ray Laue diffraction spots of an icosahedral quasicrystal
W. Zhou, R. Wang, J. Gui, J. Zhao and J. Jiang
J. Appl. Cryst. (1994). 27, 20-24 [doi:10.1107/S0021889893006247]
Small-angle X-ray scattering of systems with inhomogeneous particles
R. Itri and L. Q. Amaral
J. Appl. Cryst. (1994). 27, 25-28 [doi:10.1107/S0021889893006284]
A consistent formalism for partial structure functions
E. Sváb and F. Hajdu
J. Appl. Cryst. (1994). 27, 29-35 [doi:10.1107/S0021889893006260]
Analysis of neutron and X-ray reflectivity data. I. Theory
I. W. Hamley and J. S. Pedersen
J. Appl. Cryst. (1994). 27, 36-49 [doi:10.1107/S0021889893006272]
Analysis of neutron and X-ray reflectivity data. II. Constrained least-squares methods
J. S. Pedersen and I. W. Hamley
J. Appl. Cryst. (1994). 27, 50-55 [doi:10.1107/S0021889893006387]
The three-dimensional resolution function of the four-reflection monochromator: a route to a higher intensity
P. van der Sluis
J. Appl. Cryst. (1994). 27, 56-66 [doi:10.1107/S002188989300651X]
Characterization of thin nickel electrocoatings by the low-incident-beam-angle diffraction method
K. Van Acker, L. De Buyser, J. P. Celis and P. Van Houtte
J. Appl. Cryst. (1994). 27, 67-73 [doi:10.1107/S0021889893006600]
Electron diffraction and microscope studies of zirconium oxides stabilized by several metal oxides
R. Miida, M. Tanaka, H. Arashi and M. Ishigame
J. Appl. Cryst. (1994). 27, 74-79 [doi:10.1107/S0021889893006727]
KI7: a program written in vectorial Fortran for the simulation of powder diffraction patterns
A. Martorana, G. Deganello and D. Duca
J. Appl. Cryst. (1994). 27, 80-88 [doi:10.1107/S0021889893006831]
Optimization of a double bent-crystal diffractometer for neutron small-angle scattering experiments
J. Saroun, P. Lukás, P. Mikula and B. Alefield
J. Appl. Cryst. (1994). 27, 89-91 [doi:10.1107/S0021889893007009]
On the evaluation of integrals useful for calculating the electrostatic potential and its derivatives from pseudo-atoms
Z. Su and P. Coppens
J. Appl. Cryst. (1994). 27, 92-95 [doi:10.1107/S0021889893007472]
A single-crystal orientation technique using doubly exposed Weissenberg photographs
I. Tanaka, M. Yao, N. Kamiya and H. Iwasaki
J. Appl. Cryst. (1994). 27, 96-102 [doi:10.1107/S0021889893006946]
High-resolution transmission-electron-microscopy observation of the ultra-fine structure of natural magnetite
Y. G. Wang, D. H. Ping and J. G. Guo
J. Appl. Cryst. (1994). 27, 103-110 [doi:10.1107/S0021889893007484]
Fitting of rocking curves from ion-implanted semiconductors
J. G. E. Klappe and P. F. Fewster
J. Appl. Cryst. (1994). 27, 111-121 [doi:10.1107/S0021889893006752]
Laue image analysis. II. Variable radial elliptical masking and its application in studies involving inherently streaked Laue exposures
T. J. Greenhough and A. K. Shrive
computer programs
J. Appl. Cryst. (1994). 27, 122-124 [doi:10.1107/S0021889893005849]
Programs for translation searches with two independent models simultaneously
A. G. Urzhumtsev and A. D. Podjarny
J. Appl. Cryst. (1994). 27, 124-127 [doi:10.1107/S0021889893006843]
DIMS - a direct-method program for incommensurate modulated structures
Z. Fu and H. Fan
laboratory notes
J. Appl. Cryst. (1994). 27, 127-128 [doi:10.1107/S0021889893008702]
A rotating sample mounting device for a Guinier powder diffractometer
G. Brüderl, H. Burzlaff and B. Perdikatsis
J. Appl. Cryst. (1994). 27, 129-130 [doi:10.1107/S0021889893008957]
Using energy discrimination in reduction of fluorescence radiation in X-ray powder diffraction
P. Norby
computer program abstracts
J. Appl. Cryst. (1994). 27, 131 [doi:10.1107/S002188989300857X]
PSL + SEARCHER and DIRECTER - automatic structure analysis of organic compounds using a PC
K. Okada
international union of crystallography
J. Appl. Cryst. (1994). 27, 131 [doi:10.1107/S0021889894099711]
Restructuring of the IUCr editorial office
book reviews
J. Appl. Cryst. (1994). 27, 131-132 [doi:10.1107/S0021889893011410]
Structure of electrified interfaces edited by J. Lipkowski and P. N. Ross
books received
J. Appl. Cryst. (1994). 27, 132 [doi:10.1107/S0021889893011264]
Infrared transmission spectra of carbonate minerals by G. C. Jones and B. Jackson
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