Journal of Applied Crystallography

Volume 27, Part 1 (February 1994)


Cover illustration Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G. Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore.

editorial



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J. Appl. Cryst. (1994). 27, 1    [doi:10.1107/S0021889893011720]

Editorial

A. M. Glazer


international union of crystallography



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J. Appl. Cryst. (1994). 27, 2-6    [doi:10.1107/S0021889894099723]

Notes for Authors


research papers



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J. Appl. Cryst. (1994). 27, 7-12    [doi:10.1107/S0021889893005618]

Fourier-coefficient method of X-ray rocking-curve interpretation

A. A. Stepanov



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J. Appl. Cryst. (1994). 27, 13-19    [doi:10.1107/S0021889894099589]

Standard stereographic diagrams and indexing of X-ray Laue diffraction spots of an icosahedral quasicrystal

W. Zhou, R. Wang, J. Gui, J. Zhao and J. Jiang



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J. Appl. Cryst. (1994). 27, 20-24    [doi:10.1107/S0021889893006247]

Small-angle X-ray scattering of systems with inhomogeneous particles

R. Itri and L. Q. Amaral



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J. Appl. Cryst. (1994). 27, 25-28    [doi:10.1107/S0021889893006284]

A consistent formalism for partial structure functions

E. Sváb and F. Hajdu



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J. Appl. Cryst. (1994). 27, 29-35    [doi:10.1107/S0021889893006260]

Analysis of neutron and X-ray reflectivity data. I. Theory

I. W. Hamley and J. S. Pedersen



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J. Appl. Cryst. (1994). 27, 36-49    [doi:10.1107/S0021889893006272]

Analysis of neutron and X-ray reflectivity data. II. Constrained least-squares methods

J. S. Pedersen and I. W. Hamley



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J. Appl. Cryst. (1994). 27, 50-55    [doi:10.1107/S0021889893006387]

The three-dimensional resolution function of the four-reflection monochromator: a route to a higher intensity

P. van der Sluis



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J. Appl. Cryst. (1994). 27, 56-66    [doi:10.1107/S002188989300651X]

Characterization of thin nickel electrocoatings by the low-incident-beam-angle diffraction method

K. Van Acker, L. De Buyser, J. P. Celis and P. Van Houtte



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J. Appl. Cryst. (1994). 27, 67-73    [doi:10.1107/S0021889893006600]

Electron diffraction and microscope studies of zirconium oxides stabilized by several metal oxides

R. Miida, M. Tanaka, H. Arashi and M. Ishigame



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J. Appl. Cryst. (1994). 27, 74-79    [doi:10.1107/S0021889893006727]

KI7: a program written in vectorial Fortran for the simulation of powder diffraction patterns

A. Martorana, G. Deganello and D. Duca



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J. Appl. Cryst. (1994). 27, 80-88    [doi:10.1107/S0021889893006831]

Optimization of a double bent-crystal diffractometer for neutron small-angle scattering experiments

J. Saroun, P. Lukás, P. Mikula and B. Alefield



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J. Appl. Cryst. (1994). 27, 89-91    [doi:10.1107/S0021889893007009]

On the evaluation of integrals useful for calculating the electrostatic potential and its derivatives from pseudo-atoms

Z. Su and P. Coppens



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J. Appl. Cryst. (1994). 27, 92-95    [doi:10.1107/S0021889893007472]

A single-crystal orientation technique using doubly exposed Weissenberg photographs

I. Tanaka, M. Yao, N. Kamiya and H. Iwasaki



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J. Appl. Cryst. (1994). 27, 96-102    [doi:10.1107/S0021889893006946]

High-resolution transmission-electron-microscopy observation of the ultra-fine structure of natural magnetite

Y. G. Wang, D. H. Ping and J. G. Guo



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J. Appl. Cryst. (1994). 27, 103-110    [doi:10.1107/S0021889893007484]

Fitting of rocking curves from ion-implanted semiconductors

J. G. E. Klappe and P. F. Fewster



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J. Appl. Cryst. (1994). 27, 111-121    [doi:10.1107/S0021889893006752]

Laue image analysis. II. Variable radial elliptical masking and its application in studies involving inherently streaked Laue exposures

T. J. Greenhough and A. K. Shrive


computer programs



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J. Appl. Cryst. (1994). 27, 122-124    [doi:10.1107/S0021889893005849]

Programs for translation searches with two independent models simultaneously

A. G. Urzhumtsev and A. D. Podjarny



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J. Appl. Cryst. (1994). 27, 124-127    [doi:10.1107/S0021889893006843]

DIMS - a direct-method program for incommensurate modulated structures

Z. Fu and H. Fan


laboratory notes



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J. Appl. Cryst. (1994). 27, 127-128    [doi:10.1107/S0021889893008702]

A rotating sample mounting device for a Guinier powder diffractometer

G. Brüderl, H. Burzlaff and B. Perdikatsis



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J. Appl. Cryst. (1994). 27, 129-130    [doi:10.1107/S0021889893008957]

Using energy discrimination in reduction of fluorescence radiation in X-ray powder diffraction

P. Norby


computer program abstracts



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J. Appl. Cryst. (1994). 27, 131    [doi:10.1107/S002188989300857X]

PSL + SEARCHER and DIRECTER - automatic structure analysis of organic compounds using a PC

K. Okada


international union of crystallography



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J. Appl. Cryst. (1994). 27, 131    [doi:10.1107/S0021889894099711]

Restructuring of the IUCr editorial office


book reviews



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J. Appl. Cryst. (1994). 27, 131-132    [doi:10.1107/S0021889893011410]

Structure of electrified interfaces edited by J. Lipkowski and P. N. Ross


books received



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J. Appl. Cryst. (1994). 27, 132    [doi:10.1107/S0021889893011264]

Infrared transmission spectra of carbonate minerals by G. C. Jones and B. Jackson


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